Electron sources

Industry

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H01J49/08

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/08Electron sources

Industries

Patents Grantslast 30 patents

Information Patent Grant
Electron capture detector
- Patent number 11,971,394
- Issue date Apr 30, 2024
- SHARP KABUSHIKI KAISHA
- Shohei Komaru
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D-printed field emission sources for compact systems
- Patent number 11,791,121
- Issue date Oct 17, 2023
- Massachusetts Institute of Technology
- Luis Fernando Velásquez-García
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization sources and methods and systems using them
- Patent number 11,670,496
- Issue date Jun 6, 2023
- PerkinElmer U.S. LLC
- Adam Patkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron capture dissociation (ECD) utilizing electron beam generat...
- Patent number 11,217,437
- Issue date Jan 4, 2022
- Agilent Technologies, Inc.
- Kenneth R. Newton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry detection device and mass spectrometer
- Patent number 11,164,732
- Issue date Nov 2, 2021
- Shimadzu Corporation
- Hideharu Shichi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization sources and methods and systems using them
- Patent number 10,985,002
- Issue date Apr 20, 2021
- PerkinElmer Health Sciences, Inc.
- Adam Patkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,971,347
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Mitsuhiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer, sampling probe, and analysis method
- Patent number 10,930,488
- Issue date Feb 23, 2021
- Shimadzu Corporation
- Osamu Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robust ion source
- Patent number 10,892,153
- Issue date Jan 12, 2021
- MKS Instruments, Inc.
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EELS detection technique in an electron microscope
- Patent number 10,832,901
- Issue date Nov 10, 2020
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mirror and ion-optical lens for imaging
- Patent number 10,636,646
- Issue date Apr 28, 2020
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 10,566,179
- Issue date Feb 18, 2020
- Shimadzu Corporation
- Tomoyuki Oshiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robust ion source
- Patent number 10,541,122
- Issue date Jan 21, 2020
- MKS Instruments, Inc.
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fourier transform mass spectrometer
- Patent number 10,446,384
- Issue date Oct 15, 2019
- DH Technologies Development Pte. Ltd.
- James Walter Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer using a cold electron beam as an i...
- Patent number 10,388,506
- Issue date Aug 20, 2019
- Kora Basic Science Institute
- Mo Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metamaterial photocathode for detection and imaging of infrared rad...
- Patent number 10,236,165
- Issue date Mar 19, 2019
- The United States of America, as represented by the Secretary of the Navy
- Benjamin R. Conley
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High-speed low-noise ion current detection circuit and mass spectro...
- Patent number 10,224,192
- Issue date Mar 5, 2019
- Atonarp Inc.
- Anand Pandurangan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for controlling injection of electron...
- Patent number 10,037,876
- Issue date Jul 31, 2018
- Korea Basic Science Institute
- Seung Yong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High dynamic range ion detector for mass spectrometers
- Patent number 9,899,201
- Issue date Feb 20, 2018
- Melvin Andrew Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion detection
- Patent number 9,741,551
- Issue date Aug 22, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap mass spectrometer using cold electron source
- Patent number 9,412,576
- Issue date Aug 9, 2016
- Korea Basic Science Institute
- Seung Yong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron source for an RF-free electronmagnetostatic electron-induc...
- Patent number 9,305,760
- Issue date Apr 5, 2016
- State of Oregon Acting by and through the State Board of Higher Education on...
- Douglas F. Barofsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Anion generating and electron capture dissociation apparatus using...
- Patent number 9,230,791
- Issue date Jan 5, 2016
- Korea Basic Science Institute
- Hyun Sik Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultraviolet diode and atomic mass analysis ionization source collec...
- Patent number 8,981,289
- Issue date Mar 17, 2015
- Korea Basic Science Institute
- Seung Yong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for obtaining the ion source of a mass spectrometer using an...
- Patent number 8,927,943
- Issue date Jan 6, 2015
- Korea Basic Science Institute
- Mo Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,410,433
- Issue date Apr 2, 2013
- Inficon GmbH
- Martin Wüest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoemission induced electron ionization
- Patent number 8,288,735
- Issue date Oct 16, 2012
- Morpho Detection, Inc.
- Jack A. Syage
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytic spectrometers with non-radioactive electron sources
- Patent number 8,188,444
- Issue date May 29, 2012
- Bruker Daltonik GmbH
- Klaus Zimmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,071,941
- Issue date Dec 6, 2011
- Inficon GmbH
- Martin Wüest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzer
- Patent number 8,044,343
- Issue date Oct 25, 2011
- Rigaku Corporation
- Tadashi Arii
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Internal Fragment Reduction in Top Down ECD Analysis of Proteins
- Publication number 20240222103
- Publication date Jul 4, 2024
- DH Technologies Development Pte. Ltd.
- Takashi BABA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD
- Publication number 20240014022
- Publication date Jan 11, 2024
- ISOTOPX LTD
- Damian Paul TOOTELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNET POSITIONING SYSTEM FOR ION SOURCE
- Publication number 20230411135
- Publication date Dec 21, 2023
- Thermo Finnigan LLC
- Dustin D. Holden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLDING DEVICE FOR AT LEAST ONE FILAMENT AND MASS SPECTROMETER
- Publication number 20230084351
- Publication date Mar 16, 2023
- Leybold GmbH
- Niklas Pengemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION SOURCES AND METHODS AND SYSTEMS USING THEM
- Publication number 20210375608
- Publication date Dec 2, 2021
- PerkinElmer Health Sciences, Inc.
- Adam Patkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON CAPTURE DETECTOR
- Publication number 20210116428
- Publication date Apr 22, 2021
- SHARP KABUSHIKI KAISHA
- SHOHEI KOMARU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210020422
- Publication date Jan 21, 2021
- Hitachi High-Technologies Corporation
- Mitsuhiro NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION SOURCES AND METHODS AND SYSTEMS USING THEM
- Publication number 20200395204
- Publication date Dec 17, 2020
- PerkinElmer Health Sciences, Inc.
- Adam Patkin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D-PRINTED FIELD EMISSION SOURCES FOR COMPACT SYSTEMS
- Publication number 20200357595
- Publication date Nov 12, 2020
- Massachusetts Institute of Technology
- Luis Fernando Velásquez-García
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Application
MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD
- Publication number 20200328071
- Publication date Oct 15, 2020
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20200266046
- Publication date Aug 20, 2020
- Shimadzu Corporation
- Osamu FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Robust Ion Source
- Publication number 20200118806
- Publication date Apr 16, 2020
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY DETECTION DEVICE AND MASS SPECTROMETER
- Publication number 20190362954
- Publication date Nov 28, 2019
- Shimadzu Corporation
- Hideharu SHICHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE
- Publication number 20190341243
- Publication date Nov 7, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON CAPTURE DISSOCIATION (ECD) UTILIZING ELECTRON BEAM GENERAT...
- Publication number 20190287775
- Publication date Sep 19, 2019
- Agilent Technologies, Inc.
- Kenneth R. Newton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-SPEED LOW-NOISE ION CURRENT DETECTION CIRCUIT AND MASS SPECTRO...
- Publication number 20190027348
- Publication date Jan 24, 2019
- ATONARP INC.
- Anand Pandurangan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIPID-ANALYZING METHOD USING MASS SPECTROMETRY AND MASS SPECTROMETER
- Publication number 20190004071
- Publication date Jan 3, 2019
- Shimadzu Corporation
- Hidenori TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
Robust Ion Source
- Publication number 20180358217
- Publication date Dec 13, 2018
- MKS Instruments, Inc.
- James E. Blessing
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPROVED ION MIRROR AND ION-OPTICAL LENS FOR IMAGING
- Publication number 20180358219
- Publication date Dec 13, 2018
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20180315589
- Publication date Nov 1, 2018
- SHIMADZU CORPORATION
- Tomoyuki OSHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Ionization (EI) Utilizing Different EI Energies
- Publication number 20180277348
- Publication date Sep 27, 2018
- Agilent Technologies, Inc.
- Harry F. Prest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fourier Transform Mass Spectrometer
- Publication number 20180114685
- Publication date Apr 26, 2018
- DH Technologies Development Pte. Ltd.
- James Walter Hager
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER AND METHOD FOR CONTROLLING INJECTION OF ELECTRON...
- Publication number 20170200598
- Publication date Jul 13, 2017
- Korea Basic Science Institute
- Seung Yong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION DETECTION
- Publication number 20170040152
- Publication date Feb 9, 2017
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Alekseevich Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON SOURCE FOR AN RF-FREE ELECTRONMAGNETOSTATIC ELECTRON-INDUC...
- Publication number 20150187557
- Publication date Jul 2, 2015
- State of Oregon acting by and through the State board of higher education on...
- Douglas F. Barofsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTORS AND METHODS OF USING THEM
- Publication number 20150162174
- Publication date Jun 11, 2015
- PerkinElmer Health Sciences, Inc.
- Hamid Badiei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON IONIZATION (EI) UTILIZING DIFFERENT EI ENERGIES
- Publication number 20140374583
- Publication date Dec 25, 2014
- Harry F. Prest
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANION GENERATING AND ELECTRON CAPTURE DISSOCIATION APPARATUS USING...
- Publication number 20140367568
- Publication date Dec 18, 2014
- Hyun Sik Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ULTRAVIOLET DIODE AND ATOMIC MASS ANALYSIS IONIZATION SOURCE COLLEC...
- Publication number 20140339423
- Publication date Nov 20, 2014
- KOREA BASIC SCIENCE INSTITUTE
- Seung Yong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR OBTAINING THE ION SOURCE OF A MASS SPECTROMETER USING AN...
- Publication number 20140124662
- Publication date May 8, 2014
- KOREA BASIC SCIENCE INSTITUTE
- Mo Yang
- H01 - BASIC ELECTRIC ELEMENTS

Electron sources

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron capture detector

3D-printed field emission sources for compact systems

Ionization sources and methods and systems using them

Electron capture dissociation (ECD) utilizing electron beam generat...

Mass spectrometry detection device and mass spectrometer

Ionization sources and methods and systems using them

Charged particle beam apparatus

Mass spectrometer, sampling probe, and analysis method

Robust ion source

EELS detection technique in an electron microscope

Ion mirror and ion-optical lens for imaging

Time-of-flight mass spectrometer

Robust ion source

Fourier transform mass spectrometer

Time-of-flight mass spectrometer using a cold electron beam as an i...

Metamaterial photocathode for detection and imaging of infrared rad...

High-speed low-noise ion current detection circuit and mass spectro...

Mass spectrometer and method for controlling injection of electron...

High dynamic range ion detector for mass spectrometers

Ion detection

Ion trap mass spectrometer using cold electron source

Electron source for an RF-free electronmagnetostatic electron-induc...

Anion generating and electron capture dissociation apparatus using...

Ultraviolet diode and atomic mass analysis ionization source collec...

Device for obtaining the ion source of a mass spectrometer using an...

Mass spectrometer

Photoemission induced electron ionization

Analytic spectrometers with non-radioactive electron sources

Mass spectrometer

Gas analyzer

Patents Applicationslast 30 patents

Internal Fragment Reduction in Top Down ECD Analysis of Proteins

APPARATUS AND METHOD

MAGNET POSITIONING SYSTEM FOR ION SOURCE

HOLDING DEVICE FOR AT LEAST ONE FILAMENT AND MASS SPECTROMETER

IONIZATION SOURCES AND METHODS AND SYSTEMS USING THEM

ELECTRON CAPTURE DETECTOR

CHARGED PARTICLE BEAM APPARATUS

IONIZATION SOURCES AND METHODS AND SYSTEMS USING THEM

3D-PRINTED FIELD EMISSION SOURCES FOR COMPACT SYSTEMS

MASS SPECTROMETER, SAMPLING PROBE, AND ANALYSIS METHOD

MASS SPECTROMETER

Robust Ion Source

MASS SPECTROMETRY DETECTION DEVICE AND MASS SPECTROMETER

EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE

ELECTRON CAPTURE DISSOCIATION (ECD) UTILIZING ELECTRON BEAM GENERAT...

HIGH-SPEED LOW-NOISE ION CURRENT DETECTION CIRCUIT AND MASS SPECTRO...

LIPID-ANALYZING METHOD USING MASS SPECTROMETRY AND MASS SPECTROMETER

Robust Ion Source

IMPROVED ION MIRROR AND ION-OPTICAL LENS FOR IMAGING

TIME-OF-FLIGHT MASS SPECTROMETER

Electron Ionization (EI) Utilizing Different EI Energies

Fourier Transform Mass Spectrometer

MASS SPECTROMETER AND METHOD FOR CONTROLLING INJECTION OF ELECTRON...

ION DETECTION

ELECTRON SOURCE FOR AN RF-FREE ELECTRONMAGNETOSTATIC ELECTRON-INDUC...

DETECTORS AND METHODS OF USING THEM

ELECTRON IONIZATION (EI) UTILIZING DIFFERENT EI ENERGIES

ANION GENERATING AND ELECTRON CAPTURE DISSOCIATION APPARATUS USING...

ULTRAVIOLET DIODE AND ATOMIC MASS ANALYSIS IONIZATION SOURCE COLLEC...

DEVICE FOR OBTAINING THE ION SOURCE OF A MASS SPECTROMETER USING AN...