Error analysis, representation of errors

Industry

CPC
G11C29/56008

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/56008Error analysis, representation of errors

Industries

Patents Grantslast 30 patents

Information Patent Grant
Analog signals monitoring for functional safety
- Patent number 12,131,792
- Issue date Oct 29, 2024
- Infineon Technologies LLC
- Yoram Betser
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having syndrome generator
- Patent number 12,040,039
- Issue date Jul 16, 2024
- Micron Technology, Inc.
- Kenya Adachi
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 12,032,018
- Issue date Jul 9, 2024
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Test device and test method thereof
- Patent number 11,961,578
- Issue date Apr 16, 2024
- NANYA TECHNOLOGY CORPORATION
- Jyun-Da Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for testing memory
- Patent number 11,929,137
- Issue date Mar 12, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yangyang Dai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error avoidance based on voltage distribution parameters of block f...
- Patent number 11,915,776
- Issue date Feb 27, 2024
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory sub-system including an in-package sequencer to perform erro...
- Patent number 11,869,618
- Issue date Jan 9, 2024
- Micron Technology, Inc.
- Samir Mittal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quick configurable universal register for a configurable integrated...
- Patent number 11,749,368
- Issue date Sep 5, 2023
- Intel Corporation
- Bee Yee Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shared error correction coding circuitry
- Patent number 11,742,047
- Issue date Aug 29, 2023
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 11,624,780
- Issue date Apr 11, 2023
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and associated chip
- Patent number 11,508,452
- Issue date Nov 22, 2022
- Realtek Semiconductor Corporation
- Sheng-Lin Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device, method of testing the same and test sy...
- Patent number 11,501,846
- Issue date Nov 15, 2022
- Samsung Electronics Co., Ltd.
- Sanglok Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Error avoidance based on voltage distribution parameters of block f...
- Patent number 11,443,830
- Issue date Sep 13, 2022
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory test method and related device
- Patent number 11,393,553
- Issue date Jul 19, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE
Information Patent Grant
Estimating an error rate associated with memory
- Patent number 11,334,413
- Issue date May 17, 2022
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system quality integral analysis and configuration
- Patent number 11,335,425
- Issue date May 17, 2022
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hamming-distance analyzer and method for analyzing hamming-distance
- Patent number 11,195,593
- Issue date Dec 7, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory inspecting method and memory inspecting system
- Patent number 11,195,592
- Issue date Dec 7, 2021
- Integrated Silicon Solution Inc.
- PaiLu Dennis Wang
- G11 - INFORMATION STORAGE
Information Patent Grant
Failure analyzing apparatus and failure analyzing method
- Patent number 11,162,995
- Issue date Nov 2, 2021
- TOSHIBA MEMORY CORPORATION
- Yukinobu Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Memory system quality margin analysis and configuration
- Patent number 11,127,479
- Issue date Sep 21, 2021
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Leveraging chip variability
- Patent number 11,107,548
- Issue date Aug 31, 2021
- Microsoft Technology Licensing, LLC
- Benjamin Zorn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory sub-system including an in-package sequencer to perform erro...
- Patent number 10,991,445
- Issue date Apr 27, 2021
- Micron Technology, Inc.
- Samir Mittal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-die ECC with error counter and internal address generation
- Patent number 10,949,296
- Issue date Mar 16, 2021
- Intel Corporation
- John B. Halbert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Artificial intelligence based monitoring of solid state drives and...
- Patent number 10,930,365
- Issue date Feb 23, 2021
- Intel Corporation
- Pavel Poliakov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory chip and test system including the same
- Patent number 10,916,325
- Issue date Feb 9, 2021
- SK Hynix Inc.
- Jae Seok Kang
- G11 - INFORMATION STORAGE
Information Patent Grant
Sorting non-volatile memories
- Patent number 10,886,004
- Issue date Jan 5, 2021
- International Business Machines Corporation
- Jeffrey W. Christensen
- G11 - INFORMATION STORAGE
Information Patent Grant
Receiver equalization and stressed eye testing system
- Patent number 10,859,626
- Issue date Dec 8, 2020
- FutureWei Technologies, Inc.
- Gang Zhao
- G01 - MEASURING TESTING
Information Patent Grant
Methods of testing cell arrays and semiconductor devices executing...
- Patent number 10,847,243
- Issue date Nov 24, 2020
- SK hynix Inc.
- Young Bo Shim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods for reducing chip testing time using trans-threshold correl...
- Patent number 10,840,157
- Issue date Nov 17, 2020
- University of Viriginia Patent Foundation
- Christopher J. Lukas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system quality integral analysis and configuration
- Patent number 10,825,540
- Issue date Nov 3, 2020
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20240355404
- Publication date Oct 24, 2024
- WINBOND ELECTRONICS CORP.
- Yutaka ITO
