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Energy-dispersive (Si-Li type) spectrometer
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H01J2237/2442
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ELECTRICITY
H01
Electric elements
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ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J2237/00
Discharge tubes exposing object to beam
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H01J2237/2442
Energy-dispersive (Si-Li type) spectrometer
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Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device
Patent number
12,094,980
Issue date
Sep 17, 2024
Japan Display Inc.
Tatsuya Toda
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radiation detector and radiation detection apparatus
Patent number
11,444,213
Issue date
Sep 13, 2022
Fondazione Bruno Kessler
Antonino Picciotto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-resolution x-ray spectroscopy surface material analysis
Patent number
11,404,244
Issue date
Aug 2, 2022
Applied Materials Israel Ltd.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of examining a sample using a charged particle microscope
Patent number
11,002,692
Issue date
May 11, 2021
FEI Company
Tomas Tuma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nanostructured carbon materials and methods of making and use thereof
Patent number
10,995,000
Issue date
May 4, 2021
Vanderbilt University
Anna Douglas
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus for combined stem and EDS tomography
Patent number
10,890,545
Issue date
Jan 12, 2021
Imec VZW
Hugo Bender
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam apparatus, observation method using charged p...
Patent number
10,763,074
Issue date
Sep 1, 2020
HITACHI HIGH-TECH CORPORATION
Hiroyuki Chiba
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Handheld material analyser
Patent number
10,712,296
Issue date
Jul 14, 2020
ORION ENGINEERING LIMITED
Vladimir Vishnyakov
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for in situ high temperature X-ray spectroscopy...
Patent number
10,656,106
Issue date
May 19, 2020
EDAX, Incorporated
Patrick Paul Camus
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for high energy X-ray detection in electron mic...
Patent number
10,614,997
Issue date
Apr 7, 2020
EDAX, Incorporated
Patrick Paul Camus
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron probe microanalyzer and storage medium
Patent number
10,410,825
Issue date
Sep 10, 2019
Shimadzu Corporation
Hiroshi Sakamae
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-module photon detector and use thereof
Patent number
10,197,514
Issue date
Feb 5, 2019
Bruker Nano GmbH
Meiken Falke
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detector and radiation detection apparatus
Patent number
10,132,941
Issue date
Nov 20, 2018
Horiba, Ltd.
Kengo Yasui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Control device, control method, and analysis system
Patent number
10,121,630
Issue date
Nov 6, 2018
Jeol Ltd.
Kazuhiro Tachibana
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detector and radiation detection apparatus
Patent number
9,857,483
Issue date
Jan 2, 2018
Horiba, Ltd.
Kengo Yasui
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multi-module photon detector and use thereof
Patent number
9,797,848
Issue date
Oct 24, 2017
Bruker Nano GmbH
Meiken Falke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated mineral classification
Patent number
9,778,215
Issue date
Oct 3, 2017
FEI Company
Michael James Owen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sub-pixel analysis and display of fine grained mineral samples
Patent number
9,714,908
Issue date
Jul 25, 2017
FEI Company
Michael James Owen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope and elemental mapping image generation method
Patent number
9,627,175
Issue date
Apr 18, 2017
Jeol Ltd.
Masaki Morita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of acquiring EBSP patterns
Patent number
9,618,463
Issue date
Apr 11, 2017
FEI Company
Marek Uncovský
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectroscopic element and charged particle beam device using the same
Patent number
9,601,308
Issue date
Mar 21, 2017
Hitachi, Ltd.
Yoshihiro Anan
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Semiconductor radiation detector with large active area, and method...
Patent number
9,548,402
Issue date
Jan 17, 2017
Oxford Instruments Analytical Oy
Veikko Kämäräinen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low-interference sensor head for a radiation detector, as well as a...
Patent number
9,299,532
Issue date
Mar 29, 2016
Bruker Nano GmbH
Meiken Falke
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor drift detector and corresponding operating method
Patent number
9,142,702
Issue date
Sep 22, 2015
PNDetector GmbH
Gerhard Lutz
G01 - MEASURING TESTING
Information
Patent Grant
Mounting structures for multi-detector electron microscopes
Patent number
8,993,963
Issue date
Mar 31, 2015
FEI Company
Hanno Sebastian von Harrach
G01 - MEASURING TESTING
Information
Patent Grant
Charged-particle microscopy with occlusion detection
Patent number
8,698,078
Issue date
Apr 15, 2014
FEI Company
Daniel Woodrow Phifer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor head for an x-ray detector and x-ray detector containing sai...
Patent number
8,558,175
Issue date
Oct 15, 2013
Bruker Nano GmbH
Robert Krömer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam systems and methods
Patent number
8,450,215
Issue date
May 28, 2013
Carl Zeiss Microscopy GmbH
Hubert Mantz
G01 - MEASURING TESTING
Information
Patent Grant
X-ray detection system
Patent number
8,421,007
Issue date
Apr 16, 2013
TOHOKU UNIVERSITY
Masami Terauchi
G01 - MEASURING TESTING
Information
Patent Grant
X-ray detector for electron microscope
Patent number
8,410,439
Issue date
Apr 2, 2013
PEI Company
Hanno Sebastian Von Harrach
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ARRAY SUBSTRATE
Publication number
20240429320
Publication date
Dec 26, 2024
Japan Display Inc.
Tatsuya TODA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD TO INVESTIGATE A SEMICONDUCTOR SAMPLE LAYER BY LAYER AND INV...
Publication number
20240404786
Publication date
Dec 5, 2024
Carl Zeiss SMT GMBH
Ivo IHRKE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH-RESOLUTION X-RAY SPECTROSCOPY SURFACE MATERIAL ANALYSIS
Publication number
20220254598
Publication date
Aug 11, 2022
APPLIED MATERIALS ISRAEL LTD.
