Fine scanning or positioning

Industry

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G01Q10/04

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Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q10/00Scanning or positioning arrangements

Current Industry

G01Q10/04Fine scanning or positioning

Industries

Patents Grantslast 30 patents

Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,940,461
- Issue date Mar 26, 2024
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever with a collocated piezoelectric actuator-sensor pair
- Patent number 11,852,654
- Issue date Dec 26, 2023
- Board of Regents, The University of Texas System
- Seyed Omid Reza Moheimani
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,796,563
- Issue date Oct 24, 2023
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Integrated dual-probe rapid in-situ switching measurement method an...
- Patent number 11,789,037
- Issue date Oct 17, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing Liu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,764,050
- Issue date Sep 19, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for analyte detection and analysis
- Patent number 11,747,323
- Issue date Sep 5, 2023
- ULTIMA GENOMICS, INC.
- Kristopher Barbee
- G01 - MEASURING TESTING
Information Patent Grant
Method of imaging a surface using a scanning probe microscope
- Patent number 11,733,265
- Issue date Aug 22, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever, scanning probe microscope, and measurement method using...
- Patent number 11,733,264
- Issue date Aug 22, 2023
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope using artificial intelligence object recogn...
- Patent number 11,709,180
- Issue date Jul 25, 2023
- Chungbuk National University Industry-Academic Cooperation Foundation
- Man Hee Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermally stable, drift resistant probe for a scanning probe micros...
- Patent number 11,644,480
- Issue date May 9, 2023
- Bruker Nano, Inc.
- Jeffrey K. Wong
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,635,449
- Issue date Apr 25, 2023
- BRUKER NANO, INC.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscope equipped with optical measurement device an...
- Patent number 11,619,649
- Issue date Apr 4, 2023
- Park Systems Corp.
- Sang-il Park
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope, scan head and method
- Patent number 11,592,460
- Issue date Feb 28, 2023
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Roelof Willem Herfst
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for analyte detection and analysis
- Patent number 11,499,962
- Issue date Nov 15, 2022
- ULTIMA GENOMICS, INC.
- Kristopher Barbee
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope with use of composite materials
- Patent number 11,467,182
- Issue date Oct 11, 2022
- Vladimir Zhizhimontov
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Systems and approaches for semiconductor metrology and surface anal...
- Patent number 11,430,647
- Issue date Aug 30, 2022
- NOVA MEASURING INSTRUMENTS, INC.
- David A. Reed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope and optical axis adjustment method in sca...
- Patent number 11,346,856
- Issue date May 31, 2022
- Shimadzu Corporation
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Nanoscale dynamic mechanical analysis via atomic force microscopy (...
- Patent number 11,307,220
- Issue date Apr 19, 2022
- BRUKER NANO
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for a scanning probe microscope
- Patent number 11,237,185
- Issue date Feb 1, 2022
- Carl Zeiss SMT GmbH
- Ulrich Matejka
- G01 - MEASURING TESTING
Information Patent Grant
Wide-field scanning probe microscope combined with an apparatus for...
- Patent number 11,237,186
- Issue date Feb 1, 2022
- Chastnoe Uchrezhdenie “Nazarbayev University Research and Innovation System”
- Alexander Mihaylovich Alekseev
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and optical axis adjustment method in sca...
- Patent number 11,162,974
- Issue date Nov 2, 2021
- Shimadzu Corporation
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for a scanning probe microscope and method for sca...
- Patent number 11,156,632
- Issue date Oct 26, 2021
- Bruker Nano GmbH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe nanotomograph comprising an optical analysis module
- Patent number 11,150,266
- Issue date Oct 19, 2021
- NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM
- Alexander Mihaylovich Alekseev
- G01 - MEASURING TESTING
Information Patent Grant
Method and device of using a scanning probe microscope
- Patent number 11,112,426
- Issue date Sep 7, 2021
- Ecole Polytechnique Federale de Lausanne (EPFL)
- Georg Ernest Fantner
- G01 - MEASURING TESTING
Information Patent Grant
Linear structure for displacement transmission, and one-dimensional...
- Patent number 11,087,952
- Issue date Aug 10, 2021
- Korea Research Institute of Standards and Science
- Dal Hyun Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning probe microscope and method for increasing a scan speed of...
- Patent number 11,054,439
- Issue date Jul 6, 2021
- Carl Zeiss SMT GmbH
- Christof Baur
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a probe suitable for scanning probe microscopy
- Patent number 11,035,880
- Issue date Jun 15, 2021
- Imec VZW
- Thomas Hantschel
- G01 - MEASURING TESTING
Information Patent Grant
Z-position motion stage for use in a scanning probe microscopy syst...
- Patent number 11,035,879
- Issue date Jun 15, 2021
- Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Albert Dekker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE
- Publication number 20240369595
- Publication date Nov 7, 2024
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...
- Publication number 20240272196
- Publication date Aug 15, 2024
- The Research Foundation for the State University of New York
- Michael DAPOLITO
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...
- Publication number 20240175895
- Publication date May 30, 2024
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Probe Microscope, Sample Observation Processing System, an...
- Publication number 20240168052
- Publication date May 23, 2024
- Hitachi High-Tech Corporation
- Toru AISO
- G01 - MEASURING TESTING
Information Patent Application
OPTOMECHANICAL TRANSDUCER
- Publication number 20240094240
- Publication date Mar 21, 2024
- Centre National de la Recherche Scientifique
- Cyprien LEMOUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20240087869
- Publication date Mar 14, 2024
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...
- Publication number 20240069095
- Publication date Feb 29, 2024
- Intel Corporation
- Huei Hao YAP
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
- Publication number 20240027425
- Publication date Jan 25, 2024
- Ultima Genomics, Inc.
- Kristopher BARBEE
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20230243867
- Publication date Aug 3, 2023
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
- Publication number 20230152300
- Publication date May 18, 2023
- Ultima Genomics, Inc.
- Kristopher BARBEE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20230091625
- Publication date Mar 23, 2023
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
- Publication number 20230030991
- Publication date Feb 2, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...
- Publication number 20230019239
- Publication date Jan 19, 2023
- Shenyang Institute of Automation, Chinese Academy of Sciences
- Lianqing LIU
- G01 - MEASURING TESTING
Information Patent Application
AFM Imaging with Creep Correction
- Publication number 20220381803
- Publication date Dec 1, 2022
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Application
ATOMIC FORCE MICROSCOPE USING ARTIFICIAL INTELLIGENCE OBJECT RECOGN...
- Publication number 20220373575
- Publication date Nov 24, 2022
- CHUNGBUK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
- Man Hee LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ATOMIC NANO-POSITIONING DEVICE
- Publication number 20220299544
- Publication date Sep 22, 2022
- National Research Council of Canada
- Robert A. Wolkow
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...
- Publication number 20220260611
- Publication date Aug 18, 2022
- HITACHI HIGH-TECH CORPORATION
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20220252638
- Publication date Aug 11, 2022
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...
- Publication number 20220244288
- Publication date Aug 4, 2022
- Massachusetts Institute of Technology
- Fangzhou XIA
- G01 - MEASURING TESTING
Information Patent Application
Arrangement Having a Measuring Apparatus for a Scanning Probe Micro...
- Publication number 20220244287
- Publication date Aug 4, 2022
- BRUKER NANO GMBH
- Torsten Jahnke
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD
- Publication number 20220057430
- Publication date Feb 24, 2022
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Roelof Willem HERFST
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...
- Publication number 20210302465
- Publication date Sep 30, 2021
- Shimadzu Corporation
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...
- Publication number 20210305037
- Publication date Sep 30, 2021
- NOVA MEASURING INSTRUMENTS INC.
- David A. REED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...
- Publication number 20210263068
- Publication date Aug 26, 2021
- Shimadzu Corporation
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...
- Publication number 20210239732
- Publication date Aug 5, 2021
- Bruker Nano, Inc.
- Sergey Osechinskiy
- B82 - NANO-TECHNOLOGY
Information Patent Application
MICRO-OPTOMECHANICAL SYSTEM AND METHOD FOR THE PRODUCTION THEREOF
- Publication number 20210096152
- Publication date Apr 1, 2021
- Karlsruher Institut für Technologie
- Philipp-Immanuel Dietrich
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measuring Device for a Scanning Probe Microscope and Method for Sca...
- Publication number 20200400715
- Publication date Dec 24, 2020
- BRUKER NANO GMBH
- Detlef Knebel
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS
- Publication number 20200326327
- Publication date Oct 15, 2020
- Ultima Genomics, Inc.
- Kristopher BARBEE
- G01 - MEASURING TESTING
Information Patent Application
Surface Analyzer
- Publication number 20200319229
- Publication date Oct 8, 2020
- Shimadzu Corporation
- Keita FUJINO
- G01 - MEASURING TESTING
Information Patent Application
Method for Producing a Probe Suitable for Scanning Probe Microscopy
- Publication number 20200278379
- Publication date Sep 3, 2020
- IMEC vzw
- Thomas Hantschel
- G01 - MEASURING TESTING

