Diffuse illumination

Industry

CPC
G01N2201/0634

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/0634Diffuse illumination

Industries

Patents Grantslast 30 patents

Information Patent Grant
Light emitting diode arrangements for gemstone evaluation
- Patent number 12,135,278
- Issue date Nov 5, 2024
- Gemological Institute of America, Inc. (GIA)
- Jing Zeng
- F21 - LIGHTING
Information Patent Grant
Biochip device
- Patent number 12,117,397
- Issue date Oct 15, 2024
- Gen-Probe Incorporated
- Claude Weisbuch
- G01 - MEASURING TESTING
Information Patent Grant
Specific component detection method, determination method, and appa...
- Patent number 12,092,570
- Issue date Sep 17, 2024
- The University of Tokyo
- Yohei Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Submerged fluorometer with low excitation angle
- Patent number 12,085,509
- Issue date Sep 10, 2024
- Christopher Lee
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system and semiconductor fabrication apparatus in...
- Patent number 12,073,556
- Issue date Aug 27, 2024
- SK Hynix Inc.
- Jeong Ok Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining a force applied to a sample du...
- Patent number 12,019,014
- Issue date Jun 25, 2024
- Thermo Electron Scientific Instruments LLC
- William Robert Keefe
- G01 - MEASURING TESTING
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of manufacturin...
- Patent number 12,017,278
- Issue date Jun 25, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Capnometer
- Patent number 11,986,284
- Issue date May 21, 2024
- CAMBRIDGE RESPIRATORY INNOVATIONS LTD
- Julian Carter
- G01 - MEASURING TESTING
Information Patent Grant
Multi-mode illumination system
- Patent number 11,927,533
- Issue date Mar 12, 2024
- ESSENLIX CORPORATION
- Ji Qi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for assessing optical quality of gemstones
- Patent number 11,921,051
- Issue date Mar 5, 2024
- Gemological Institute of America, Inc. (GIA)
- Hiroshi Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for fluorescence grading of gemstones
- Patent number 11,892,405
- Issue date Feb 6, 2024
- Gemological Institute of America, Inc. (GIA)
- Hiroshi Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Downhole laser system with an improved laser output production and...
- Patent number 11,885,746
- Issue date Jan 30, 2024
- United States Department of Energy
- Dustin McIntyre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Glycosuria measurement device
- Patent number 11,879,888
- Issue date Jan 23, 2024
- Taiwan RedEye Biomedical Inc.
- Tsung-Jui Lin
- G02 - OPTICS
Information Patent Grant
Portable electronic device, accessory, and operating method therefor
- Patent number 11,813,072
- Issue date Nov 14, 2023
- Samsung Electronics Co., Ltd.
- Maxim Alexeevich Vilenskii
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy method and apparatus
- Patent number 11,774,364
- Issue date Oct 3, 2023
- The University of Nottingham
- Ioan Notingher
- G01 - MEASURING TESTING
Information Patent Grant
Three-photon light sheet imaging
- Patent number 11,762,180
- Issue date Sep 19, 2023
- University Court of the University of St Andrews
- Kishan Dholakia
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for exploring an optical property of a sample
- Patent number 11,686,680
- Issue date Jun 27, 2023
- Fundacio Institut de Ciencies Fotoniques
- Valerio Pruneri
- G01 - MEASURING TESTING
Information Patent Grant
Multi-parameter inspection apparatus for monitoring of additive man...
- Patent number 11,668,658
- Issue date Jun 6, 2023
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Light extraction device, detection device, and method for using same
- Patent number 11,640,069
- Issue date May 2, 2023
- BOE Technology Group Co., Ltd.
- Xiandong Meng
- G02 - OPTICS
Information Patent Grant
Apparatus and method for fluorescence grading of gemstones
- Patent number 11,630,065
- Issue date Apr 18, 2023
- Gemological Institute of America, Inc. (GIA)
- Hiroshi Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical chemical analysis apparatus
- Patent number 11,549,885
- Issue date Jan 10, 2023
- Asahi Kasei Microdevices Corporation
- Takaaki Furuya
- G01 - MEASURING TESTING
Information Patent Grant
Multi-mode illumination system
- Patent number 11,543,353
- Issue date Jan 3, 2023
- ESSENLIX CORPORATION
- Ji Qi
- G01 - MEASURING TESTING
Information Patent Grant
Detection arrangement and method for producing detection arrangements
- Patent number 11,486,819
- Issue date Nov 1, 2022
- OSRAM OLED GmbH
- Frank Singer
- G01 - MEASURING TESTING
Information Patent Grant
Mobile ingredient analysis system, and method for true-to-sample me...
- Patent number 11,475,555
- Issue date Oct 18, 2022
- CARL ZEISS SPECTROSCOPY GMBH
- Ralf-Peter Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Downhole laser system with an improved laser output production and...
- Patent number 11,451,004
- Issue date Sep 20, 2022
- U.S. Department of Energy
- Dustin McIntyre
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image capturing apparatus and biometric information acquiring appar...
- Patent number 11,375,899
- Issue date Jul 5, 2022
- Riken
- Takuma Kobayashi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Gas measurement system
- Patent number 11,327,008
- Issue date May 10, 2022
- Mettler-Toledo GmbH
- Francesca Venturini
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for fluorescence grading of gemstones
- Patent number 11,300,514
- Issue date Apr 12, 2022
- Gemological Institute of America, Inc. (GIA)
- Hiroshi Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
IoT based apparatus for assessing quality of food produce
- Patent number 11,295,433
- Issue date Apr 5, 2022
- Miku Jha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor device with OLED
- Patent number 11,285,267
- Issue date Mar 29, 2022
- Sanofi-Aventis Deutschland GmbH
