electric circuits, signal processing

Industry

CPC
G01N2223/304

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/304electric circuits, signal processing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
X-ray spectrometer and pulse height prediction program
- Patent number 12,105,035
- Issue date Oct 1, 2024
- Rigaku Corporation
- Tsutomu Tada
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing signal of neutral atom imaging unit
- Patent number 11,982,633
- Issue date May 14, 2024
- Peking University
- Yongfu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Ore component analysis device and method
- Patent number 11,953,455
- Issue date Apr 9, 2024
- SHANDONG UNIVERSITY
- Chen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system and data acquisition method and structure thereof
- Patent number 11,921,058
- Issue date Mar 5, 2024
- Canon Medical Systems Corporation
- James Lawrence Begelman
- G01 - MEASURING TESTING
Information Patent Grant
Source productivity assay integrating pyrolysis data and X-ray diff...
- Patent number 11,885,790
- Issue date Jan 30, 2024
- Saudi Arabian Oil Company
- David Jacobi
- G01 - MEASURING TESTING
Information Patent Grant
System and method for the proscriptive determination of parameters...
- Patent number 11,816,765
- Issue date Nov 14, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing a sample by material basis decomposition
- Patent number 11,808,565
- Issue date Nov 7, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Andrea Brambilla
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for combined simultaneous analyses of mater...
- Patent number 11,796,492
- Issue date Oct 24, 2023
- INEL S.A.S.
- Henry Pilliere
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,782,000
- Issue date Oct 10, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Period-coded containers with a traceable material composition
- Patent number 11,713,268
- Issue date Aug 1, 2023
- Owens-Brockway Glass Container Inc.
- Philippe Floriot
- G01 - MEASURING TESTING
Information Patent Grant
Compton scattering correction methods for pixellated radiation dete...
- Patent number 11,701,065
- Issue date Jul 18, 2023
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,698,353
- Issue date Jul 11, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Portable XRF data screening method for heavy metal contaminated soil
- Patent number 11,698,354
- Issue date Jul 11, 2023
- BEIJING MUNICIPAL RESEARCH INSTITUTE OF ENVIRONMENTAL PROTECTION
- Lina Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Quantum mechanical/X-ray crystallography diagnostic for proteins
- Patent number 11,688,488
- Issue date Jun 27, 2023
- Quantumbio, Inc.
- Lance Michael Westerhoff
- G01 - MEASURING TESTING
Information Patent Grant
Beam alignment systems and method
- Patent number 11,665,806
- Issue date May 30, 2023
- Schlumberger Technology Corporation
- Jani Reijonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substance identification device and method for extracting statistic...
- Patent number 11,619,599
- Issue date Apr 4, 2023
- Tsinghua University
- Zhi Zeng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for calibrating a PET scanner
- Patent number 11,619,755
- Issue date Apr 4, 2023
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu Lyu
- G01 - MEASURING TESTING
Information Patent Grant
Radiation imaging system and radiation imaging apparatus
- Patent number 11,534,129
- Issue date Dec 27, 2022
- Canon Kabushiki Kaisha
- Koichi Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for real time measurement control
- Patent number 11,519,869
- Issue date Dec 6, 2022
- KLA-Tencor Corporation
- Antonio Arion Gellineau
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,513,086
- Issue date Nov 29, 2022
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Radiation image imaging apparatus, electronic device, wireless comm...
- Patent number 11,484,281
- Issue date Nov 1, 2022
- Konica Minolta, Inc.
- Kentaro Hara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
X-ray detector module, medical imaging device and method for operat...
- Patent number 11,452,487
- Issue date Sep 27, 2022
- Siemens Healthcare GmbH
- Michael Hosemann
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and method for high-resolution high contrast x-ray ghost dif...
- Patent number 11,402,342
- Issue date Aug 2, 2022
- Bar Ilan University
- Sharon Shwartz
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for operating a signal filter and radiation detection system
- Patent number 11,397,270
- Issue date Jul 26, 2022
- Ketek GmbH
- Florian Rettenmeier
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase contrast detector
- Patent number 11,389,124
- Issue date Jul 19, 2022
- General Electric Company
- Uwe Wiedmann
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining rotation angles
- Patent number 11,337,667
- Issue date May 24, 2022
- Shanghai United Imaging Healthcare Co., Ltd.
- Jingbo Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiographic image detection device and method for operating the same
- Patent number 11,313,979
- Issue date Apr 26, 2022
- FUJIFILM Corporation
- Syo Shimizukawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Enhanced chemical characterization of solid matrices using x-ray fl...
- Patent number 11,187,692
- Issue date Nov 30, 2021
- Texas Tech University System
- David Weindorf
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 11,156,569
- Issue date Oct 26, 2021
- Rigaku Corporation
- Yasujiro Yamada
- G01 - MEASURING TESTING
Information Patent Grant
