Digital circuitry

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CPC
G01N2201/125

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/125Digital circuitry

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Light emitting apparatus, light emitting method, light detection ap...
- Patent number 12,235,210
- Issue date Feb 25, 2025
- MEGA CRYSTAL BIOTECHNOLOGY SINGAPORE PTE. LTD
- Yi-Sheng Ting
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Universal rapid diagnostic test reader with trans-visual sensitivity
- Patent number 12,222,287
- Issue date Feb 11, 2025
- NOWDiagnostics, Inc.
- Neven Karlovac
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and assay chip for probing, detecting and analyzing...
- Patent number 12,163,888
- Issue date Dec 10, 2024
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Active-source-pixel, integrated device for rapid analysis of biolog...
- Patent number 12,123,834
- Issue date Oct 22, 2024
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Repair welding inspection device and repair welding inspection method
- Patent number 12,078,600
- Issue date Sep 3, 2024
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Kazuki Hanada
- G01 - MEASURING TESTING
Information Patent Grant
Analog signal processing for a lightweight and compact laser-based...
- Patent number 11,994,464
- Issue date May 28, 2024
- SEEKOPS INC.
- Victor Alexander Miller
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable integrated circuits for adjusting cell sorting class...
- Patent number 11,978,269
- Issue date May 7, 2024
- Becton, Dickinson and Company
- Paul Barclay Purcell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light emitting apparatus, light emitting method, light detection ap...
- Patent number 11,965,822
- Issue date Apr 23, 2024
- MEGA CRYSTAL BIOTECHNOLOGY SINGAPORE PTE. LTD
- Yi-Sheng Ting
- G01 - MEASURING TESTING
Information Patent Grant
Data acquisition control for advanced analytic instruments having p...
- Patent number 11,808,700
- Issue date Nov 7, 2023
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reconfigurable integrated circuits for adjusting cell sorting class...
- Patent number 11,704,918
- Issue date Jul 18, 2023
- Becton, Dickinson and Company
- Paul Barclay Purcell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Prism-coupling systems and methods with improved intensity transiti...
- Patent number 11,448,595
- Issue date Sep 20, 2022
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus, stratum age estimation apparatus, analysis meth...
- Patent number 11,448,634
- Issue date Sep 20, 2022
- NEC Corporation
- Yousuke Taira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated device with external light source for probing detecting...
- Patent number 11,428,635
- Issue date Aug 30, 2022
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Signal acquisition device
- Patent number 11,307,140
- Issue date Apr 19, 2022
- Olympus Corporation
- Kentaro Imoto
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and assay chip for probing, detecting and analyzing...
- Patent number 11,287,382
- Issue date Mar 29, 2022
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- G01 - MEASURING TESTING
Information Patent Grant
Ultra low range sulfite measurement
- Patent number 11,231,368
- Issue date Jan 25, 2022
- Hach Company
- Amit Das
- G01 - MEASURING TESTING
Information Patent Grant
Coupon reader
- Patent number 11,023,773
- Issue date Jun 1, 2021
- Research International, Inc.
- Elric Saaski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Molten metal inclusion testing
- Patent number 10,753,878
- Issue date Aug 25, 2020
- Worcester Polytechnic Institute
- Shaymus W. Hudson
- G01 - MEASURING TESTING
Information Patent Grant
Active-source-pixel, integrated device for rapid analysis of biolog...
- Patent number 10,712,273
- Issue date Jul 14, 2020
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- G01 - MEASURING TESTING
Information Patent Grant
Active-source-pixel, integrated device for rapid analysis of biolog...
- Patent number 10,712,274
- Issue date Jul 14, 2020
