Direct photo-ionisation

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H01J49/162

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/162Direct photo-ionisation

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Substantially simultaneous resonance-enhanced multiphoton and laser...
- Patent number 11,923,182
- Issue date Mar 5, 2024
- Helmholtz Zentrum Munchen Deutsches Forschungszentrum fur Gesundheit und Umwe...
- Ralf Zimmermann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable beam size via homogenizer movement
- Patent number 11,747,586
- Issue date Sep 5, 2023
- ELEMENTAL SCIENTIFIC LASERS, LLC
- Jay N. Wilkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization for tandem ion mobility spectrometry
- Patent number 11,525,803
- Issue date Dec 13, 2022
- Hamilton Sundstrand Corporation
- Benjamin D. Gardner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atmospheric pressure ion source interface
- Patent number 11,430,646
- Issue date Aug 30, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Aivaras Venckus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis device for gaseous samples and method for verification of...
- Patent number 10,804,092
- Issue date Oct 13, 2020
- Bundesrepublik Deutschland, vertreten durch den Bundesminister für Wirtschaft...
- Jens Riedel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer with photoionization ion source method and system
- Patent number 10,790,131
- Issue date Sep 29, 2020
- Aviv Amirav
- Aviv Amirav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface layer disruption and ionization utilizing an extreme ultrav...
- Patent number 10,665,446
- Issue date May 26, 2020
- Rapiscan Systems, Inc.
- Udo H. Verkerk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of determining presence of isotopes
- Patent number 10,629,419
- Issue date Apr 21, 2020
- The University of Manchester
- Kieran Flanagan
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer performing mass spectrometry for sample with lase...
- Patent number 10,553,416
- Issue date Feb 4, 2020
- Toshiba Memory Corproation
- Haruko Akutsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus and mass spectrometry method
- Patent number 10,497,554
- Issue date Dec 3, 2019
- TOSHIBA MEMORY CORPORATION
- Jun Asakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for multiplexed sample analysis by photoionizing secondary s...
- Patent number 10,408,814
- Issue date Sep 10, 2019
- The Board of Trustees ofthe Leland Stanford Junior University
- Robert M. Angelo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for separating ions and neutrals and methods of operating t...
- Patent number 10,141,173
- Issue date Nov 27, 2018
- Rapiscan Systems, Inc.
- Jack A. Syage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strong field photoionization ion source for a mass spectrometer
- Patent number 10,068,757
- Issue date Sep 4, 2018
- Thermo Finnigan LLC.
- James M. Hitchcock
- G01 - MEASURING TESTING
Information Patent Grant
Ion source for mass spectrometers
- Patent number 9,831,078
- Issue date Nov 28, 2017
- Agilent Technologies, Inc.
- Adrian Land
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for multiplexed sample analysis by photoionizing secondary s...
- Patent number 9,797,879
- Issue date Oct 24, 2017
- The Board of Trustees of the Leland Stanford Junior University
- Robert M. Angelo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trace gas concentration in ART MS traps
- Patent number 9,714,919
- Issue date Jul 25, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for analysis of sample and apparatus therefor
- Patent number 9,691,594
- Issue date Jun 27, 2017
- Rigaku Corporation
- Tadashi Arii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged droplets generating apparatus including a gas conduit for l...
- Patent number 9,589,782
- Issue date Mar 7, 2017
- Dimitris Papanastasiou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization within ion trap using photoionization and electron ioniz...
- Patent number 9,570,282
- Issue date Feb 14, 2017
- 1ST Detect Corporation
- Abrar Riaz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for separating ions and neutrals and methods of operating t...
- Patent number 9,558,924
