ellipsoidal collector

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CPC
G01N2223/348

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/348ellipsoidal collector

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Patents Grantslast 30 patents

Information Patent Grant
Thermal wave microscopy using areal infrared detection
- Patent number 4,578,584
- Issue date Mar 25, 1986
- International Business Machines Corporation
- Thomas Baumann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents