Differential pressure

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CPC
H01J2237/188

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/188Differential pressure

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Aperture device and analyzer arrangement
- Patent number 11,942,316
- Issue date Mar 26, 2024
- SCIENTA OMICRON AB
- Peter Amann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced electron beam generation
- Patent number 11,517,975
- Issue date Dec 6, 2022
- Arcam AB
- Mattias Fager
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Stage device, charged particle beam apparatus, and vacuum apparatus
- Patent number 11,417,496
- Issue date Aug 16, 2022
- Hitachi, Ltd.
- Motohiro Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Aberration correction in charged particle system
- Patent number 11,348,756
- Issue date May 31, 2022
- ASML Netherlands B.V.
- Alexander Hendrik Vincent Van Veen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 11,276,547
- Issue date Mar 15, 2022
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-stage vacuum equipment with stages separation controlled by S...
- Patent number 11,239,041
- Issue date Feb 1, 2022
- S.A.E.S. Getters S.p.A.
- Marco Urbano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,861,670
- Issue date Dec 8, 2020
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum condition controlling apparatus, system and method for speci...
- Patent number 10,699,874
- Issue date Jun 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe with vacuum differential
- Patent number 10,614,995
- Issue date Apr 7, 2020
- Cameca Instruments, Inc.
- Thomas F. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,522,321
- Issue date Dec 31, 2019
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis in air
- Patent number 10,354,834
- Issue date Jul 16, 2019
- Oxford Instruments Nanotechnology Tools Limited
- Peter J. Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide field atmospheric scanning electron microscope
- Patent number 10,262,832
- Issue date Apr 16, 2019
- Gerasimos Daniel Danilatos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage shielding and cooling in a charged particle beam gener...
- Patent number 10,037,864
- Issue date Jul 31, 2018
- Mapper Lithography IP B.V.
- Alexander Hendrik Vincent Van Veen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microscopy support structures
- Patent number 9,984,850
- Issue date May 29, 2018
- Protochips, Inc.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User interface for an electron microscope
- Patent number 9,865,427
- Issue date Jan 9, 2018
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus having a selectively positionabl...
- Patent number 9,741,528
- Issue date Aug 22, 2017
- Carl Zeiss Microscopy GmbH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder and charged particle device
- Patent number 9,721,752
- Issue date Aug 1, 2017
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis in air
- Patent number 9,704,688
- Issue date Jul 11, 2017
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging and processing for plasma ion source
- Patent number 9,691,583
- Issue date Jun 27, 2017
- FEI Company
- Thomas G. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle lithography system and beam generator
- Patent number 9,653,261
- Issue date May 16, 2017
- Mapper Lithography IP B.V.
- Alexander Hendrik Vincent Van Veen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,640,364
- Issue date May 2, 2017
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diaphragm mounting member and charged particle beam device
- Patent number 9,633,817
- Issue date Apr 25, 2017
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,627,172
- Issue date Apr 18, 2017
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample storage container, charged particle beam apparatus, and imag...
- Patent number 9,564,288
- Issue date Feb 7, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,530,612
- Issue date Dec 27, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,530,611
- Issue date Dec 27, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,466,458
- Issue date Oct 11, 2016
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope, an interface and a method for observi...
- Patent number 9,431,213
- Issue date Aug 30, 2016
- B-Nano Ltd.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy support structures
- Patent number 9,275,826
- Issue date Mar 1, 2016
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation at high temperature surface equilibrium conditions
- Patent number 9,218,991
- Issue date Dec 22, 2015
- Infineon Technologies Americas Corp.
- Michael A. Briere
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON GUN CHAMBER FOR SCANNING ELECTRON MICROSCOPE, ELECTRON GUN...
- Publication number 20240212971
- Publication date Jun 27, 2024
- National Institute for Materials Science
- Han ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM SYSTEM