- Issue date Jan 31, 2017
- Morpho Detection, LLC
- Jack A. Syage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum ultraviolet photoionization and chemical ionization combined...
- Patent number 9,412,577
- Issue date Aug 9, 2016
- Dalian Institute of Chemical Physics, Chinese Academy of Sciences
- Haiyang Li
- G01 - MEASURING TESTING
Information Patent Grant
Laser ion source
- Patent number 9,251,991
- Issue date Feb 2, 2016
- Kabushiki Kaisha Toshiba
- Akiko Kakutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultrafast laser system for biological mass spectrometry
- Patent number 9,202,678
- Issue date Dec 1, 2015
- Board of Trustees of Michigan State University
- Marcos Dantus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Excitation of reagent molecules withn a rf confined ion guide or io...
- Patent number 9,123,523
- Issue date Sep 1, 2015
- Micromass UK Limited
- Martin Raymond Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma-based photon source, ion source, and related systems and met...
- Patent number 9,029,797
- Issue date May 12, 2015
- Agilent Technologies, Inc.
- Mark Denning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization method, ion producing device and uses of the same in ion...
- Patent number 8,987,681
- Issue date Mar 24, 2015
- EADS Deutschland GmbH
- Johann Goebel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for chemical sampling and method of assembling the same
- Patent number 8,723,111
- Issue date May 13, 2014
- Morpho Detection, LLC
- Jack A. Syage
- G01 - MEASURING TESTING
Information Patent Grant
Ionizing device
- Patent number 8,592,779
- Issue date Nov 26, 2013
- Hamamatsu Photonics K.K.
- Shigeki Matsuura
- G01 - MEASURING TESTING
Information Patent Grant
Windowless ionization device
- Patent number 8,563,924
- Issue date Oct 22, 2013
- Agilent Technologies, Inc.
- James Edward Cooley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device for repetitive chemical analysis of a gas flow
- Patent number 8,431,889
- Issue date Apr 30, 2013
- Helmholtz Zentrum Muenchen Deutsches Forschungszentrum fuer Gesundheit und Um...
- Ralf Zimmermann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIRECT IONIZATION IN IMAGING MASS SPECTROMETRY OPERATION
- Publication number 20210391161
- Publication date Dec 16, 2021
- Fluidigm Canada Inc.
- Alexander Loboda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE BEAM SIZE VIA HOMOGENIZER MOVEMENT
- Publication number 20210255414
- Publication date Aug 19, 2021
- Elemental Scientific Lasers, LLC
- Jay N. Wilkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ATMOSPHERIC PRESSURE ION SOURCE INTERFACE
- Publication number 20210142997
- Publication date May 13, 2021
- Thermo Fisher Scientific (Bremen) GmbH
- Aivaras VENCKUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR MASS SPECTROSCOPIC ANALYSIS OF PARTICLES
- Publication number 20210134574
- Publication date May 6, 2021
- HELMHOLTZ ZENTRUM MÜNCHEN DEUTSCHES FORSCHUNGSZENTRUM FÜR GESUNDHEIT UND UMWE...
- Ralf Zimmermann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer with Photoionization Ion Source Method and System
- Publication number 20190348269
- Publication date Nov 14, 2019
- Aviv Amirav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Analysis Device For Gaseous Samples And Method For Verification of...
- Publication number 20190267225
- Publication date Aug 29, 2019
- Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Für Wirtschaft...
- Jens Riedel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF DETERMINING PRESENCE OF ISOTOPES
- Publication number 20190244797
- Publication date Aug 8, 2019
- The University of Manchester
- Kieran FLANAGAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Surface Layer Disruption and Ionization Utilizing an Extreme Ultrav...
- Publication number 20190228959
- Publication date Jul 25, 2019
- Rapiscan Systems, Inc.
- Udo H. Verkerk
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MULTIPLEXED SAMPLE ANALYSIS BY PHOTOIONIZING SECONDARY S...
- Publication number 20180024111
- Publication date Jan 25, 2018
- The Board of Trustees of the Leland Stanford Junior University
- Robert M. Angelo
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF COMPOUNDS THROUGH DOPANT-ASSISTED PHOTOIONIZATION
