Field-emission microscopes

Industry

CPC
H01J2237/2623

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2623Field-emission microscopes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Ion source and electron source having single-atom termination struc...
- Patent number 10,529,531
- Issue date Jan 7, 2020
- Hitachi High-Tech Science Corporation
- Chuhei Oshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,236,225
- Issue date Jan 12, 2016
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle sources and methods for manufacturing the same
- Patent number 9,023,226
- Issue date May 5, 2015
- 38th Research Institute, China Electronics Technology Group Corporation
- Huarong Liu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ion sources, systems and methods
- Patent number 9,012,867
- Issue date Apr 21, 2015
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ultra high precision measurement tool
- Patent number 8,785,849
- Issue date Jul 22, 2014
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnick mbH
- Juergen Frosien
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,748,845
- Issue date Jun 10, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,110,814
- Issue date Feb 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,786,451
- Issue date Aug 31, 2010
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,358
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,361
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,360
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,557,359
- Issue date Jul 7, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,554,096
- Issue date Jun 30, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,554,097
- Issue date Jun 30, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,521,693
- Issue date Apr 21, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,518,122
- Issue date Apr 14, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,511,280
- Issue date Mar 31, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,511,279
- Issue date Mar 31, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,504,639
- Issue date Mar 17, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,495,232
- Issue date Feb 24, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,488,952
- Issue date Feb 10, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sources, systems and methods
- Patent number 7,485,873
- Issue date Feb 3, 2009
- ALIS Corporation
- Billy W. Ward
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nano-tip fabrication by spatially controlled etching
- Patent number 7,431,856
- Issue date Oct 7, 2008
- National Research Council of Canada
- Mohamed Rezeq
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20140306121
- Publication date Oct 16, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
PARTICLE SOURCES AND METHODS FOR MANUFACTURING THE SAME
- Publication number 20140077684
- Publication date Mar 20, 2014
- 38th Research Institute, China Electronics Technology Group Corporation
- Huarong Liu
- B82 - NANO-TECHNOLOGY
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20120141693
- Publication date Jun 7, 2012
- ALIS Corporation
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
ULTRA HIGH PRECISION MEASUREMENT TOOL
- Publication number 20090289185
- Publication date Nov 26, 2009
- ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
- Juergen FROSIEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20090179161
- Publication date Jul 16, 2009
- ALIS Corporation
- BILLY W. WARD
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070221843
- Publication date Sep 27, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070210250
- Publication date Sep 13, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070210251
- Publication date Sep 13, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070205375
- Publication date Sep 6, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194251
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070194226
- Publication date Aug 23, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070187621
- Publication date Aug 16, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158555
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158556
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158558
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158557
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158580
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158581
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070158582
- Publication date Jul 12, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ion sources, systems and methods
- Publication number 20070138388
- Publication date Jun 21, 2007
- Billy W. Ward
- B82 - NANO-TECHNOLOGY
Information Patent Application
NANO-TIP FABRICATION BY SPATIALLY CONTROLLED ETCHING
- Publication number 20070025907
- Publication date Feb 1, 2007
- NATIONAL RESEARCH COUNCIL OF CANADA AND UNIVERSITY OF ALBERTA
- Mohamed Rezeq
- G01 - MEASURING TESTING

Field-emission microscopes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ion source and electron source having single-atom termination struc...

Ion sources, systems and methods

Particle sources and methods for manufacturing the same

Ion sources, systems and methods

Ultra high precision measurement tool

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Nano-tip fabrication by spatially controlled etching

Patents Applicationslast 30 patents

ION SOURCES, SYSTEMS AND METHODS

PARTICLE SOURCES AND METHODS FOR MANUFACTURING THE SAME

ION SOURCES, SYSTEMS AND METHODS

ULTRA HIGH PRECISION MEASUREMENT TOOL

ION SOURCES, SYSTEMS AND METHODS

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

Ion sources, systems and methods

NANO-TIP FABRICATION BY SPATIALLY CONTROLLED ETCHING