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Double pass monochromator
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CPC
G01J2003/1819
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/1819
Double pass monochromator
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Patents Grants
last 30 patents
Information
Patent Grant
Double-pass diffraction grating
Patent number
8,203,789
Issue date
Jun 19, 2012
Capella Photonics, Inc.
Massimo Martinelli
G01 - MEASURING TESTING
Information
Patent Grant
Optical channel monitor
Patent number
7,463,828
Issue date
Dec 9, 2008
John Moon
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optical spectrum analyzer
Patent number
7,253,897
Issue date
Aug 7, 2007
Cidra Corporation
John A. Moon
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
High optical rejection optical spectrum analyzer/monochromator
Patent number
6,930,776
Issue date
Aug 16, 2005
EXFO Electro-Optical Engineering Inc.
Gang He
G01 - MEASURING TESTING
Information
Patent Grant
Diffraction grating position sensing and control for a scanning mon...
Patent number
5,359,409
Issue date
Oct 25, 1994
Hewlett-Packard Company
Kenneth R. Wildnauer
G01 - MEASURING TESTING
Information
Patent Grant
Optical spectrum analyzer having double-pass monochromator
Patent number
5,233,405
Issue date
Aug 3, 1993
Hewlett-Packard Company
Kenneth R. Wildnauer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
High optical rejection optical spectrum analyzer/monochromator
Publication number
20050073679
Publication date
Apr 7, 2005
Gang He
G01 - MEASURING TESTING
Information
Patent Application
Optical spectrum analyzer
Publication number
20040246477
Publication date
Dec 9, 2004
John A. Moon
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Optical channel monitor
Publication number
20030007148
Publication date
Jan 9, 2003
John Moon
G01 - MEASURING TESTING