filters, rotating filter disc

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CPC
G01N2223/313

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/313filters, rotating filter disc

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Patents Grantslast 30 patents

Information Patent Grant
System and method for imaging a subject
- Patent number 12,070,344
- Issue date Aug 27, 2024
- Medtronic Navigation, Inc.
- Patrick A. Helm
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus and method for x-ray fluorescence analysis
- Patent number 12,007,380
- Issue date Jun 11, 2024
- Malvern Panalytical B.V.
- Bruno Vrebos
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluoresence apparatus for a measurement of mineral slurries
- Patent number 11,644,431
- Issue date May 9, 2023
- Microtrace Pty Limited
- Gregory John Roach
- G01 - MEASURING TESTING
Information Patent Grant
Detection scheme for x-ray small angle scattering
- Patent number 11,592,406
- Issue date Feb 28, 2023
- Rensselaer Polytechnic Institute
- Ge Wang
- G01 - MEASURING TESTING
Information Patent Grant
Shutter assembly for x-ray detection
- Patent number 11,577,320
- Issue date Feb 14, 2023
- Thermo Electron Scientific Instruments LLC
- Justin Morrow
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
X-ray filter
- Patent number 11,506,709
- Issue date Nov 22, 2022
- Intel Corporation
- Mario Pacheco
- G01 - MEASURING TESTING
Information Patent Grant
System and method for high-resolution high contrast x-ray ghost dif...
- Patent number 11,402,342
- Issue date Aug 2, 2022
- Bar Ilan University
- Sharon Shwartz
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Detection scheme for x-ray small angle scattering
- Patent number 11,313,814
- Issue date Apr 26, 2022
- Rensselaer Polytechnic Institute
- Ge Wang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method for simultaneously and automatically analyzing microorganism...
- Patent number 11,226,347
- Issue date Jan 18, 2022
- Biotrack Holding B.V.
- Gijsbert Johan Jansen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method, and apparatus for x-ray backscatter inspection of p...
- Patent number 11,169,098
- Issue date Nov 9, 2021
- The Boeing Company
- Morteza Safai
- G01 - MEASURING TESTING
Information Patent Grant
Filter system for the local attenuation of X-radiation, X-ray appar...
- Patent number 11,158,436
- Issue date Oct 26, 2021
- Siemens Healthcare GmbH
- Manfred Ruehrig
- G01 - MEASURING TESTING
Information Patent Grant
Radiation-based thickness gauge
- Patent number 11,079,222
- Issue date Aug 3, 2021
- NDC Technologies Inc.
- Vahe Ghazikhanian
- G01 - MEASURING TESTING
Information Patent Grant
System and method for imaging a subject
- Patent number 11,071,507
- Issue date Jul 27, 2021
- Medtronic Navigation, Inc.
- Patrick A. Helm
- G01 - MEASURING TESTING
Information Patent Grant
Human body security inspection apparatus and method of operating th...
- Patent number 10,983,243
- Issue date Apr 20, 2021
- Tsinghua University
- Zhiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting a power line
- Patent number 10,976,266
- Issue date Apr 13, 2021
- HYDRO-QUEBEC
- Nicolas Pouliot
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Device and method for measuring in-situ time-resolved X-ray absorpt...
- Patent number 10,969,348
- Issue date Apr 6, 2021
- Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Jianda Shao
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle cabin inspection system and method
- Patent number 10,900,911
- Issue date Jan 26, 2021
- SMITHS HEIMANN SAS
- Agathe Brabant
- G01 - MEASURING TESTING
Information Patent Grant
System and method for imaging a subject
- Patent number 10,888,294
- Issue date Jan 12, 2021
- Medtronic Navigation, Inc.
- Patrick A. Helm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for spectral characterization in computed tomogra...
- Patent number 10,859,515
- Issue date Dec 8, 2020
- Carl Zeiss X-ray Microscopy, Inc.
- Zhifeng Huang
- G01 - MEASURING TESTING
Information Patent Grant
High resolution X-Ray imaging system
- Patent number 10,839,972
- Issue date Nov 17, 2020
- Joseph T. Young
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector and X-ray CT apparatus
- Patent number 10,823,684
- Issue date Nov 3, 2020
- Canon Medical Systems Corporation
- Minoru Horinouchi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray phase contrast imaging with fourier transform determination o...
- Patent number 10,801,971
- Issue date Oct 13, 2020
- SHIMADZU CORPORATION
- Naoki Morimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection apparatus and correction method for X-ray inspecti...
- Patent number 10,718,725
- Issue date Jul 21, 2020
- ANRITSU INFIVIS CO., LTD.
- Itaru Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 10,641,718
- Issue date May 5, 2020
- Bruker Handheld LLC
- Brian Scott Parks
- G02 - OPTICS
Information Patent Grant
Method and apparatus for performing multi-energy (including dual en...
- Patent number 10,429,323
- Issue date Oct 1, 2019
- Photo Diagnostic Systems, Inc.
- William A. Worstell
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Dual-energy ray scanning system, scanning method and inspecting system
- Patent number 10,285,252
- Issue date May 7, 2019
- Nuctech Company Limited
- Yu Hu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray filtration
- Patent number 10,082,473
- Issue date Sep 25, 2018
- General Electric Company
- Jed Douglas Pack
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray interferometer
- Patent number 10,074,451
- Issue date Sep 11, 2018
- CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE S.A.—RECHERCHE ET DEVE...
- Christian Kottler
- G01 - MEASURING TESTING
Information Patent Grant
Masks that selectively attentuate radiation for inspection of print...