- Gertrud Blei
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
FLUORESCENCE DETECTION VIA OUTCOUPLERS
- Publication number 20240377324
- Publication date Nov 14, 2024
- Hewlett-Packard Development Company, L.P.
- Alexander Govyadinov
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE OPTICAL SYSTEM FOR A SPECTROGRAPH
- Publication number 20240361234
- Publication date Oct 31, 2024
- Thermo Electron Scientific Instruments LLC
- Julian Irwin
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20240342804
- Publication date Oct 17, 2024
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
COLORIMETRY METHOD AND SYSTEM
- Publication number 20240344975
- Publication date Oct 17, 2024
- Instrument Systems GmbH
- Elisabeth BOTHSCHAFTER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTRAL ANALYSIS WITH LINEAR IMAGE SENSOR
- Publication number 20240337593
- Publication date Oct 10, 2024
- Baker Hughes Holdings LLC
- Jakub Joseph Prchlik
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A FORCE APPLIED TO A SAMPLE DU...
- Publication number 20240310277
- Publication date Sep 19, 2024
- Thermo Electron Scientific Instruments LLC
- William Robert Keefe
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DETECTING SURFACE DEFECTS IN OBJECTS
- Publication number 20240255441
- Publication date Aug 1, 2024
- UTPVISION S.R.L.
- Roberto Finazzi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING SYSTEM
- Publication number 20240192127
- Publication date Jun 13, 2024
- Endress + Hauser Conducta GmbH + Co. KG
- Joachim Bolle
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODE ILLUMINATION SYSTEM
- Publication number 20240192137
- Publication date Jun 13, 2024
- ESSENLIX CORPORATION
- Ji Qi
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY...
- Publication number 20240175812
- Publication date May 30, 2024
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR FLUORESCENCE GRADING OF GEMSTONES
- Publication number 20240167955
- Publication date May 23, 2024
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Hiroshi TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS
- Publication number 20240102937
- Publication date Mar 28, 2024
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Tsung-Han TSAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A REFRACTOMETER
- Publication number 20240068940
- Publication date Feb 29, 2024
- KXS TECHNOLOGIES OY
- Harri SALO
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...
- Publication number 20240003809
- Publication date Jan 4, 2024
- ASML NETHERLANDS B.V.
- Peter Michael KRAUS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HIGH SPECTRAL AND TEMPORAL RESOLUTION GLOW DISCHARGE SPECTROMETRY D...
- Publication number 20230349832
- Publication date Nov 2, 2023
- HORIBA FRANCE SAS
- Patrick CHAPON
- G01 - MEASURING TESTING
Information Patent Application
DISPERSION MEASUREMENT DEVICE AND DISPERSION MEASUREMENT METHOD
- Publication number 20230333007
- Publication date Oct 19, 2023
- Hamamatsu Photonics K.K.
- Koyo WATANABE
- G01 - MEASURING TESTING
Information Patent Application
MULTI-ELEMENT SUPER RESOLUTION OPTICAL INSPECTION SYSTEM
- Publication number 20230296517
- Publication date Sep 21, 2023
- KLA Corporation
- Grace Hsiu-Ling Chen
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20230288323
- Publication date Sep 14, 2023
- Ryosuke KASAHARA
- G01 - MEASURING TESTING
Information Patent Application
Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...
- Publication number 20230258578
- Publication date Aug 17, 2023
- Araz Yacoubian
- B22 - CASTING POWDER METALLURGY
Information Patent Application
OPTICAL ABSORPTION SPECTROMETER
- Publication number 20230236115
- Publication date Jul 27, 2023
- ams International AG
- Remco VERDOOLD
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR DETERMINING THE PRESENCE OR CONCENTRATION OF TARGET M...
- Publication number 20230236127
- Publication date Jul 27, 2023
- ams International AG
- Remco VERDOOLD
- G01 - MEASURING TESTING
Information Patent Application
DISSOLVED GAS SENSING SYSTEM AND METHOD
- Publication number 20230221246
- Publication date Jul 13, 2023
- WOODS HOLE OCEANOGRAPHIC INSTITUTION
- Jason KAPIT
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS AND METHOD FOR FLUORESCENCE GRADING OF GEMSTONES
- Publication number 20230213447
- Publication date Jul 6, 2023
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Hiroshi TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
GLYCOSURIA MEASUREMENT DEVICE
- Publication number 20230213498
- Publication date Jul 6, 2023
- TAIWAN REDEYE BIOMEDICAL INC.
- Tsung-Jui LIN
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED EVANESCENT PRISM COUPLING SYSTEMS AND METHODS FOR CHARACTE...
- Publication number 20230168186
- Publication date Jun 1, 2023
- Corning Incorporated
- Rostislav Vatchev Roussev
- G01 - MEASURING TESTING
Information Patent Application
SPECIFIC COMPONENT DETECTION METHOD, DETERMINATION METHOD, AND APPA...
- Publication number 20230145009
- Publication date May 11, 2023
- THE UNIVERSITY OF TOKYO
- Yohei KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION SYSTEM AND SEMICONDUCTOR FABRICATION APPARATUS IN...
- Publication number 20230134909
- Publication date May 4, 2023
- SK HYNIX INC.
- Jeong Ok PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-MODE ILLUMINATION SYSTEM
- Publication number 20230078084
- Publication date Mar 16, 2023
- ESSENLIX CORPORATION
- Ji Qi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISCRIMINATION APPARATUS AND METHODS ADAPTED TO MONITOR REA...
- Publication number 20230064409
- Publication date Mar 2, 2023
- Siemens Healthcare Diagnostics Inc.
- Mohiudeen Azhar
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Submerged Fluorometer with Low Excitation Angle
- Publication number 20230047096
- Publication date Feb 16, 2023
- Christopher Lee
- G01 - MEASURING TESTING

Diffuse illumination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Light emitting diode arrangements for gemstone evaluation

Biochip device

Specific component detection method, determination method, and appa...

Submerged fluorometer with low excitation angle

Defect inspection system and semiconductor fabrication apparatus in...

Method and apparatus for determining a force applied to a sample du...

Multi-parameter inspection apparatus for monitoring of manufacturin...

Capnometer

Multi-mode illumination system

Apparatus and method for assessing optical quality of gemstones

Apparatus and method for fluorescence grading of gemstones

Downhole laser system with an improved laser output production and...

Glycosuria measurement device

Portable electronic device, accessory, and operating method therefor

Raman spectroscopy method and apparatus

Three-photon light sheet imaging

Apparatus for exploring an optical property of a sample

Multi-parameter inspection apparatus for monitoring of additive man...

Light extraction device, detection device, and method for using same

Apparatus and method for fluorescence grading of gemstones

Optical chemical analysis apparatus

Multi-mode illumination system

Detection arrangement and method for producing detection arrangements

Mobile ingredient analysis system, and method for true-to-sample me...

Downhole laser system with an improved laser output production and...

Image capturing apparatus and biometric information acquiring appar...

Gas measurement system

Apparatus and method for fluorescence grading of gemstones

IoT based apparatus for assessing quality of food produce

Sensor device with OLED

Patents Applicationslast 30 patents

FLUORESCENCE DETECTION VIA OUTCOUPLERS

ADJUSTABLE OPTICAL SYSTEM FOR A SPECTROGRAPH

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

COLORIMETRY METHOD AND SYSTEM

SPECTRAL ANALYSIS WITH LINEAR IMAGE SENSOR

METHOD AND APPARATUS FOR DETERMINING A FORCE APPLIED TO A SAMPLE DU...

APPARATUS FOR DETECTING SURFACE DEFECTS IN OBJECTS

OPTICAL MEASURING SYSTEM

MULTI-MODE ILLUMINATION SYSTEM

HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY...

APPARATUS AND METHOD FOR FLUORESCENCE GRADING OF GEMSTONES

HIGH CLARITY GEMSTONE FACET AND INTERNAL IMAGING ANALYSIS

A REFRACTOMETER

METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GE...

HIGH SPECTRAL AND TEMPORAL RESOLUTION GLOW DISCHARGE SPECTROMETRY D...

DISPERSION MEASUREMENT DEVICE AND DISPERSION MEASUREMENT METHOD

MULTI-ELEMENT SUPER RESOLUTION OPTICAL INSPECTION SYSTEM

MEASURING APPARATUS

Multi-Parameter Inspection Apparatus for Monitoring of Manufacturin...

OPTICAL ABSORPTION SPECTROMETER

APPARATUS FOR DETERMINING THE PRESENCE OR CONCENTRATION OF TARGET M...

DISSOLVED GAS SENSING SYSTEM AND METHOD

APPARATUS AND METHOD FOR FLUORESCENCE GRADING OF GEMSTONES

GLYCOSURIA MEASUREMENT DEVICE

ENHANCED EVANESCENT PRISM COUPLING SYSTEMS AND METHODS FOR CHARACTE...

SPECIFIC COMPONENT DETECTION METHOD, DETERMINATION METHOD, AND APPA...

DEFECT INSPECTION SYSTEM AND SEMICONDUCTOR FABRICATION APPARATUS IN...

MULTI-MODE ILLUMINATION SYSTEM

OPTICAL DISCRIMINATION APPARATUS AND METHODS ADAPTED TO MONITOR REA...

Submerged Fluorometer with Low Excitation Angle