Electron or ion microscopes

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H01J2237/26

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/26Electron or ion microscopes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System comprising a multi-beam particle microscope and method for o...
- Patent number 12,300,462
- Issue date May 13, 2025
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultra-precision timing clock method
- Patent number 12,226,246
- Issue date Feb 18, 2025
- Weng-Dah Ken
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Bifocal electron microscope
- Patent number 12,216,068
- Issue date Feb 4, 2025
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation carrier for microscope
- Patent number 12,046,444
- Issue date Jul 23, 2024
- FlowVIEW Tek
- Po-Yang Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optically-addressed phase modulator for electron beams
- Patent number 12,033,829
- Issue date Jul 9, 2024
- The Board of Trustees of the Leland Stanford Junior University
- Stewart A. Koppell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Use of optical polarization states to control a ponderomotive phase...
- Patent number 11,990,313
- Issue date May 21, 2024
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample preparation system and method for electron microscope observ...
- Patent number 11,990,314
- Issue date May 21, 2024
- SANYU ELECTRON CO., LTD.
- Shinsuke Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
- Patent number 11,942,303
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a multi-beam particle microscope and method for o...
- Patent number 11,935,721
- Issue date Mar 19, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-contact angle measuring apparatus
- Patent number 11,903,755
- Issue date Feb 20, 2024
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,906,450
- Issue date Feb 20, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated multi-grid handling apparatus
- Patent number 11,881,377
- Issue date Jan 23, 2024
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Build material handling unit for a powder module for an apparatus f...
- Patent number 11,878,463
- Issue date Jan 23, 2024
- CONCEPT LASER GMBH
- Dominik Eideloth
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Electron microscope sample holder fluid handling with independent p...
- Patent number 11,869,744
- Issue date Jan 9, 2024
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Grid structure
- Patent number 11,830,702
- Issue date Nov 28, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Wei Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical objective lens
- Patent number 11,808,930
- Issue date Nov 7, 2023
- ASML Netherlands B.V.
- Jian Zhang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Automated tomography field ion microscope
- Patent number 11,791,129
- Issue date Oct 17, 2023
- Centre National de la Recherche Scientifique
- François Vurpillot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multidimensional printer
- Patent number 11,738,312
- Issue date Aug 29, 2023
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Andrei A. Kolmakov
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Methods of supporting a graphene sheet disposed on a frame support
- Patent number 11,708,637
- Issue date Jul 25, 2023
- The Regents of the University of California
- Bong-Gyoon Han
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for transmission electron microscopy cathodoluminescence
- Patent number 11,688,581
- Issue date Jun 27, 2023
- Gatan, Inc.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Navigation for electron microscopy
- Patent number 11,688,582
- Issue date Jun 27, 2023
- Oxford Instruments Nanotechnology Tools Limited
- Anthony Hyde
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for inspecting an EUV mask
- Patent number 11,662,323
- Issue date May 30, 2023
- ASML Netherlands B.V.
- Guochong Weng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and sample observation method using the same
- Patent number 11,551,907
- Issue date Jan 10, 2023
- Riken
- Ken Harada
- G01 - MEASURING TESTING
Information Patent Grant
Identifying fiducial markers in microscope images
- Patent number 11,469,075
- Issue date Oct 11, 2022
- Applied Materials, Inc.
- Yun-Ching Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,460,419
- Issue date Oct 4, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring 3D diffraction data
- Patent number 11,456,149
- Issue date Sep 27, 2022
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated multi-grid handling apparatus
- Patent number 11,450,507
- Issue date Sep 20, 2022
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing a sample for transmission electron microscopy
- Patent number 11,437,217
- Issue date Sep 6, 2022
- Imec VZW
- Eric Vancoille
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Light guide assembly for an electron microscope
- Patent number 11,335,536
- Issue date May 17, 2022
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoparticle compositions
- Patent number 11,306,399
- Issue date Apr 19, 2022
- JANUARY THERAPEUTICS, INC.
- Raj Raheja
- C01 - INORGANIC CHEMISTRY

