Emission microscopes

Industry

CPC
H01J2237/2812

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2812Emission microscopes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Correlation between emission spots utilizing CAD data in combinatio...
- Patent number 11,561,256
- Issue date Jan 24, 2023
- Synopsys, Inc.
- Ankush Bharati Oberai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle beam microscopy
- Patent number 9,997,331
- Issue date Jun 12, 2018
- Mochii, Inc.
- Christopher Su-Yan Own
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 9,966,226
- Issue date May 8, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection system and methods of inspecting a semicon...
- Patent number 9,455,121
- Issue date Sep 27, 2016
- Samsung Electronics Co., Ltd.
- Hyunwoo Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for sample extraction and handling
- Patent number 9,349,570
- Issue date May 24, 2016
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,236,225
- Issue date Jan 12, 2016
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,012,867
- Issue date Apr 21, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,748,845
- Issue date Jun 10, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample surface inspection apparatus and method
- Patent number 8,674,317
- Issue date Mar 18, 2014
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sample extraction and handling
- Patent number 8,357,913
- Issue date Jan 22, 2013
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,110,814
- Issue date Feb 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample surface inspection apparatus and method
- Patent number 8,076,654
- Issue date Dec 13, 2011
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,786,451
- Issue date Aug 31, 2010
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoelectron microscope
- Patent number 7,718,961
- Issue date May 18, 2010
- Raymond Browning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,358
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,361
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,360
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,359
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,554,096
- Issue date Jun 30, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,554,097
- Issue date Jun 30, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,521,693
- Issue date Apr 21, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,518,122
- Issue date Apr 14, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,511,280
- Issue date Mar 31, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,511,279
- Issue date Mar 31, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,504,639
- Issue date Mar 17, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,495,232
- Issue date Feb 24, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,488,952
- Issue date Feb 10, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,485,873
- Issue date Feb 3, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample surface inspection apparatus and method
- Patent number 7,391,036
- Issue date Jun 24, 2008
- Ebara Corporation
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Grant
3504175
- Patent number 3,504,175
- Issue date Mar 31, 1970
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE
- Publication number 20240249911
- Publication date Jul 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Teruo KOHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON GUN AND ELECTRON MICROSCOPE
- Publication number 20230298847
- Publication date Sep 21, 2023
- KLA Corporation
- Yung-Ho Alex Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Correlation between Emission Spots Utilizing CAD Data in Combinatio...
- Publication number 20210199714
- Publication date Jul 1, 2021
- Synopsys, Inc.
- Ankush Bharati OBERAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION SYSTEM AND METHODS OF INSPECTING A SEMICON...
- Publication number 20160086769
- Publication date Mar 24, 2016
- Hyunwoo KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope And Methods Of Inspecting And Reviewin...
- Publication number 20160064184
- Publication date Mar 3, 2016
- KLA-Tencor Corporation
- David L. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Sample Extraction and Handling
- Publication number 20150311034
- Publication date Oct 29, 2015
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20150262788
- Publication date Sep 17, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY ELECTRON OPTICS AND DETECTION DEVICE
- Publication number 20150228452
- Publication date Aug 13, 2015
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan LANIO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20140306121
- Publication date Oct 16, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
SECONDARY ELECTRON OPTICS AND DETECTION DEVICE
- Publication number 20140175277
- Publication date Jun 26, 2014
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
- Stefan Lanio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20140131575
- Publication date May 15, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
- Publication number 20130153785
- Publication date Jun 20, 2013
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20120141693
- Publication date Jun 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
SAMPLE SURFACE INSPECTION APPARATUS AND METHOD
- Publication number 20120049063
- Publication date Mar 1, 2012
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
- Publication number 20100305747
- Publication date Dec 2, 2010
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Application
LASER ATOM PROBES
- Publication number 20100294928
- Publication date Nov 25, 2010
- Imago AScientific Instruments Corporation
- Joseph Hale Bunton
- B82 - NANO-TECHNOLOGY
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20090179161
- Publication date Jul 16, 2009
- ALIS Corporation
- BILLY W. WARD
- B82 - NANO-TECHNOLOGY
Information Patent Application
Sample surface inspection apparatus and method
- Publication number 20080265159
- Publication date Oct 30, 2008
- EBARA CORPORATION
- Masahiro Hatakeyama
- G01 - MEASURING TESTING
Information Patent Application
Ion sources, systems and methods
- Publication number 20070221843
- Publication date Sep 27, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070210250
- Publication date Sep 13, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070210251
- Publication date Sep 13, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070205375
- Publication date Sep 6, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194251
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194226
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070187621
- Publication date Aug 16, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158555
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158556
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158558
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158557
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158580
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY

Emission microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Correlation between emission spots utilizing CAD data in combinatio...

Charged-particle beam microscopy

Cross-section processing and observation method and cross-section p...

Semiconductor inspection system and methods of inspecting a semicon...

Method and apparatus for sample extraction and handling

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Sample surface inspection apparatus and method

Method and apparatus for sample extraction and handling

Ion sources, systems and methods

Sample surface inspection apparatus and method

Ion sources, systems and methods

Photoelectron microscope

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Sample surface inspection apparatus and method

3504175

Patents Applicationslast 30 patents

SPIN-POLARIZED SCANNING ELECTRON MICROSCOPE

ELECTRON GUN AND ELECTRON MICROSCOPE

Correlation between Emission Spots Utilizing CAD Data in Combinatio...

SEMICONDUCTOR INSPECTION SYSTEM AND METHODS OF INSPECTING A SEMICON...

Scanning Electron Microscope And Methods Of Inspecting And Reviewin...

Method and Apparatus for Sample Extraction and Handling

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

SECONDARY ELECTRON OPTICS AND DETECTION DEVICE

ION SOURCES, SYSTEMS AND METHODS

SECONDARY ELECTRON OPTICS AND DETECTION DEVICE

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING

ION SOURCES, SYSTEMS AND METHODS

SAMPLE SURFACE INSPECTION APPARATUS AND METHOD

METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING

LASER ATOM PROBES

ION SOURCES, SYSTEMS AND METHODS

Sample surface inspection apparatus and method

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods