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Electron-optical or ion-optical arrangements for the correction of image defects
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H01J37/153
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H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J37/00
Discharge tubes with provision for introducing objects or material to be exposed to the discharge
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H01J37/153
Electron-optical or ion-optical arrangements for the correction of image defects
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system of image-forming multi-electron beams
Patent number
12,165,831
Issue date
Dec 10, 2024
KLA Corporation
Xinrong Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mechanism for adjusting angle of incidence on charged particle beam...
Patent number
12,119,202
Issue date
Oct 15, 2024
HITACHI HIGH-TECH CORPORATION
Shunichi Motomura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method to correct first order astigmatism and first order distortio...
Patent number
12,106,933
Issue date
Oct 1, 2024
FEI Company
Jan Stopka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scanning charged-particle-beam microscopy with energy-dispersive x-...
Patent number
12,094,684
Issue date
Sep 17, 2024
Mochii, Inc.
Christopher Su-Yan Own
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Beam deflection device, aberration corrector, monochromator, and ch...
Patent number
12,062,519
Issue date
Aug 13, 2024
HITACHI HIGH-TECH CORPORATION
Pieter Kruit
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for aligning a multi-beam system
Patent number
12,057,287
Issue date
Aug 6, 2024
Jan Stopka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Charged particle beam device and inspection method
Patent number
12,057,288
Issue date
Aug 6, 2024
HITACHI HIGH-TECH CORPORATION
Momoyo Enyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optically-addressed phase modulator for electron beams
Patent number
12,033,829
Issue date
Jul 9, 2024
The Board of Trustees of the Leland Stanford Junior University
Stewart A. Koppell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple charged-particle beam apparatus with low crosstalk
Patent number
12,033,830
Issue date
Jul 9, 2024
ASML Netherlands B.V.
Weiming Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measurement and correction of optical aberrations in charged partic...
Patent number
11,990,315
Issue date
May 21, 2024
FEI Company
Erik Franken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle assessment tool, inspection method
Patent number
11,984,295
Issue date
May 14, 2024
ASML Netherlands B.V.
Marco Jan-Jaco Wieland
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
11,967,482
Issue date
Apr 23, 2024
HITACHI HIGH-TECH CORPORATION
Wen Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam writing apparatus, charged particle beam writ...
Patent number
11,961,708
Issue date
Apr 16, 2024
NuFlare Technology, Inc.
Haruyuki Nomura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus using charged particle beams
Patent number
11,961,697
Issue date
Apr 16, 2024
ASML Netherlands B.V.
Xuerang Hu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Machine learning on wafer defect review
Patent number
11,935,722
Issue date
Mar 19, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Chung-Pin Chou
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electron beam application apparatus
Patent number
11,915,903
Issue date
Feb 27, 2024
HITACHI HIGH-TECH CORPORATION
Momoyo Enyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Conduction inspection method for multipole aberration corrector, an...
Patent number
11,915,902
Issue date
Feb 27, 2024
NuFlare Technology, Inc.
Atsushi Ando
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Reduction of thermal magnetic field noise in TEM corrector systems
Patent number
11,915,904
Issue date
Feb 27, 2024
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Estimation model generation method and electron microscope
Patent number
11,842,880
Issue date
Dec 12, 2023
Jeol Ltd.
Ryusuke Sagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, device and system for reducing off-axial aberration in elec...
Patent number
11,817,290
Issue date
Nov 14, 2023
FEI Company
Maarten Bischoff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam device
Patent number
11,817,289
Issue date
Nov 14, 2023
HITACHI HIGH-TECH CORPORATION
Tsunenori Nomaguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of determining aberrations of a charged particle beam, and...
Patent number
11,810,753
Issue date
Nov 7, 2023
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Dominik Ehberger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electron optical module for providing an off-axial electron beam wi...
Patent number
11,804,357
Issue date
Oct 31, 2023
FEI Company
Ali Mohammadi-Gheidari
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,798,776
Issue date
Oct 24, 2023
HITACHI HIGH-TECH CORPORATION
Shunichi Motomura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle assessment tool, inspection method
Patent number
11,798,783
Issue date
Oct 24, 2023
ASML Netherlands B.V.
Marco Jan-Jaco Wieland
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,791,124
Issue date
Oct 17, 2023
Hitachi High-Technologies Corporation
Yuta Kawamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron beam observation device, electron beam observation system,...
Patent number
11,791,130
Issue date
Oct 17, 2023
HITACHI HIGH-TECH CORPORATION
Koichi Hamada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Aberration corrector
Patent number
11,791,125
Issue date
Oct 17, 2023
NuFlare Technology, Inc.
Yuichi Maekawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus
Patent number
11,784,023
Issue date
Oct 10, 2023
Hitachi High-Technologies Corporation
Yuta Kawamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multistage-connected multipole, multistage multipole unit, and char...
Patent number
11,769,650
Issue date
Sep 26, 2023
HITACHI HIGH-TECH CORPORATION
Hideto Dohi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE
Publication number
20240420915
Publication date
Dec 19, 2024
HITACHI HIGH-TECH CORPORATION
Mihiro TAKASAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR MANUFACTURING DEVICE AND CONTROL OF THE SAME
Publication number
20240412407
Publication date
Dec 12, 2024
Samsung Electronics Co., Ltd.