Yehuda Zur
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20220013668
Publication date
Jan 13, 2022
Japan Display Inc.
Tatsuya TODA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
RADIATION DETECTOR AND RADIATION DETECTION APPARATUS
Publication number
20200183024
Publication date
Jun 11, 2020
FONDAZIONE BRUNO KESSLER
Antonino PICCIOTTO
G01 - MEASURING TESTING
Information
Patent Application
HANDHELD MATERIAL ANALYSER
Publication number
20200088660
Publication date
Mar 19, 2020
ORION ENGINEERING LIMITED
Vladimir VISHNYAKOV
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
Publication number
20200057011
Publication date
Feb 20, 2020
FEI Company
Tomas Tuma
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR COMBINED STEM AND EDS TOMOGRAPHY
Publication number
20190323977
Publication date
Oct 24, 2019
IMEC vzw
Hugo Bender
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NANOSTRUCTURED CARBON MATERIALS AND METHODS OF MAKING AND USE THEREOF
Publication number
20190315624
Publication date
Oct 17, 2019
Vanderbilt University
Anna Douglas
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
SYSTEMS AND METHODS FOR IN SITU HIGH TEMPERATURE X-RAY SPECTROSCOPY...
Publication number
20190242836
Publication date
Aug 8, 2019
EDAX, Incorporated
Patrick Paul Camus
G01 - MEASURING TESTING
Information
Patent Application
ELECTRON PROBE MICROANALYZER AND STORAGE MEDIUM
Publication number
20190006146
Publication date
Jan 3, 2019
Shimadzu Corporation
Hiroshi SAKAMAE
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR AND RADIATION DETECTION APPARATUS
Publication number
20180120456
Publication date
May 3, 2018
HORIBA, Ltd.
Kengo YASUI
G01 - MEASURING TESTING
Information
Patent Application
MULTI-MODULE PHOTON DETECTOR AND USE THEREOF
Publication number
20180038810
Publication date
Feb 8, 2018
BRUKER NANO GMBH
Meiken Falke
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DRIFT DETECTOR AND CORRESPONDING OPERATING METHOD
Publication number
20140332692
Publication date
Nov 13, 2014
PNSENSOR GMBH
Gerhard Lutz
G01 - MEASURING TESTING
Information
Patent Application
Mounting structures for multi-detector electron microscopes
Publication number
20140319347
Publication date
Oct 30, 2014
Hanno Sebastian von Harrach
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTOR, RADIATION DETECTION APPARATUS, AND X-RAY ANALYZER
Publication number
20140124665
Publication date
May 8, 2014
HORIBA, Ltd.
Kengo YASUI
G01 - MEASURING TESTING
Information
Patent Application
X-ray Detector for Electron Microscope
Publication number
20140077080
Publication date
Mar 20, 2014
FEI Company
Hanno Sebastian von Harrach
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DETECTOR FOR ELECTRON MICROSCOPE
Publication number
20130240731
Publication date
Sep 19, 2013
FEI Company
Hanno Sebastian von Harrach
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MATERIAL ANALYSIS BY A FOCUSED ELECTRON BE...
Publication number
20130054153
Publication date
Feb 28, 2013
TESCAN, a.s.
David MOTL
G01 - MEASURING TESTING
Information
Patent Application
CHARGED-PARTICLE MICROSCOPY WITH OCCLUSION DETECTION
Publication number
20120292503
Publication date
Nov 22, 2012
FEI Company
Daniel Woodrow Phifer, JR.
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
X-Ray Detection System
Publication number
20120292508
Publication date
Nov 22, 2012
JEOL Ltd.
Masami Terauchi
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYSER
Publication number
20120273679
Publication date
Nov 1, 2012
OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LTD
Angus Bewick
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH COLLECTION EFFICIENCY X-RAY SPECTROMETER SYSTEM WITH INTEGRATE...
Publication number
20120160999
Publication date
Jun 28, 2012
UChicago Argonne, LLC
Nestor J. Zaluzec
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOW-INTERFERENCE SENSOR HEAD FOR A RADIATION DETECTOR, AS WELL AS A...
Publication number
20120132818
Publication date
May 31, 2012
BRUKER NANO GMBH
Meiken Falke
G01 - MEASURING TESTING
Information
Patent Application
X-ray Detector for Electron Microscope
Publication number
20120074333
Publication date
Mar 29, 2012
FEI Company
Hanno Sebastian von Harrach
G01 - MEASURING TESTING
Information
Patent Application
Sensor head for an x-ray detector and x-ray detector containing sai...
Publication number
20110139987
Publication date
Jun 16, 2011
Bruker Nano BmbH
Robert Krömer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICROCALORIMETRY FOR X-RAY SPECTROSCOPY
Publication number
20110064191
Publication date
Mar 17, 2011
FEI Company
Milos Toth
G01 - MEASURING TESTING
Information
Patent Application
Particle beam systems and methods
Publication number
20110031215
Publication date
Feb 10, 2011
Hubert Mantz
G01 - MEASURING TESTING
Information
Patent Application
Wavelength-dispersive X-ray spectrometer
Publication number
20100284513
Publication date
Nov 11, 2010
JEOL Ltd.
Kazuyasu KAWABE
G01 - MEASURING TESTING
Information
Patent Application
X-RAY DETECTOR FOR ELECTRON MICROSCOPE
Publication number
20100148064
Publication date
Jun 17, 2010
FEI Company
Hanno Sebastian von Harrach
G01 - MEASURING TESTING