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G01N2223/651

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/651dust

Industries

Patents Grantslast 30 patents

Information Patent Grant
Analyzing apparatus, analyzing method, and program
- Patent number 11,293,885
- Issue date Apr 5, 2022
- Horiba, Ltd.
- Yusuke Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus and calibration method
- Patent number 9,594,037
- Issue date Mar 14, 2017
- Horiba, Ltd.
- Yusuke Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Thermal wave microscopy using areal infrared detection
- Patent number 4,578,584
- Issue date Mar 25, 1986
- International Business Machines Corporation
- Thomas Baumann
- G01 - MEASURING TESTING