Electron or ion diffraction tubes

Industry

CPC
H01J37/295

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge

Current Industry

H01J37/295Electron or ion diffraction tubes

Industries

Patents Grantslast 30 patents

Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 12,165,839
- Issue date Dec 10, 2024
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal defect observation method for compound semiconductor
- Patent number 12,038,396
- Issue date Jul 16, 2024
- Mitsubishi Electric Corporation
- Hajime Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating a diffraction image
- Patent number 12,009,176
- Issue date Jun 11, 2024
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 11,749,498
- Issue date Sep 5, 2023
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for generating a diffraction image
- Patent number 11,694,874
- Issue date Jul 4, 2023
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling transmission electron microscope and transmis...
- Patent number 11,251,016
- Issue date Feb 15, 2022
- Jeol Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron gun and electron beam application device
- Patent number 11,227,740
- Issue date Jan 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Soichiro Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for preparation and delivery of biological sample...
- Patent number 11,217,425
- Issue date Jan 4, 2022
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Packaging of semiconductor X-ray detectors
- Patent number 11,199,634
- Issue date Dec 14, 2021
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System for electron diffraction analysis
- Patent number 11,195,692
- Issue date Dec 7, 2021
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring electron backscatter diffraction...
- Patent number 11,114,275
- Issue date Sep 7, 2021
- FEI Company
- Pavel Stejskal
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for zone axis alignment
- Patent number 11,024,480
- Issue date Jun 1, 2021
- FEI Company
- Zhenxin Zhong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Holography reconstruction method and program
- Patent number 11,024,482
- Issue date Jun 1, 2021
- Riken
- Ken Harada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interferometric electron microscope
- Patent number 11,011,344
- Issue date May 18, 2021
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam device, observation method, and diffraction grating
- Patent number 10,948,426
- Issue date Mar 16, 2021
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Method of acquiring holograms by off-axis electron holography in pr...
- Patent number 10,884,379
- Issue date Jan 5, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Victor Boureau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and specimen tilt angle adjustment method
- Patent number 10,867,771
- Issue date Dec 15, 2020
- Jeol Ltd.
- Shuji Kawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction imaging system for determining molecular struc...
- Patent number 10,784,078
- Issue date Sep 22, 2020
- Roger D. Durst
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for enhancing SE detection in mirror-based lig...
- Patent number 10,692,694
- Issue date Jun 23, 2020
- FEI Company
- Galen Gledhill
- G02 - OPTICS
Information Patent Grant
Image capture assembly and method for electron back scatter diffrac...
- Patent number 10,692,689
- Issue date Jun 23, 2020
- VG Systems Limited
- Zoran Pesic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Packaging of semiconductor X-ray detectors
- Patent number 10,677,940
- Issue date Jun 9, 2020
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing electron diffraction pattern analysis upon a s...
- Patent number 10,663,414
- Issue date May 26, 2020
- Oxford Instruments Nanotechnology Tools Limited
- Frank Willi Bauer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase contrast transmission electron microscope device
- Patent number 10,658,155
- Issue date May 19, 2020
- Inter-University Research Institute Corporation National Institutes of Natura...
- Yukinori Nagatani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device for moving an aperture having pluralit...
- Patent number 10,636,621
- Issue date Apr 28, 2020
- Hitachi High-Technologies Corporation
- Akinari Hanawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning transmission electron microscope
- Patent number 10,636,622
- Issue date Apr 28, 2020
- Tescan Orsay Holding, A.S.
- Petras Stanislav
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope for magnetic field measurement and magnetic fie...
- Patent number 10,629,410
- Issue date Apr 21, 2020
- Hitachi, Ltd.
- Toshiaki Tanigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,629,407
- Issue date Apr 21, 2020
- Jeol Ltd.
- Tomohisa Fukuda
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining the deflection of an electron beam resulting...
- Patent number 10,593,511
- Issue date Mar 17, 2020
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Benedikt Haas
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and imaging method
- Patent number 10,535,497
- Issue date Jan 14, 2020
- Hitachi High-Technologies Corporation
- Hirokazu Tamaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Fully Integrated Microcrystal Electron Diffra...
