Drilling

Industry

CPC
H01J2237/3118

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/3118Drilling

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of stem-based drilling of ultrathin silicon nitride nanopore...
- Patent number 11,338,247
- Issue date May 24, 2022
- The Trustees of the University of Pennsylvania
- Marija Drndic
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,729,510
- Issue date May 20, 2014
- Gatan Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,653,489
- Issue date Feb 18, 2014
- Gatan, Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation thermal management apparatus and methods
- Patent number 8,610,090
- Issue date Dec 17, 2013
- Gatan Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,592,763
- Issue date Nov 26, 2013
- Gatan Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,445,874
- Issue date May 21, 2013
- Gatan Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation thermal management apparatus and methods
- Patent number 8,384,050
- Issue date Feb 26, 2013
- Gatan, Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam sample preparation apparatus and methods
- Patent number 8,283,642
- Issue date Oct 9, 2012
- Gatan, Inc.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Grant
Method for forming a vertical edge submicron through-hole and a thi...
- Patent number 6,544,897
- Issue date Apr 8, 2003
- Seiko Instruments Inc.
- Takashi Kaito
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Ion Beam Sample Preparation Thermal Management Apparatus and Methods
- Publication number 20140077106
- Publication date Mar 20, 2014
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20130228702
- Publication date Sep 5, 2013
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20130228708
- Publication date Sep 5, 2013
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Thermal Management Apparatus and Methods
- Publication number 20130134331
- Publication date May 30, 2013
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20120085923
- Publication date Apr 12, 2012
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Thermal Management Apparatus and Methods
- Publication number 20120085937
- Publication date Apr 12, 2012
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20120085938
- Publication date Apr 12, 2012
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Ion Beam Sample Preparation Apparatus and Methods
- Publication number 20120085939
- Publication date Apr 12, 2012
- GATAN, INC.
- Steven Thomas Coyle
- G01 - MEASURING TESTING
Information Patent Application
Micro-protruding structure
- Publication number 20080272301
- Publication date Nov 6, 2008
- Masatsugu Shigeno
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Micro-protruding structure
- Publication number 20050212010
- Publication date Sep 29, 2005
- Masatsugu Shigeno
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method for forming a vertical edge submicron through-hole and a thi...
- Publication number 20020081507
- Publication date Jun 27, 2002
- Takashi Kaito
- H01 - BASIC ELECTRIC ELEMENTS

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of stem-based drilling of ultrathin silicon nitride nanopore...

Ion beam sample preparation apparatus and methods

Ion beam sample preparation apparatus and methods

Ion beam sample preparation thermal management apparatus and methods

Ion beam sample preparation apparatus and methods

Ion beam sample preparation apparatus and methods

Ion beam sample preparation thermal management apparatus and methods

Ion beam sample preparation apparatus and methods

Method for forming a vertical edge submicron through-hole and a thi...

Patents Applicationslast 30 patents

Ion Beam Sample Preparation Thermal Management Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Thermal Management Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Thermal Management Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Ion Beam Sample Preparation Apparatus and Methods

Micro-protruding structure

Micro-protruding structure

Method for forming a vertical edge submicron through-hole and a thi...