- Publication number 20170213715
- Publication date Jul 27, 2017
- Morpho Detection, LLC
- Stephen Davila
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE AERODYNAMIC LENS SYSTEM FOR AERODYNAMIC FOCUSING OF AERO...
- Publication number 20170047215
- Publication date Feb 16, 2017
- NATIONAL SUN YAT-SEN UNIVERSITY
- Chia-Chen Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA-BASED PHOTON SOURCE, ION SOURCE, AND RELATED SYSTEMS AND MET...
- Publication number 20150028222
- Publication date Jan 29, 2015
- AGILENT TECHNOLOGIES, INC.
- Mark Denning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION WITHIN ION TRAP USING PHOTOIONIZATION AND ELECTRON IONIZ...
- Publication number 20140264010
- Publication date Sep 18, 2014
- 1ST DETECT CORPORATION
- Abrar RIAZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM ULTRAVIOLET PHOTOIONIZATION AND CHEMICAL IONIZATION COMBINED...
- Publication number 20130236362
- Publication date Sep 12, 2013
- Haiyang Li
- G01 - MEASURING TESTING
Information Patent Application
LASER ION SOURCE
- Publication number 20130221234
- Publication date Aug 29, 2013
- Kabushiki Kaisha Toshiba
- Akiko KAKUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE FOR MASS SPECTROMETERS
- Publication number 20130193318
- Publication date Aug 1, 2013
- AGILENT TECHNOLOGIES, INC.
- Adrian LAND
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR CHEMICAL SAMPLING AND METHOD OF ASSEMBLING THE SAME
- Publication number 20130082172
- Publication date Apr 4, 2013
- Jack A. Syage
- G01 - MEASURING TESTING
Information Patent Application
WINDOWLESS IONIZATION DEVICE
- Publication number 20130001416
- Publication date Jan 3, 2013
- AGILENT TECHNOLOGIES, INC.
- James Edward COOLEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR REPETITIVE CHEMICAL ANALYSIS OF A GAS FLOW
- Publication number 20120286154
- Publication date Nov 15, 2012
- Ralf Zimmermann
- G01 - MEASURING TESTING
Information Patent Application
UV-LED IONIZATION SOURCE AND PROCESS FOR LOW ENERGY PHOTOEMISSION I...
- Publication number 20120248301
- Publication date Oct 4, 2012
- Battelle Memorial Institute
- Luke C. Short
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization Method, Ion Producing Device and Uses of the Same in Ion...
- Publication number 20120235032
- Publication date Sep 20, 2012
- EADS Deutschland GmbH
- Johann Goebel
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD USING MICROPLASMA ARRAY FOR IONIZING SAMPLES FOR...
- Publication number 20110180699
- Publication date Jul 28, 2011
- AGILENT TECHNOLOGIES, INC.
- James Edward COOLEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCE
- Publication number 20110049352
- Publication date Mar 3, 2011
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR DETECTING AT LEAST ONE TARGET SUBSTANCE
- Publication number 20110049354
- Publication date Mar 3, 2011
- Matthias Englmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRAFAST LASER SYSTEM FOR BIOLOGICAL MASS SPECTROMETRY
- Publication number 20100123075
- Publication date May 20, 2010
- Board of Trustees of Michigan State University
- Marcos Dantus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE ENERGY PHOTOIONIZATION DEVICE AND METHOD FOR MASS SPECTROM...
- Publication number 20100032559
- Publication date Feb 11, 2010
- Agilent Technologies, Inc.
- Viorica Lopez-Avila
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pulsed ultraviolet ion source
- Publication number 20090272896
- Publication date Nov 5, 2009
- Vladimir V. Belyakov
- G01 - MEASURING TESTING
Information Patent Application
LASER AND ENVIRONMENTAL MONITORING METHOD
- Publication number 20090256071
- Publication date Oct 15, 2009
- Board of Trustees operating Michigan State University
- Marcos Dantus
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR THE MASS SPECTROMETRIC DETECTION OF COMPOUNDS
- Publication number 20090218482
- Publication date Sep 3, 2009
- GSF-Forschungszentrum fuer Umwelt und Gesundheit, GmbH
- Fabian Muehlberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DESORBING AND IONIZING CHEMICAL COMPOUNDS FRO...
- Publication number 20090159790
- Publication date Jun 25, 2009
- LICENTIA OY
- Risto Kostiainen
- H01 - BASIC ELECTRIC ELEMENTS

Direct photo-ionisation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Substantially simultaneous resonance-enhanced multiphoton and laser...

Variable beam size via homogenizer movement

Ionization for tandem ion mobility spectrometry

Atmospheric pressure ion source interface

Analysis device for gaseous samples and method for verification of...

Mass spectrometer with photoionization ion source method and system

Surface layer disruption and ionization utilizing an extreme ultrav...

Method of determining presence of isotopes

Mass spectrometer performing mass spectrometry for sample with lase...

Mass spectrometry apparatus and mass spectrometry method

Method for multiplexed sample analysis by photoionizing secondary s...

Systems for separating ions and neutrals and methods of operating t...

Strong field photoionization ion source for a mass spectrometer

Ion source for mass spectrometers

Method for multiplexed sample analysis by photoionizing secondary s...

Trace gas concentration in ART MS traps

Method for analysis of sample and apparatus therefor

Charged droplets generating apparatus including a gas conduit for l...

Ionization within ion trap using photoionization and electron ioniz...

Systems for separating ions and neutrals and methods of operating t...

Vacuum ultraviolet photoionization and chemical ionization combined...

Laser ion source

Ultrafast laser system for biological mass spectrometry

Excitation of reagent molecules withn a rf confined ion guide or io...

Plasma-based photon source, ion source, and related systems and met...

Ionization method, ion producing device and uses of the same in ion...

Apparatus for chemical sampling and method of assembling the same

Ionizing device

Windowless ionization device

Method and device for repetitive chemical analysis of a gas flow

Patents Applicationslast 30 patents

DIRECT IONIZATION IN IMAGING MASS SPECTROMETRY OPERATION

VARIABLE BEAM SIZE VIA HOMOGENIZER MOVEMENT

ATMOSPHERIC PRESSURE ION SOURCE INTERFACE

DEVICE AND METHOD FOR MASS SPECTROSCOPIC ANALYSIS OF PARTICLES

Mass Spectrometer with Photoionization Ion Source Method and System

Analysis Device For Gaseous Samples And Method For Verification of...

METHOD OF DETERMINING PRESENCE OF ISOTOPES

Surface Layer Disruption and Ionization Utilizing an Extreme Ultrav...

METHOD FOR MULTIPLEXED SAMPLE ANALYSIS BY PHOTOIONIZING SECONDARY S...

DETECTION OF COMPOUNDS THROUGH DOPANT-ASSISTED PHOTOIONIZATION

ADJUSTABLE AERODYNAMIC LENS SYSTEM FOR AERODYNAMIC FOCUSING OF AERO...

PLASMA-BASED PHOTON SOURCE, ION SOURCE, AND RELATED SYSTEMS AND MET...

IONIZATION WITHIN ION TRAP USING PHOTOIONIZATION AND ELECTRON IONIZ...

VACUUM ULTRAVIOLET PHOTOIONIZATION AND CHEMICAL IONIZATION COMBINED...

LASER ION SOURCE

ION SOURCE FOR MASS SPECTROMETERS

APPARATUS FOR CHEMICAL SAMPLING AND METHOD OF ASSEMBLING THE SAME

WINDOWLESS IONIZATION DEVICE

METHOD AND DEVICE FOR REPETITIVE CHEMICAL ANALYSIS OF A GAS FLOW

UV-LED IONIZATION SOURCE AND PROCESS FOR LOW ENERGY PHOTOEMISSION I...

Ionization Method, Ion Producing Device and Uses of the Same in Ion...

DEVICE AND METHOD USING MICROPLASMA ARRAY FOR IONIZING SAMPLES FOR...

ION SOURCE

METHOD AND DEVICE FOR DETECTING AT LEAST ONE TARGET SUBSTANCE

ULTRAFAST LASER SYSTEM FOR BIOLOGICAL MASS SPECTROMETRY

VARIABLE ENERGY PHOTOIONIZATION DEVICE AND METHOD FOR MASS SPECTROM...

Pulsed ultraviolet ion source

LASER AND ENVIRONMENTAL MONITORING METHOD

METHOD AND DEVICE FOR THE MASS SPECTROMETRIC DETECTION OF COMPOUNDS

METHOD AND SYSTEM FOR DESORBING AND IONIZING CHEMICAL COMPOUNDS FRO...