Patents Applicationslast 30 patents

Information Patent Application
NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD
- Publication number 20250176925
- Publication date Jun 5, 2025
- Weng-Dah Ken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20250157786
- Publication date May 15, 2025
- Hitachi, Ltd
- Fumiaki ICHIHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20250155387
- Publication date May 15, 2025
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
BLANKER-ENHANCED MOIRE IMAGING
- Publication number 20250104958
- Publication date Mar 27, 2025
- FEI Company
- Bert Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR PERFORMING AN INTERFEROMETRIC MEASUREMENT
- Publication number 20250069849
- Publication date Feb 27, 2025
- Technische Universitat Berlin
- Tolga WAGNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER-BASED CONTRAST CONTROL IN TRANSMISSION ELECTRON MICROSCOPY
- Publication number 20250062099
- Publication date Feb 20, 2025
- Yeda Research and Development Co. Ltd.
- Osip SCHWARTZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...
- Publication number 20240429020
- Publication date Dec 26, 2024
- Hitachi, Ltd
- Akira SUGAWARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOW FOR HIGH RESOLUTION STEREOSCOPIC MEASUREMENTS
- Publication number 20240339289
- Publication date Oct 10, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Adar Sonn-Segev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...
- Publication number 20240282549
- Publication date Aug 22, 2024
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20240272100
- Publication date Aug 15, 2024
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
Automated Multi-Grid Handling Apparatus
- Publication number 20240212972
- Publication date Jun 27, 2024
- Richard Joseph Pickreign
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR O...
- Publication number 20240212977
- Publication date Jun 27, 2024
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS
- Publication number 20240115222
- Publication date Apr 11, 2024
- Weng-Dah Ken
- G04 - HOROLOGY
Information Patent Application
PHASE IMAGE PROCESSING APPARATUS AND PHASE IMAGE PROCESSING METHOD
- Publication number 20240021406
- Publication date Jan 18, 2024
- Hitachi, Ltd
- Yoshio TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION IN AN INSPECTION...
- Publication number 20230298851
- Publication date Sep 21, 2023
- ASML NETHERLANDS B.V.
- Chih-Yu JEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRODE STRUCTURE FOR GUIDING A CHARGED PARTICLE BEAM
- Publication number 20230170177
- Publication date Jun 1, 2023
- Friedrich-Alexander-Universitat Erlangen-Nurnberg
- Robert ZIMMERMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...
- Publication number 20230154723
- Publication date May 18, 2023
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION APPARATUS, AND METHOD FOR ACQUIRING ALIGNMENT AM...
- Publication number 20230145411
- Publication date May 11, 2023
- NuFlare Technology, Inc.
- Shinji SUGIHARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GRID STRUCTURE
- Publication number 20230059669
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Wei YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20230003672
- Publication date Jan 5, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Multi-Grid Handling Apparatus
- Publication number 20220415607
- Publication date Dec 29, 2022
- RICHARD JOSEPH PICKREIGN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...
- Publication number 20220319803
- Publication date Oct 6, 2022
- The Regents of the University of California
- Jeremy J. Axelrod
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORTS AND SAMPLE COOLING SYSTEMS FOR CRYO-ELECTRON MICROS...
- Publication number 20220291098
- Publication date Sep 15, 2022
- MITEGEN, LLC
- David Closs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR
- Publication number 20220254601
- Publication date Aug 11, 2022
- Centre National de la Recherche Scientifique
- Angela VELLA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optically-addressed phase modulator for electron beams
- Publication number 20220238298
- Publication date Jul 28, 2022
- Stewart A. Koppell
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBSERVATION CARRIER FOR MICROSCOPE
- Publication number 20220148846
- Publication date May 12, 2022
- FlowVIEW Tek
- Po-Yang Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE
- Publication number 20220139666
- Publication date May 5, 2022
- Centre National de la Recherche Scientifique
- François VURPILLOT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE SAMPLE HOLDER FLUID HANDLING WITH INDEPENDENT P...
- Publication number 20220130637
- Publication date Apr 28, 2022
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PREPARATION SYSTEM AND METHOD FOR ELECTRON MICROSCOPE OBSERV...
- Publication number 20220068598
- Publication date Mar 3, 2022
- SANYU ELECTRON CO., LTD.
- Shinsuke SHIBATA
- G01 - MEASURING TESTING
Information Patent Application
Method for Preparing a Sample for Transmission Electron Microscopy
- Publication number 20210391144
- Publication date Dec 16, 2021
- IMEC vzw
- Eric Vancoille
- H01 - BASIC ELECTRIC ELEMENTS

Electron or ion microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System comprising a multi-beam particle microscope and method for o...