System and method for the proscriptive determination of parameters...
- Patent number 11,138,767
- Issue date Oct 5, 2021
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS
- Publication number 20250085239
- Publication date Mar 13, 2025
- Anritsu Corporation
- Michihiko IKEDA
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD
- Publication number 20250067688
- Publication date Feb 27, 2025
- Hitachi, Ltd
- Akinori ASAHARA
- G01 - MEASURING TESTING
Information Patent Application
DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN
- Publication number 20240410841
- Publication date Dec 12, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Vadim KUCHIK
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC IMAGING CALIBRATION METHOD
- Publication number 20240402099
- Publication date Dec 5, 2024
- EMvision Medical Devices Ltd
- Amin ABBOSH
- G01 - MEASURING TESTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20240385127
- Publication date Nov 21, 2024
- Samsung SDI Co.,Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...
- Publication number 20240387295
- Publication date Nov 21, 2024
- SANDISK TECHNOLOGIES, INC.
- Tsuyoshi Sendoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20240319117
- Publication date Sep 26, 2024
- ISHIDA CO., LTD.
- Kota TOMINAGA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Monitoring Output Energy of a High-Energy X...
- Publication number 20240310300
- Publication date Sep 19, 2024
- Rapiscan Holdings, Inc.
- James Ollier
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC IMAGING APPARATUS AND RADIOGRAPHIC IMAGING
- Publication number 20240288386
- Publication date Aug 29, 2024
- Canon Kabushiki Kaisha
- HIROKAZU OHGURI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR COMPUTED TOMOGRAPHY SYSTEM CALIBRATION
- Publication number 20240264096
- Publication date Aug 8, 2024
- Baker Hughes Holdings LLC
- Alexander Suppes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM
- Publication number 20240264098
- Publication date Aug 8, 2024
- Rigaku Corporation
- Tsutomu TADA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...
- Publication number 20240255443
- Publication date Aug 1, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi MATSUBARA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...
- Publication number 20240219323
- Publication date Jul 4, 2024
- SMITHS DETECTION GERMANY GMBH
- Philipp FISCHER
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR APPARATUS FOR A MEDICAL IMAGING DEVICE
- Publication number 20240215940
- Publication date Jul 4, 2024
- Siemens Healthcare GmbH
- Michael HOSEMANN
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD, SURFACE DENSITY DEVICE, DETECTION MEANS, AND STOR...
- Publication number 20240151521
- Publication date May 9, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Qiangjun WANG
- G01 - MEASURING TESTING
Information Patent Application
Methods And Systems For X-Ray Scatterometry Measurements Employing...
- Publication number 20240060914
- Publication date Feb 22, 2024
- KLA Corporation
- Mohsen Mahvash
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR K-EDGE-BASED X-RAY IMAGING HAVING IMPROVED...
- Publication number 20230400422
- Publication date Dec 14, 2023
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
SCREENING METHOD
- Publication number 20230317203
- Publication date Oct 5, 2023
- University of Leeds
- Elton Zeqiraj
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM
- Publication number 20230296539
- Publication date Sep 21, 2023
- Rigaku Corporation
- Masatsugu YOSHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...
- Publication number 20230288355
- Publication date Sep 14, 2023
- COZAI LTD
- Hagai COHEN
- G01 - MEASURING TESTING
Information Patent Application
IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS
- Publication number 20230273135
- Publication date Aug 31, 2023
- Chrysos Corporation Limited
- James Tickner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEMS AND METHODS FOR ADAPTIVELY CONTROLLING FILAMENT CURRENT IN...
- Publication number 20230251210
- Publication date Aug 10, 2023
- HOLOGIC, INC.
- Guoyun Ru
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER
- Publication number 20230243988
- Publication date Aug 3, 2023
- Shanghai United Imaging Healthcare Co., Ltd.
- Xinyu LYU
- G01 - MEASURING TESTING
Information Patent Application
SOURCE PRODUCTIVITY ASSAY INTEGRATING PYROLYSIS DATA AND X-RAY DIFF...
- Publication number 20230184737
- Publication date Jun 15, 2023
- Saudi Arabian Oil Company
- David Jacobi
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG
- Publication number 20230152248
- Publication date May 18, 2023
- Rigaku Corporation
- Takuya KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM AND DATA ACQUISITION METHOD AND STRUCTURE THEREOF
- Publication number 20230111828
- Publication date Apr 13, 2023
- CANON MEDICAL SYSTEMS CORPORATION
- James Lawrence BEGELMAN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RADIOGRAPHIC IMAGING APPARATUS AND RADIATION DETECTOR
- Publication number 20230076183
- Publication date Mar 9, 2023
- FUJIFILM Healthcare Corporation
- Masafumi Onouchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR CLASSIFICATION OF SAMPLES
- Publication number 20220317069
- Publication date Oct 6, 2022
- Security Matters Ltd.
- Yair GROF
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND D...
- Publication number 20220299455
- Publication date Sep 22, 2022
- NCS TESTING TECHNOLOGY CO., LTD
- DONGLING LI
- G01 - MEASURING TESTING

electric circuits, signal processing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

