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Information storage
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STATIC STORES
G11C29/00
Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation
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G11C29/56008
Error analysis, representation of errors
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Patents Grants
last 30 patents
Information
Patent Grant
Test device and test method thereof
Patent number
11,961,578
Issue date
Apr 16, 2024
NANYA TECHNOLOGY CORPORATION
Jyun-Da Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for testing memory
Patent number
11,929,137
Issue date
Mar 12, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Yangyang Dai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Error avoidance based on voltage distribution parameters of block f...
Patent number
11,915,776
Issue date
Feb 27, 2024
Micron Technology, Inc.
Michael Sheperek
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory sub-system including an in-package sequencer to perform erro...
Patent number
11,869,618
Issue date
Jan 9, 2024
Micron Technology, Inc.
Samir Mittal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Quick configurable universal register for a configurable integrated...
Patent number
11,749,368
Issue date
Sep 5, 2023
Intel Corporation
Bee Yee Ng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Shared error correction coding circuitry
Patent number
11,742,047
Issue date
Aug 29, 2023
Micron Technology, Inc.
Marco Sforzin
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for receiver equalization and stressed eye testin...
Patent number
11,624,780
Issue date
Apr 11, 2023
Huawei Technologies Co., Ltd.
Gang Zhao
G11 - INFORMATION STORAGE
Information
Patent Grant
Circuit and associated chip
Patent number
11,508,452
Issue date
Nov 22, 2022
Realtek Semiconductor Corporation
Sheng-Lin Lin
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor memory device, method of testing the same and test sy...
Patent number
11,501,846
Issue date
Nov 15, 2022
Samsung Electronics Co., Ltd.
Sanglok Kim
G11 - INFORMATION STORAGE
Information
Patent Grant
Error avoidance based on voltage distribution parameters of block f...
Patent number
11,443,830
Issue date
Sep 13, 2022
Micron Technology, Inc.
Michael Sheperek
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory test method and related device
Patent number
11,393,553
Issue date
Jul 19, 2022
CHANGXIN MEMORY TECHNOLOGIES, INC.
Chuanqi Shi
G11 - INFORMATION STORAGE
Information
Patent Grant
Estimating an error rate associated with memory
Patent number
11,334,413
Issue date
May 17, 2022
Micron Technology, Inc.
Sivagnanam Parthasarathy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory system quality integral analysis and configuration
Patent number
11,335,425
Issue date
May 17, 2022
Micron Technology, Inc.
Bruce A. Liikanen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hamming-distance analyzer and method for analyzing hamming-distance
Patent number
11,195,593
Issue date
Dec 7, 2021
Taiwan Semiconductor Manufacturing Co., Ltd
Shih-Lien Linus Lu
G11 - INFORMATION STORAGE
Information
Patent Grant
Memory inspecting method and memory inspecting system
Patent number
11,195,592
Issue date
Dec 7, 2021
Integrated Silicon Solution Inc.
PaiLu Dennis Wang
G11 - INFORMATION STORAGE
Information
Patent Grant
Failure analyzing apparatus and failure analyzing method
Patent number
11,162,995
Issue date
Nov 2, 2021
TOSHIBA MEMORY CORPORATION
Yukinobu Hayashida
G01 - MEASURING TESTING
Information
Patent Grant
Memory system quality margin analysis and configuration
Patent number
11,127,479
Issue date
Sep 21, 2021
Micron Technology, Inc.
Bruce A. Liikanen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Leveraging chip variability
Patent number
11,107,548
Issue date
Aug 31, 2021
Microsoft Technology Licensing, LLC
Benjamin Zorn
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory sub-system including an in-package sequencer to perform erro...
Patent number
10,991,445
Issue date
Apr 27, 2021
Micron Technology, Inc.
Samir Mittal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
On-die ECC with error counter and internal address generation
Patent number
10,949,296
Issue date
Mar 16, 2021
Intel Corporation
John B. Halbert
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Artificial intelligence based monitoring of solid state drives and...
Patent number
10,930,365
Issue date
Feb 23, 2021
Intel Corporation
Pavel Poliakov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory chip and test system including the same
Patent number
10,916,325
Issue date
Feb 9, 2021
SK Hynix Inc.
