Emission microscopes

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CPC
H01J2237/285

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/285Emission microscopes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Aperture device and analyzer arrangement
- Patent number 11,942,316
- Issue date Mar 26, 2024
- SCIENTA OMICRON AB
- Peter Amann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated tomography field ion microscope
- Patent number 11,791,129
- Issue date Oct 17, 2023
- Centre National de la Recherche Scientifique
- François Vurpillot
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for transmission electron microscopy cathodoluminescence
- Patent number 11,688,581
- Issue date Jun 27, 2023
- Gatan, Inc.
- John Andrew Hunt
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam system and method for the particle-optical examinatio...
- Patent number 11,657,999
- Issue date May 23, 2023
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a 2D sample with a multi-beam particle microscope
- Patent number 11,521,827
- Issue date Dec 6, 2022
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a 3D sample with a multi-beam particle microscope
- Patent number 11,069,508
- Issue date Jul 20, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for the particle-optical examinatio...
- Patent number 11,049,686
- Issue date Jun 29, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe inspection device, field ion microscope, and distortion...
- Patent number 10,916,405
- Issue date Feb 9, 2021
- TOSHIBA MEMORY CORPORATION
- Takahiro Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for atomic probe tomography
- Patent number 10,903,045
- Issue date Jan 26, 2021
- Imec VZW
- Paul van der Heide
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for using multimodal imaging to determine struc...
- Patent number 10,707,052
- Issue date Jul 7, 2020
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe with vacuum differential
- Patent number 10,614,995
- Issue date Apr 7, 2020
- Cameca Instruments, Inc.
- Thomas F. Kelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for the particle-optical examinatio...
- Patent number 10,535,494
- Issue date Jan 14, 2020
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and method for using multimodal imaging to determine struct...
- Patent number 10,446,368
- Issue date Oct 15, 2019
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detector supplement device for spectroscopy setup
- Patent number 10,366,863
- Issue date Jul 30, 2019
- EMPA Eidgenossische Materialprufungs-und Forschungsanstalt
- Davide Bleiner
- G01 - MEASURING TESTING
Information Patent Grant
Sample chamber device for electron microscope, and electron microsc...
- Patent number 10,312,049
- Issue date Jun 4, 2019
- Korea Research Institute of Standards and Science
- Bok Lae Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for the particle-optical examinatio...
- Patent number 10,163,603
- Issue date Dec 25, 2018
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device
- Patent number 10,157,722
- Issue date Dec 18, 2018
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication of a malleable lamella for correlative atomic-resolutio...
- Patent number 9,797,923
- Issue date Oct 24, 2017
- FEI Company
- Roger Alvis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Near-field optical transmission electron emission microscope
- Patent number 9,653,258
- Issue date May 16, 2017
- Krzysztof Grzelakowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for simultaneous detection of secondary electrons...
- Patent number 9,494,516
- Issue date Nov 15, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of adjusting a stigmator in a particle beam apparatus and a...
- Patent number 9,455,115
- Issue date Sep 27, 2016
- Carl Zeiss Microscopy GmbH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of detecting electrons, an electron-detector and an inspecti...
- Patent number 9,336,982
- Issue date May 10, 2016
- Carl Zeiss Microscopy GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SMS probe and SEM imaging system and methods of use
- Patent number 9,245,722
- Issue date Jan 26, 2016
- Georgia Tech Research Corporation
- Andrei G. Fedorov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample surface inspection apparatus and method
- Patent number 8,674,317
- Issue date Mar 18, 2014
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 8,497,476
- Issue date Jul 30, 2013
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
System and method for localization of large numbers of fluorescent...
- Patent number 8,319,181
- Issue date Nov 27, 2012
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Grant
Combination laser and charged particle beam system
- Patent number 8,314,410
- Issue date Nov 20, 2012
- FEI Company
- Marcus Straw
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection method and electron beam inspection apparatus
- Patent number 8,288,722
- Issue date Oct 16, 2012
- Hitachi, Ltd.
- Masaki Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample surface inspection apparatus and method
- Patent number 8,076,654
- Issue date Dec 13, 2011
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for ultrafast photoelectron microscope
- Patent number 7,915,583
- Issue date Mar 29, 2011
- California Institute of Technology
- Ahmed Zewail
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR
- Publication number 20240395499
- Publication date Nov 28, 2024
- RINKEN
- Takahiro SHIMOJIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION APPARATUS AND INSPECTION METHOD
- Publication number 20230071801
- Publication date Mar 9, 2023
- HITACHI HIGH-TECH CORPORATION
- Momoyo ENYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE
- Publication number 20220139666
- Publication date May 5, 2022
- Centre National de la Recherche Scientifique
- François VURPILLOT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APERTURE DEVICE AND ANALYSER ARRANGEMENT
- Publication number 20220020580
- Publication date Jan 20, 2022
- SCIENTA OMICRON AB
- Peter AMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING THE 3D STRUCTURE OF BIOMOLECULES
- Publication number 20210364525
- Publication date Nov 25, 2021
- Martin Andersson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD OF IMAGING A 2D SAMPLE WITH A MULTI-BEAM PARTICLE MICROSCOPE
- Publication number 20210351001
- Publication date Nov 11, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE
- Publication number 20210313141
- Publication date Oct 7, 2021
- GATAN, INC.
- John Andrew Hunt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR THE PARTICLE-OPTICAL EXAMINATIO...
- Publication number 20210313137
- Publication date Oct 7, 2021
- Carl Zeiss MultiSEM GmbH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20210042943
- Publication date Feb 11, 2021
- Shimadzu Corporation
- Ryuta MATSUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...
- Publication number 20200286711
- Publication date Sep 10, 2020
- Toshiba Memory Corporation
- Takahiro IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF IMAGING A 3D SAMPLE WITH A MULTI-BEAM PARTICLE MICROSCOPE
- Publication number 20200243300
- Publication date Jul 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR THE PARTICLE-OPTICAL EXAMINATIO...
- Publication number 20200098541
- Publication date Mar 26, 2020
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...
- Publication number 20200020507
- Publication date Jan 16, 2020
- Atomnaut Inc.
- Peter V. LIDDICOAT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR THE PARTICLE-OPTICAL EXAMINATIO...
- Publication number 20190122852
- Publication date Apr 25, 2019
- CARL ZEISS MICROSCOPY GMBH
- Dirk Zeidler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...
- Publication number 20190074160
- Publication date Mar 7, 2019
- Atomnaut Inc.
- Peter V. Liddicoat
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTOR SUPPLEMENT DEVICE FOR SPECTROSCOPY SETUP
- Publication number 20180350556
- Publication date Dec 6, 2018
- EMPA Eidgenössische Materialprüfungs- und Forschunsanstalt
- Davide BLEINER
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CHAMBER DEVICE FOR ELECTRON MICROSCOPE, AND ELECTRON MICROSC...
- Publication number 20180158645
- Publication date Jun 7, 2018
- Korea Research Institute of Standards and Science
- Bok Lae CHO
- G02 - OPTICS
Information Patent Application
Near-field Optical Transmission Electron Emission Microscope
- Publication number 20160254120
- Publication date Sep 1, 2016
- Krzysztof Grzelakowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Adjusting a Stigmator in a Particle Beam Apparatus and a...
- Publication number 20160181055
- Publication date Jun 23, 2016
- CARL ZEISS MICROSCOPY GMBH
- Simon Diemer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20160093464
- Publication date Mar 31, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hiroyuki SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation Sensor, and its Application in a Charged-Particle Microscope
- Publication number 20160056015
- Publication date Feb 25, 2016
- FEI Company
- Gerard Nicolaas Anne van Veen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Characterization method for a reservoir micro pore structure and a...
- Publication number 20150371818
- Publication date Dec 24, 2015
- Petrochina Company Limited
- Jianming Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Simultaneous Detection of Secondary Electrons...
- Publication number 20150369737
- Publication date Dec 24, 2015
- FEI Company
- William Parker
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS...
- Publication number 20140131573
- Publication date May 15, 2014
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20140014848
- Publication date Jan 16, 2014
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
Vector Potential Photoelectron Microscope
- Publication number 20120298861
- Publication date Nov 29, 2012
- Raymond Browning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20120235036
- Publication date Sep 20, 2012
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Localization of Large Numbers of Fluorescent...
- Publication number 20120193530
- Publication date Aug 2, 2012
- FEI Company
- N. William Parker
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED METALLIC MICROTIP COUPON STRUCTURE FOR ATOM PROBE TOMOGR...
- Publication number 20120117696
- Publication date May 10, 2012
- International Business Machines Corporation
- Michael Hatzistergos
- B82 - NANO-TECHNOLOGY
Information Patent Application
Laser Atom Probe and Laser Atom Probe Analysis Methods
- Publication number 20120080596
- Publication date Apr 5, 2012
- IMEC
- Wilfried Vandervorst
- H01 - BASIC ELECTRIC ELEMENTS

