Electron Multiplier

Industry

CPC
H01J2237/2444

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2444Electron Multiplier

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for detector equalization during the imaging of objects with...
- Patent number 11,645,740
- Issue date May 9, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 11,276,547
- Issue date Mar 15, 2022
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,861,670
- Issue date Dec 8, 2020
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,522,321
- Issue date Dec 31, 2019
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam-induced etching
- Patent number 10,304,658
- Issue date May 28, 2019
- FEI Company
- Aiden Martin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam processing using process gas and cooled surface
- Patent number 9,799,490
- Issue date Oct 24, 2017
- FEI Company
- Aiden Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device and measurement device
- Patent number 9,779,912
- Issue date Oct 3, 2017
- Hitachi High-Technologies Corporation
- Masami Makuuchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Scanning electron microscope
- Patent number 9,466,458
- Issue date Oct 11, 2016
- B-NANO LTD.
- Dov Shachal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam-induced etching
- Patent number 9,123,506
- Issue date Sep 1, 2015
- FEI Company
- Aiden Martin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Particle detection system
- Patent number 9,076,629
- Issue date Jul 7, 2015
- Hermes Microvision Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,029,766
- Issue date May 12, 2015
- Hitachi High-Technologies Corporation
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detectors
- Patent number 9,000,396
- Issue date Apr 7, 2015
- Carl Zeiss Microscopy, LLC
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector system comprising a conversion electrode
- Patent number 8,952,328
- Issue date Feb 10, 2015
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample inspection methods, systems and components
- Patent number 8,669,525
- Issue date Mar 11, 2014
- Carl Zeiss Microscopy, LLC
- Sybren Sijbrandij
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection system
- Patent number 8,552,377
- Issue date Oct 8, 2013
- Hermes Microvision, Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and electron beam inspection method
- Patent number 8,431,893
- Issue date Apr 30, 2013
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector for electron column and method for detecting electrons for...
- Patent number 8,324,573
- Issue date Dec 4, 2012
- Ho Seob Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope using gas amplification
- Patent number 8,299,432
- Issue date Oct 30, 2012
- FEI Company
- Milos Toth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detection system
- Patent number 8,237,125
- Issue date Aug 7, 2012
- Hermes Microvision, Inc.
- Yi-Xiang Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and electron beam inspection method
- Patent number 8,207,498
- Issue date Jun 26, 2012
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus of an inspection system using an electron beam
- Patent number 8,134,125
- Issue date Mar 13, 2012
- Hitachi, Ltd.
- Yuko Iwabuchi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 8,097,848
- Issue date Jan 17, 2012
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and electron beam inspection method
- Patent number 7,875,849
- Issue date Jan 25, 2011
- Hitachi High-Technologies Corporation
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multistage gas cascade amplifier
- Patent number 7,791,020
- Issue date Sep 7, 2010
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam instrument and method of detecting charged pa...
- Patent number 7,777,195
- Issue date Aug 17, 2010
- Carl Zeiss SMT Limited
- Armin Heinz Hayn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,755,045
- Issue date Jul 13, 2010
- Hitachi High-Technologies Corporation
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-speed high-efficiency solid-state electron detector
- Patent number 7,714,300
- Issue date May 11, 2010
- KLA-Tencor Technologies Corporation
- Mark A. McCord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-resolved measurement apparatus and position-sensitive election...
- Patent number 7,619,199
- Issue date Nov 17, 2009
- Hamamatsu Photonics K.K.
- Nobuyuki Hirai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-potential distribution measuring apparatus, image carrier,...
- Patent number 7,612,570
- Issue date Nov 3, 2009
- Ricoh Company, Limited
- Hiroyuki Suhara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 7,557,346
- Issue date Jul 7, 2009
- Hitachi High-Technologies Corporation
- Junichi Katane
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTOR EQUALIZATION DURING THE IMGAGING OF OBJECTS WIT...
- Publication number 20210192700
- Publication date Jun 24, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20210050178
- Publication date Feb 18, 2021
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20200135425
- Publication date Apr 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20180342368
- Publication date Nov 29, 2018
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20140361167
- Publication date Dec 11, 2014
- Hitachi High-Technologies Corporation
- Hideo Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam-Induced Etching
- Publication number 20140363978
- Publication date Dec 11, 2014
- Aiden Martin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Environmental SEM Gas Injection System
- Publication number 20140034830
- Publication date Feb 6, 2014
- FEI Company
- Marc Castagna
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTION SYSTEM
- Publication number 20130327953
- Publication date Dec 12, 2013
- YI-XIANG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Detector System Comprising a Conversion Electrode
- Publication number 20130056634
- Publication date Mar 7, 2013
- FEI Company
- Albertus Aemillius Seyno Sluijterman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus and Electron Beam Inspection Method
- Publication number 20120261574
- Publication date Oct 18, 2012
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTION SYSTEM
- Publication number 20120145898
- Publication date Jun 14, 2012
- HERMES MICROVISION, INC.
- YI-XIANG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND AN APPARATUS OF AN INSPECTION SYSTEM USING AN ELECTRON...
- Publication number 20120132801
- Publication date May 31, 2012
- Yuko Iwabuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE DETECTORS
- Publication number 20120068068
- Publication date Mar 22, 2012
- CARL ZEISS NTS, LLC.
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTION SYSTEM
- Publication number 20110260069
- Publication date Oct 27, 2011
- Hermes Microvision, Inc.
- YI-XIANG WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE INSPECTION METHODS, SYSTEMS AND COMPONENTS
- Publication number 20110121176
- Publication date May 26, 2011
- CARL ZEISS NTS, LLC.
- Sybren Sijbrandij
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam Apparatus And Electron Beam Inspection Method
- Publication number 20110101223
- Publication date May 5, 2011
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection Apparatus for Detecting Charged Particles, Methods for De...
- Publication number 20110095178
- Publication date Apr 28, 2011
- Anastassios GIANNAKOPULOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Detection Apparatus for Detecting Charged Particles, Methods for De...
- Publication number 20110095177
- Publication date Apr 28, 2011
- Anastassios GIANNAKOPULOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION
- Publication number 20100108881
- Publication date May 6, 2010
- FEI Company
- MILOS TOTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20100090109
- Publication date Apr 15, 2010
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTISTAGE GAS CASCADE AMPLIFIER
- Publication number 20090242758
- Publication date Oct 1, 2009
- FEI Company
- MAREK UNCOVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090230304
- Publication date Sep 17, 2009
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE APPLICATION APPARATUS
- Publication number 20090101817
- Publication date Apr 23, 2009
- Takashi OHSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS OF AN INSPECTION SYSTEM USING AN ELECTRON BEAM
- Publication number 20090057556
- Publication date Mar 5, 2009
- Yuko Iwabuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTOR FOR ELECTRON COLUMN AND METHOD FOR DETECTING ELECTRONS FOR...
- Publication number 20090014650
- Publication date Jan 15, 2009
- Ho Seob Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus and Electron Beam Inspection Method
- Publication number 20080099673
- Publication date May 1, 2008
- Muneyuki Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Instrument and Method of Detecting Charged Pa...
- Publication number 20080078934
- Publication date Apr 3, 2008
- CARL ZEISS SMT LIMITED
- Armin Heinz Hayn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20080073534
- Publication date Mar 27, 2008
- Hitachi High-Technologies Corporation
- Junichi Katane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE-POTENTIAL DISTRIBUTION MEASURING APPARATUS, IMAGE CARRIER,...
- Publication number 20080056746
- Publication date Mar 6, 2008
- Hiroyuki Suhara
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Scanning Electron Microscope
- Publication number 20080035843
- Publication date Feb 14, 2008
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS

Electron Multiplier

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for detector equalization during the imaging of objects with...

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the-lens detection o...

Electron beam-induced etching

Charged particle beam processing using process gas and cooled surface

Inspection device and measurement device

Scanning electron microscope

Electron beam-induced etching

Particle detection system

Scanning electron microscope

Charged particle detectors

Charged particle detector system comprising a conversion electrode

Sample inspection methods, systems and components

Particle detection system

Electron beam apparatus and electron beam inspection method

Detector for electron column and method for detecting electrons for...

Scanning transmission electron microscope using gas amplification

Particle detection system

Electron beam apparatus and electron beam inspection method

Method and apparatus of an inspection system using an electron beam

Scanning electron microscope

Electron beam apparatus and electron beam inspection method

Multistage gas cascade amplifier

Charged particle beam instrument and method of detecting charged pa...

Scanning electron microscope

High-speed high-efficiency solid-state electron detector

Time-resolved measurement apparatus and position-sensitive election...

Surface-potential distribution measuring apparatus, image carrier,...

Scanning electron microscope

Patents Applicationslast 30 patents

METHOD FOR DETECTOR EQUALIZATION DURING THE IMGAGING OF OBJECTS WIT...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

SCANNING ELECTRON MICROSCOPE

Electron Beam-Induced Etching

Environmental SEM Gas Injection System

PARTICLE DETECTION SYSTEM

Charged Particle Detector System Comprising a Conversion Electrode

Electron Beam Apparatus and Electron Beam Inspection Method

PARTICLE DETECTION SYSTEM

METHOD AND AN APPARATUS OF AN INSPECTION SYSTEM USING AN ELECTRON...

CHARGED PARTICLE DETECTORS

PARTICLE DETECTION SYSTEM

SAMPLE INSPECTION METHODS, SYSTEMS AND COMPONENTS

Electron Beam Apparatus And Electron Beam Inspection Method

Detection Apparatus for Detecting Charged Particles, Methods for De...

Detection Apparatus for Detecting Charged Particles, Methods for De...

SCANNING TRANSMISSION ELECTRON MICROSCOPE USING GAS AMPLIFICATION

SCANNING ELECTRON MICROSCOPE

MULTISTAGE GAS CASCADE AMPLIFIER

SCANNING ELECTRON MICROSCOPE

CHARGED PARTICLE APPLICATION APPARATUS

METHOD AND APPARATUS OF AN INSPECTION SYSTEM USING AN ELECTRON BEAM

DETECTOR FOR ELECTRON COLUMN AND METHOD FOR DETECTING ELECTRONS FOR...

Electron Beam Apparatus and Electron Beam Inspection Method

Charged Particle Beam Instrument and Method of Detecting Charged Pa...

Scanning electron microscope

SURFACE-POTENTIAL DISTRIBUTION MEASURING APPARATUS, IMAGE CARRIER,...

Scanning Electron Microscope