Electron- or ion-optical arrangements

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H01J49/06

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/06Electron- or ion-optical arrangements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Outer source assembly and associated components
- Patent number 12,327,718
- Issue date Jun 10, 2025
- Micromass UK Ltd.
- Alastair Booth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for analyzing samples
- Patent number 12,327,717
- Issue date Jun 10, 2025
- CMP Scientific Corp
- Paul Nurmi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron induced dissociation devices and methods
- Patent number 12,315,713
- Issue date May 27, 2025
- DH Technologies Development Pte. Ltd.
- Takashi Baba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tissue analysis by mass spectrometry or ion mobility spectrometry
- Patent number 12,315,714
- Issue date May 27, 2025
- Micromass UK Limited
- Steven Derek Pringle
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Mass spectrometer
- Patent number 12,308,223
- Issue date May 20, 2025
- Shimadzu Corporation
- Kohei Hosoo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage control for Ion mobility separation
- Patent number 12,300,479
- Issue date May 13, 2025
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for analyzing samples
- Patent number 12,293,909
- Issue date May 6, 2025
- CMP Scientific Corp
- Joshua Wiley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Instrument, including an electrostatic linear ion trap, for analyzi...
- Patent number 12,283,475
- Issue date Apr 22, 2025
- The Trustees of Indiana University
- Martin F. Jarrold
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamically concentrating ion packets in the extraction region of a...
- Patent number 12,283,474
- Issue date Apr 22, 2025
- DH Technologies Development Pte. Ltd.
- Nicholas G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems, devices, and methods for contaminant resistant insulative...
- Patent number 12,283,454
- Issue date Apr 22, 2025
- TAE TECHNOLOGIES, INC.
- Christopher J. Killer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 12,278,097
- Issue date Apr 15, 2025
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 12,278,098
- Issue date Apr 15, 2025
- STANDARD BIOTOOLS CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 12,266,518
- Issue date Apr 1, 2025
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analysis apparatus and method
- Patent number 12,261,034
- Issue date Mar 25, 2025
- BRUKER SWITZERLAND AG
- Dimitris Papanastasiou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-power mass interrogation system and assay for determining vitam...
- Patent number 12,261,032
- Issue date Mar 25, 2025
- Leidos, Inc.
- Noah Peter Christian
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-atomic object crystal transport through atomic object confine...
- Patent number 12,243,733
- Issue date Mar 4, 2025
- Quantinuum LLC
- William Cody Burton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switchable ion guide
- Patent number 12,243,734
- Issue date Mar 4, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-atomic object crystal transport through atomic object confine...
- Patent number 12,237,160
- Issue date Feb 25, 2025
- Quantinuum LLC
- William Cody Burton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High pressure mass analyzer
- Patent number 12,230,489
- Issue date Feb 18, 2025
- DH Technologies Development Pte. Ltd.
- James Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas retaining ion guide with axial acceleration
- Patent number 12,205,809
- Issue date Jan 21, 2025
- Urs Steiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide
- Patent number 12,205,810
- Issue date Jan 21, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer with multiple reflection
- Patent number 12,205,814
- Issue date Jan 21, 2025
- Claus Köster
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for identifying a reagent during a process in an analysis sy...
- Patent number 12,203,905
- Issue date Jan 21, 2025
- Roche Diagnostics Operations, Inc.
- Dieter Heindl
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Multi-mode ionization apparatus and uses thereof
- Patent number 12,205,807
- Issue date Jan 21, 2025
- MSTM, LLC
- Milan Pophristic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide geometry improvements
- Patent number 12,198,919
- Issue date Jan 14, 2025
- Thermo Finnigan LLC.
- Mikhail V Ugarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compact time-of-flight mass analyzer
- Patent number 12,191,134
- Issue date Jan 7, 2025
- Spacetek Technology AG
- Jürg Jost
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge detection mass spectrometry
- Patent number 12,191,130
- Issue date Jan 7, 2025
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for detecting charged particles or light
- Patent number 12,183,837
- Issue date Dec 31, 2024
- Hamamatsu Photonics K.K.
- Sayaka Takatsuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-induced dissociation devices and methods
- Patent number 12,176,196
- Issue date Dec 24, 2024
- OHIO STATE INNOVATION FOUNDATION
- Vicki Wysocki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization device and mass spectrometer
- Patent number 12,176,199
- Issue date Dec 24, 2024
- LEYBOLD GMBH
- Yessica Brachthaeuser
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RESIDUAL GAS ANALYSER, PROJECTION EXPOSURE APPARATUS COMPRISING A R...
- Publication number 20250166983
- Publication date May 22, 2025
- Carl Zeiss SMT GMBH
- Achim SCHOELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-MODE IONIZATION APPARATUS AND USES THEREOF
- Publication number 20250157805
- Publication date May 15, 2025
- MSTM, LLC
- Milan Pophristic
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER
- Publication number 20250157804
- Publication date May 15, 2025
- Shimadzu Corporation
- Yusuke SAKAGOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SKIMMERS FOR PLASMA INTERFACES
- Publication number 20250149322
- Publication date May 8, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Joachim Hinrichs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER ION SOURCE
- Publication number 20250140544
- Publication date May 1, 2025
- IONOSCOPE LIMITED LIABILITY COMPANY
- Sergey Stanislavovich POTESHIN
- G01 - MEASURING TESTING
Information Patent Application
Method and Systems for Analyzing Ions Using Differential Mobility S...
- Publication number 20250130199
- Publication date Apr 24, 2025
- DH Technologies Development Pte. Ltd.
- Nicholas G. Bloomfield
- G01 - MEASURING TESTING
Information Patent Application
CHARGE DETECTION MASS SPECTROMETRY
- Publication number 20250125135
- Publication date Apr 17, 2025
- Micromass UK Limited
- Keith Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE-SIZE RANGE AERODYNAMIC FOCUSING LENS
- Publication number 20250112034
- Publication date Apr 3, 2025
- Board of Regents of NSHE, on behalf of DRI
- Xiaoling Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEUTERIUM GAS GENERATOR AND DEVICES FOR CONSERVATION THEREOF
- Publication number 20250104993
- Publication date Mar 27, 2025
- Thermo Finnigan LLC
- Michael A. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE GEOMETRY IMPROVEMENTS
- Publication number 20250104988
- Publication date Mar 27, 2025
- Thermo Finnigan LLC
- Mikhail V. UGAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER FOR GENERATING AND SUMMING MASS SPECTRAL DATA
- Publication number 20250104990
- Publication date Mar 27, 2025
- Micromass UK Limited
- Martin Green
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE
- Publication number 20250095979
- Publication date Mar 20, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER
- Publication number 20250093297
- Publication date Mar 20, 2025
- Bruker Scientific LLC
- Melvin Andrew PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER
- Publication number 20250093298
- Publication date Mar 20, 2025
- Bruker Scientific LLC
- Melvin Andrew PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR TRANSMITTING GASEOUS IONIC SAMPLE MATERIAL...
- Publication number 20250079144
- Publication date Mar 6, 2025
- Bruker Daltonics GmbH & Co. KG
- Benjamin BIRNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER
- Publication number 20250076250
- Publication date Mar 6, 2025
- Bruker Scientific LLC
- Melvin Andrew PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method to Operate a Mass Spectrometer to Counteract Space Charge Ef...
- Publication number 20250069877
- Publication date Feb 27, 2025
- DH Technologies Development Pte. Ltd.
- Mircea GUNA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20250046594
- Publication date Feb 6, 2025
- Shimadzu Corporation
- Takeshi UCHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PRODUCING FILAMENT ARRAY
- Publication number 20250046595
- Publication date Feb 6, 2025
- BC MACHINING TECHNOLOGIES INC.
- Eugene Kokbas
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
COMPLEMENTED ION FUNNEL FOR MASS SPECTROMETER
- Publication number 20250037983
- Publication date Jan 30, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. MAKAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20250029824
- Publication date Jan 23, 2025
- YOUNG IN ACE Co., Ltd.
- Sungwon Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20250029826
- Publication date Jan 23, 2025
- Shimadzu Corporation
- Koichi KIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AURORAL SUBSTORM SIMULATION METHOD AND DYNAMIC MODEL BASED ON NEUTR...
- Publication number 20250029821
- Publication date Jan 23, 2025
- National Space Science Center, Chinese Academy of Sciences
- Li LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer
- Publication number 20250029825
- Publication date Jan 23, 2025
- YOUNG IN ACE Co., Ltd.
- Sungwon Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECONFIGURABLE SEQUENTIALLY-PACKED ION (SPION) TRANSFER DEVICE
- Publication number 20250006481
- Publication date Jan 2, 2025
- Trace Matters Scientific LLC
- Mazdak Taghioskoui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR CONTAMINANT RESISTANT INSULATIVE...
- Publication number 20250006452
- Publication date Jan 2, 2025
- TAE TECHNOLOGIES, INC.
- Christopher J. Killer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER FOR ANALYZING AN ANALYTE SAMPLE
- Publication number 20240429037
- Publication date Dec 26, 2024
- Analytik Jena GmbH+Co. KG
- Iouri Kalinitchenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OUTER SOURCE ASSEMBLY AND ASSOCIATED COMPONENTS
- Publication number 20240420942
- Publication date Dec 19, 2024
- Micromass UK Limited
- Alastair BOOTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD
- Publication number 20240404810
- Publication date Dec 5, 2024
- HGSG LTD
- John HOYES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CALIBRATING A TIME-OF-FLIGHT MASS ANALYSER AND TIME-OF-F...
- Publication number 20240395520
- Publication date Nov 28, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS

Electron- or ion-optical arrangements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Outer source assembly and associated components

Systems and methods for analyzing samples

Electron induced dissociation devices and methods

Tissue analysis by mass spectrometry or ion mobility spectrometry

Mass spectrometer

Voltage control for Ion mobility separation

Systems and methods for analyzing samples

Instrument, including an electrostatic linear ion trap, for analyzi...

Dynamically concentrating ion packets in the extraction region of a...

Systems, devices, and methods for contaminant resistant insulative...

Bench-top time of flight mass spectrometer

High resolution imaging apparatus and method

Ion analyzer

Ion analysis apparatus and method

Low-power mass interrogation system and assay for determining vitam...

Multi-atomic object crystal transport through atomic object confine...

Switchable ion guide

Multi-atomic object crystal transport through atomic object confine...

High pressure mass analyzer

Gas retaining ion guide with axial acceleration

Ion guide

Time-of-flight mass spectrometer with multiple reflection

Method for identifying a reagent during a process in an analysis sy...

Multi-mode ionization apparatus and uses thereof

Ion guide geometry improvements

Compact time-of-flight mass analyzer

Charge detection mass spectrometry

Detector for detecting charged particles or light

Surface-induced dissociation devices and methods

Ionization device and mass spectrometer

Patents Applicationslast 30 patents

RESIDUAL GAS ANALYSER, PROJECTION EXPOSURE APPARATUS COMPRISING A R...

MULTI-MODE IONIZATION APPARATUS AND USES THEREOF

MASS SPECTROMETER

SKIMMERS FOR PLASMA INTERFACES

MASS SPECTROMETER ION SOURCE

Method and Systems for Analyzing Ions Using Differential Mobility S...

CHARGE DETECTION MASS SPECTROMETRY

WIDE-SIZE RANGE AERODYNAMIC FOCUSING LENS

DEUTERIUM GAS GENERATOR AND DEVICES FOR CONSERVATION THEREOF

ION GUIDE GEOMETRY IMPROVEMENTS

MASS SPECTROMETER FOR GENERATING AND SUMMING MASS SPECTRAL DATA

ION GUIDE

LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER

LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER

APPARATUS AND METHOD FOR TRANSMITTING GASEOUS IONIC SAMPLE MATERIAL...

LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER

Method to Operate a Mass Spectrometer to Counteract Space Charge Ef...

Mass Spectrometer

METHOD AND APPARATUS FOR PRODUCING FILAMENT ARRAY

COMPLEMENTED ION FUNNEL FOR MASS SPECTROMETER

MASS SPECTROMETER

Mass Spectrometer

AURORAL SUBSTORM SIMULATION METHOD AND DYNAMIC MODEL BASED ON NEUTR...

Mass Spectrometer

RECONFIGURABLE SEQUENTIALLY-PACKED ION (SPION) TRANSFER DEVICE

SYSTEMS, DEVICES, AND METHODS FOR CONTAMINANT RESISTANT INSULATIVE...

MASS SPECTROMETER FOR ANALYZING AN ANALYTE SAMPLE

OUTER SOURCE ASSEMBLY AND ASSOCIATED COMPONENTS

MASS SPECTROMETER AND METHOD

METHOD FOR CALIBRATING A TIME-OF-FLIGHT MASS ANALYSER AND TIME-OF-F...