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- G01 - MEASURING TESTING
Information Patent Grant
Universal rapid diagnostic test reader with trans-visual sensitivity
- Patent number 10,641,766
- Issue date May 5, 2020
- NOWDiagnostics, Inc.
- Onur Mudanyali
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Universal rapid diagnostic test reader with trans-visual sensitivity
- Patent number 10,571,395
- Issue date Feb 25, 2020
- NOWDiagnostics, Inc.
- Neven Karlovac
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Block-to-block reticle inspection
- Patent number 10,539,512
- Issue date Jan 21, 2020
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Grant
Optical system and assay chip for probing, detecting and analyzing...
- Patent number 10,533,945
- Issue date Jan 14, 2020
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Texture analysis of a coated surface using pivot-normalization
- Patent number 10,481,081
- Issue date Nov 19, 2019
- PPG Industries Ohio, Inc.
- Alison M. Norris
- G01 - MEASURING TESTING
Information Patent Grant
Simulated integrated computational elements and their applications
- Patent number 10,481,087
- Issue date Nov 19, 2019
- Halliburton Energy Services, Inc.
- Li Gao
- G01 - MEASURING TESTING
Information Patent Grant
Coupon reader
- Patent number 10,318,845
- Issue date Jun 11, 2019
- Research International, Inc.
- Elric Saaski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for digital reading of quick tests
- Patent number 10,180,400
- Issue date Jan 15, 2019
- Optricon Entwicklungsgesellschaft Fur Optische Technologien MBH
- Wilko Hein
- G01 - MEASURING TESTING
Information Patent Grant
Ultrasonic probe
- Patent number 10,143,441
- Issue date Dec 4, 2018
- SOCIONEXT INC.
- Masato Yoshioka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Integrated device with external light source for probing detecting...
- Patent number 10,048,208
- Issue date Aug 14, 2018
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SENSING MODULE, SYSTEM AND METHOD FOR OPERATING OPTICAL SEN...
- Publication number 20240219235
- Publication date Jul 4, 2024
- LITE-ON SINGAPORE PTE. LTD.
- LAY-THANT KO
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITTING APPARATUS, LIGHT EMITTING METHOD, LIGHT DETECTION AP...
- Publication number 20240219296
- Publication date Jul 4, 2024
- MEGA CRYSTAL BIOTECHNOLOGY SINGAPORE PTE. LTD
- YI-SHENG TING
- G01 - MEASURING TESTING
Information Patent Application
HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY...
- Publication number 20240175812
- Publication date May 30, 2024
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Application
DATA ACQUISITION CONTROL FOR ADVANCED ANALYTIC INSTRUMENTS HAVING P...
- Publication number 20240068943
- Publication date Feb 29, 2024
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Reconfigurable Integrated Circuits for Adjusting Cell Sorting Class...
- Publication number 20230334883
- Publication date Oct 19, 2023
- Becton, Dickinson and Company
- Paul Barclay Purcell
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR THE IN-LINE MEASUREMENT OF ALKALI METAL-CON...
- Publication number 20230160821
- Publication date May 25, 2023
- Applied Materials, Inc.
- Subramanya P. HERLE
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMITTING APPARATUS, LIGHT EMITTING METHOD, LIGHT DETECTION AP...
- Publication number 20220373453
- Publication date Nov 24, 2022
- MEGA CRYSTAL BIOTECHNOLOGY SINGAPORE PTE. LTD
- YI-SHENG TING
- G01 - MEASURING TESTING
Information Patent Application
SPECTRAL IMAGING SYSTEM AND METHOD FOR LOW SIGNAL DETECTION AND PRO...
- Publication number 20220364992
- Publication date Nov 17, 2022
- STEPHEN STETSON
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED DEVICE WITH EXTERNAL LIGHT SOURCE FOR PROBING DETECTING...
- Publication number 20220364996
- Publication date Nov 17, 2022
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
OPTICAL SYSTEM AND ASSAY CHIP FOR PROBING, DETECTING AND ANALYZING...
- Publication number 20220214279
- Publication date Jul 7, 2022
- Quantum-Si Incorporated
- JONATHAN M. ROTHBERG
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