- Publication number 20240387141
- Publication date Nov 21, 2024
- The Regents of the University of California
- Tamir Gonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS
- Publication number 20240355577
- Publication date Oct 24, 2024
- Eldico Scientific AG
- Gunther STEINFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES AND SYSTEMS FOR SPATIAL SUBTRACTION OF ELECTRON BACKSCATTER...
- Publication number 20240186105
- Publication date Jun 6, 2024
- Katholieke Universiteit Leuven
- Etienne Brodu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope
- Publication number 20240186103
- Publication date Jun 6, 2024
- Hitachi High-Tech Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...
- Publication number 20240128050
- Publication date Apr 18, 2024
- FEI Company
- Yuchen DENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20240021407
- Publication date Jan 18, 2024
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS
- Publication number 20230395350
- Publication date Dec 7, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Patrick Trimby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION
- Publication number 20230314348
- Publication date Oct 5, 2023
- UNIVERSITY OF HOUSTON SYSTEM
- Byron Freelon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE
- Publication number 20230298853
- Publication date Sep 21, 2023
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR ENERGY SELECTIVE DIRECT ELECTRON IMAGING
- Publication number 20230145436
- Publication date May 11, 2023
- DIRECT ELECTRON, LP
- Benjamin BAMMES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Gun, Charged Particle Beam System, and Lock Nut
- Publication number 20230126658
- Publication date Apr 27, 2023
- Hitachi High-Tech Corporation
- Teruaki HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE
- Publication number 20230020957
- Publication date Jan 19, 2023
- FEI Company
- Bart BUIJSSE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR
- Publication number 20220268715
- Publication date Aug 25, 2022
- Mitsubishi Electric Corporation
- Hajime SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20220115205
- Publication date Apr 14, 2022
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...
- Publication number 20210005420
- Publication date Jan 7, 2021
- FEI Company
- Pavel Stejskal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...
- Publication number 20200411282
- Publication date Dec 31, 2020
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Controlling Transmission Electron Microscope and Transmis...
- Publication number 20200312612
- Publication date Oct 1, 2020
- JEOL Ltd.
- Yuji Kohno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED SYSTEM FOR ELECTRON DIFFRACTION ANALYSIS
- Publication number 20200273663
- Publication date Aug 27, 2020
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGING OF SEMICONDUCTOR X-RAY DETECTORS
- Publication number 20200264321
- Publication date Aug 20, 2020
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE
- Publication number 20200266020
- Publication date Aug 20, 2020
- Hitachi High-Technologies Corporation
- Soichiro MATSUNAGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLOGRAPHY RECONSTRUCTION METHOD AND PROGRAM
- Publication number 20200105498
- Publication date Apr 2, 2020
- Riken
- Ken HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...
- Publication number 20190295817
- Publication date Sep 26, 2019
- Hitachi, Ltd
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MIRROR-BASED LIGHT IMAGING CHARGED PARTICLE MICROSCOPES
- Publication number 20190198289
- Publication date Jun 27, 2019
- FEI Company
- Galen Gledhill
- G02 - OPTICS
Information Patent Application
Charged Particle Beam Device
- Publication number 20190148106
- Publication date May 16, 2019
- JEOL Ltd.
- Tomohisa Fukuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND IMAGING METHOD
- Publication number 20190131107
- Publication date May 2, 2019
- Hitachi High-Technologies Corporation
- Hirokazu TAMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE CONTRAST TRANSMISSION ELECTRON MICROSCOPE DEVICE
- Publication number 20190122855
- Publication date Apr 25, 2019
- INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION NATIONAL INSTITUTES OF NATURA...
- Yukinori NAGATANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Specimen Tilt Angle Adjustment Method
- Publication number 20190115187
- Publication date Apr 18, 2019
- JEOL Ltd.
- Shuji Kawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PACKAGING OF SEMICONDUCTOR X-RAY DETECTORS
- Publication number 20190064371
- Publication date Feb 28, 2019
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan CAO
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device and Sample Observation Method
- Publication number 20180076004
- Publication date Mar 15, 2018
- Hitachi High-Technologies Corporation
- Akinari HANAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOW ENERGY ELECTRON MICROSCOPY
- Publication number 20170358422
- Publication date Dec 14, 2017
- TSINGHUA UNIVERSITY
- PENG LIU
- H01 - BASIC ELECTRIC ELEMENTS

Electron or ion diffraction tubes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Transmission electron microscope and inspection method using transm...

System and method for preparation and delivery of biological sample...

Crystal defect observation method for compound semiconductor

Method and system for generating a diffraction image

System and method for preparation and delivery of biological sample...

Method and system for generating a diffraction image

Method of controlling transmission electron microscope and transmis...

Electron gun and electron beam application device

System and method for preparation and delivery of biological sample...

Packaging of semiconductor X-ray detectors

System for electron diffraction analysis

Methods and systems for acquiring electron backscatter diffraction...

Method and system for zone axis alignment

Holography reconstruction method and program

Interferometric electron microscope

Particle beam device, observation method, and diffraction grating

Method of acquiring holograms by off-axis electron holography in pr...

Electron microscope and specimen tilt angle adjustment method

Electron diffraction imaging system for determining molecular struc...

Method and apparatus for enhancing SE detection in mirror-based lig...

Image capture assembly and method for electron back scatter diffrac...

Packaging of semiconductor X-ray detectors

Method of performing electron diffraction pattern analysis upon a s...

Phase contrast transmission electron microscope device

Charged particle beam device for moving an aperture having pluralit...

Scanning transmission electron microscope

Electron microscope for magnetic field measurement and magnetic fie...

Charged particle beam device

Method of determining the deflection of an electron beam resulting...

Electron microscope and imaging method

Patents Applicationslast 30 patents

System and Method for Fully Integrated Microcrystal Electron Diffra...

CHARGED-PARTICLE BEAM DEVICE FOR DIFFRACTION ANALYSIS

DEVICES AND SYSTEMS FOR SPATIAL SUBTRACTION OF ELECTRON BACKSCATTER...

Transmission Electron Microscope

METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS

SPIN-RESOLVED ULTRAFAST ELECTRON DIFFRACTION

METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE

METHOD AND APPARATUS FOR ENERGY SELECTIVE DIRECT ELECTRON IMAGING

Charged Particle Gun, Charged Particle Beam System, and Lock Nut

METHOD AND SYSTEM FOR GENERATING A DIFFRACTION IMAGE

CRYSTAL DEFECT OBSERVATION METHOD FOR COMPOUND SEMICONDUCTOR

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

METHODS AND SYSTEMS FOR ACQUIRING ELECTRON BACKSCATTER DIFFRACTION...

SYSTEM AND METHOD FOR PREPARATION AND DELIVERY OF BIOLOGICAL SAMPLE...

Method of Controlling Transmission Electron Microscope and Transmis...

IMPROVED SYSTEM FOR ELECTRON DIFFRACTION ANALYSIS

PACKAGING OF SEMICONDUCTOR X-RAY DETECTORS

ELECTRON GUN AND ELECTRON BEAM APPLICATION DEVICE

HOLOGRAPHY RECONSTRUCTION METHOD AND PROGRAM

ELECTRON MICROSCOPE FOR MAGNETIC FIELD MEASUREMENT AND MAGNETIC FIE...

MIRROR-BASED LIGHT IMAGING CHARGED PARTICLE MICROSCOPES

Charged Particle Beam Device

ELECTRON MICROSCOPE AND IMAGING METHOD

PHASE CONTRAST TRANSMISSION ELECTRON MICROSCOPE DEVICE

Electron Microscope and Specimen Tilt Angle Adjustment Method

PACKAGING OF SEMICONDUCTOR X-RAY DETECTORS

Charged Particle Beam Device and Sample Observation Method

LOW ENERGY ELECTRON MICROSCOPY