- Patent number 9,869,643
- Issue date Jan 16, 2018
- Cisco Technology, Inc.
- ShiJie Wen
- G01 - MEASURING TESTING
Information Patent Grant
Backscatter inspection systems, and related methods
- Patent number 9,851,312
- Issue date Dec 26, 2017
- The Boeing Company
- William Talion Edwards
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
System And Method For Imaging A Subject
- Publication number 20240298986
- Publication date Sep 12, 2024
- Medtronic Navigation, Inc.
- Patrick A. HELM
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...
- Publication number 20240019386
- Publication date Jan 18, 2024
- Bruce Kaiser
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS
- Publication number 20230384247
- Publication date Nov 30, 2023
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki TAKAHARA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...
- Publication number 20230375484
- Publication date Nov 23, 2023
- The University of North Carolina at Chapel Hill
- Christina Inscoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AN X-RAY INSPECTION SYSTEM, AN X-RAY IMAGING ACCESSORY, A SAMPLE SU...
- Publication number 20230304946
- Publication date Sep 28, 2023
- Nordson Corporation
- Bill Walker
- G01 - MEASURING TESTING
Information Patent Application
RADIATION IMAGING APPARATUS AND RADIOGRAPHING SYSTEM
- Publication number 20230236138
- Publication date Jul 27, 2023
- Canon Kabushiki Kaisha
- TAKANORI TAYA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING SPECTRAL X-RAY IMAGING USING AN ALTERNATING HIGH VOLTAGE X...
- Publication number 20230152245
- Publication date May 18, 2023
- Teledyne Dalsa B.V.
- Jonathan E. Snyder
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION
- Publication number 20230137186
- Publication date May 4, 2023
- ASML NETHERLANDS B.V.
- Weiming REN
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING
- Publication number 20220221413
- Publication date Jul 14, 2022
- Rensselaer Polytechnic Institute
- Ge Wang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SYSTEM AND METHOD FOR IMAGING A SUBJECT
- Publication number 20210345978
- Publication date Nov 11, 2021
- Medtronic Navigation, Inc.
- Patrick A. HELM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...
- Publication number 20210310967
- Publication date Oct 7, 2021
- The Boeing Company
- Morteza Safai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING
- Publication number 20210080409
- Publication date Mar 18, 2021
- Rensselaer Polytechnic Institute
- Ge Wang
- G01 - MEASURING TESTING
Information Patent Application
FILTER SYSTEM FOR THE LOCAL ATTENUATION OF X-RADIATION, X-RAY APPAR...
- Publication number 20200303085
- Publication date Sep 24, 2020
- Siemens Healthcare GmbH
- Manfred RUEHRIG
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD AND APPARATUS FOR PERFORMING MULTI-ENERGY (INCLUDING DUAL EN...
- Publication number 20200271597
- Publication date Aug 27, 2020
- Photo Diagnostic Systems,Inc,
- William A. Worstell
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RADIATION-BASED THICKNESS GAUGE
- Publication number 20200240776
- Publication date Jul 30, 2020
- NDC Technologies Inc.
- Vahe GHAZIKHANIAN
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Imaging a Subject
- Publication number 20200205764
- Publication date Jul 2, 2020
- Medtronic Navigation, Inc.
- Patrick A. HELM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
System and Method for Imaging a Subject
- Publication number 20200205758
- Publication date Jul 2, 2020
- Medtronic Navigation, Inc.
- Patrick A. HELM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY FILTER
- Publication number 20200166569
- Publication date May 28, 2020
- Intel Corporation
- Mario Pacheco
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR AND X-RAY CT APPARATUS
- Publication number 20200011813
- Publication date Jan 9, 2020
- Canon Medical Systems Corporation
- Minoru HORINOUCHI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING IN-SITU TIME-RESOLVED X-RAY ABSORPT...
- Publication number 20200003706
- Publication date Jan 2, 2020
- Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences
- Jianda SHAO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING A POWER LINE
- Publication number 20190285557
- Publication date Sep 19, 2019
- HYDRO-QUEBEC
- Nicolas POULIOT
- G01 - MEASURING TESTING
Information Patent Application
ANTI-SCATTER FILTER FOR AN X-RAY INSPECTION SYSTEM, X-RAY INSPECTIO...
- Publication number 20180322977
- Publication date Nov 8, 2018
- YXLON INTERNATIONAL GMBH
- Klaus BAVENDIEK
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
High Resolution X-Ray Imaging System
- Publication number 20180277275
- Publication date Sep 27, 2018
- Joseph T. Young
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS
- Publication number 20180128726
- Publication date May 10, 2018
- Industrial Technology Research Institute
- Yen-Liang Lin
- G01 - MEASURING TESTING
Information Patent Application
X-RAY FLUORESCENCE ANALYZER
- Publication number 20180031497
- Publication date Feb 1, 2018
- BRUKER AXS HANDHELD, INC.
- Brian Scott Parks
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SPECTRAL CHARACTERIZATION IN COMPUTED TOMOGRA...
- Publication number 20170276620
- Publication date Sep 28, 2017
- CARL ZEISS X-RAY MICROSCOPY, INC.
- Zhifeng Huang
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR X-RAY MICROSCOPY
- Publication number 20170261442
- Publication date Sep 14, 2017
- Sigray, Inc.
- Wenbing Yun
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING
- Publication number 20140233697
- Publication date Aug 21, 2014
- Konstantin Ignatyev
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DYNAMIC SPECTRAL FILTRATION
- Publication number 20130287164
- Publication date Oct 31, 2013
- Carey Shawn Rogers
- G01 - MEASURING TESTING

filters, rotating filter disc

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for imaging a subject

Apparatus and method for x-ray fluorescence analysis

X-ray fluoresence apparatus for a measurement of mineral slurries

Detection scheme for x-ray small angle scattering

Shutter assembly for x-ray detection

X-ray filter

System and method for high-resolution high contrast x-ray ghost dif...

Detection scheme for x-ray small angle scattering

Method for simultaneously and automatically analyzing microorganism...

System, method, and apparatus for x-ray backscatter inspection of p...

Filter system for the local attenuation of X-radiation, X-ray appar...

Radiation-based thickness gauge

System and method for imaging a subject

Human body security inspection apparatus and method of operating th...

Apparatus and method for inspecting a power line

Device and method for measuring in-situ time-resolved X-ray absorpt...

Vehicle cabin inspection system and method

System and method for imaging a subject

Method and system for spectral characterization in computed tomogra...

High resolution X-Ray imaging system

X-ray detector and X-ray CT apparatus

X-ray phase contrast imaging with fourier transform determination o...

X-ray inspection apparatus and correction method for X-ray inspecti...

X-ray fluorescence analyzer

Method and apparatus for performing multi-energy (including dual en...

Dual-energy ray scanning system, scanning method and inspecting system

X-ray filtration

X-ray interferometer

Masks that selectively attentuate radiation for inspection of print...

Backscatter inspection systems, and related methods

Patents Applicationslast 30 patents

System And Method For Imaging A Subject

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

X-RAY FLUORESCENCE WITH HEAVY ELEMENT TARGET AND METHODS OF USE THE...

X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS

SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...

AN X-RAY INSPECTION SYSTEM, AN X-RAY IMAGING ACCESSORY, A SAMPLE SU...

RADIATION IMAGING APPARATUS AND RADIOGRAPHING SYSTEM

SCANNING SPECTRAL X-RAY IMAGING USING AN ALTERNATING HIGH VOLTAGE X...

SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION

DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING

SYSTEM AND METHOD FOR IMAGING A SUBJECT

SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF P...

DETECTION SCHEME FOR X-RAY SMALL ANGLE SCATTERING

FILTER SYSTEM FOR THE LOCAL ATTENUATION OF X-RADIATION, X-RAY APPAR...

METHOD AND APPARATUS FOR PERFORMING MULTI-ENERGY (INCLUDING DUAL EN...

RADIATION-BASED THICKNESS GAUGE

System and Method for Imaging a Subject

System and Method for Imaging a Subject

X-RAY FILTER

X-RAY DETECTOR AND X-RAY CT APPARATUS

DEVICE AND METHOD FOR MEASURING IN-SITU TIME-RESOLVED X-RAY ABSORPT...

APPARATUS AND METHOD FOR INSPECTING A POWER LINE

ANTI-SCATTER FILTER FOR AN X-RAY INSPECTION SYSTEM, X-RAY INSPECTIO...

High Resolution X-Ray Imaging System

ANALYSIS APPARATUS

X-RAY FLUORESCENCE ANALYZER

METHOD AND SYSTEM FOR SPECTRAL CHARACTERIZATION IN COMPUTED TOMOGRA...

METHOD AND APPARATUS FOR X-RAY MICROSCOPY

X-RAY IMAGING

APPARATUS AND METHOD FOR DYNAMIC SPECTRAL FILTRATION