Energy spectrometers

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H01J49/44

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/44Energy spectrometers

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for identification of primary immune resistanc...
- Patent number 12,094,587
- Issue date Sep 17, 2024
- Biodesix, Inc.
- Carlos Oliveira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Agnostic compound elution determination
- Patent number 11,953,478
- Issue date Apr 9, 2024
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time of flight mass analyser
- Patent number 11,621,156
- Issue date Apr 4, 2023
- Micromass UK Limited
- Boris Kozlov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for determining energy spectrum of X-ray device
- Patent number 11,437,225
- Issue date Sep 6, 2022
- Shanghai United Imaging Healthcare Co., Ltd.
- Peng Cheng
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Input lens and electron spectrometer
- Patent number 11,404,260
- Issue date Aug 2, 2022
- Jeol Ltd.
- Tatsuya Uchida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass spectrometer and method of mass spectrometry
- Patent number 11,387,094
- Issue date Jul 12, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,361,956
- Issue date Jun 14, 2022
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Variable discriminator threshold for ion detection
- Patent number 11,315,775
- Issue date Apr 26, 2022
- PERKINELMFR HEALTH SCIENCES CANADA, INC.
- William Fisher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,152,201
- Issue date Oct 19, 2021
- Shimadzu Corporation
- Tomoyuki Oshiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer and time-of-flight mass spectromet...
- Patent number 11,120,979
- Issue date Sep 14, 2021
- Kioxia Corporation
- Jun Asakawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometry method and device for detecting ionising radiation for...
- Patent number 11,056,333
- Issue date Jul 6, 2021
- ICOHUP
- Gaël Patton
- G01 - MEASURING TESTING
Information Patent Grant
Hard X-ray photoelectron spectroscopy system
- Patent number 11,002,693
- Issue date May 11, 2021
- SCIENTA OMICRON AB
- Tomas Wiell
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 10,991,566
- Issue date Apr 27, 2021
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EELS detection technique in an electron microscope
- Patent number 10,832,901
- Issue date Nov 10, 2020
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Closed path ion mobility spectrometer having a common ion inlet and...
- Patent number 10,788,453
- Issue date Sep 29, 2020
- The Trustees of Indiana University
- David E. Clemmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission charged particle microscope with improved EELS/EFTEM m...
- Patent number 10,559,448
- Issue date Feb 11, 2020
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid ion mobility spectrometer
- Patent number 10,234,423
- Issue date Mar 19, 2019
- Indiana University Research and Technology Corporation
- David E. Clemmer
- G01 - MEASURING TESTING
Information Patent Grant
Method of mass spectrometry and a mass spectrometer
- Patent number 10,153,145
- Issue date Dec 11, 2018
- Micromass UK Limited
- Emmanuelle Claude
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectrometer
- Patent number 9,997,346
- Issue date Jun 12, 2018
- MB Scientific AB
- Peter Baltzer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting time-of-flight mass spectrometer with axial pulsed...
- Patent number 9,984,863
- Issue date May 29, 2018
- Leco Corporation
- Anatoly N. Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron spectrometer and measurement method
- Patent number 9,613,790
- Issue date Apr 4, 2017
- Jeol Ltd.
- Yasuhide Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monochromator and charged particle apparatus including the same
- Patent number 9,425,022
- Issue date Aug 23, 2016
- Korea Research Institute of Standards and Science
- Takashi Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Integrated hydrocarbon analysis
- Patent number 9,417,220
- Issue date Aug 16, 2016
- ExxonMobil Research and Engineering Company
- Frank C. Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for improving characteristic peak signals in anal...
- Patent number 9,406,496
- Issue date Aug 2, 2016
- Universitat de Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometry apparatus and methods
- Patent number 8,975,579
- Issue date Mar 10, 2015
- Ilika Technologies Limited
- David Bream
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sequential radial mirror analyser
- Patent number 8,723,114
- Issue date May 13, 2014
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 8,704,162
- Issue date Apr 22, 2014
- Shimadzu Corporation
- Tohru Shiohama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion energy analyzer and methods of manufacturing and operating
- Patent number 7,875,859
- Issue date Jan 25, 2011
- Tokyo Electron Limited
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Two-grid ion energy analyzer and methods of manufacturing and opera...
- Patent number 7,777,179
- Issue date Aug 17, 2010
- Tokyo Electron Limited
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Velocity imaging tandem mass spectrometer
- Patent number 7,534,996
- Issue date May 19, 2009
- Wayne State University
- Arthur Suits
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE SPECTROMETER
- Publication number 20240331993
- Publication date Oct 3, 2024
- SCIENTA OMICRON AB
- Patrik KARLSSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS Auto-Alignment Using Full Image Simulation
- Publication number 20240194466
- Publication date Jun 13, 2024
- FEI Company
- Peter Christiaan Tiemeijer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Agnostic Compound Elution Determination
- Publication number 20220187260
- Publication date Jun 16, 2022
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210233761
- Publication date Jul 29, 2021
- Shimadzu Corporation
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR IDENTIFICATION OF PRIMARY IMMUNE RESISTANC...
- Publication number 20210118538
- Publication date Apr 22, 2021
- BIODESIX, INC.
- Carlos Oliveira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Input Lens and Electron Spectrometer
- Publication number 20210098244
- Publication date Apr 1, 2021
- JEOL Ltd.
- Tatsuya Uchida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HARD X-RAY PHOTOELECTRON SPECTROSCOPY SYSTEM
- Publication number 20210010960
- Publication date Jan 14, 2021
- SCIENTA OMICRON AB
- Tomas WIELL
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING ENERGY SPECTRUM OF X-RAY DEVICE
- Publication number 20200176237
- Publication date Jun 4, 2020
- Shanghai United Imaging Healthcare Co., Ltd.
- Peng CHENG
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Spectrometry method and device for detecting ionising radiation for...
- Publication number 20200075309
- Publication date Mar 5, 2020
- ICOHUP
- Gaël PATTON
- G01 - MEASURING TESTING
Information Patent Application
HYBRID ION MOBILITY SPECTROMETER
- Publication number 20190360964
- Publication date Nov 28, 2019
- Indiana University Research and Technology Corporation
- David E. Clemmer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE
- Publication number 20190341243
- Publication date Nov 7, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH IMPROVED EELS/EFTEM M...
- Publication number 20190180973
- Publication date Jun 13, 2019
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID ION MOBILITY SPECTROMETER
- Publication number 20170307565
- Publication date Oct 26, 2017
- Indiana University Research and Technology Corporation
- David E. Clemmer
- G01 - MEASURING TESTING
Information Patent Application
Method Of Mass Spectrometry And A Mass Spectrometer
- Publication number 20170207072
- Publication date Jul 20, 2017
- Micromass UK Limited
- Emmanuelle Claude
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTABLE AERODYNAMIC LENS SYSTEM FOR AERODYNAMIC FOCUSING OF AERO...
- Publication number 20170047215
- Publication date Feb 16, 2017
- NATIONAL SUN YAT-SEN UNIVERSITY
- Chia-Chen Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE DIELECTRIC LAYER THICKNESS AND DOPANT MEASURING METHOD
- Publication number 20160372385
- Publication date Dec 22, 2016
- GLOBALFOUNDRIES INC.
- Kriteshwar K. Kohli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MONOCHROMATOR AND CHARGED PARTICLE APPARATUS INCLUDING THE SAME
- Publication number 20150371811
- Publication date Dec 24, 2015
- Korea Research Institute of Standards and Science
- Takashi OGAWA
- G01 - MEASURING TESTING
Information Patent Application
AUGER ELEMENTAL IDENTIFICATION ALGORITHM
- Publication number 20130341504
- Publication date Dec 26, 2013
- KLA -TENCOR CORPORATION,
- Mark Neill
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...
- Publication number 20130240728
- Publication date Sep 19, 2013
- Universitat De Barcelona
- Sonia Estrade Albiol
- G01 - MEASURING TESTING
Information Patent Application
Time-of-Flight Electron Energy Analyzer
- Publication number 20130126727
- Publication date May 23, 2013
- The Regents of the University of California
- Christopher Jozwiak
- G01 - MEASURING TESTING
Information Patent Application
SEQUENTIAL RADIAL MIRROR ANALYSER
- Publication number 20130126730
- Publication date May 23, 2013
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY APPARATUS AND METHODS
- Publication number 20120318972
- Publication date Dec 20, 2012
- David Bream
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ENERGY ANALYZER AND METHODS OF MANUFACTURING AND OPERATING
- Publication number 20090242790
- Publication date Oct 1, 2009
- TOKYO ELECTRON LIMITED
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two-grid ion energy analyzer and methods of manufacturing and opera...
- Publication number 20090242791
- Publication date Oct 1, 2009
- TOKYO ELECTRON LIMITED
- Lee Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Velocity Imaging Tandem Mass Spectrometer
- Publication number 20080001080
- Publication date Jan 3, 2008
- Wayne State University
- Arthur Suits
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spectroscopy instrument using broadband modulation and statistical...
- Publication number 20060178844
- Publication date Aug 10, 2006
- Lawrence J. LeGore
- G01 - MEASURING TESTING
Information Patent Application
Ion-optical phase volume compression
- Publication number 20050274902
- Publication date Dec 15, 2005
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RF quadrupole systems with potential gradients
- Publication number 20050274887
- Publication date Dec 15, 2005
- Bruker Daltonik GmbH
- Gerhard Weiss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Fabrication of chopper for particle beam instrument
- Publication number 20050102829
- Publication date May 19, 2005
- University of Maine
- Nicholas LeCursi
- G01 - MEASURING TESTING
Information Patent Application
Spectroscopy instrument using broadband modulation and statistical...
- Publication number 20050086026
- Publication date Apr 21, 2005
- University of Maine
- Lawrence J. LeGore
- G01 - MEASURING TESTING