X-ray spectrometer and pulse height prediction program

Method for analyzing signal of neutral atom imaging unit

Ore component analysis device and method

Imaging system and data acquisition method and structure thereof

Source productivity assay integrating pyrolysis data and X-ray diff...

System and method for the proscriptive determination of parameters...

Characterizing a sample by material basis decomposition

Apparatuses and methods for combined simultaneous analyses of mater...

Quantitative analysis method, quantitative analysis program, and X-...

Period-coded containers with a traceable material composition

Compton scattering correction methods for pixellated radiation dete...

Quantitative analysis method, quantitative analysis program, and X-...

Portable XRF data screening method for heavy metal contaminated soil

Quantum mechanical/X-ray crystallography diagnostic for proteins

Beam alignment systems and method

Substance identification device and method for extracting statistic...

System and method for calibrating a PET scanner

Radiation imaging system and radiation imaging apparatus

Methods and systems for real time measurement control

X-ray fluorescence spectrometer

Radiation image imaging apparatus, electronic device, wireless comm...

X-ray detector module, medical imaging device and method for operat...

System and method for high-resolution high contrast x-ray ghost dif...

Method for operating a signal filter and radiation detection system

X-ray phase contrast detector

Systems and methods for determining rotation angles

Radiographic image detection device and method for operating the same

Enhanced chemical characterization of solid matrices using x-ray fl...

X-ray fluorescence spectrometer

System and method for the proscriptive determination of parameters...

Patents Applicationslast 30 patents

MASS ESTIMATION METHOD AND X-RAY INSPECTION APPARATUS

PARTICLE BEAM ANALYZER AND PARTICLE BEAM ANALYSIS METHOD

DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN

ELECTROMAGNETIC IMAGING CALIBRATION METHOD

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

MODELLING AND PREDICTION OF VIRTUAL QUALITY CONTROL DATA INCORPORAT...

X-RAY INSPECTION APPARATUS

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

Systems and Methods for Monitoring Output Energy of a High-Energy X...

RADIOGRAPHIC IMAGING APPARATUS AND RADIOGRAPHIC IMAGING

APPARATUS AND METHOD FOR COMPUTED TOMOGRAPHY SYSTEM CALIBRATION

X-RAY SPECTROMETER AND PULSE HEIGHT PREDICTION PROGRAM

X-RAY TRANSMISSION INSPECTION APPARATUS AND X-RAY TRANSMISSION INSP...

X-RAY DETECTOR HAVING INCREASED RESOLUTION, ARRANGEMENT, AND CORRES...

DETECTOR APPARATUS FOR A MEDICAL IMAGING DEVICE

DETECTION METHOD, SURFACE DENSITY DEVICE, DETECTION MEANS, AND STOR...

Methods And Systems For X-Ray Scatterometry Measurements Employing...

SYSTEMS AND METHODS FOR K-EDGE-BASED X-RAY IMAGING HAVING IMPROVED...

SCREENING METHOD

CORRECTION APPARATUS, SYSTEM, METHOD, AND PROGRAM

ELECTRON SPECTROSCOPY BASED TECHNIQUES FOR DETERMINING VARIOUS CHEM...

IMPROVEMENTS IN GAMMA-ACTIVATION ANALYSIS MEASUREMENTS

SYSTEMS AND METHODS FOR ADAPTIVELY CONTROLLING FILAMENT CURRENT IN...

SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER

SOURCE PRODUCTIVITY ASSAY INTEGRATING PYROLYSIS DATA AND X-RAY DIFF...

CORRECTION AMOUNT SPECIFYING APPARATUS, METHOD, PROGRAM, AND JIG

IMAGING SYSTEM AND DATA ACQUISITION METHOD AND STRUCTURE THEREOF

RADIOGRAPHIC IMAGING APPARATUS AND RADIATION DETECTOR

METHOD AND SYSTEM FOR CLASSIFICATION OF SAMPLES

METHOD FOR QUANTITATIVELY CHARACTERIZING DENDRITE SEGREGATION AND D...