Environmental cells

Industry

CPC
H01J2237/2003

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2003Environmental cells

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble int...
- Patent number 11,961,702
- Issue date Apr 16, 2024
- Saudi Arabian Oil Company
- Hassan Alqahtani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Build material handling unit for a powder module for an apparatus f...
- Patent number 11,878,463
- Issue date Jan 23, 2024
- CONCEPT LASER GMBH
- Dominik Eideloth
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Multidimensional printer
- Patent number 11,738,312
- Issue date Aug 29, 2023
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Andrei A. Kolmakov
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
MEMS frame heating platform for electron imagable fluid reservoirs...
- Patent number 11,170,968
- Issue date Nov 9, 2021
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- G01 - MEASURING TESTING
Information Patent Grant
Transmission electron microscope specimen and method of manufacturi...
- Patent number 10,804,071
- Issue date Oct 13, 2020
- National Chiao Tung University
- Wen-Wei Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMs frame heating platform for electron imagable fluid reservoirs...
- Patent number 10,777,380
- Issue date Sep 15, 2020
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cell for electrochemical measurement
- Patent number 10,718,731
- Issue date Jul 21, 2020
- Toyota Jidosha Kabushiki Kaisha
- Shinya Nagashima
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting a sample using an assembly comprising a scann...
- Patent number 10,651,009
- Issue date May 12, 2020
- DELMIC IP B.V.
- Jacob Pieter Hoogenboom
- G02 - OPTICS
Information Patent Grant
Examination container and electron microscope
- Patent number 10,607,808
- Issue date Mar 31, 2020
- TAIWAN ELECTRON MICROSCOPE INSTRUMENT CORPORATION
- Tsu-Wei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for enabling modular part replacement within an electron mic...
- Patent number 10,586,679
- Issue date Mar 10, 2020
- PROTOCHIPS, INC.
- Daniel Stephen Gardiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical cell and method of producing the same
- Patent number 10,504,688
- Issue date Dec 10, 2019
- Honda Motor Co., Ltd.
- Takanori Maebashi
- G01 - MEASURING TESTING
Information Patent Grant
MEMs frame heating platform for electron imagable fluid reservoirs...
- Patent number 10,446,363
- Issue date Oct 15, 2019
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation support unit for charged particle microscope and sample...
- Patent number 10,431,416
- Issue date Oct 1, 2019
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for optimizing fluid flow across a sample within an electron...
- Patent number 10,373,800
- Issue date Aug 6, 2019
- Protochips, Inc.
- Daniel Stephen Gardiner
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Ion beam device and sample observation method
- Patent number 10,340,117
- Issue date Jul 2, 2019
- Hitachi, Ltd.
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wide field atmospheric scanning electron microscope
- Patent number 10,262,832
- Issue date Apr 16, 2019
- Gerasimos Daniel Danilatos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an electrical connection to a sample support in...
- Patent number 10,256,563
- Issue date Apr 9, 2019
- Protochips, Inc.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, sample observation method, sample pla...
- Patent number 10,241,062
- Issue date Mar 26, 2019
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope sample holder for forming a gas or liquid cell...
- Patent number 10,192,714
- Issue date Jan 29, 2019
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMs frame heating platform for electron imagable fluid reservoirs...
- Patent number 10,128,079
- Issue date Nov 13, 2018
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample holder for charged particle...
- Patent number 10,068,745
- Issue date Sep 4, 2018
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope sample holder for forming a gas or liquid cell...
- Patent number 10,043,633
- Issue date Aug 7, 2018
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for enabling modular part replacement within an electron mic...
- Patent number 10,014,154
- Issue date Jul 3, 2018
- PROTOCHIPS, INC.
- Daniel Stephen Gardiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy support structures
- Patent number 9,984,850
- Issue date May 29, 2018
- Protochips, Inc.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microreactor for use in microscopy
- Patent number 9,922,797
- Issue date Mar 20, 2018
- Technische Universiteit Delft
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
User interface for an electron microscope
- Patent number 9,865,427
- Issue date Jan 9, 2018
- FEI Company
- Martinus Petrus Maria Bierhoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming an electrical connection to a sample support in...
- Patent number 9,837,746
- Issue date Dec 5, 2017
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Localized, in-vacuum modification of small structures
- Patent number 9,812,286
- Issue date Nov 7, 2017
- FEI Company
- David H. Narum
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Charged particle beam processing using process gas and cooled surface
- Patent number 9,799,490
- Issue date Oct 24, 2017
- FEI Company
- Aiden Martin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thin-ice grid assembly for cryo-electron microscopy
- Patent number 9,786,469
- Issue date Oct 10, 2017
- University of Washington
- Liguo Wang
