due to temperature

Industry

CPC
G01B5/0014

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B5/00Measuring arrangements characterised by the use of mechanical means

Current Industry

G01B5/0014due to temperature

Industries

Patents Grantslast 30 patents

Information Patent Grant
Electric discharge machine and sensor unit
- Patent number 12,186,821
- Issue date Jan 7, 2025
- Sodick Co., Ltd.
- Masashi Sakaguchi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Measuring probe with sensing coils and temperature compensation
- Patent number 12,174,013
- Issue date Dec 24, 2024
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Displacement sensor and displacement sensor system
- Patent number 12,140,421
- Issue date Nov 12, 2024
- JAPAN SYSTEM DEVELOPMENT CO., LTD.
- Yoshiichi Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Support element for a precision device, support frame for a precisi...
- Patent number 12,031,813
- Issue date Jul 9, 2024
- Etel SA
- Ivan Garcia-Herreros
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system, optical measurement method, and non-tra...
- Patent number 11,892,281
- Issue date Feb 6, 2024
- Otsuka Electronics Co., Ltd.
- Shiro Kawaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring method and optical measuring device
- Patent number 11,879,725
- Issue date Jan 23, 2024
- Dentsply Sirona Inc.
- Konrad Klein
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measurement device
- Patent number 11,859,969
- Issue date Jan 2, 2024
- Tokyo Seimitsu Co., Ltd.
- Hideki Morii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system with heat measurement
- Patent number 11,835,335
- Issue date Dec 5, 2023
- OY MAPVISION LTD.
- Janne Juslin
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for inspecting processing apparatus
- Patent number 11,817,335
- Issue date Nov 14, 2023
- Tokyo Electron Limited
- Kippei Sugita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position-measuring device
- Patent number 11,796,297
- Issue date Oct 24, 2023
- Dr. Johannes Heidenhain GmbH
- Thilo Schlicksbier
- G01 - MEASURING TESTING
Information Patent Grant
Depth measurement using a pulsed structured light projector
- Patent number 11,774,769
- Issue date Oct 3, 2023
- Meta Platforms Technologies, LLC
- Michael Hall
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe unit correction method
- Patent number 11,761,759
- Issue date Sep 19, 2023
- Mitutoyo Corporation
- Kohju Kasahara
- G01 - MEASURING TESTING
Information Patent Grant
Assembly for position measurement
- Patent number 11,733,019
- Issue date Aug 22, 2023
- DR. JOHANNES HEIDENHAIN GMBH
- Kilian Bauer
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device
- Patent number 11,733,018
- Issue date Aug 22, 2023
- Kuo-Hsuan Huang
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate positioning machine
- Patent number 11,624,603
- Issue date Apr 11, 2023
- Renishaw plc
- Stephen Mark Angood
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Methods and apparatus for compensating for thermal expansion during...
- Patent number 11,491,739
- Issue date Nov 8, 2022
- Thermwood Corporation
- Kenneth J. Susnjara
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Three-dimensional measuring system, and three-dimensional measuring...
- Patent number 11,365,959
- Issue date Jun 21, 2022
- Tokyo Seimitsu Co., Ltd.
- Hitoshi Tamura
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Coordinate positioning machine
- Patent number 11,300,396
- Issue date Apr 12, 2022
- Renishaw plc
- Stephen Mark Angood
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Drilling template
- Patent number 11,246,222
- Issue date Feb 8, 2022
- Airbus Operations S.L.
- Alvaro Jara Rodelgo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Articulating probe head for measuring system
- Patent number 11,204,229
- Issue date Dec 21, 2021
- TESA SA
- Dikran Antreasyan
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for compensating for thermal expansion during...
- Patent number 11,072,162
- Issue date Jul 27, 2021
- Thermwood Corporation
- Kenneth J. Susnjara
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional coordinate measurement apparatus
- Patent number 11,067,382
- Issue date Jul 20, 2021
- Tokyo Seimitsu Co., Ltd.
- Yukio Kanno
- G01 - MEASURING TESTING
Information Patent Grant
Thermal management of an optical scanning device
- Patent number 11,022,434
- Issue date Jun 1, 2021
- Hexagon Metrology, Inc.
- Tom Bauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, method, and storage medium
- Patent number 10,979,694
- Issue date Apr 13, 2021
- Canon Kabushiki Kaisha
- Daisuke Kotake
- G01 - MEASURING TESTING
Information Patent Grant
Machine geometry monitoring
- Patent number 10,962,361
- Issue date Mar 30, 2021
- Hexagon Technology Center GmbH
- Claudio Iseli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Depth measurement using a pulsed structured light projector
- Patent number 10,962,790
- Issue date Mar 30, 2021
- Facebook Technologies, LLC
- Michael Hall
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement system
- Patent number 10,871,364
- Issue date Dec 22, 2020
- Gregory M. Valente
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate positioning machine
- Patent number 10,830,567
- Issue date Nov 10, 2020
- Renishaw plc
- Stephen Mark Angood
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for compensating for thermal expansion during...
- Patent number 10,766,244
- Issue date Sep 8, 2020
- Thermwood Corporation
- Kenneth J. Susnjara
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Mounting tool for linear displacement measuring apparatus
- Patent number 10,746,574
- Issue date Aug 18, 2020
- Mitutoyo Corporation
- Kazushi Kikuchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ULTRASONIC REMOTE CONDITION MONITORING SYSTEM
- Publication number 20240418505
- Publication date Dec 19, 2024
- Evident Scientific, Inc.
- Anthony E. Sayegh
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE THICKNESS MEASURING DEVICE, SUBSTRATE PROCESSING SYSTEM,...
- Publication number 20240369339
- Publication date Nov 7, 2024
- TOKYO ELECTRON LIMITED
- Teruhiko MORIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Reticle Thermal Expansion Calibration Method Capable of Improving S...
- Publication number 20240337613
- Publication date Oct 10, 2024
- United Semiconductor (Xiamen) Co., Ltd.
- MAOHUA REN
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE WITH FIELD GENERATING COIL CONFIGURATION AND TEMPER...
- Publication number 20240219163
- Publication date Jul 4, 2024
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING MACHINE
- Publication number 20240210154
- Publication date Jun 27, 2024
- HEXAGON TECHNOLOGY CENTER GMBH
- Nikolay KHANENYA
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE COMPENSATION FOR MACHINE TOOL
- Publication number 20240125584
- Publication date Apr 18, 2024
- HEXAGON TECHNOLOGY CENTER GMBH
- Claudio ISELI
- G01 - MEASURING TESTING
Information Patent Application
DUAL-PATTERN OPTICAL 3D DIMENSIONING
- Publication number 20230221102
- Publication date Jul 13, 2023
- Honeywell International Inc.
- Tao XIAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Thermal Monitoring in Laminate Structures
- Publication number 20230194361
- Publication date Jun 22, 2023
- IMEC vzw
- Philippe Nivelle
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20230052870
- Publication date Feb 16, 2023
- TOKYO SEIMITSU CO., LTD.
- Hideki MORII
- G01 - MEASURING TESTING
Information Patent Application
Reticle Thermal Expansion Calibration Method Capable of Improving S...
- Publication number 20230030500
- Publication date Feb 2, 2023
- United Semiconductor (Xiamen) Co., Ltd.
- MAOHUA REN
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT SENSOR AND DISPLACEMENT SENSOR SYSTEM
- Publication number 20220397380
- Publication date Dec 15, 2022
- Japan System Development Co., Ltd.
- Yoshiichi YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
PROBE UNIT CORRECTION METHOD
- Publication number 20220390227
- Publication date Dec 8, 2022
- Mitutoyo Corporation
- Kohju KASAHARA
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY DETERMINATION APPARATUS, ABNORMALITY DETERMINATION METH...
- Publication number 20220349694
- Publication date Nov 3, 2022
- MITUTOYO CORPORATION
- Yo TERASHITA
- G01 - MEASURING TESTING
Information Patent Application
A SETTLEMENT MONITORING SYSTEM AND METHOD
- Publication number 20220316873
- Publication date Oct 6, 2022
- Osprey Measurement Systems LTD
- Daniel Scott
- G01 - MEASURING TESTING
Information Patent Application
SUPPORT ELEMENT FOR A PRECISION DEVICE, SUPPORT FRAME FOR A PRECISI...
- Publication number 20220214152
- Publication date Jul 7, 2022
- ETEL S.A.
- Ivan Garcia-Herreros
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE POSITIONING MACHINE
- Publication number 20220178670
- Publication date Jun 9, 2022
- RENISHAW PLC
- Stephen Mark ANGOOD
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHODS AND APPARATUS FOR ESTIMATING MATERIAL SHEET SHAPE
- Publication number 20220163309
- Publication date May 26, 2022
- Corning Incorporated
- John Steele Abbott
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR COMPENSATING FOR THERMAL EXPANSION DURING...
- Publication number 20210331460
- Publication date Oct 28, 2021
- THERMWOOD CORPORATION
- Kenneth J. SUSNJARA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
ASSEMBLY FOR POSITION MEASUREMENT
- Publication number 20210318109
- Publication date Oct 14, 2021
- Dr. Johannes Heidenhain Gmbh
- Kilian Bauer
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL MEASURING SYSTEM, AND THREE-DIMENSIONAL MEASURING...
- Publication number 20210293519
- Publication date Sep 23, 2021
- TOKYO SEIMITSU CO., LTD.
- Hitoshi TAMURA
- G01 - MEASURING TESTING
Information Patent Application
DEPTH MEASUREMENT USING A PULSED STRUCTURED LIGHT PROJECTOR
- Publication number 20210165233
- Publication date Jun 3, 2021
- Facebook Technologies, LLC
- Michael Hall
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COORDINATE POSITIONING MACHINE
- Publication number 20210033376
- Publication date Feb 4, 2021
- RENISHAW PLC
- Stephen Mark ANGOOD
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHODS AND APPARATUS FOR COMPENSATING FOR THERMAL EXPANSION DURING...
- Publication number 20200384756
- Publication date Dec 10, 2020
- THERMWOOD CORPORATION
- Kenneth J. Susnjara
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM WITH HEAT MEASUREMENT
- Publication number 20200318958
- Publication date Oct 8, 2020
- OY MAPVISION LTD
- Janne JUSLIN
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE
- Publication number 20200300597
- Publication date Sep 24, 2020
- Kuo-Hsuan HUANG
- G01 - MEASURING TESTING
Information Patent Application
ARTICULATING PROBE HEAD FOR MEASURING SYSTEM
- Publication number 20200191541
- Publication date Jun 18, 2020
- Tesa SA
- Dikran ANTREASYAN
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL COORDINATE MEASUREMENT APPARATUS
- Publication number 20200124400
- Publication date Apr 23, 2020
- TOKYO SEIMITSU CO., LTD.
- Yukio KANNO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20200072592
- Publication date Mar 5, 2020
- Gregory M. Valente
- G01 - MEASURING TESTING
Information Patent Application
THERMAL MANAGEMENT OF AN OPTICAL SCANNING DEVICE
- Publication number 20200025558
- Publication date Jan 23, 2020
- Hexagon Metrology, Inc.
- Tom Bauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR COMPENSATING FOR THERMAL EXPANSION DURING...
- Publication number 20200009851
- Publication date Jan 9, 2020
- THERMWOOD CORPORATION
- Kenneth J. Susnjara
- G01 - MEASURING TESTING

due to temperature

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electric discharge machine and sensor unit

Measuring probe with sensing coils and temperature compensation

Displacement sensor and displacement sensor system

Support element for a precision device, support frame for a precisi...

Optical measurement system, optical measurement method, and non-tra...

Optical measuring method and optical measuring device

Measurement device

Measurement system with heat measurement

Method and system for inspecting processing apparatus

Position-measuring device

Depth measurement using a pulsed structured light projector

Probe unit correction method

Assembly for position measurement

Measuring device

Coordinate positioning machine

Methods and apparatus for compensating for thermal expansion during...

Three-dimensional measuring system, and three-dimensional measuring...

Coordinate positioning machine

Drilling template

Articulating probe head for measuring system

Methods and apparatus for compensating for thermal expansion during...

Three-dimensional coordinate measurement apparatus

Thermal management of an optical scanning device

Information processing apparatus, method, and storage medium

Machine geometry monitoring

Depth measurement using a pulsed structured light projector

Measurement system

Coordinate positioning machine

Methods and apparatus for compensating for thermal expansion during...

Mounting tool for linear displacement measuring apparatus

Patents Applicationslast 30 patents

ULTRASONIC REMOTE CONDITION MONITORING SYSTEM

SUBSTRATE THICKNESS MEASURING DEVICE, SUBSTRATE PROCESSING SYSTEM,...

Reticle Thermal Expansion Calibration Method Capable of Improving S...

MEASURING PROBE WITH FIELD GENERATING COIL CONFIGURATION AND TEMPER...

COORDINATE MEASURING MACHINE

TEMPERATURE COMPENSATION FOR MACHINE TOOL

DUAL-PATTERN OPTICAL 3D DIMENSIONING

Thermal Monitoring in Laminate Structures

MEASUREMENT DEVICE

Reticle Thermal Expansion Calibration Method Capable of Improving S...

DISPLACEMENT SENSOR AND DISPLACEMENT SENSOR SYSTEM

PROBE UNIT CORRECTION METHOD

ABNORMALITY DETERMINATION APPARATUS, ABNORMALITY DETERMINATION METH...

A SETTLEMENT MONITORING SYSTEM AND METHOD

SUPPORT ELEMENT FOR A PRECISION DEVICE, SUPPORT FRAME FOR A PRECISI...

COORDINATE POSITIONING MACHINE

METHODS AND APPARATUS FOR ESTIMATING MATERIAL SHEET SHAPE

METHODS AND APPARATUS FOR COMPENSATING FOR THERMAL EXPANSION DURING...

ASSEMBLY FOR POSITION MEASUREMENT

THREE-DIMENSIONAL MEASURING SYSTEM, AND THREE-DIMENSIONAL MEASURING...

DEPTH MEASUREMENT USING A PULSED STRUCTURED LIGHT PROJECTOR

COORDINATE POSITIONING MACHINE

METHODS AND APPARATUS FOR COMPENSATING FOR THERMAL EXPANSION DURING...

MEASUREMENT SYSTEM WITH HEAT MEASUREMENT

MEASURING DEVICE

ARTICULATING PROBE HEAD FOR MEASURING SYSTEM

THREE-DIMENSIONAL COORDINATE MEASUREMENT APPARATUS

MEASUREMENT SYSTEM

THERMAL MANAGEMENT OF AN OPTICAL SCANNING DEVICE

METHODS AND APPARATUS FOR COMPENSATING FOR THERMAL EXPANSION DURING...