Electrostatic force probe

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CPC
Y10S977/864

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/864Electrostatic force probe

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope for cleaning nanostructures
- Patent number 11,130,159
- Issue date Sep 28, 2021
- International Business Machines Corporation
- Pio Peter Niraj Nirmalraj
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Cleaning of nanostructures
- Patent number 10,543,515
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Pio Peter Niraj Nirmalraj
- B08 - CLEANING
Information Patent Grant
Probe arrangement for exchanging in a controllable way liquids with...
- Patent number 8,986,626
- Issue date Mar 24, 2015
- ETH Zürich / ETH Transfer
- Michael Gabi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe characterization of surfaces
- Patent number 7,420,106
- Issue date Sep 2, 2008
- The University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a probe having a field effect transistor chan...
- Patent number 7,402,736
- Issue date Jul 22, 2008
- Postech Foundation
- Wonkyu Moon
- G11 - INFORMATION STORAGE
Information Patent Grant
Nanotube semiconductor structures with varying electrical properties
- Patent number 7,312,096
- Issue date Dec 25, 2007
- Kulite Semiconductor Products, Inc.
- Anthony D. Kurtz
- G01 - MEASURING TESTING
Information Patent Grant
Scanning evanescent electro-magnetic microscope
- Patent number 6,532,806
- Issue date Mar 18, 2003
- The Regents of the University of California
- Xiao-Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic force detector with cantilever for an electrostatic f...
- Patent number 6,507,197
- Issue date Jan 14, 2003
- Trek, Inc.
- Akiyoshi Itoh
- G01 - MEASURING TESTING
Information Patent Grant
Electron exposure apparatus
- Patent number 6,366,340
- Issue date Apr 2, 2002
- Hitachi, Ltd.
- Masayoshi Ishibashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electrostatic force detector with cantilever and shield for an elec...
- Patent number 6,337,478
- Issue date Jan 8, 2002
- Trek, Inc.
- Toshio Uehara
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Bi-level charge pulse apparatus to facilitate nerve location during...
- Patent number 6,325,764
- Issue date Dec 4, 2001
- Becton, Dickinson and Company
- Richard Lee Griffith
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Microscopic system equipt with an electron microscope and a scannin...
- Patent number 6,242,737
- Issue date Jun 5, 2001
- Japan Science and Technology Corporation
- Hideaki Ohnishi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring mechanical and electrical charac...
- Patent number 6,185,991
- Issue date Feb 13, 2001
- PSIA Corporation
- Jaewan Hong
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning evanescent electro-magnetic microscope
- Patent number 6,173,604
- Issue date Jan 16, 2001
- The Regents of the University of California
- Xiao-Dong Xiang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope for measuring the electrical properties o...
- Patent number 5,929,643
- Issue date Jul 27, 1999
- Olympus Optical Co., Ltd.
- Nobuaki Sakai
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Bi-level charge pulse apparatus to facilitate nerve location during...
- Patent number 5,853,373
- Issue date Dec 29, 1998
- Becton, Dickinson and Company
- Richard Lee Griffith
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Electrostatic actuator, probe using the actuator, scanning probe mi...
- Patent number 5,753,911
- Issue date May 19, 1998
- Canon Kabushiki Kaisha
- Susumu Yasuda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for high-speed potentiometry using scanning probe...
- Patent number 5,488,305
- Issue date Jan 30, 1996
- The Board of Trustees of the Leland Stanford Junior University
- David M. Bloom
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method of measuring high-speed electrical waveforms usin...
- Patent number 5,381,101
- Issue date Jan 10, 1995
- The Board of Trustees of the Leland Stanford Junior University
- David M. Bloom
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning electrochemical microscopy
- Patent number 5,202,004
- Issue date Apr 13, 1993
- Digital Instruments, Inc.
- Juhyoun Kwak
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
CLEANING OF NANOSTRUCTURES
- Publication number 20200094295
- Publication date Mar 26, 2020
- International Business Machines Corporation
- Pio Peter Niraj Nirmalraj
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PROBE ARRANGEMENT FOR EXCHANGING IN A CONTROLLABLE WAY LIQUIDS WITH...
- Publication number 20110124027
- Publication date May 26, 2011
- ETH Zurich / ETH Transfer
- Michael Gabi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Nanotube semiconductor structures with varying electrical properties
- Publication number 20070034975
- Publication date Feb 15, 2007
- Anthony D. Kurtz
- G01 - MEASURING TESTING
Information Patent Application
Probe of scanning probe microscope having a field effect transistor...
- Publication number 20060230475
- Publication date Oct 12, 2006
- POSTECH FOUNDATION
- Wonkyu Moon
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe characterization of surfaces
- Publication number 20060225164
- Publication date Oct 5, 2006
- The University of Utah
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
Nanotube semiconductor structures with varying electrical properties
- Publication number 20040188780
- Publication date Sep 30, 2004
- Anthony D. Kurtz
- G01 - MEASURING TESTING
Information Patent Application
Electron exposure apparatus
- Publication number 20020101573
- Publication date Aug 1, 2002
- Hitachi, Ltd.
- Masayoshi Ishibashi
- B82 - NANO-TECHNOLOGY

Electrostatic force probe

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scanning probe microscope for cleaning nanostructures

Cleaning of nanostructures

Probe arrangement for exchanging in a controllable way liquids with...

Scanning probe characterization of surfaces

Method of fabricating a probe having a field effect transistor chan...

Nanotube semiconductor structures with varying electrical properties

Scanning evanescent electro-magnetic microscope

Electrostatic force detector with cantilever for an electrostatic f...

Electron exposure apparatus

Electrostatic force detector with cantilever and shield for an elec...

Bi-level charge pulse apparatus to facilitate nerve location during...

Microscopic system equipt with an electron microscope and a scannin...

Method and apparatus for measuring mechanical and electrical charac...

Scanning evanescent electro-magnetic microscope

Scanning probe microscope for measuring the electrical properties o...

Bi-level charge pulse apparatus to facilitate nerve location during...

Electrostatic actuator, probe using the actuator, scanning probe mi...

System and method for high-speed potentiometry using scanning probe...

System and method of measuring high-speed electrical waveforms usin...

Scanning electrochemical microscopy

Patents Applicationslast 30 patents

CLEANING OF NANOSTRUCTURES

PROBE ARRANGEMENT FOR EXCHANGING IN A CONTROLLABLE WAY LIQUIDS WITH...

Nanotube semiconductor structures with varying electrical properties

Probe of scanning probe microscope having a field effect transistor...

Scanning probe characterization of surfaces

Nanotube semiconductor structures with varying electrical properties

Electron exposure apparatus