Ultra-precision timing clock method

Bifocal electron microscope

Observation carrier for microscope

Optically-addressed phase modulator for electron beams

Use of optical polarization states to control a ponderomotive phase...

Sample preparation system and method for electron microscope observ...

Systems and methods for real time stereo imaging using multiple ele...

System comprising a multi-beam particle microscope and method for o...

Non-contact angle measuring apparatus

Electron diffraction holography

Automated multi-grid handling apparatus

Build material handling unit for a powder module for an apparatus f...

Electron microscope sample holder fluid handling with independent p...

Grid structure

Optical objective lens

Automated tomography field ion microscope

Multidimensional printer

Methods of supporting a graphene sheet disposed on a frame support

Apparatus for transmission electron microscopy cathodoluminescence

Navigation for electron microscopy

Method and system for inspecting an EUV mask

Electron microscope and sample observation method using the same

Identifying fiducial markers in microscope images

Electron diffraction holography

Methods and systems for acquiring 3D diffraction data

Automated multi-grid handling apparatus

Method for preparing a sample for transmission electron microscopy

Light guide assembly for an electron microscope

Nanoparticle compositions

Patents Applicationslast 30 patents

NON-INVASIVE MEASURING/DIAGNOSIS/TREATMENT APPARATUS AND METHOD

Charged Particle Beam Apparatus

BIFOCAL ELECTRON MICROSCOPE

BLANKER-ENHANCED MOIRE IMAGING

DEVICE FOR PERFORMING AN INTERFEROMETRIC MEASUREMENT

LASER-BASED CONTRAST CONTROL IN TRANSMISSION ELECTRON MICROSCOPY

SAMPLE HOLDER, ELECTRON MICROSCOPE SYSTEM AND SAMPLE OBSERVATION ME...

FLOW FOR HIGH RESOLUTION STEREOSCOPIC MEASUREMENTS

USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...

BIFOCAL ELECTRON MICROSCOPE

Automated Multi-Grid Handling Apparatus

SYSTEM COMPRISING A MULTI-BEAM PARTICLE MICROSCOPE AND METHOD FOR O...

ULTRA-PRECISION TIMING CLOCK METHOD AND APPARATUS

PHASE IMAGE PROCESSING APPARATUS AND PHASE IMAGE PROCESSING METHOD

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION IN AN INSPECTION...

ELECTRODE STRUCTURE FOR GUIDING A CHARGED PARTICLE BEAM

SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...

PATTERN INSPECTION APPARATUS, AND METHOD FOR ACQUIRING ALIGNMENT AM...

GRID STRUCTURE

ELECTRON DIFFRACTION HOLOGRAPHY

Automated Multi-Grid Handling Apparatus

USE OF OPTICAL POLARIZATION STATES TO CONTROL A PONDEROMOTIVE PHASE...

SAMPLE SUPPORTS AND SAMPLE COOLING SYSTEMS FOR CRYO-ELECTRON MICROS...

TOMOGRAPHIC ATOM PROBE WITH TERAHERTZ PULSE GENERATOR

Optically-addressed phase modulator for electron beams

OBSERVATION CARRIER FOR MICROSCOPE

AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE

ELECTRON MICROSCOPE SAMPLE HOLDER FLUID HANDLING WITH INDEPENDENT P...

SAMPLE PREPARATION SYSTEM AND METHOD FOR ELECTRON MICROSCOPE OBSERV...

Method for Preparing a Sample for Transmission Electron Microscopy