Displaying image using synthesised colours

Industry

CPC
H01J2237/225

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/225Displaying image using synthesised colours

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,598,733
- Issue date Mar 7, 2023
- FEI Company
- Tomas Tûma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample using a charged particle microscope, w...
- Patent number 11,417,497
- Issue date Aug 16, 2022
- FEI Company
- Remco Schoenmakers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of examining a sample using a charged particle microscope
- Patent number 11,327,032
- Issue date May 10, 2022
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus
- Patent number 11,133,149
- Issue date Sep 28, 2021
- Hitachi High-Tech Science Corporation
- Toshihiro Mochizuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and data analysis system for semi-automated particle analysi...
- Patent number 10,955,368
- Issue date Mar 23, 2021
- Carl Zeiss Microscopy Ltd.
- Champ Gohil
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron microscope and control method
- Patent number 10,741,359
- Issue date Aug 11, 2020
- Jeol Ltd.
- Akira Abe
- G01 - MEASURING TESTING
Information Patent Grant
Sample observation device having a selectable acceleration voltage
- Patent number 10,141,159
- Issue date Nov 27, 2018
- Hitachi High-Technologies Corporation
- Ayumi Doi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D profiling system of semiconductor chip and method for operating...
- Patent number 10,068,324
- Issue date Sep 4, 2018
- Samsung Electronics Co., Ltd.
- Jung Soo Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sub-pixel analysis and display of fine grained mineral samples
- Patent number 9,714,908
- Issue date Jul 25, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-color nanoscale imaging based on nanoparticle cathodoluminesc...
- Patent number 9,541,512
- Issue date Jan 10, 2017
- President and Fellows of Harvard College
- Ronald Walsworth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and scanning transmission electron mic...
- Patent number 8,878,130
- Issue date Nov 4, 2014
- Hitachi High-Technologies Corporation
- Hiromi Inada
- G01 - MEASURING TESTING
Information Patent Grant
Microscope system, method for operating a charged-particle microscope
- Patent number 8,426,812
- Issue date Apr 23, 2013
- Carl Zeiss Microscopy Ltd.
- Stewart Bean
- G02 - OPTICS
Information Patent Grant
Electron beam system and method of operating the same
- Patent number 7,569,819
- Issue date Aug 4, 2009
- Jeol Ltd.
- Norihisa Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning interference electron microscope
- Patent number 7,417,227
- Issue date Aug 26, 2008
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-density recording scanning microscope
- Patent number 6,563,115
- Issue date May 13, 2003
- Sanyu Denshi Co. Ltd.
- Katsuto Goto
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 5,608,218
- Issue date Mar 4, 1997
- Hitachi, Ltd.
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for displaying a sample image
- Patent number 5,393,976
- Issue date Feb 28, 1995
- Kabushiki Kaisha Topcon
- Hirotami Koike
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for image formation
- Patent number 4,560,872
- Issue date Dec 24, 1985
- Commonwealth Scientific and Industrial Research Organization
- Ariel D. Antonovsky
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
3628014
- Patent number 3,628,014
- Issue date Dec 14, 1971
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
- Publication number 20200363349
- Publication date Nov 19, 2020
- FEI Company
- Jan Klusácek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-Color Nanoscale Imaging Based On Nanoparticle Cathodoluminesc...
- Publication number 20140194314
- Publication date Jul 10, 2014
- President and Fellows of Harvard College
- Ronald Walsworth
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND SCANNING TRANSMISSION ELECTRON MIC...
- Publication number 20140138542
- Publication date May 22, 2014
- Hitachi High-Technologies Corporation
- Hiromi Inada
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SUPERIMPOSING AND DISPLAYING ELECTRON MICROSCOPE IMAGE A...
- Publication number 20120326033
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microscope System, Method for Operating a Charged-Particle Microscope
- Publication number 20120104250
- Publication date May 3, 2012
- CARL ZEISS NTS LTD.
- Stewart Bean
- G02 - OPTICS
Information Patent Application
Electron Beam System and Method of Operating the Same
- Publication number 20080087821
- Publication date Apr 17, 2008
- JEOL Ltd.
- Norihisa Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for multiple labeling detection and evaluation...
- Publication number 20060210129
- Publication date Sep 21, 2006
- DEUTSCHES KREBSFORSCHUNGZENTRUM
- Michael Trendelenburg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Scanning interference electron microscope
- Publication number 20060124850
- Publication date Jun 15, 2006
- Hitachi High-Technologies Corporation
- Takao Matsumoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Displaying image using synthesised colours

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of examining a sample using a charged particle microscope

Method of examining a sample using a charged particle microscope, w...

Method of examining a sample using a charged particle microscope

Focused ion beam apparatus

Method and data analysis system for semi-automated particle analysi...

Electron microscope and control method

Sample observation device having a selectable acceleration voltage

3D profiling system of semiconductor chip and method for operating...

Sub-pixel analysis and display of fine grained mineral samples

Multi-color nanoscale imaging based on nanoparticle cathodoluminesc...

Scanning electron microscope and scanning transmission electron mic...

Microscope system, method for operating a charged-particle microscope

Electron beam system and method of operating the same

Scanning interference electron microscope

High-density recording scanning microscope

Scanning electron microscope

Apparatus for displaying a sample image

Method and apparatus for image formation

3628014

Patents Applicationslast 30 patents

METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE

Multi-Color Nanoscale Imaging Based On Nanoparticle Cathodoluminesc...

SCANNING ELECTRON MICROSCOPE AND SCANNING TRANSMISSION ELECTRON MIC...

METHOD FOR SUPERIMPOSING AND DISPLAYING ELECTRON MICROSCOPE IMAGE A...

Microscope System, Method for Operating a Charged-Particle Microscope

Electron Beam System and Method of Operating the Same

Method and apparatus for multiple labeling detection and evaluation...

Scanning interference electron microscope