- Publication number 20230307205
- Publication date Sep 28, 2023
- V Technology Co., LTD.
- Michinobu MIZUMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCT...
- Publication number 20230230818
- Publication date Jul 20, 2023
- Kokusai Electric Corporation
- Tetsuaki Inada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM WELDING SYSTEMS EMPLOYING A PLASMA CATHODE
- Publication number 20220384138
- Publication date Dec 1, 2022
- US Electron, Inc.
- John Noonan
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APERTURE DEVICE AND ANALYSER ARRANGEMENT
- Publication number 20220020580
- Publication date Jan 20, 2022
- SCIENTA OMICRON AB
- Peter AMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-STAGE VACUUM EQUIPMENT WITH STAGES SEPARATION CONTROLLED BY S...
- Publication number 20210249217
- Publication date Aug 12, 2021
- Saes Getters S.p.A.
- Marco URBANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20210050178
- Publication date Feb 18, 2021
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Stage Device, Charged Particle Beam Apparatus, and Vacuum Apparatus
- Publication number 20210027978
- Publication date Jan 28, 2021
- Hitachi, Ltd
- Motohiro TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20200135425
- Publication date Apr 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM CONDITION CONTROLLING APPARATUS, SYSTEM AND METHOD FOR SPECI...
- Publication number 20200035448
- Publication date Jan 30, 2020
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Wei He
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20180342368
- Publication date Nov 29, 2018
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY ANALYSIS IN AIR
- Publication number 20170271125
- Publication date Sep 21, 2017
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter J. STATHAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150380207
- Publication date Dec 31, 2015
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USER INTERFACE FOR AN ELECTRON MICROSCOPE
- Publication number 20150332891
- Publication date Nov 19, 2015
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20150243475
- Publication date Aug 27, 2015
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Instrument
- Publication number 20140209193
- Publication date Jul 31, 2014
- Mitsuhide Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication of III-Nitride Layers
- Publication number 20140213046
- Publication date Jul 31, 2014
- INTERNATIONAL RECTIFIER CORPORATION
- Michael A. Briere
- C30 - CRYSTAL GROWTH
Information Patent Application
Ion Implantation at High Temperature Surface Equilibrium Conditions
- Publication number 20140147998
- Publication date May 29, 2014
- INTERNATIONAL RECTIFIER CORPORATION
- Michael A. Briere
- C30 - CRYSTAL GROWTH
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20140117232
- Publication date May 1, 2014
- B-NANO LTD.
- Dov SHACHAL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE LITHOGRAPHY SYSTEM WITH INTERMEDIATE CHAMBER
- Publication number 20140061497
- Publication date Mar 6, 2014
- MAPPER LITHOGRAPHY IP BV
- Laura DINU-GÜRTLER
- B82 - NANO-TECHNOLOGY
Information Patent Application
IMAGING AND PROCESSING FOR PLASMA ION SOURCE
- Publication number 20130320229
- Publication date Dec 5, 2013
- FEI Company
- Tom Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Growing a III-Nitride Layer
- Publication number 20130196490
- Publication date Aug 1, 2013
- INTERNATIONAL RECTIFIER CORPORATION
- Michael A. Briere
- C30 - CRYSTAL GROWTH
Information Patent Application
Processing System
- Publication number 20130098292
- Publication date Apr 25, 2013
- CARL ZEISS NTS GMBH
- Emmerich Bertagnolli
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...
- Publication number 20130087704
- Publication date Apr 11, 2013
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE BEAM DRAWING APPARATUS, AND METHOD OF MANUFACTURIN...
- Publication number 20130040240
- Publication date Feb 14, 2013
- Canon Kabushiki Kaisha
- Shigeru Terashima
- B82 - NANO-TECHNOLOGY
Information Patent Application
DRAWING APPARATUS, METHOD OF MANUFACTURING ARTICLE, AND PROCESSING...
- Publication number 20120328988
- Publication date Dec 27, 2012
- Canon Kabushiki Kaisha
- Yoshihiro Hirata
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED PARTICLE LITHOGRAPHY SYSTEM WITH INTERMEDIATE CHAMBER
- Publication number 20120293780
- Publication date Nov 22, 2012
- MAPPER LITHOGRAPHY IP BV
- Laura DINU-GÜRTLER
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle Beam System
- Publication number 20120199740
- Publication date Aug 9, 2012
- CARL ZEISS NTS GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM DEVICE WITH DEFLECTION SYSTEM
- Publication number 20120138814
- Publication date Jun 7, 2012
- CARL ZEISS NTS LTD.
- Dirk Preikszas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICES
- Publication number 20120091337
- Publication date Apr 19, 2012
- Carl Zeiss NTS Limited
- Stewart John Bean
- H01 - BASIC ELECTRIC ELEMENTS

Differential pressure

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Aperture device and analyzer arrangement

Enhanced electron beam generation

Stage device, charged particle beam apparatus, and vacuum apparatus

Aberration correction in charged particle system

Charged particle optical apparatus for through-the-lens detection o...

Multi-stage vacuum equipment with stages separation controlled by S...

Charged particle optical apparatus for through-the-lens detection o...

Vacuum condition controlling apparatus, system and method for speci...

Atom probe with vacuum differential

Charged particle optical apparatus for through-the-lens detection o...

X-ray analysis in air

Wide field atmospheric scanning electron microscope

High voltage shielding and cooling in a charged particle beam gener...

Microscopy support structures

User interface for an electron microscope

Charged particle optical apparatus having a selectively positionabl...

Sample holder and charged particle device

X-ray analysis in air

Imaging and processing for plasma ion source

Charged particle lithography system and beam generator

Charged particle beam system and method of operating a charged part...

Diaphragm mounting member and charged particle beam device

Charged particle beam system and method of operating a charged part...

Sample storage container, charged particle beam apparatus, and imag...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Scanning electron microscope

Scanning electron microscope, an interface and a method for observi...

Microscopy support structures

Ion implantation at high temperature surface equilibrium conditions

Patents Applicationslast 30 patents

ELECTRON GUN CHAMBER FOR SCANNING ELECTRON MICROSCOPE, ELECTRON GUN...

FOCUSED ION BEAM SYSTEM

SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCT...

ELECTRON BEAM WELDING SYSTEMS EMPLOYING A PLASMA CATHODE

APERTURE DEVICE AND ANALYSER ARRANGEMENT

MULTI-STAGE VACUUM EQUIPMENT WITH STAGES SEPARATION CONTROLLED BY S...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

Stage Device, Charged Particle Beam Apparatus, and Vacuum Apparatus

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

VACUUM CONDITION CONTROLLING APPARATUS, SYSTEM AND METHOD FOR SPECI...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

X-RAY ANALYSIS IN AIR

SCANNING ELECTRON MICROSCOPE

USER INTERFACE FOR AN ELECTRON MICROSCOPE

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

Charged Particle Beam Instrument

Fabrication of III-Nitride Layers

Ion Implantation at High Temperature Surface Equilibrium Conditions

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

CHARGED PARTICLE LITHOGRAPHY SYSTEM WITH INTERMEDIATE CHAMBER

IMAGING AND PROCESSING FOR PLASMA ION SOURCE

Method and Apparatus for Growing a III-Nitride Layer

Processing System

GAS FIELD IONIZATION ION SOURCE, SCANNING CHARGED PARTICLE MICROSCO...

CHARGED PARTICLE BEAM DRAWING APPARATUS, AND METHOD OF MANUFACTURIN...

DRAWING APPARATUS, METHOD OF MANUFACTURING ARTICLE, AND PROCESSING...

CHARGED PARTICLE LITHOGRAPHY SYSTEM WITH INTERMEDIATE CHAMBER

Particle Beam System

PARTICLE BEAM DEVICE WITH DEFLECTION SYSTEM

CHARGED PARTICLE BEAM DEVICES