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE HOLDER AND ELECTRON MICROSCOPE
- Publication number 20240404781
- Publication date Dec 5, 2024
- Hitachi Ltd.
- Toshiaki TANIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems And Methods For Transferring A Sample
- Publication number 20240112879
- Publication date Apr 4, 2024
- FEI Company
- Maarten Bischoff
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATION OF IN SITU HR-LCTEM NANOFLUIDIC CELL FOR NANOBUBBLE INT...
- Publication number 20230187170
- Publication date Jun 15, 2023
- Saudi Arabian Oil Company
- Hassan Alqahtani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FABRICATING THIN FILM LIQUID CELLS
- Publication number 20230025535
- Publication date Jan 26, 2023
- Universiteit Leiden
- Pauline Marthe Gerardina VAN DEURSEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN CONTROL MEANS FOR PARTICLE BEAM MICROSCOPY
- Publication number 20210285899
- Publication date Sep 16, 2021
- Gerasimos Daniel DANILATOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS...
- Publication number 20200411277
- Publication date Dec 31, 2020
- PROTOCHIPS, INC.
- Franklin Stampley WALDEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS...
- Publication number 20200043697
- Publication date Feb 6, 2020
- PROTOCHIPS, INC.
- Franklin Stampley WALDEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE SPECIMEN AND METHOD OF MANUFACTURI...
- Publication number 20200027691
- Publication date Jan 23, 2020
- NATIONAL CHIAO-TUNG UNIVERSITY
- Wen-Wei WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS...
- Publication number 20190080882
- Publication date Mar 14, 2019
- PROTOCHIPS, INC.
- Franklin Stampley WALDEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ENABLING MODULAR PART REPLACEMENT WITHIN AN ELECTRON MIC...
- Publication number 20180330915
- Publication date Nov 15, 2018
- PROTOCHIPS, INC.
- Daniel Stephen Gardiner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OPTIMIZING FLUID FLOW ACROSS A SAMPLE WITHIN AN ELECTRON...
- Publication number 20180294138
- Publication date Oct 11, 2018
- PROTOCHIPS, INC.
- Daniel Stephen Gardiner
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN...
- Publication number 20180097307
- Publication date Apr 5, 2018
- PROTOCHIPS, INC.
- John DAMIANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL...
- Publication number 20170278670
- Publication date Sep 28, 2017
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROREACTOR FOR USE IN MICROSCOPY
- Publication number 20170236685
- Publication date Aug 17, 2017
- Technische Universiteit Delft
- Hendrik Willem Zandbergen
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS...
- Publication number 20170062177
- Publication date Mar 2, 2017
- PROTOCHIPS, INC.
- Franklin Stampley Walden II
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN...
- Publication number 20170054239
- Publication date Feb 23, 2017
- PROTOCHIPS, INC.
- John DAMIANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL...
- Publication number 20170025245
- Publication date Jan 26, 2017
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LOCALIZED, IN-VACUUM MODIFICATION OF SMALL STRUCTURES
- Publication number 20160189920
- Publication date Jun 30, 2016
- FEI Company
- David H. Narum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY SUPPORT STRUCTURES
- Publication number 20160172153
- Publication date Jun 16, 2016
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USER INTERFACE FOR AN ELECTRON MICROSCOPE
- Publication number 20150332891
- Publication date Nov 19, 2015
- FEI Company
- MART PETRUS MARIA BIERHOFF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY SUPPORT STRUCTURES
- Publication number 20150179397
- Publication date Jun 25, 2015
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORTING MEMBER FOR OBSERVING SCANNING ELECTRON MICROSCOPI...
- Publication number 20140346352
- Publication date Nov 27, 2014
- National Institute of Advanced Industrial Science and Technology
- Toshihiko Ogura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR IMAGING ELECTRON MICROSCOPE ENVIRONMENTAL SAMPLE SUPPORT...
- Publication number 20140268321
- Publication date Sep 18, 2014
- PROTOCHIPS, INC.
- John DAMIANO
- G02 - OPTICS
Information Patent Application
METHOD FOR FORMING AN ELECTRICAL CONNECTION TO AN SAMPLE SUPPORT IN...
- Publication number 20140138558
- Publication date May 22, 2014
- PROTOCHIPS, INC.
- John DAMIANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDING APPARATUS FOR ELECTRON MICROSCOPE, AND ELECTRON MICR...
- Publication number 20140042318
- Publication date Feb 13, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR IRRADIATING AN ETEM-SAMPLE WITH LIGHT
- Publication number 20140034829
- Publication date Feb 6, 2014
- Peter Crozier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE SAMPLE HOLDER AND SAMPLE OBSERVATION METHOD
- Publication number 20140014835
- Publication date Jan 16, 2014
- Hitachi High-Technologies Corporation
- Kotaro Hosoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL...
- Publication number 20130264476
- Publication date Oct 10, 2013
- PROTOCHIPS, INC.
- John Damiano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Holder Assembly for Cooperating with an Environmental Cell and an E...
- Publication number 20130213439
- Publication date Aug 22, 2013
- DELFT UNIVERSITY OF TECHNOLOGY
- Hendrik Willem Zandbergen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GRAPHENE-BASED MEMBRANES AS ELECTRON TRANSPARENT WINDOWS FOR AMBIEN...
- Publication number 20130146221
- Publication date Jun 13, 2013
- SOUTHERN ILLINOIS UNIVERSITY CARBONDALE
- Andrei Kolmakov
- B82 - NANO-TECHNOLOGY

Environmental cells

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fabrication of in situ HR-LCTEM nanofluidic cell for nanobubble int...

Build material handling unit for a powder module for an apparatus f...

Multidimensional printer

MEMS frame heating platform for electron imagable fluid reservoirs...

Transmission electron microscope specimen and method of manufacturi...

MEMs frame heating platform for electron imagable fluid reservoirs...

Cell for electrochemical measurement

Method for inspecting a sample using an assembly comprising a scann...

Examination container and electron microscope

Method for enabling modular part replacement within an electron mic...

Analytical cell and method of producing the same

MEMs frame heating platform for electron imagable fluid reservoirs...

Observation support unit for charged particle microscope and sample...

Method for optimizing fluid flow across a sample within an electron...

Ion beam device and sample observation method

Wide field atmospheric scanning electron microscope

Method for forming an electrical connection to a sample support in...

Charged particle beam device, sample observation method, sample pla...

Electron microscope sample holder for forming a gas or liquid cell...

MEMs frame heating platform for electron imagable fluid reservoirs...

Charged particle beam device and sample holder for charged particle...

Electron microscope sample holder for forming a gas or liquid cell...

Method for enabling modular part replacement within an electron mic...

Microscopy support structures

Microreactor for use in microscopy

User interface for an electron microscope

Method for forming an electrical connection to a sample support in...

Localized, in-vacuum modification of small structures

Charged particle beam processing using process gas and cooled surface

Thin-ice grid assembly for cryo-electron microscopy

Patents Applicationslast 30 patents

SAMPLE HOLDER AND ELECTRON MICROSCOPE

Systems And Methods For Transferring A Sample

FABRICATION OF IN SITU HR-LCTEM NANOFLUIDIC CELL FOR NANOBUBBLE INT...

FABRICATING THIN FILM LIQUID CELLS

SPECIMEN CONTROL MEANS FOR PARTICLE BEAM MICROSCOPY

MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS...

MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS...

TRANSMISSION ELECTRON MICROSCOPE SPECIMEN AND METHOD OF MANUFACTURI...

MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS...

METHOD FOR ENABLING MODULAR PART REPLACEMENT WITHIN AN ELECTRON MIC...

METHOD FOR OPTIMIZING FLUID FLOW ACROSS A SAMPLE WITHIN AN ELECTRON...

METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN...

ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL...

MICROREACTOR FOR USE IN MICROSCOPY

MEMS FRAME HEATING PLATFORM FOR ELECTRON IMAGABLE FLUID RESERVOIRS...

METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN...

ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL...

LOCALIZED, IN-VACUUM MODIFICATION OF SMALL STRUCTURES

MICROSCOPY SUPPORT STRUCTURES

USER INTERFACE FOR AN ELECTRON MICROSCOPE

MICROSCOPY SUPPORT STRUCTURES

SAMPLE SUPPORTING MEMBER FOR OBSERVING SCANNING ELECTRON MICROSCOPI...

DEVICE FOR IMAGING ELECTRON MICROSCOPE ENVIRONMENTAL SAMPLE SUPPORT...

METHOD FOR FORMING AN ELECTRICAL CONNECTION TO AN SAMPLE SUPPORT IN...

SAMPLE HOLDING APPARATUS FOR ELECTRON MICROSCOPE, AND ELECTRON MICR...

SYSTEM AND METHOD FOR IRRADIATING AN ETEM-SAMPLE WITH LIGHT

ELECTRON MICROSCOPE SAMPLE HOLDER AND SAMPLE OBSERVATION METHOD

ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL...

Holder Assembly for Cooperating with an Environmental Cell and an E...

GRAPHENE-BASED MEMBRANES AS ELECTRON TRANSPARENT WINDOWS FOR AMBIEN...