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G01N2201/0637
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G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2201/00
Features of devices classified in G01N21/00
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G01N2201/0637
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Patents Grants
last 30 patents
Information
Patent Grant
Droplet sensor
Patent number
11,598,721
Issue date
Mar 7, 2023
Mitsumi Electric Co., Ltd.
Hideo Kurosawa
G01 - MEASURING TESTING
Information
Patent Grant
Droplet sensor
Patent number
11,486,827
Issue date
Nov 1, 2022
Mitsumi Electric Co., Ltd.
Hideo Kurosawa
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Spectrometers and instruments including them
Patent number
11,221,254
Issue date
Jan 11, 2022
PerkinElmer Health Sciences, Inc.
Mahsa Farsad
G01 - MEASURING TESTING
Information
Patent Grant
Sorting or classifying apparatus
Patent number
10,987,701
Issue date
Apr 27, 2021
BÜHLER UK LIMITED
David Gherardi
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
Compact optical gas detection system and apparatus
Patent number
10,866,185
Issue date
Dec 15, 2020
Analog Devices, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Grant
Compact optical gas detection system and apparatus
Patent number
10,830,693
Issue date
Nov 10, 2020
Analog Devices, Inc.
Shrenik Deliwala
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometers and instruments including them
Patent number
10,809,124
Issue date
Oct 20, 2020
PerkinElmer Health Sciences, Inc.
Mahsa Farsad
G01 - MEASURING TESTING
Information
Patent Grant
Optical cavity for gas sensor and gas sensor having optical cavity
Patent number
10,613,028
Issue date
Apr 7, 2020
ELT SENSOR CORP.
Ihn Lee
G02 - OPTICS
Information
Patent Grant
Quality control station for a sheet element processing machine and...
Patent number
10,571,405
Issue date
Feb 25, 2020
BOBST MEX SA
Matthieu Richard
G01 - MEASURING TESTING
Information
Patent Grant
Optical Analyzer
Patent number
10,557,791
Issue date
Feb 11, 2020
Topcon Corporation
Taichi Yuasa
G01 - MEASURING TESTING
Information
Patent Grant
Container inspection system
Patent number
10,393,670
Issue date
Aug 27, 2019
Applied Vision Corporation
Richard A. Sones
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for monitoring ultraviolet light for a fiber cure...
Patent number
10,393,578
Issue date
Aug 27, 2019
Phoseon Technology, Inc.
Doug Childers
G01 - MEASURING TESTING
Information
Patent Grant
Optical Analyzer
Patent number
10,352,851
Issue date
Jul 16, 2019
Topcon Corporation
Taichi Yuasa
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for monitoring ultraviolet light for a fiber cure...
Patent number
10,175,103
Issue date
Jan 8, 2019
Phoseon Technology, Inc.
Doug Childers
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Compact device for sensing a liquid with energy harvesting from liq...
Patent number
10,161,861
Issue date
Dec 25, 2018
Hong Kong Applied Science and Technology Research Institute Company Limited
Chun Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Optical element, transmission probe, sample container, optical devi...
Patent number
10,082,462
Issue date
Sep 25, 2018
Yokogawa Electric Corporation
Yasuyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Optical gas sensor
Patent number
9,976,991
Issue date
May 22, 2018
Cooper Technologies Company
Kalaga Venu Madhav
G01 - MEASURING TESTING
Information
Patent Grant
Flow cytometry optics
Patent number
9,816,911
Issue date
Nov 14, 2017
Beckman Coulter, Inc.
Antao Chen
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for monitoring ultraviolet light for a fiber cure...
Patent number
9,442,007
Issue date
Sep 13, 2016
Phoseon Technology, Inc.
Doug Childers
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Grant
Multi-stage ramp-up annealing for frequency-conversion crystals
Patent number
9,413,134
Issue date
Aug 9, 2016
KLA-Tencor Corporation
Vladimir Dribinski
G01 - MEASURING TESTING
Information
Patent Grant
Laser with high quality, stable output beam, and long life high con...
Patent number
9,097,683
Issue date
Aug 4, 2015
KLA-Tencor Corporation
Vladimir Dribinski
G01 - MEASURING TESTING
Information
Patent Grant
Optical characteristic measuring apparatus
Patent number
8,982,345
Issue date
Mar 17, 2015
National Institute of Advanced Industrial Science and Technology
Etsuo Kawate
G01 - MEASURING TESTING
Information
Patent Grant
Spectroscopic ellipsometers
Patent number
7,999,949
Issue date
Aug 16, 2011
Raintree Scientific Instruments (Shanghai) Corporation
Tongxin Lu
G01 - MEASURING TESTING
Information
Patent Grant
Absorption spectroscopy apparatus and method
Patent number
7,777,887
Issue date
Aug 17, 2010
Ion Optics, Inc.
Martin U. Pralle
G01 - MEASURING TESTING
Information
Patent Grant
Maximal-aperture reflecting objective
Patent number
7,643,226
Issue date
Jan 5, 2010
Salk Institute for Biological Studies
Dejan Vucinic
G01 - MEASURING TESTING
Information
Patent Grant
System and method for correction for angular spread in determining...
Patent number
7,349,107
Issue date
Mar 25, 2008
Lockheed Martin Corporation
Hsueh-Mei W. Graham
G01 - MEASURING TESTING
Information
Patent Grant
Portable device for measuring the light intensity from an object, a...
Patent number
7,130,033
Issue date
Oct 31, 2006
Optis
Jacques Delacour
G01 - MEASURING TESTING
Information
Patent Grant
Optical mechanism for precisely controlling the angle of an inciden...
Patent number
6,288,841
Issue date
Sep 11, 2001
National Science Council
Solomon J. H. Lee
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
Microspot Reflectometer
Publication number
20240344980
Publication date
Oct 17, 2024
The Boeing Company
Brian Gunther
G02 - OPTICS
Information
Patent Application
DETECTING SYSTEM USING SPECTRUM MEASUREMENT DEVICE
Publication number
20240319079
Publication date
Sep 26, 2024
InnoSpectra Corporation
Fei-Peng Chang
G01 - MEASURING TESTING
Information
Patent Application
GAS DETECTION APPARATUS
Publication number
20240035958
Publication date
Feb 1, 2024
ASAHI KASEI MICRODEVICES CORPORATION
Shota ISSHIKI
G01 - MEASURING TESTING
Information
Patent Application
DROPLET SENSOR
Publication number
20210096069
Publication date
Apr 1, 2021
MITSUMI ELECTRIC CO., LTD.
Hideo KUROSAWA
G01 - MEASURING TESTING
Information
Patent Application
Spectrometers and Instruments Including Them
Publication number
20200408595
Publication date
Dec 31, 2020
PerkinElmer Health Sciences, Inc.
Mahsa Farsad
G01 - MEASURING TESTING
Information
Patent Application
Spectrometers and Instruments Including Them
Publication number
20190339123
Publication date
Nov 7, 2019
PerkinElmer Heath Sciences, Inc.
Mahsa Farsad
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MONITORING ULTRAVIOLET LIGHT FOR A FIBER CURE...
Publication number
20180306641
Publication date
Oct 25, 2018
PHOSEON TECHNOLOGY, INC.
Doug Childers
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Application
OPTICAL ANALYZER
Publication number
20180003628
Publication date
Jan 4, 2018
TOPCON CORPORATION
Taichi YUASA
G01 - MEASURING TESTING
Information
Patent Application
LIGHT COLLECTION FROM DNV SENSORS
Publication number
20170023487
Publication date
Jan 26, 2017
Lockheed Martin Corporation
Brian P. Boesch
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASURING DEVICE AND DEVICE HAVING OPTICAL SYSTEM
Publication number
20160252451
Publication date
Sep 1, 2016
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Etsuo Kawate
G02 - OPTICS
Information
Patent Application
Laser With High Quality, Stable Output Beam, And Long Life High Con...
Publication number
20150022805
Publication date
Jan 22, 2015
KLA-Tencor Corporation
Vladimir Dribinski
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MONITORING ULTRAVIOLET LIGHT FOR A FIBER CURE...
Publication number
20140328579
Publication date
Nov 6, 2014
PHOSEON TECHNOLOGY, INC.
Doug Childers
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information
Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS
Publication number
20140002825
Publication date
Jan 2, 2014
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Etsuo Kawate
G02 - OPTICS
Information
Patent Application
Laser With High Quality, Stable Output Beam, And Long Life High Con...
Publication number
20130021602
Publication date
Jan 24, 2013
KLA-Tencor Corporation
Vladimir Dribinski
C30 - CRYSTAL GROWTH
Information
Patent Application
Composite Optical Focusing Devices
Publication number
20100118308
Publication date
May 13, 2010
Raintree Scientific Instruments (Shanghai) Corporation
Tongxin Lu
G01 - MEASURING TESTING
Information
Patent Application
ABSORPTION SPECTROSCOPY APPARATUS AND METHOD
Publication number
20080252892
Publication date
Oct 16, 2008
Ion Optics DBA ICx Photonics
Martin U. Pralle
G01 - MEASURING TESTING
Information
Patent Application
Spectroscopic Ellipsometers
Publication number
20070247624
Publication date
Oct 25, 2007
Raintree Scientific Instruments (Shanghai) Corporation
Tongxin Lu
G01 - MEASURING TESTING
Information
Patent Application
Optical Focusing Devices
Publication number
20070242267
Publication date
Oct 18, 2007
Raintree Scientific Instruments (Shanghai) Corporation
Tongxin Lu
G01 - MEASURING TESTING
Information
Patent Application
Maximal-aperture reflecting objective
Publication number
20070153368
Publication date
Jul 5, 2007
The Salk Institute for Biological Studies.
Dejan Vucinic
G02 - OPTICS
Information
Patent Application
Portable biochip scanner using surface plasmon resonance
Publication number
20060187459
Publication date
Aug 24, 2006
Gyeong-sik Ok
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Portable device for measuring the light intensity from an object, a...
Publication number
20060023202
Publication date
Feb 2, 2006
Jacques Delacour
G01 - MEASURING TESTING
Information
Patent Application
System and method for correction for angular spread in determining...
Publication number
20050006585
Publication date
Jan 13, 2005
Hsueh-Mei W. Graham
G01 - MEASURING TESTING