diffraction cameras

Industry

CPC
G01N2223/0561

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/0561diffraction cameras

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
- Patent number 11,933,746
- Issue date Mar 19, 2024
- Paul Scherrer Institut
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting semiconductor device and method for inspec...
- Patent number 11,703,465
- Issue date Jul 18, 2023
- Kioxia Corporation
- Nobuhito Kuge
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for semiconductor metrology based on wavelength...
- Patent number 11,460,418
- Issue date Oct 4, 2022
- KLA Corporation
- Alexander Kuznetsov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining the concentration of an element of a heteroe...
- Patent number 10,718,726
- Issue date Jul 21, 2020
- Infineon Technologies Austria AG
- Katja Hoenes
- G01 - MEASURING TESTING
Information Patent Grant
Recrystallization rate measurement method of zirconium alloy claddi...
- Patent number 10,641,719
- Issue date May 5, 2020
- Kepco Nuclear Fuel Co., Ltd.
- Tae Sik Jung
- G01 - MEASURING TESTING
Information Patent Grant
Integrated reciprocal space mapping for simultaneous lattice parame...
- Patent number 9,864,075
- Issue date Jan 9, 2018
- Jonathan Giencke
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for use in examining the lattice of a semiconductor wafer...
- Patent number 4,078,175
- Issue date Mar 7, 1978
- James C. Administrator of the National Aeronautics and Space Administration,...
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...
- Publication number 20220404296
- Publication date Dec 22, 2022
- PAUL SCHERRER INSTITUT
- Soichiro Tsujino
- G01 - MEASURING TESTING
Information Patent Application
Recrystallization Rate Measurement Method of Zirconium Alloy Claddi...
- Publication number 20190154600
- Publication date May 23, 2019
- KEPCO NUCLEAR FUEL CO., LTD.
- Tae Sik Jung
- G01 - MEASURING TESTING
Information Patent Application
Method for Determining the Concentration of an Element of a Heteroe...
- Publication number 20190113468
- Publication date Apr 18, 2019
- Infineon Technologies Austria AG
- Katja Hoenes
- G01 - MEASURING TESTING

diffraction cameras

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device for hosting a probe solution of molecules in a plurality of...

Screening system

Apparatus for inspecting semiconductor device and method for inspec...

Methods and systems for semiconductor metrology based on wavelength...

Method for determining the concentration of an element of a heteroe...

Recrystallization rate measurement method of zirconium alloy claddi...

Integrated reciprocal space mapping for simultaneous lattice parame...

Apparatus for use in examining the lattice of a semiconductor wafer...

Patents Applicationslast 30 patents

DEVICE FOR HOSTING A PROBE SOLUTION OF MOLECULES IN A PLURALITY OF...

Recrystallization Rate Measurement Method of Zirconium Alloy Claddi...

Method for Determining the Concentration of an Element of a Heteroe...