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G01J2001/242

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for determining a material's characteristics b...
- Patent number 5,270,797
- Issue date Dec 14, 1993
- Brooklyn College Foundation
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a material's characteristics b...
- Patent number 5,260,772
- Issue date Nov 9, 1993
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Method for in-situ determination of the fermi level in GaAs and sim...
- Patent number 5,159,410
- Issue date Oct 27, 1992
- Fred H. Pollak
- G01 - MEASURING TESTING
Information Patent Grant
Photometer
- Patent number 4,737,029
- Issue date Apr 12, 1988
- Tokyo Kogaku Kikai Kabushiki Kaisha
- Kenji Yabusaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents