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G01Q10/065

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q10/00Scanning or positioning arrangements

Current Industry

G01Q10/065Feedback mechanisms

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 12,055,560
- Issue date Aug 6, 2024
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,965,910
- Issue date Apr 23, 2024
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe system
- Patent number 11,959,936
- Issue date Apr 16, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning probe microscope and binary state scanning probe...
- Patent number 11,860,188
- Issue date Jan 2, 2024
- Industry-Academic Cooperation Foundation, Yonsei University
- Wooyoung Shim
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and method for resonance-enhanced detecti...
- Patent number 11,846,653
- Issue date Dec 19, 2023
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,796,563
- Issue date Oct 24, 2023
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a surface using a scanning probe microscope
- Patent number 11,733,265
- Issue date Aug 22, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Compensating control signal for raster scan of a scanning probe mic...
- Patent number 11,656,244
- Issue date May 23, 2023
- Bruker Nano GmbH
- Wolfgang Dobler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices configured to operated scanning tunneling micro...
- Patent number 11,650,222
- Issue date May 16, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated optimization of AFM light source positioning
- Patent number 11,644,478
- Issue date May 9, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for operating a bending beam in a closed control...
- Patent number 11,630,124
- Issue date Apr 18, 2023
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Phase-shift-based amplitude detector for a high-speed atomic force...
- Patent number 11,549,964
- Issue date Jan 10, 2023
- Cornell University
- Atsushi Miyagi
- G01 - MEASURING TESTING
Information Patent Grant
Method of observing objects using a spinning localized observation
- Patent number 11,460,527
- Issue date Oct 4, 2022
- Vassili Peidous
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope and a method for operating thereof
- Patent number 11,402,404
- Issue date Aug 2, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Jan Jacobus Benjamin Biemond
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and setting method thereof
- Patent number 11,391,755
- Issue date Jul 19, 2022
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
System and method of performing scanning probe microscopy on a subs...
- Patent number 11,320,457
- Issue date May 3, 2022
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy system for and method of mapping nanostru...
- Patent number 11,320,454
- Issue date May 3, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Grant
Phase-shift-based amplitude detector for a high-speed atomic force...
- Patent number 11,243,229
- Issue date Feb 8, 2022
- Cornell University
- Atsushi Miyagi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,237,185
- Issue date Feb 1, 2022
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for a scanning probe microscope and method for sca...
- Patent number 11,156,632
- Issue date Oct 26, 2021
- Bruker Nano GmbH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
AFM with suppressed parasitic signals
- Patent number 11,156,633
- Issue date Oct 26, 2021
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Grant
Methods and devices configured to operated scanning tunneling micro...
- Patent number 11,143,671
- Issue date Oct 12, 2021
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and device of using a scanning probe microscope
- Patent number 11,112,426
- Issue date Sep 7, 2021
- Ecole Polytechnique Federale de Lausanne (EPFL)
- Georg Ernest Fantner
- G01 - MEASURING TESTING
Information Patent Grant
Feedback correction in sub-resonant tapping mode of an atomic force...
- Patent number 11,099,210
- Issue date Aug 24, 2021
- Trustees of Tufts College
- Piers Echols-Jones
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with case and elastic body
- Patent number 11,073,535
- Issue date Jul 27, 2021
- Shimadzu Corporation
- Masato Hirade
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 11,002,757
- Issue date May 11, 2021
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy device, method and lithographic system
- Patent number 10,976,345
- Issue date Apr 13, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Abbas Mohtashami
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe system
- Patent number 10,969,404
- Issue date Apr 6, 2021
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,928,418
- Issue date Feb 23, 2021
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Method of controlling a probe using constant command signals
- Patent number 10,895,584
- Issue date Jan 19, 2021
- CONCEPT SCIENTIFIQUE INSTRUMENTS
- Louis Pacheco
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING...
- Publication number 20240264199
- Publication date Aug 8, 2024
- CESKE VYSOKE UCENI TECHNICKE V PRAZE
- Egor UKRAINTSEV
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20240230709
- Publication date Jul 11, 2024
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...
- Publication number 20240210443
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQU...
- Publication number 20240210444
- Publication date Jun 27, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Gaëlle Charrier
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...
- Publication number 20240110939
- Publication date Apr 4, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20230251284
- Publication date Aug 10, 2023
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20230251285
- Publication date Aug 10, 2023
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
- Publication number 20230030991
- Publication date Feb 2, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...
- Publication number 20230018874
- Publication date Jan 19, 2023
- MOLECULAR VISTA, INC.
- William Morrison
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE SYSTEM
- Publication number 20220390484
- Publication date Dec 8, 2022
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
Probe for Scanning Probe Microscope and Binary State Scanning Probe...
- Publication number 20220308086
- Publication date Sep 29, 2022
- Industry-Academic Cooperation Foundation, Yonsei University
- Wooyoung Shim
- G01 - MEASURING TESTING
Information Patent Application
PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE...
- Publication number 20220260612
- Publication date Aug 18, 2022
- Cornell University
- Atsushi Miyagi
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING
- Publication number 20220244289
- Publication date Aug 4, 2022
- Oxford Instruments Asylum Research, Inc.
- Jason Bemis
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...
- Publication number 20220082583
- Publication date Mar 17, 2022
- Carl Zeiss SMT GMBH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...
- Publication number 20220082582
- Publication date Mar 17, 2022
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD OF PERFORMING SCANNING PROBE MICROSCOPY ON A SUBS...
- Publication number 20210318353
- Publication date Oct 14, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF
- Publication number 20210311090
- Publication date Oct 7, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Jan Jacobus Benjamin BIEMOND
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SETTING METHOD THEREOF
- Publication number 20210293849
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
Measuring Device for a Scanning Probe Microscope and Method for Sca...
- Publication number 20210190818
- Publication date Jun 24, 2021
- BRUKER NANO GMBH
- Wolfgang Dobler
- G01 - MEASURING TESTING
Information Patent Application
PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE...
- Publication number 20210172976
- Publication date Jun 10, 2021
- Cornell University
- Atsushi Miyagi
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...
- Publication number 20210132109
- Publication date May 6, 2021
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring Device for a Scanning Probe Microscope and Method for Sca...
- Publication number 20200400715
- Publication date Dec 24, 2020
- BRUKER NANO GMBH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
AFM with Suppressed Parasitic Signals
- Publication number 20200371134
- Publication date Nov 26, 2020
- Ozgur Sahin
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope
- Publication number 20200341027
- Publication date Oct 29, 2020
- Shimadzu Corporation
- Masato HIRADE
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20200191826
- Publication date Jun 18, 2020
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20200141970
- Publication date May 7, 2020
- INFINITESIMA LIMITED
- Andrew HUMPHRIS
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE CLEANING METHOD, SUBSTRATE CLEANING APPARATUS, SUBSTRATE...
- Publication number 20200116480
- Publication date Apr 16, 2020
- EBARA CORPORATION
- Shohei Shima
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPY SYSTEM FOR AND METHOD OF MAPPING NANOSTRU...
- Publication number 20200116754
- Publication date Apr 16, 2020
- Hamed Sadeghian Marnani
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe System
- Publication number 20200041540
- Publication date Feb 6, 2020
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE
- Publication number 20200025796
- Publication date Jan 23, 2020
- Carl Zeiss SMT GMBH
- Ulrich Matejka
- G01 - MEASURING TESTING