ANALOG SIGNAL PROCESSING FOR A LIGHTWEIGHT AND COMPACT LASER-BASED...
- Publication number 20220178821
- Publication date Jun 9, 2022
- SeekOps Inc.
- Victor Alexander Miller
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND ASSAY CHIP FOR PROBING, DETECTING AND ANALYZING...
- Publication number 20220170861
- Publication date Jun 2, 2022
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
REPAIR WELDING INSPECTION DEVICE AND REPAIR WELDING INSPECTION METHOD
- Publication number 20220120697
- Publication date Apr 21, 2022
- Panasonic Intellectual Property Management Co., Ltd.
- Kazuki HANADA
- G01 - MEASURING TESTING
Information Patent Application
PRISM-COUPLING SYSTEMS AND METHODS WITH IMPROVED INTENSITY TRANSITI...
- Publication number 20210131959
- Publication date May 6, 2021
- Corning Incorporated
- Ryan Claude Andrews
- G01 - MEASURING TESTING
Information Patent Application
RECONFIGURABLE INTEGRATED CIRCUITS FOR ADJUSTING CELL SORTING CLASS...
- Publication number 20210012087
- Publication date Jan 14, 2021
- Becton, Dickinson and Company
- Paul Barclay Purcell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ULTRA LOW RANGE SULFITE MEASUREMENT
- Publication number 20200378893
- Publication date Dec 3, 2020
- Hach Company
- Amit Das
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE-SOURCE-PIXEL, INTEGRATED DEVICE FOR RAPID ANALYSIS OF BIOLOG...
- Publication number 20200371034
- Publication date Nov 26, 2020
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ANALYSIS APPARATUS, STRATUM AGE ESTIMATION APPARATUS, ANALYSIS METH...
- Publication number 20200166497
- Publication date May 28, 2020
- NEC Corporation
- Yousuke TAIRA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL ACQUISITION DEVICE
- Publication number 20200116634
- Publication date Apr 16, 2020
- OLYMPUS CORPORATION
- Kentaro IMOTO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEM AND ASSAY CHIP FOR PROBING, DETECTING AND ANALYZING...
- Publication number 20200088643
- Publication date Mar 19, 2020
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
DATA ACQUISITION CONTROL FOR ADVANCED ANALYTIC INSTRUMENTS HAVING P...
- Publication number 20190383737
- Publication date Dec 19, 2019
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- G01 - MEASURING TESTING
Information Patent Application
MOLTEN METAL INCLUSION TESTING
- Publication number 20190128811
- Publication date May 2, 2019
- Worcester Polytechnic Institute
- Shaymus W. Hudson
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE-SOURCE-PIXEL, INTEGRATED DEVICE FOR RAPID ANALYSIS OF BIOLOG...
- Publication number 20180348132
- Publication date Dec 6, 2018
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ACTIVE-SOURCE-PIXEL, INTEGRATED DEVICE FOR RAPID ANALYSIS OF BIOLOG...
- Publication number 20180348133
- Publication date Dec 6, 2018
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
INTEGRATED DEVICE WITH EXTERNAL LIGHT SOURCE FOR PROBING DETECTING...
- Publication number 20180328850
- Publication date Nov 15, 2018
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
OPTICAL SYSTEM AND ASSAY CHIP FOR PROBING, DETECTING AND ANALYZING...
- Publication number 20180088052
- Publication date Mar 29, 2018
- Quantum-Si Incorporated
- Jonathan M. Rothberg
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Block-to-Block Reticle Inspection
- Publication number 20180003647
- Publication date Jan 4, 2018
- KLA-Tencor Corporation
- Abdurrahman Sezginer
- G01 - MEASURING TESTING
Information Patent Application
Open Scattered Light Smoke Detector And Testing Device For An Open...
- Publication number 20160328936
- Publication date Nov 10, 2016
- SIEMENS SCHWEIZ AG
- Martin Fischer
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEM, METHOD, AND COMPUTER PROGRAM PRODUCT EMPLOYING AU...
- Publication number 20160320315
- Publication date Nov 3, 2016
- KLA-Tencor Corporation
- Liequan Lee
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ACQUIRING AND PROJECTING BROADBAND IMAGE CAPABLE OF I...
- Publication number 20160277687
- Publication date Sep 22, 2016
- KOREA PHOTONICS TECHNOLOGY INSTITUTE
- Byeong Il LEE
- G01 - MEASURING TESTING

Digital circuitry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Light emitting apparatus, light emitting method, light detection ap...

Universal rapid diagnostic test reader with trans-visual sensitivity

Optical system and assay chip for probing, detecting and analyzing...

Active-source-pixel, integrated device for rapid analysis of biolog...

Repair welding inspection device and repair welding inspection method

Analog signal processing for a lightweight and compact laser-based...

Reconfigurable integrated circuits for adjusting cell sorting class...

Light emitting apparatus, light emitting method, light detection ap...

Data acquisition control for advanced analytic instruments having p...

Reconfigurable integrated circuits for adjusting cell sorting class...

Prism-coupling systems and methods with improved intensity transiti...

Analysis apparatus, stratum age estimation apparatus, analysis meth...

Integrated device with external light source for probing detecting...

Signal acquisition device

Optical system and assay chip for probing, detecting and analyzing...

Ultra low range sulfite measurement

Coupon reader

Molten metal inclusion testing

Active-source-pixel, integrated device for rapid analysis of biolog...

Active-source-pixel, integrated device for rapid analysis of biolog...

Universal rapid diagnostic test reader with trans-visual sensitivity

Universal rapid diagnostic test reader with trans-visual sensitivity

Block-to-block reticle inspection

Optical system and assay chip for probing, detecting and analyzing...

Texture analysis of a coated surface using pivot-normalization

Simulated integrated computational elements and their applications

Coupon reader

Device for digital reading of quick tests

Ultrasonic probe

Integrated device with external light source for probing detecting...

Patents Applicationslast 30 patents

OPTICAL SENSING MODULE, SYSTEM AND METHOD FOR OPERATING OPTICAL SEN...

LIGHT EMITTING APPARATUS, LIGHT EMITTING METHOD, LIGHT DETECTION AP...

HYBRID SYSTEMS AND METHODS FOR CHARACTERIZING STRESS IN CHEMICALLY...

DATA ACQUISITION CONTROL FOR ADVANCED ANALYTIC INSTRUMENTS HAVING P...

Reconfigurable Integrated Circuits for Adjusting Cell Sorting Class...

SYSTEMS AND METHODS FOR THE IN-LINE MEASUREMENT OF ALKALI METAL-CON...

LIGHT EMITTING APPARATUS, LIGHT EMITTING METHOD, LIGHT DETECTION AP...

SPECTRAL IMAGING SYSTEM AND METHOD FOR LOW SIGNAL DETECTION AND PRO...

INTEGRATED DEVICE WITH EXTERNAL LIGHT SOURCE FOR PROBING DETECTING...

OPTICAL SYSTEM AND ASSAY CHIP FOR PROBING, DETECTING AND ANALYZING...

ANALOG SIGNAL PROCESSING FOR A LIGHTWEIGHT AND COMPACT LASER-BASED...

OPTICAL SYSTEM AND ASSAY CHIP FOR PROBING, DETECTING AND ANALYZING...

REPAIR WELDING INSPECTION DEVICE AND REPAIR WELDING INSPECTION METHOD

PRISM-COUPLING SYSTEMS AND METHODS WITH IMPROVED INTENSITY TRANSITI...

RECONFIGURABLE INTEGRATED CIRCUITS FOR ADJUSTING CELL SORTING CLASS...

ULTRA LOW RANGE SULFITE MEASUREMENT

ACTIVE-SOURCE-PIXEL, INTEGRATED DEVICE FOR RAPID ANALYSIS OF BIOLOG...

ANALYSIS APPARATUS, STRATUM AGE ESTIMATION APPARATUS, ANALYSIS METH...

SIGNAL ACQUISITION DEVICE

OPTICAL SYSTEM AND ASSAY CHIP FOR PROBING, DETECTING AND ANALYZING...

DATA ACQUISITION CONTROL FOR ADVANCED ANALYTIC INSTRUMENTS HAVING P...

MOLTEN METAL INCLUSION TESTING

ACTIVE-SOURCE-PIXEL, INTEGRATED DEVICE FOR RAPID ANALYSIS OF BIOLOG...

ACTIVE-SOURCE-PIXEL, INTEGRATED DEVICE FOR RAPID ANALYSIS OF BIOLOG...

INTEGRATED DEVICE WITH EXTERNAL LIGHT SOURCE FOR PROBING DETECTING...

OPTICAL SYSTEM AND ASSAY CHIP FOR PROBING, DETECTING AND ANALYZING...

Block-to-Block Reticle Inspection

Open Scattered Light Smoke Detector And Testing Device For An Open...

METROLOGY SYSTEM, METHOD, AND COMPUTER PROGRAM PRODUCT EMPLOYING AU...

APPARATUS FOR ACQUIRING AND PROJECTING BROADBAND IMAGE CAPABLE OF I...