Fine scanning or positioning

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Coated active cantilever probes for use in topography imaging in op...

Cantilever with a collocated piezoelectric actuator-sensor pair

Apparatus and method for a scanning probe microscope

Integrated dual-probe rapid in-situ switching measurement method an...

Systems and approaches for semiconductor metrology and surface anal...

Methods and systems for analyte detection and analysis

Method of imaging a surface using a scanning probe microscope

Cantilever, scanning probe microscope, and measurement method using...

AFM imaging with creep correction

Atomic force microscope using artificial intelligence object recogn...

Thermally stable, drift resistant probe for a scanning probe micros...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Atomic force microscope equipped with optical measurement device an...

Scanning probe microscope, scan head and method

Methods and systems for analyte detection and analysis

Scanning probe microscope with use of composite materials

Systems and approaches for semiconductor metrology and surface anal...

Scanning probe microscope and optical axis adjustment method in sca...

Nanoscale dynamic mechanical analysis via atomic force microscopy (...

Apparatus and method for a scanning probe microscope

Wide-field scanning probe microscope combined with an apparatus for...

Scanning probe microscope and optical axis adjustment method in sca...

Measuring device for a scanning probe microscope and method for sca...

Scanning probe nanotomograph comprising an optical analysis module

Method and device of using a scanning probe microscope

Linear structure for displacement transmission, and one-dimensional...

Scanning probe microscope and method for increasing a scan speed of...

Method for producing a probe suitable for scanning probe microscopy

Z-position motion stage for use in a scanning probe microscopy syst...

Patents Applicationslast 30 patents

LIGHTING SYSTEM FOR MULTI-PROBE MICROSCOPE

SCATTERING-TYPE SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH AKIYAMA...

Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (...

Scanning Probe Microscope, Sample Observation Processing System, an...

OPTOMECHANICAL TRANSDUCER

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...

METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE

INTEGRATED DUAL-PROBE RAPID IN-SITU SWITCHING MEASUREMENT METHOD AN...

AFM Imaging with Creep Correction

ATOMIC FORCE MICROSCOPE USING ARTIFICIAL INTELLIGENCE OBJECT RECOGN...

ATOMIC NANO-POSITIONING DEVICE

CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...

Arrangement Having a Measuring Apparatus for a Scanning Probe Micro...

SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD

SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...

SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANAL...

SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD IN SCA...

Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (...

MICRO-OPTOMECHANICAL SYSTEM AND METHOD FOR THE PRODUCTION THEREOF

Measuring Device for a Scanning Probe Microscope and Method for Sca...

METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS

Surface Analyzer

Method for Producing a Probe Suitable for Scanning Probe Microscopy