flaws comparing to predetermined standards

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CPC
G01N2223/6466

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/6466flaws comparing to predetermined standards

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for inspecting a structure across a cover layer c...
- Patent number 12,188,884
- Issue date Jan 7, 2025
- Inversa Systems LTD.
- Peter Marc Cabot
- G01 - MEASURING TESTING
Information Patent Grant
System and method for crack detection
- Patent number 11,946,883
- Issue date Apr 2, 2024
- United States as represented by the Administrator of NASA
- Ajay M Koshti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiographic crack image quality indicator system and method
- Patent number 11,747,287
- Issue date Sep 5, 2023
- Ajay M Koshti
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for detecting defects in devices using X-rays
- Patent number 11,688,067
- Issue date Jun 27, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,662,479
- Issue date May 30, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for manufacturing printed circuit board based o...
- Patent number 11,651,492
- Issue date May 16, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device, inspection method, and method for producing obje...
- Patent number 11,639,904
- Issue date May 2, 2023
- Nikon Corporation
- Takeshi Ohbayashi
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for product failure prediction based on X-ray i...
- Patent number 11,615,533
- Issue date Mar 28, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for process control based on X-ray inspection
- Patent number 11,430,118
- Issue date Aug 30, 2022
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
EBeam inspection method
- Patent number 11,315,237
- Issue date Apr 26, 2022
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of crystallographic properties in aerospace components
- Patent number 11,181,491
- Issue date Nov 23, 2021
- Raytheon Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a reference blade for calibrating tomographic...
- Patent number 11,060,986
- Issue date Jul 13, 2021
- SAFRAN AIRCRAFT ENGINES
- Sara Somanou
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,042,981
- Issue date Jun 22, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection of crystallographic properties in aerospace components
- Patent number 9,939,393
- Issue date Apr 10, 2018
- United Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Grant
X-ray backscatter system and method for detecting discrepancies in...
- Patent number 9,709,514
- Issue date Jul 18, 2017
- The Boeing Company
- William Talion Edwards
- G01 - MEASURING TESTING
Information Patent Grant
Defect sampling for electron beam review based on defect attributes...
- Patent number 9,535,010
- Issue date Jan 3, 2017
- KLA-Tencor Corp.
- Rohan Gosain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect observation method and defect observation device
- Patent number 8,824,773
- Issue date Sep 2, 2014
- Hitachi High-Technologies Corporation
- Yohei Minekawa
- G01 - MEASURING TESTING
Information Patent Grant
Processes to create discrete corrosion defects on substrates and es...
- Patent number 8,532,952
- Issue date Sep 10, 2013
- Concurrent Technologies Corporation
- Joseph Pecina
- G01 - MEASURING TESTING
Information Patent Grant
Processes to create discrete corrosion defects on substrates and es...
- Patent number 8,448,490
- Issue date May 28, 2013
- Concurrent Technologies Corporation
- Joseph Pecina
- G01 - MEASURING TESTING
Information Patent Grant
Processes to create discrete corrosion defects on substrates and es...
- Patent number 7,776,606
- Issue date Aug 17, 2010
- Concurrent Technologies Corporation
- Joseph Pecina
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
EBeam Inspection Method
- Publication number 20220253999
- Publication date Aug 11, 2022
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Defects Detection and Classification Using...
- Publication number 20210010953
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF CRYSTALLOGRAPHIC PROPERTIES IN AEROSPACE COMPONENTS
- Publication number 20180231478
- Publication date Aug 16, 2018
- United Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Application
Reference Image Contour Generation
- Publication number 20180053291
- Publication date Feb 22, 2018
- DONGFANG JINGYUAN ELECTRON LIMITED
- Weimin Ma
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF CRYSTALLOGRAPHIC PROPERTIES IN AEROSPACE COMPONENTS
- Publication number 20170089845
- Publication date Mar 30, 2017
- United Technologies Corporation
- Iuliana Cernatescu
- G01 - MEASURING TESTING
Information Patent Application
X-RAY BACKSCATTER SYSTEM AND METHOD FOR DETECTING DISCREPANCIES IN...
- Publication number 20130255385
- Publication date Oct 3, 2013
- The Boeing Company
- William Talion Edwards
- G01 - MEASURING TESTING
Information Patent Application
DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE
- Publication number 20130140457
- Publication date Jun 6, 2013
- Yohei Minekawa
- G01 - MEASURING TESTING
Information Patent Application
PROCESSES TO CREATE DISCRETE CORROSION DEFECTS ON SUBSTRATES AND ES...
- Publication number 20100288031
- Publication date Nov 18, 2010
- Joseph Pecina
- G01 - MEASURING TESTING
Information Patent Application
PROCESSES TO CREATE DISCRETE CORROSION DEFECTS ON SUBSTRATES AND ES...
- Publication number 20100288032
- Publication date Nov 18, 2010
- Joseph Pecina
- G01 - MEASURING TESTING
Information Patent Application
Processes to create discrete corrosion defects on substrates and es...
- Publication number 20070220946
- Publication date Sep 27, 2007
- Joseph Pecina
- G01 - MEASURING TESTING

flaws comparing to predetermined standards

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for inspecting a structure across a cover layer c...

System and method for crack detection

Radiographic crack image quality indicator system and method

Methods and systems for detecting defects in devices using X-rays

Methods and systems for printed circuit board design based on autom...

Methods and systems for manufacturing printed circuit board based o...

Inspection device, inspection method, and method for producing obje...

Methods and systems for product failure prediction based on X-ray i...

Methods and systems for process control based on X-ray inspection

EBeam inspection method

Detection of crystallographic properties in aerospace components

Method of fabricating a reference blade for calibrating tomographic...

Methods and systems for printed circuit board design based on autom...

Detection of crystallographic properties in aerospace components

X-ray backscatter system and method for detecting discrepancies in...

Defect sampling for electron beam review based on defect attributes...

Defect observation method and defect observation device

Processes to create discrete corrosion defects on substrates and es...

Processes to create discrete corrosion defects on substrates and es...

Processes to create discrete corrosion defects on substrates and es...

Patents Applicationslast 30 patents

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

EBeam Inspection Method

Methods and Systems for Defects Detection and Classification Using...

DETECTION OF CRYSTALLOGRAPHIC PROPERTIES IN AEROSPACE COMPONENTS

Reference Image Contour Generation

DETECTION OF CRYSTALLOGRAPHIC PROPERTIES IN AEROSPACE COMPONENTS

X-RAY BACKSCATTER SYSTEM AND METHOD FOR DETECTING DISCREPANCIES IN...

DEFECT OBSERVATION METHOD AND DEFECT OBSERVATION DEVICE

PROCESSES TO CREATE DISCRETE CORROSION DEFECTS ON SUBSTRATES AND ES...

PROCESSES TO CREATE DISCRETE CORROSION DEFECTS ON SUBSTRATES AND ES...

Processes to create discrete corrosion defects on substrates and es...