Execute program as function of deviation from predicted state, result

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CPC
G05B2219/32058

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/32058Execute program as function of deviation from predicted state, result

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and method for explanation of condition predictions in compl...
- Patent number 11,972,178
- Issue date Apr 30, 2024
- FALKONRY INC.
- Gregory Olsen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing design and process analysis system
- Patent number 8,768,500
- Issue date Jul 1, 2014
- Steve W. Tuszynski
- G05 - CONTROLLING REGULATING
Information Patent Grant
Manufacturing design and process analysis system
- Patent number 7,917,234
- Issue date Mar 29, 2011
- Steve W. Tuszynski
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and systems for detecting deviation of a process variable f...
- Patent number 7,657,399
- Issue date Feb 2, 2010
- Fisher-Rosemount Systems, Inc.
- John P. Miller
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System for monitoring and controlling a semiconductor manufacturing...
- Patent number 7,343,217
- Issue date Mar 11, 2008
- Hitachi, Ltd.
- Junichi Tanaka
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 7,324,866
- Issue date Jan 29, 2008
- Matsushita Electric Industrial Co., Ltd.
- Shinichi Imai
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Manufacturing design and process analysis system
- Patent number 7,321,848
- Issue date Jan 22, 2008
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing design and process analysis system
- Patent number 7,187,992
- Issue date Mar 6, 2007
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Manufacturing design and process analysis system
- Patent number 7,072,808
- Issue date Jul 4, 2006
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of monitoring and/or controlling a semiconductor manufacturi...
- Patent number 7,058,470
- Issue date Jun 6, 2006
- Hitachi, Ltd.
- Junichi Tanaka
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor plasma processing apparatus with first and second pro...
- Patent number 6,828,165
- Issue date Dec 7, 2004
- Hitachi, Ltd.
- Junichi Tanaka
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method of monitoring and/or controlling a semiconductor manufacturi...
- Patent number 6,706,543
- Issue date Mar 16, 2004
- Hitachi, Ltd.
- Junichi Tanaka
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Manufacturing design and process analysis system
- Patent number 6,687,558
- Issue date Feb 3, 2004
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of monitoring and/or controlling a semiconductor manufacturi...
- Patent number 6,616,759
- Issue date Sep 9, 2003
- Hitachi, Ltd.
- Junichi Tanaka
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for dynamic model building based on machine di...
- Patent number 6,577,914
- Issue date Jun 10, 2003
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR EXPLANATION OF CONDITION PREDICTIONS IN COMPL...
- Publication number 20190265674
- Publication date Aug 29, 2019
- Falkonry Inc.
- Gregory Olsen
- G05 - CONTROLLING REGULATING
Information Patent Application
Manufacturing Design and Process Analysis System
- Publication number 20110178622
- Publication date Jul 21, 2011
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and systems for detecting deviation of a process variable f...
- Publication number 20080027677
- Publication date Jan 31, 2008
- Fisher-Rosemount Systems, Inc.
- John P. Miller
- G05 - CONTROLLING REGULATING
Information Patent Application
Manufacturing Design and Process Analysis System
- Publication number 20070219657
- Publication date Sep 20, 2007
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of monitoring and/or controlling a semiconductor manufacturi...
- Publication number 20060212156
- Publication date Sep 21, 2006
- Junichi Tanaka
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for manufacturing semiconductor device
- Publication number 20060161288
- Publication date Jul 20, 2006
- Matsushita Electric Industrial Co., Ltd.
- Shinichi Imai
- G05 - CONTROLLING REGULATING
Information Patent Application
Manufacturing design and process analysis system
- Publication number 20050246149
- Publication date Nov 3, 2005
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of monitoring and/or controlling a semiconductor manufacturi...
- Publication number 20050087298
- Publication date Apr 28, 2005
- Junichi Tanaka
- G05 - CONTROLLING REGULATING
Information Patent Application
Manufacturing design and process analysis system
- Publication number 20040167648
- Publication date Aug 26, 2004
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of monitoring and/or controlling a semiconductor manufacturi...
- Publication number 20030199108
- Publication date Oct 23, 2003
- Junichi Tanaka
- G05 - CONTROLLING REGULATING
Information Patent Application
Manufacturing design and process analysis system
- Publication number 20030176938
- Publication date Sep 18, 2003
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Manufacturing design and process analysis system
- Publication number 20030149501
- Publication date Aug 7, 2003
- Steve W. Tuszynski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MONITORING AND/OR CONTROLLING A SEMICONDUCTOR MANUFACTURI...
- Publication number 20030045009
- Publication date Mar 6, 2003
- Junichi Tanaka
- G05 - CONTROLLING REGULATING
Information Patent Application
Method of monitoring and/or controlling a semiconductor manufacturi...
- Publication number 20030045007
- Publication date Mar 6, 2003
- Junichi Tanaka
- G05 - CONTROLLING REGULATING

Execute program as function of deviation from predicted state, result

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for explanation of condition predictions in compl...

Manufacturing design and process analysis system

Manufacturing design and process analysis system

Methods and systems for detecting deviation of a process variable f...

System for monitoring and controlling a semiconductor manufacturing...

Method for manufacturing semiconductor device

Manufacturing design and process analysis system

Manufacturing design and process analysis system

Manufacturing design and process analysis system

Method of monitoring and/or controlling a semiconductor manufacturi...

Semiconductor plasma processing apparatus with first and second pro...

Method of monitoring and/or controlling a semiconductor manufacturi...

Manufacturing design and process analysis system

Method of monitoring and/or controlling a semiconductor manufacturi...

Method and apparatus for dynamic model building based on machine di...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR EXPLANATION OF CONDITION PREDICTIONS IN COMPL...

Manufacturing Design and Process Analysis System

Methods and systems for detecting deviation of a process variable f...

Manufacturing Design and Process Analysis System

Method of monitoring and/or controlling a semiconductor manufacturi...

Method for manufacturing semiconductor device

Manufacturing design and process analysis system

Method of monitoring and/or controlling a semiconductor manufacturi...

Manufacturing design and process analysis system

Method of monitoring and/or controlling a semiconductor manufacturi...

Manufacturing design and process analysis system

Manufacturing design and process analysis system

METHOD OF MONITORING AND/OR CONTROLLING A SEMICONDUCTOR MANUFACTURI...

Method of monitoring and/or controlling a semiconductor manufacturi...