Fault, if one station defect, stop it, other stations take over

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CPC
G05B2219/31355

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

Current Industry

G05B2219/31355Fault, if one station defect, stop it, other stations take over

Industries

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Information Patent Grant
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Fault, if one station defect, stop it, other stations take over

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Facility control system and facility control method

Fail-over system and method for a semiconductor equipment server

Device for controlling processing system, method for controlling pr...

Semiconductor manufacturing process monitoring

Method of achieving high productivity fault tolerant photovoltaic f...

Method of achieving high productivity fault tolerant photovoltaic f...

Method and system for aggregating and combining manufacturing data...

System and method for fabrication backup control

Routing workpieces based upon detecting a fault

Method for monitoring a workpiece during a transportation and/or pr...

Automatic soldering apparatus, apparatus and method for teaching sa...

Method and apparatus for assembling vehicle body

Patents Applicationslast 30 patents

MATRIX PRODUCTION SYSTEM AND CONTROL METHOD THEREOF

Facility Control System and Facility Control Method

METHOD FOR CONTROLLING A SYSTEM

DEVICE FOR CONTROLLING PROCESSING SYSTEM, METHOD FOR CONTROLLING PR...

SEMICONDUCTOR MANUFACTURING PROCESS MONITORING

METHOD OF ACHIEVING HIGH PRODUCTIVITY FAULT TOLERANT PHOTOVOLTAIC F...

METHOD OF ACHIEVING HIGH PRODUCTIVITY FAULT TOLERANT PHOTOVOLTAIC F...

METHOD AND SYSTEM FOR AGGREGATING AND COMBINING MANUFACTURING DATA...

System and method for fabrication backup control

Method and system for aggregating and combining manufacturing data...