Fizeau; Wedge

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G01J2009/0292

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Current Industry

G01J2009/0292Fizeau; Wedge

Industries

Patents Grantslast 30 patents

Information Patent Grant
Restoration of Fizeau FTS spectral data using low and/or zero spati...
- Patent number 7,436,518
- Issue date Oct 14, 2008
- Lockheed Martin Corporation
- Eric H. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Light intensity ratio adjustment filter for an interferometer, inte...
- Patent number 7,375,825
- Issue date May 20, 2008
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Grant
Optical feedback from mode-selective tuner
- Patent number 7,259,860
- Issue date Aug 21, 2007
- Corning Incorporated
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Grant
Low-coherence interferometry optical sensor using a single wedge po...
- Patent number 7,259,862
- Issue date Aug 21, 2007
- Opsens Inc.
- Gaétan Duplain
- G01 - MEASURING TESTING
Information Patent Grant
Refraction index change measurement
- Patent number 5,231,285
- Issue date Jul 27, 1993
- Honeywell Inc.
- Ralph T. Berg
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength meter having elliptical wedge
- Patent number 5,168,324
- Issue date Dec 1, 1992
- The United States of America as represented by the United States Department o...
- Richard P. Hackel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE HOLDER FOR USE WITH INTERFEROMETER
- Publication number 20210301870
- Publication date Sep 30, 2021
- Corning Incorporated
- Ronnie Rex Fesperman
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
TRUE HETERODYNE SPECTRALLY CONTROLLED INTERFEROMETRY
- Publication number 20180149468
- Publication date May 31, 2018
- APRE INSTRUMENTS, LLC
- ARTUR OLSZAK
- G01 - MEASURING TESTING
Information Patent Application
Light intensity ratio adjustment filter for an interferometer, inte...
- Publication number 20060066874
- Publication date Mar 30, 2006
- Fujinon Corporation
- Nobuaki Ueki
- G01 - MEASURING TESTING
Information Patent Application
Optical feedback from mode-selective tuner
- Publication number 20060062260
- Publication date Mar 23, 2006
- Joseph Marron
- G01 - MEASURING TESTING
Information Patent Application
Optical sensor using low-coherence interferometry
- Publication number 20060061768
- Publication date Mar 23, 2006
- Gaetan Duplain
- G01 - MEASURING TESTING