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER
- Publication number 20240331797
- Publication date Oct 3, 2024
- ETRON TECHNOLOGY, INC.
- Ho-Yin Chen
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY WITH BUILT-IN SYNCHRONOUS-WRITE-THROUGH REDUNDANCY AND ASSOC...
- Publication number 20240312557
- Publication date Sep 19, 2024
- MEDIATEK INC.
- Che-Wei Chou
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME
- Publication number 20240304274
- Publication date Sep 12, 2024
- Samsung Electronics Co., Ltd.
- Jiyong YOO
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...
- Publication number 20240296901
- Publication date Sep 5, 2024
- RENESAS ELECTRONICS CORPORATION
- Takuro NISHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...
- Publication number 20240274222
- Publication date Aug 15, 2024
- Tektronix, Inc.
- Swapnil Jhawar
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM FOR DETECTING MEMORY ERROR, AND DEVICE
- Publication number 20240212783
- Publication date Jun 27, 2024
- KINGTIGER Testing Technology (SZ) Ltd.
- Bosco Chun Sang LAI
- G11 - INFORMATION STORAGE
Information Patent Application
FAILURE ANALYSIS AND DETECTION METHOD FOR MEMORY
- Publication number 20240185944
- Publication date Jun 6, 2024
- Powerchip Semiconductor Manufacturing Corporation
- Chingching Shih
- G11 - INFORMATION STORAGE
Information Patent Application
TEST DEVICE AND TEST METHOD THEREOF
- Publication number 20240079082
- Publication date Mar 7, 2024
- NANYA TECHNOLOGY CORPORATION
- Jyun-Da Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAILURE ANALYSIS METHOD, COMPUTER EQUIPMENT, AND STORAGE MEDIUM
- Publication number 20240071557
- Publication date Feb 29, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Zhi YANG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE HAVING SYNDROME GENERATOR
- Publication number 20240062843
- Publication date Feb 22, 2024
- Micron Technology, Inc.
- KENYA ADACHI
- G11 - INFORMATION STORAGE
Information Patent Application
System and Method for Receiver Equalization and Stressed Eye Testin...
- Publication number 20230324457
- Publication date Oct 12, 2023
- Huawei Technologies Co., Ltd
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Application
Analog Signals Monitoring for Functional Safety
- Publication number 20230268023
- Publication date Aug 24, 2023
- Infineon Technologies LLC
- Yoram Betser
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...
- Publication number 20230012855
- Publication date Jan 19, 2023
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
SHARED ERROR CORRECTION CODING CIRCUITRY
- Publication number 20220415426
- Publication date Dec 29, 2022
- Micron Technology, Inc.
- Marco Sforzin
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...
- Publication number 20220319630
- Publication date Oct 6, 2022
- Micron Technology, Inc.
- Michael Sheperek
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE, METHOD OF TESTING THE SAME AND TEST SY...
- Publication number 20220076778
- Publication date Mar 10, 2022
- Samsung Electronics Co., Ltd.
- SANGLOK KIM
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY TEST METHOD AND RELATED DEVICE
- Publication number 20210319844
- Publication date Oct 14, 2021
- Changxin Memory Technologies, Inc.
- Chuanqi SHI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY INSPECTING METHOD AND MEMORY INSPECTING SYSTEM
- Publication number 20210257042
- Publication date Aug 19, 2021
- Integrated Silicon Solution Inc.
- PaiLu Dennis WANG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SUB-SYSTEM INCLUDING AN IN-PACKAGE SEQUENCER TO PERFORM ERRO...
- Publication number 20210233601
- Publication date Jul 29, 2021
- Micron Technology, Inc.
- Samir Mittal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM QUALITY INTEGRAL ANALYSIS AND CONFIGURATION
- Publication number 20200411126
- Publication date Dec 31, 2020
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEVERAGING CHIP VARIABILITY
- Publication number 20200342950
- Publication date Oct 29, 2020
- Microsoft Technology Licensing, LLC
- Benjamin Zorn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Receiver Equalization and Stressed Eye Testin...
- Publication number 20200333396
- Publication date Oct 22, 2020
- Huawei Technologies Co., Ltd
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Application
ESTIMATING AN ERROR RATE ASSOCIATED WITH MEMORY
- Publication number 20200159616
- Publication date May 21, 2020
- Micron Technology, Inc.
- Sivagnanam Parthasarathy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Quick Configurable Universal Register for a Configurable Integrated...
- Publication number 20200135289
- Publication date Apr 30, 2020
- Intel Corporation
- Bee Yee Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HAMMING-DISTANCE ANALYZER AND METHOD FOR ANALYZING HAMMING-DISTANCE
- Publication number 20200135294
- Publication date Apr 30, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Lien Linus Lu
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM QUALITY MARGIN ANALYSIS AND CONFIGURATION
- Publication number 20200118640
- Publication date Apr 16, 2020
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200082902
- Publication date Mar 12, 2020
- Kabushiki Kaisha Toshiba
- Junji TAKAHASHI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SUB-SYSTEM INCLUDING AN IN-PACKAGE SEQUENCER TO PERFORM ERRO...
- Publication number 20200082901
- Publication date Mar 12, 2020
- Micron Technology, Inc.
- Samir Mittal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY ENDURANCE MEASURES IN A MEMORY SUB-SYSTEM
- Publication number 20200066364
- Publication date Feb 27, 2020
- Micron Technology, Inc.
- Bruce A. Liikanen
- G06 - COMPUTING CALCULATING COUNTING

Error analysis, representation of errors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Analog signals monitoring for functional safety

Semiconductor device having syndrome generator

System and method for receiver equalization and stressed eye testin...

Test device and test method thereof

Method for testing memory

Error avoidance based on voltage distribution parameters of block f...

Memory sub-system including an in-package sequencer to perform erro...

Quick configurable universal register for a configurable integrated...

Shared error correction coding circuitry

System and method for receiver equalization and stressed eye testin...

Circuit and associated chip

Semiconductor memory device, method of testing the same and test sy...

Error avoidance based on voltage distribution parameters of block f...

Memory test method and related device

Estimating an error rate associated with memory

Memory system quality integral analysis and configuration

Hamming-distance analyzer and method for analyzing hamming-distance

Memory inspecting method and memory inspecting system

Failure analyzing apparatus and failure analyzing method

Memory system quality margin analysis and configuration

Leveraging chip variability

Memory sub-system including an in-package sequencer to perform erro...

On-die ECC with error counter and internal address generation

Artificial intelligence based monitoring of solid state drives and...

Memory chip and test system including the same

Sorting non-volatile memories

Receiver equalization and stressed eye testing system

Methods of testing cell arrays and semiconductor devices executing...

Methods for reducing chip testing time using trans-threshold correl...

Memory system quality integral analysis and configuration

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY DEVICE

MEMORY WITH ELECTRICALLY PROGRAMMABLE FUSES AND RELATED TESTER

MEMORY WITH BUILT-IN SYNCHRONOUS-WRITE-THROUGH REDUNDANCY AND ASSOC...

ELECTRONIC DEVICE INCLUDING DRAM AND METHOD FOR OPERATING THE SAME

SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...

TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIP...

METHOD AND SYSTEM FOR DETECTING MEMORY ERROR, AND DEVICE

FAILURE ANALYSIS AND DETECTION METHOD FOR MEMORY

TEST DEVICE AND TEST METHOD THEREOF

FAILURE ANALYSIS METHOD, COMPUTER EQUIPMENT, AND STORAGE MEDIUM

SEMICONDUCTOR DEVICE HAVING SYNDROME GENERATOR

System and Method for Receiver Equalization and Stressed Eye Testin...

Analog Signals Monitoring for Functional Safety

ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...

SHARED ERROR CORRECTION CODING CIRCUITRY

ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...

SEMICONDUCTOR MEMORY DEVICE, METHOD OF TESTING THE SAME AND TEST SY...

MEMORY TEST METHOD AND RELATED DEVICE

MEMORY INSPECTING METHOD AND MEMORY INSPECTING SYSTEM

MEMORY SUB-SYSTEM INCLUDING AN IN-PACKAGE SEQUENCER TO PERFORM ERRO...

MEMORY SYSTEM QUALITY INTEGRAL ANALYSIS AND CONFIGURATION

LEVERAGING CHIP VARIABILITY

System and Method for Receiver Equalization and Stressed Eye Testin...

ESTIMATING AN ERROR RATE ASSOCIATED WITH MEMORY

Quick Configurable Universal Register for a Configurable Integrated...

HAMMING-DISTANCE ANALYZER AND METHOD FOR ANALYZING HAMMING-DISTANCE

MEMORY SYSTEM QUALITY MARGIN ANALYSIS AND CONFIGURATION

SEMICONDUCTOR DEVICE

MEMORY SUB-SYSTEM INCLUDING AN IN-PACKAGE SEQUENCER TO PERFORM ERRO...

MEMORY ENDURANCE MEASURES IN A MEMORY SUB-SYSTEM