Energy spectrometers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus and method for identification of primary immune resistanc...

Agnostic compound elution determination

Multi-reflecting time of flight mass analyser

Method and system for determining energy spectrum of X-ray device

Input lens and electron spectrometer

Time of flight mass spectrometer and method of mass spectrometry

Time-of-flight mass spectrometer

Variable discriminator threshold for ion detection

Time-of-flight mass spectrometer

Time-of-flight mass spectrometer and time-of-flight mass spectromet...

Spectrometry method and device for detecting ionising radiation for...

Hard X-ray photoelectron spectroscopy system

Time-of-flight mass spectrometer

EELS detection technique in an electron microscope

Closed path ion mobility spectrometer having a common ion inlet and...

Transmission charged particle microscope with improved EELS/EFTEM m...

Hybrid ion mobility spectrometer

Method of mass spectrometry and a mass spectrometer

Electron spectrometer

Multi-reflecting time-of-flight mass spectrometer with axial pulsed...

Electron spectrometer and measurement method

Monochromator and charged particle apparatus including the same

Integrated hydrocarbon analysis

Method and system for improving characteristic peak signals in anal...

Mass spectrometry apparatus and methods

Sequential radial mirror analyser

Mass spectrometer

Ion energy analyzer and methods of manufacturing and operating

Two-grid ion energy analyzer and methods of manufacturing and opera...

Velocity imaging tandem mass spectrometer

Patents Applicationslast 30 patents

CHARGED PARTICLE SPECTROMETER

EELS Auto-Alignment Using Full Image Simulation

Agnostic Compound Elution Determination

TIME-OF-FLIGHT MASS SPECTROMETER

APPARATUS AND METHOD FOR IDENTIFICATION OF PRIMARY IMMUNE RESISTANC...

Input Lens and Electron Spectrometer

HARD X-RAY PHOTOELECTRON SPECTROSCOPY SYSTEM

METHOD AND SYSTEM FOR DETERMINING ENERGY SPECTRUM OF X-RAY DEVICE

Spectrometry method and device for detecting ionising radiation for...

HYBRID ION MOBILITY SPECTROMETER

EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE

TRANSMISSION CHARGED PARTICLE MICROSCOPE WITH IMPROVED EELS/EFTEM M...

HYBRID ION MOBILITY SPECTROMETER

Method Of Mass Spectrometry And A Mass Spectrometer

ADJUSTABLE AERODYNAMIC LENS SYSTEM FOR AERODYNAMIC FOCUSING OF AERO...

NON-DESTRUCTIVE DIELECTRIC LAYER THICKNESS AND DOPANT MEASURING METHOD

MONOCHROMATOR AND CHARGED PARTICLE APPARATUS INCLUDING THE SAME

AUGER ELEMENTAL IDENTIFICATION ALGORITHM

METHOD AND SYSTEM FOR IMPROVING CHARACTERISTIC PEAK SIGNALS IN ANAL...

Time-of-Flight Electron Energy Analyzer

SEQUENTIAL RADIAL MIRROR ANALYSER

MASS SPECTROMETRY APPARATUS AND METHODS

ION ENERGY ANALYZER AND METHODS OF MANUFACTURING AND OPERATING

Two-grid ion energy analyzer and methods of manufacturing and opera...

Velocity Imaging Tandem Mass Spectrometer

Spectroscopy instrument using broadband modulation and statistical...

Ion-optical phase volume compression

RF quadrupole systems with potential gradients

Fabrication of chopper for particle beam instrument

Spectroscopy instrument using broadband modulation and statistical...