Emission microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Aperture device and analyzer arrangement

Automated tomography field ion microscope

Apparatus for transmission electron microscopy cathodoluminescence

Particle beam system and method for the particle-optical examinatio...

Method of imaging a 2D sample with a multi-beam particle microscope

Method of imaging a 3D sample with a multi-beam particle microscope

Particle beam system and method for the particle-optical examinatio...

Atom probe inspection device, field ion microscope, and distortion...

Method and apparatus for atomic probe tomography

Systems and methods for using multimodal imaging to determine struc...

Atom probe with vacuum differential

Particle beam system and method for the particle-optical examinatio...

Systems and method for using multimodal imaging to determine struct...

Detector supplement device for spectroscopy setup

Sample chamber device for electron microscope, and electron microsc...

Particle beam system and method for the particle-optical examinatio...

Inspection device

Fabrication of a malleable lamella for correlative atomic-resolutio...

Near-field optical transmission electron emission microscope

System and method for simultaneous detection of secondary electrons...

Method of adjusting a stigmator in a particle beam apparatus and a...

Method of detecting electrons, an electron-detector and an inspecti...

SMS probe and SEM imaging system and methods of use

Sample surface inspection apparatus and method

Inspection device

System and method for localization of large numbers of fluorescent...

Combination laser and charged particle beam system

Electron beam inspection method and electron beam inspection apparatus

Sample surface inspection apparatus and method

Method and system for ultrafast photoelectron microscope

Patents Applicationslast 30 patents

FIVE-DIMENSIONAL ELECTRON MICROSCOPE AND ANALYSIS METHOD THEREFOR

ELECTRON BEAM APPLICATION APPARATUS AND INSPECTION METHOD

AUTOMATED TOMOGRAPHY FIELD ION MICROSCOPE

APERTURE DEVICE AND ANALYSER ARRANGEMENT

METHOD FOR ANALYZING THE 3D STRUCTURE OF BIOMOLECULES

METHOD OF IMAGING A 2D SAMPLE WITH A MULTI-BEAM PARTICLE MICROSCOPE

APPARATUS FOR TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE

PARTICLE BEAM SYSTEM AND METHOD FOR THE PARTICLE-OPTICAL EXAMINATIO...

SCANNING ELECTRON MICROSCOPE

ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...

METHOD OF IMAGING A 3D SAMPLE WITH A MULTI-BEAM PARTICLE MICROSCOPE

PARTICLE BEAM SYSTEM AND METHOD FOR THE PARTICLE-OPTICAL EXAMINATIO...

SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...

PARTICLE BEAM SYSTEM AND METHOD FOR THE PARTICLE-OPTICAL EXAMINATIO...

SYSTEMS AND METHODS FOR USING MULTIMODAL IMAGING TO DETERMINE STRUC...

DETECTOR SUPPLEMENT DEVICE FOR SPECTROSCOPY SETUP

SAMPLE CHAMBER DEVICE FOR ELECTRON MICROSCOPE, AND ELECTRON MICROSC...

Near-field Optical Transmission Electron Emission Microscope

Method of Adjusting a Stigmator in a Particle Beam Apparatus and a...

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

Radiation Sensor, and its Application in a Charged-Particle Microscope

Characterization method for a reservoir micro pore structure and a...

System and Method for Simultaneous Detection of Secondary Electrons...

SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS...

INSPECTION DEVICE

Vector Potential Photoelectron Microscope

INSPECTION DEVICE

System and Method for Localization of Large Numbers of Fluorescent...

INTEGRATED METALLIC MICROTIP COUPON STRUCTURE FOR ATOM PROBE TOMOGR...

Laser Atom Probe and Laser Atom Probe Analysis Methods