Jae Seok Kang
G11 - INFORMATION STORAGE
Information
Patent Grant
Sorting non-volatile memories
Patent number
10,886,004
Issue date
Jan 5, 2021
International Business Machines Corporation
Jeffrey W. Christensen
G11 - INFORMATION STORAGE
Information
Patent Grant
Receiver equalization and stressed eye testing system
Patent number
10,859,626
Issue date
Dec 8, 2020
FutureWei Technologies, Inc.
Gang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Methods of testing cell arrays and semiconductor devices executing...
Patent number
10,847,243
Issue date
Nov 24, 2020
SK hynix Inc.
Young Bo Shim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods for reducing chip testing time using trans-threshold correl...
Patent number
10,840,157
Issue date
Nov 17, 2020
University of Viriginia Patent Foundation
Christopher J. Lukas
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Memory system quality integral analysis and configuration
Patent number
10,825,540
Issue date
Nov 3, 2020
Micron Technology, Inc.
Bruce A. Liikanen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Built-in device testing of integrated circuits
Patent number
10,768,230
Issue date
Sep 8, 2020
International Business Machines Corporation
Robert M. Casatuta
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor device and memory module including the semiconductor...
Patent number
10,768,223
Issue date
Sep 8, 2020
SK hynix Inc.
Yong Seop Kim
G11 - INFORMATION STORAGE
Information
Patent Grant
Leveraging chip variability
Patent number
10,748,640
Issue date
Aug 18, 2020
Microsoft Technology Licensing, LLC
Benjamin Zorn
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
TEST DEVICE AND TEST METHOD THEREOF
Publication number
20240079082
Publication date
Mar 7, 2024
NANYA TECHNOLOGY CORPORATION
Jyun-Da Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FAILURE ANALYSIS METHOD, COMPUTER EQUIPMENT, AND STORAGE MEDIUM
Publication number
20240071557
Publication date
Feb 29, 2024
CHANGXIN MEMORY TECHNOLOGIES, INC.
Zhi YANG
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING SYNDROME GENERATOR
Publication number
20240062843
Publication date
Feb 22, 2024
Micron Technology, Inc.
KENYA ADACHI
G11 - INFORMATION STORAGE
Information
Patent Application
System and Method for Receiver Equalization and Stressed Eye Testin...
Publication number
20230324457
Publication date
Oct 12, 2023
Huawei Technologies Co., Ltd
Gang Zhao
G11 - INFORMATION STORAGE
Information
Patent Application
Analog Signals Monitoring for Functional Safety
Publication number
20230268023
Publication date
Aug 24, 2023
Infineon Technologies LLC
Yoram Betser
G11 - INFORMATION STORAGE
Information
Patent Application
ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...
Publication number
20230012855
Publication date
Jan 19, 2023
Micron Technology, Inc.
Michael Sheperek
G11 - INFORMATION STORAGE
Information
Patent Application
SHARED ERROR CORRECTION CODING CIRCUITRY
Publication number
20220415426
Publication date
Dec 29, 2022
Micron Technology, Inc.
Marco Sforzin
G11 - INFORMATION STORAGE
Information
Patent Application
ERROR AVOIDANCE BASED ON VOLTAGE DISTRIBUTION PARAMETERS OF BLOCK F...
Publication number
20220319630
Publication date
Oct 6, 2022
Micron Technology, Inc.
Michael Sheperek
G11 - INFORMATION STORAGE
Information
Patent Application
SEMICONDUCTOR MEMORY DEVICE, METHOD OF TESTING THE SAME AND TEST SY...
Publication number
20220076778
Publication date
Mar 10, 2022
Samsung Electronics Co., Ltd.
SANGLOK KIM
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY TEST METHOD AND RELATED DEVICE
Publication number
20210319844
Publication date
Oct 14, 2021
Changxin Memory Technologies, Inc.
Chuanqi SHI
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY INSPECTING METHOD AND MEMORY INSPECTING SYSTEM
Publication number
20210257042
Publication date
Aug 19, 2021
Integrated Silicon Solution Inc.
PaiLu Dennis WANG
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY SUB-SYSTEM INCLUDING AN IN-PACKAGE SEQUENCER TO PERFORM ERRO...
Publication number
20210233601
Publication date
Jul 29, 2021
Micron Technology, Inc.
Samir Mittal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY SYSTEM QUALITY INTEGRAL ANALYSIS AND CONFIGURATION
Publication number
20200411126
Publication date
Dec 31, 2020
Micron Technology, Inc.
Bruce A. Liikanen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LEVERAGING CHIP VARIABILITY
Publication number
20200342950
Publication date
Oct 29, 2020
Microsoft Technology Licensing, LLC
Benjamin Zorn
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and Method for Receiver Equalization and Stressed Eye Testin...
Publication number
20200333396
Publication date
Oct 22, 2020
Huawei Technologies Co., Ltd
Gang Zhao
G11 - INFORMATION STORAGE
Information
Patent Application
ESTIMATING AN ERROR RATE ASSOCIATED WITH MEMORY
Publication number
20200159616
Publication date
May 21, 2020
Micron Technology, Inc.
Sivagnanam Parthasarathy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Quick Configurable Universal Register for a Configurable Integrated...
Publication number
20200135289
Publication date
Apr 30, 2020
Intel Corporation
Bee Yee Ng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HAMMING-DISTANCE ANALYZER AND METHOD FOR ANALYZING HAMMING-DISTANCE
Publication number
20200135294
Publication date
Apr 30, 2020
Taiwan Semiconductor Manufacturing Co., Ltd.
Shih-Lien Linus Lu
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY SYSTEM QUALITY MARGIN ANALYSIS AND CONFIGURATION
Publication number
20200118640
Publication date
Apr 16, 2020
Micron Technology, Inc.
Bruce A. Liikanen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20200082902
Publication date
Mar 12, 2020
Kabushiki Kaisha Toshiba
Junji TAKAHASHI
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY SUB-SYSTEM INCLUDING AN IN-PACKAGE SEQUENCER TO PERFORM ERRO...
Publication number
20200082901
Publication date
Mar 12, 2020
Micron Technology, Inc.
Samir Mittal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY ENDURANCE MEASURES IN A MEMORY SUB-SYSTEM
Publication number
20200066364
Publication date
Feb 27, 2020
Micron Technology, Inc.
Bruce A. Liikanen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RECEIVER EQUALIZATION AND STRESSED EYE TESTING SYSTEM
Publication number
20200025824
Publication date
Jan 23, 2020
FutureWei Technologies, Inc.
Gang Zhao
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND MEMORY MODULE INCLUDING THE SEMICONDUCTOR...
Publication number
20190362804
Publication date
Nov 28, 2019
SK HYNIX INC.
Yong Seop KIM
G01 - MEASURING TESTING
Information
Patent Application
NON-CONTACT ELECTRON BEAM PROBING TECHNIQUES AND RELATED STRUCTURES
Publication number
20190355418
Publication date
Nov 21, 2019
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
Information
Patent Application
MEMORY SYSTEM QUALITY MARGIN ANALYSIS AND CONFIGURATION
Publication number
20190355435
Publication date
Nov 21, 2019
Micron Technology, Inc.
Bruce A. Liikanen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEMORY SYSTEM QUALITY INTEGRAL ANALYSIS AND CONFIGURATION
Publication number
20190355434
Publication date
Nov 21, 2019
Micron Technology, Inc.
Bruce A. Liikanen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SORTING NON-VOLATILE MEMORIES
Publication number
20190348144
Publication date
Nov 14, 2019
International Business Machines Corporation
Jeffrey W. Christensen
G11 - INFORMATION STORAGE
Information
Patent Application
NON-CONTACT MEASUREMENT OF MEMORY CELL THRESHOLD VOLTAGE
Publication number
20190341122
Publication date
Nov 7, 2019
Micron Technology, Inc.
Amitava Majumdar
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LEVERAGING CHIP VARIABILITY
Publication number
20190318799
Publication date
Oct 17, 2019
Microsoft Technology Licensing, LLC
Benjamin Zorn
G06 - COMPUTING CALCULATING COUNTING