Junghee Cho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTIPOLE ELEMENT, IMAGE ERROR CORRECTOR AND PARTICLE BEAM SYSTEM
Publication number
20240371597
Publication date
Nov 7, 2024
CARL ZEISS MICROSCOPY GMBH
Dirk Preikszas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ABERRATION CORRECTOR, A CHARGED PARTICLE BEAM APPARATUS, A METHOD O...
Publication number
20240355576
Publication date
Oct 24, 2024
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Florian Lampersberger
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS
Publication number
20240355577
Publication date
Oct 24, 2024
Eldico Scientific AG
Gunther STEINFELD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Optimizing Image Distortion in a Multi Beam Charged Particle Proces...
Publication number
20240304413
Publication date
Sep 12, 2024
IMS Nanofabrication GmbH
Christoph Spengler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Determining Focal Properties in a Target Beam Field of a...
Publication number
20240304415
Publication date
Sep 12, 2024
IMS Nanofabrication GmbH
Christoph Spengler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI-ELECTRON BEAM IMAGE ACQUISITION APPARATUS AND MULTI-ELECTRON...
Publication number
20240282547
Publication date
Aug 22, 2024
NuFlare Technology, Inc.
Koichi ISHII
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Microscope, Aberration Correction Method, And Imaging Method
Publication number
20240274402
Publication date
Aug 15, 2024
JEOL Ltd.
Motofumi Saitoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FORMING A MULTIPOLE DEVICE, METHOD OF INFLUENCING AN ELEC...
Publication number
20240274396
Publication date
Aug 15, 2024
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
John Breuer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF GLOBAL AND LOCAL OPTIMIZATION OF IMAGING RESOLUTION IN A...
Publication number
20240274398
Publication date
Aug 15, 2024
Carl Zeiss MultiSEM GmbH
Christof Riedesel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND COMPUTER PROGRAM PRO...
Publication number
20240258065
Publication date
Aug 1, 2024
CARL ZEISS MICROSCOPY GMBH
Dirk Preikszas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD
Publication number
20240249912
Publication date
Jul 25, 2024
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Microscope
Publication number
20240242923
Publication date
Jul 18, 2024
Hitachi High-Tech Corporation
Michiko SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FOCUSED ION BEAM SYSTEM
Publication number
20240242924
Publication date
Jul 18, 2024
V TECHNOLOGY CO., LTD.
Michinobu MIZUMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI CHARGED PARTICLE BEAM WRITING APPARATUS
Publication number
20240242920
Publication date
Jul 18, 2024
NuFlare Technology, Inc.
Hirofumi MORITA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MULTI CHARGED PARTICLE BEAM WRITING APPARATUS
Publication number
20240242922
Publication date
Jul 18, 2024
NuFlare Technology, Inc.
Hirofumi MORITA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Processor System, Correction Method, and Correction Program
Publication number
20240222064
Publication date
Jul 4, 2024
HITACHI HIGH-TECH CORPORATION
Mayuka OSAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM COLUMN, CHARGED PARTICLE BEAM CHROMATIC ABERR...
Publication number
20240222063
Publication date
Jul 4, 2024
ICT Integrated Circuit Testing Gesellschaft für Halbleiterpüftechnik mbH
John Breuer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR REPAIRING A DEFECT OF A SAMPLE USING A FOC...
Publication number
20240186109
Publication date
Jun 6, 2024
Carl Zeiss SMT GMBH
Nicole Auth
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Transmission Electron Microscope
Publication number
20240186103
Publication date
Jun 6, 2024
Hitachi High-Tech Corporation
Akinari HANAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON BEAM MODULATION DEVICE AND ELECTRON BEAM MODULATION METHOD
Publication number
20240177961
Publication date
May 30, 2024
Tohoku University
Yuuki UESUGI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM SYSTEM, CORRECTOR FOR ABERRATION CORRECTION O...
Publication number
20240170249
Publication date
May 23, 2024
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Pieter Kruit
G01 - MEASURING TESTING
Information
Patent Application
MULTI-BEAM GENERATING UNIT WITH INCREASED FOCUSING POWER
Publication number
20240170252
Publication date
May 23, 2024
Carl Zeiss MultiSEM GmbH
Yanko Sarov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron Microscope, Multipole Element for Use Therein, and Control...
Publication number
20240145210
Publication date
May 2, 2024
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Adjusting Charged Particle Optical System and Charged Par...
Publication number
20240145211
Publication date
May 2, 2024
JEOL Ltd.
Shigeyuki Morishita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON BEAM LITHOGRAPHY APPARATUS, ELECTRON BEAM LITHOGRAPHY METH...
Publication number
20240145212
Publication date
May 2, 2024
NIPPON CONTROL SYSTEM CORPORATION
Masakazu HAMAJI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DISTORTION REDUCTION IN A MULTI-BEAM IMAGING SYSTEM
Publication number
20240112884
Publication date
Apr 4, 2024
KLA Corporation
Michael I. Cook
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF COMPENSATING FOR AN EFFECT OF ELECTRODE DISTORTION, ASSES...
Publication number
20240105416
Publication date
Mar 28, 2024
ASML NETHERLANDS B.V.
Marco Jan-Jaco WIELAND
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM OF IMAGE-FORMING MULTI-ELECTRON BEAMS
Publication number
20240096586
Publication date
Mar 21, 2024
KLA Corporation
Xinrong JIANG
H01 - BASIC ELECTRIC ELEMENTS