Feedback mechanisms

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automated optimization of AFM light source positioning

Device and method for operating a bending beam in a closed control...

Scanning probe system

Probe for scanning probe microscope and binary state scanning probe...

Scanning probe microscope and method for resonance-enhanced detecti...

Apparatus and method for a scanning probe microscope

Method of imaging a surface using a scanning probe microscope

Compensating control signal for raster scan of a scanning probe mic...

Methods and devices configured to operated scanning tunneling micro...

Automated optimization of AFM light source positioning

Device and method for operating a bending beam in a closed control...

Phase-shift-based amplitude detector for a high-speed atomic force...

Method of observing objects using a spinning localized observation

Scanning probe microscope and a method for operating thereof

Scanning probe microscope and setting method thereof

System and method of performing scanning probe microscopy on a subs...

Scanning probe microscopy system for and method of mapping nanostru...

Phase-shift-based amplitude detector for a high-speed atomic force...

Apparatus and method for a scanning probe microscope

Measuring device for a scanning probe microscope and method for sca...

AFM with suppressed parasitic signals

Methods and devices configured to operated scanning tunneling micro...

Method and device of using a scanning probe microscope

Feedback correction in sub-resonant tapping mode of an atomic force...

Scanning probe microscope with case and elastic body

Method and apparatus of operating a scanning probe microscope

Atomic force microscopy device, method and lithographic system

Scanning probe system

Scanning probe microscope

Method of controlling a probe using constant command signals

Patents Applicationslast 30 patents

A METHOD OF EXAMINING A SAMPLE IN AN ATOMIC FORCE MICROSCOPE USING...

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY...

USE OF SCANNING ELECTROCHEMICAL MICROSCOPY AS A PREDICTIVE TECHNIQU...

AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND...

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE AND METHOD FOR RESONANCE-ENHANCED DETECTI...

SCANNING PROBE SYSTEM

Probe for Scanning Probe Microscope and Binary State Scanning Probe...

PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE...

AUTOMATED OPTIMIZATION OF AFM LIGHT SOURCE POSITIONING

DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL...

METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...

SYSTEM AND METHOD OF PERFORMING SCANNING PROBE MICROSCOPY ON A SUBS...

A SCANNING PROBE MICROSCOPE AND A METHOD FOR OPERATING THEREOF

SCANNING PROBE MICROSCOPE AND SETTING METHOD THEREOF

Measuring Device for a Scanning Probe Microscope and Method for Sca...

PHASE-SHIFT-BASED AMPLITUDE DETECTOR FOR A HIGH-SPEED ATOMIC FORCE...

METHODS AND DEVICES CONFIGURED TO OPERATED SCANNING TUNNELING MICRO...

Measuring Device for a Scanning Probe Microscope and Method for Sca...

AFM with Suppressed Parasitic Signals

Scanning Probe Microscope

Method and Apparatus of Operating a Scanning Probe Microscope

SCANNING PROBE MICROSCOPE

SUBSTRATE CLEANING METHOD, SUBSTRATE CLEANING APPARATUS, SUBSTRATE...

SCANNING PROBE MICROSCOPY SYSTEM FOR AND METHOD OF MAPPING NANOSTRU...

Scanning Probe System

APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE