Membership
Tour
Register
Log in
Electron or ion microscopes
Follow
Industry
CPC
H01J2237/26
This industry / category may be too specific. Please go to a parent level for more data
Parent Industries
H
ELECTRICITY
H01
Electric elements
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
Current Industry
H01J2237/26
Electron or ion microscopes
Industries
Overview
Organizations
People
Information
Impact
Please log in for detailed analytics
Patents Grants
last 30 patents
Information
Patent Grant
System comprising a multi-beam particle microscope and method for o...
Patent number
12,300,462
Issue date
May 13, 2025
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ultra-precision timing clock method
Patent number
12,226,246
Issue date
Feb 18, 2025
Weng-Dah Ken
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Bifocal electron microscope
Patent number
12,216,068
Issue date
Feb 4, 2025
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Observation carrier for microscope
Patent number
12,046,444
Issue date
Jul 23, 2024
FlowVIEW Tek
Po-Yang Peng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optically-addressed phase modulator for electron beams
Patent number
12,033,829
Issue date
Jul 9, 2024
The Board of Trustees of the Leland Stanford Junior University
Stewart A. Koppell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Use of optical polarization states to control a ponderomotive phase...
Patent number
11,990,313
Issue date
May 21, 2024
The Regents of the University of California
Jeremy J. Axelrod
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample preparation system and method for electron microscope observ...
Patent number
11,990,314
Issue date
May 21, 2024
SANYU ELECTRON CO., LTD.
Shinsuke Shibata
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
Patent number
11,942,303
Issue date
Mar 26, 2024
ASML Netherlands B.V.
Yan Ren
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System comprising a multi-beam particle microscope and method for o...
Patent number
11,935,721
Issue date
Mar 19, 2024
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Non-contact angle measuring apparatus
Patent number
11,903,755
Issue date
Feb 20, 2024
Weng-Dah Ken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron diffraction holography
Patent number
11,906,450
Issue date
Feb 20, 2024
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated multi-grid handling apparatus
Patent number
11,881,377
Issue date
Jan 23, 2024
Richard Joseph Pickreign
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Build material handling unit for a powder module for an apparatus f...
Patent number
11,878,463
Issue date
Jan 23, 2024
CONCEPT LASER GMBH
Dominik Eideloth
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Electron microscope sample holder fluid handling with independent p...
Patent number
11,869,744
Issue date
Jan 9, 2024
PROTOCHIPS, INC.
Franklin Stampley Walden
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Grid structure
Patent number
11,830,702
Issue date
Nov 28, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Wei Yang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical objective lens
Patent number
11,808,930
Issue date
Nov 7, 2023
ASML Netherlands B.V.
Jian Zhang
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Automated tomography field ion microscope
Patent number
11,791,129
Issue date
Oct 17, 2023
Centre National de la Recherche Scientifique
François Vurpillot
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multidimensional printer
Patent number
11,738,312
Issue date
Aug 29, 2023
GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
Andrei A. Kolmakov
B22 - CASTING POWDER METALLURGY
Information
Patent Grant
Methods of supporting a graphene sheet disposed on a frame support
Patent number
11,708,637
Issue date
Jul 25, 2023
The Regents of the University of California
Bong-Gyoon Han
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Apparatus for transmission electron microscopy cathodoluminescence
Patent number
11,688,581
Issue date
Jun 27, 2023
Gatan, Inc.
John Andrew Hunt
G01 - MEASURING TESTING
Information
Patent Grant
Navigation for electron microscopy
Patent number
11,688,582
Issue date
Jun 27, 2023
Oxford Instruments Nanotechnology Tools Limited
Anthony Hyde
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for inspecting an EUV mask
Patent number
11,662,323
Issue date
May 30, 2023
ASML Netherlands B.V.
Guochong Weng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope and sample observation method using the same
Patent number
11,551,907
Issue date
Jan 10, 2023
Riken
Ken Harada
G01 - MEASURING TESTING
Information
Patent Grant
Identifying fiducial markers in microscope images
Patent number
11,469,075
Issue date
Oct 11, 2022
Applied Materials, Inc.
Yun-Ching Chang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron diffraction holography
Patent number
11,460,419
Issue date
Oct 4, 2022
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for acquiring 3D diffraction data
Patent number
11,456,149
Issue date
Sep 27, 2022
FEI Company
Bart Buijsse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated multi-grid handling apparatus
Patent number
11,450,507
Issue date
Sep 20, 2022
Richard Joseph Pickreign
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for preparing a sample for transmission electron microscopy
Patent number
11,437,217
Issue date
Sep 6, 2022
Imec VZW
Eric Vancoille
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light guide assembly for an electron microscope
Patent number
11,335,536
Issue date
May 17, 2022
FEI Company
Marek Uncovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nanoparticle compositions
Patent number
11,306,399
Issue date
Apr 19, 2022
JANUARY THERAPEUTICS, INC.
Raj Raheja
C01 - INORGANIC CHEMISTRY
Patents Applications
last 30 patents
Information
Patent Application
NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD
Publication number
20250176925
Publication date
Jun 5, 2025
Weng-Dah Ken
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20250157786
Publication date
May 15, 2025
Hitachi, Ltd
Fumiaki ICHIHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BIFOCAL ELECTRON MICROSCOPE
Publication number
20250155387
Publication date
May 15, 2025
FEI Company
Alexander Henstra
G01 - MEASURING TESTING
Information
Patent Application
BLANKER-ENHANCED MOIRE IMAGING
Publication number
20250104958
Publication date
Mar 27, 2025
FEI Company
Bert Freitag
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEVICE FOR PERFORMING AN INTERFEROMETRIC MEASUREMENT
Publication number
20250069849
Publication date
Feb 27, 2025
Technische Universitat Berlin
Tolga WAGNER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LASER-BASED CONTRAST CONTROL IN TRANSMISSION ELECTRON MICROSCOPY
Publication number
20250062099
Publication date
Feb 20, 2025
Yeda Research and Development Co. Ltd.
Osip SCHWARTZ
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...
Publication number
20240429020
Publication date
Dec 26, 2024
Hitachi, Ltd
Akira SUGAWARA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FLOW FOR HIGH RESOLUTION STEREOSCOPIC MEASUREMENTS
Publication number
20240339289
Publication date
Oct 10, 2024
APPLIED MATERIALS ISRAEL LTD.
Adar Sonn-Segev
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...
Publication number
20240282549
Publication date
Aug 22, 2024
The Regents of the University of California
Jeremy J. Axelrod
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BIFOCAL ELECTRON MICROSCOPE
Publication number
20240272100
Publication date
Aug 15, 2024
FEI Company
Alexander Henstra
G01 - MEASURING TESTING
Information
Patent Application
Automated Multi-Grid Handling Apparatus
Publication number
20240212972
Publication date
Jun 27, 2024
Richard Joseph Pickreign
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR O...
Publication number
20240212977
Publication date
Jun 27, 2024
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
Publication number
20240115222
Publication date
Apr 11, 2024
Weng-Dah Ken
G04 - HOROLOGY
Information
Patent Application
PHASE IMAGE PROCESSING APPARATUS AND PHASE IMAGE PROCESSING METHOD
Publication number
20240021406
Publication date
Jan 18, 2024
Hitachi, Ltd
Yoshio TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION IN AN INSPECTION...
Publication number
20230298851
Publication date
Sep 21, 2023
ASML NETHERLANDS B.V.
Chih-Yu JEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRODE STRUCTURE FOR GUIDING A CHARGED PARTICLE BEAM
Publication number
20230170177
Publication date
Jun 1, 2023
Friedrich-Alexander-Universitat Erlangen-Nurnberg
Robert ZIMMERMANN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...
Publication number
20230154723
Publication date
May 18, 2023
ASML NETHERLANDS B.V.
Yan REN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PATTERN INSPECTION APPARATUS, AND METHOD FOR ACQUIRING ALIGNMENT AM...
Publication number
20230145411
Publication date
May 11, 2023
NuFlare Technology, Inc.
Shinji SUGIHARA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
GRID STRUCTURE
Publication number
20230059669
Publication date
Feb 23, 2023
CHANGXIN MEMORY TECHNOLOGIES, INC.
Wei YANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
Publication number
20230003672
Publication date
Jan 5, 2023
FEI Company
Alexander Henstra
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Automated Multi-Grid Handling Apparatus
Publication number
20220415607
Publication date
Dec 29, 2022
RICHARD JOSEPH PICKREIGN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...
Publication number
20220319803
Publication date
Oct 6, 2022
The Regents of the University of California
Jeremy J. Axelrod
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SAMPLE SUPPORTS AND SAMPLE COOLING SYSTEMS FOR CRYO-ELECTRON MICROS...
Publication number
20220291098
Publication date
Sep 15, 2022
MITEGEN, LLC
David Closs
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR
Publication number
20220254601
Publication date
Aug 11, 2022
Centre National de la Recherche Scientifique
Angela VELLA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Optically-addressed phase modulator for electron beams
Publication number
20220238298
Publication date
Jul 28, 2022
Stewart A. Koppell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OBSERVATION CARRIER FOR MICROSCOPE
Publication number
20220148846
Publication date
May 12, 2022
FlowVIEW Tek
Po-Yang Peng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE
Publication number
20220139666
Publication date
May 5, 2022
Centre National de la Recherche Scientifique
François VURPILLOT
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON MICROSCOPE SAMPLE HOLDER FLUID HANDLING WITH INDEPENDENT P...
Publication number
20220130637
Publication date
Apr 28, 2022
PROTOCHIPS, INC.
Franklin Stampley Walden
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PREPARATION SYSTEM AND METHOD FOR ELECTRON MICROSCOPE OBSERV...
Publication number
20220068598
Publication date
Mar 3, 2022
SANYU ELECTRON CO., LTD.
Shinsuke SHIBATA
G01 - MEASURING TESTING
Information
Patent Application
Method for Preparing a Sample for Transmission Electron Microscopy
Publication number
20210391144
Publication date
Dec 16, 2021
IMEC vzw
Eric Vancoille
H01 - BASIC ELECTRIC ELEMENTS