diffraction of electrons

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CPC
G01N2223/0565

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/0565diffraction of electrons

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for the detection and correction of lens distortions in an e...
- Patent number 12,078,603
- Issue date Sep 3, 2024
- Joerg Kaercher
- G01 - MEASURING TESTING
Information Patent Grant
Method and system to determine crystal structure
- Patent number 11,988,618
- Issue date May 21, 2024
- FEI Company
- Bart Buijsse
- G01 - MEASURING TESTING
Information Patent Grant
Method for improving an EBSD/TKD map
- Patent number 11,940,396
- Issue date Mar 26, 2024
- Bruker Nano GmbH
- Daniel Radu Goran
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron diffraction intensity from single crystal silicon in a pho...
- Patent number 11,915,837
- Issue date Feb 27, 2024
- Arizona Board of Regents on behalf of Arizona State University
- William Graves
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
- Patent number 11,815,476
- Issue date Nov 14, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanopatterned electron beams for temporal coherence and determinist...
- Patent number 11,798,706
- Issue date Oct 24, 2023
- Arizona Board of Regents on behalf of Arizona State University
- William Graves
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for diffraction pattern acquisition
- Patent number 11,499,926
- Issue date Nov 15, 2022
- FEI Company
- TomáTomá{hacek over (s)} Vystavel
- G01 - MEASURING TESTING
Information Patent Grant
Kikuchi diffraction detector
- Patent number 11,300,530
- Issue date Apr 12, 2022
- Bruker Nano GmbH
- Daniel Radu Goran
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope and method of image gener...
- Patent number 10,340,118
- Issue date Jul 2, 2019
- Jeol Ltd.
- Ryusuke Sagawa
- G01 - MEASURING TESTING
Information Patent Grant
Strain mapping in TEM using precession electron diffraction
- Patent number 9,568,442
- Issue date Feb 14, 2017
- Drexel University
- Mitra Lenore Taheri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution amplitude contrast imaging
- Patent number 9,412,558
- Issue date Aug 9, 2016
- Universiteit Antwerpen
- Dirk Van Dyck
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR STRUCTURALLY CHARACTERIZING COMPOUNDS
- Publication number 20230057900
- Publication date Feb 23, 2023
- The Regents of the University of California
- Hosea M. Nelson
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
- Publication number 20220317066
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE
- Publication number 20220317067
- Publication date Oct 6, 2022
- FEI Company
- Bart BUIJSSE
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...
- Publication number 20220317068
- Publication date Oct 6, 2022
- Bruker AXS, LLC
- Joerg KAERCHER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IMPROVING AN EBSD/TKD MAP
- Publication number 20220221412
- Publication date Jul 14, 2022
- BRUKER NANO GMBH
- Daniel Radu GORAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DIFFRACTION PATTERN ACQUISITIONMETHOD FOR DIFFRACTION PA...
- Publication number 20210404978
- Publication date Dec 30, 2021
- FEI Company
- Tomás Vystavel
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DIFFRACTION INTENSITY FROM SINGLE CRYSTAL SILICON IN A PHO...
- Publication number 20210341399
- Publication date Nov 4, 2021
- Arizona Board of Regents on behalf of Arizona State University
- William Graves
- G01 - MEASURING TESTING
Information Patent Application
KIKUCHI DIFFRACTION DETECTOR
- Publication number 20210025837
- Publication date Jan 28, 2021
- BRUKER NANO GMBH
- Daniel Radu GORAN
- G01 - MEASURING TESTING
Information Patent Application
FATIGUE LEVEL ESTIMATION METHOD AND CREATING METHOD FOR DATABASE FO...
- Publication number 20210025863
- Publication date Jan 28, 2021
- JTEKT Corporation
- Yousuke NAGANO
- G01 - MEASURING TESTING

diffraction of electrons

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for the detection and correction of lens distortions in an e...

Method and system to determine crystal structure

Method for improving an EBSD/TKD map

Electron diffraction intensity from single crystal silicon in a pho...

Methods and systems for acquiring three-dimensional electron diffra...

Nanopatterned electron beams for temporal coherence and determinist...

Method for diffraction pattern acquisition

Kikuchi diffraction detector

Scanning transmission electron microscope and method of image gener...

Strain mapping in TEM using precession electron diffraction

High-resolution amplitude contrast imaging

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR STRUCTURALLY CHARACTERIZING COMPOUNDS

METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...

METHOD AND SYSTEM TO DETERMINE CRYSTAL STRUCTURE

METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN E...

METHOD FOR IMPROVING AN EBSD/TKD MAP

METHOD FOR DIFFRACTION PATTERN ACQUISITIONMETHOD FOR DIFFRACTION PA...

ELECTRON DIFFRACTION INTENSITY FROM SINGLE CRYSTAL SILICON IN A PHO...

KIKUCHI DIFFRACTION DETECTOR

FATIGUE LEVEL ESTIMATION METHOD AND CREATING METHOD FOR DATABASE FO...