Fluorescence

Industry

CPC
G01Q60/20

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q60/00Particular type of SPM [Scanning Probe Microscopy] or microscopes Essential components thereof

Current Industry

G01Q60/20Fluorescence

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Quantum-dot-based measuring system and method
- Patent number 11,644,479
- Issue date May 9, 2023
- SHANGHAI UNIVERSITY
- Na Chen
- G01 - MEASURING TESTING
Information Patent Grant
Microscopy imaging
- Patent number 11,635,447
- Issue date Apr 25, 2023
- Alentic Microscience Inc.
- Alan Marc Fine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microscopy imaging
- Patent number 10,900,999
- Issue date Jan 26, 2021
- Alentic Microscience Inc.
- Alan Marc Fine
- G01 - MEASURING TESTING
Information Patent Grant
Systems, apparatuses, and methods for optical focusing in scatterin...
- Patent number 10,648,934
- Issue date May 12, 2020
- Massachusetts Institute of Technology
- Donggyu Kim
- G02 - OPTICS
Information Patent Grant
Microscopy imaging
- Patent number 10,620,234
- Issue date Apr 14, 2020
- Alentic Microscience Inc.
- Alan Marc Fine
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for non-destructive surface chemical analysis o...
- Patent number 9,910,066
- Issue date Mar 6, 2018
- Horiba Instruments, Inc.
- Sergey A. Saunin
- G01 - MEASURING TESTING
Information Patent Grant
Active probe for near field optical microscopy comprising hyperpola...
- Patent number 9,784,761
- Issue date Oct 10, 2017
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Céline Fiorini
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for the evanescent illumination of a sample
- Patent number 8,378,314
- Issue date Feb 19, 2013
- Carl Zeiss Microscopy GmbH
- Manfred Matthae
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical microscope
- Patent number 8,217,346
- Issue date Jul 10, 2012
- National University Corporation Shizuoka University
- Yoshimasa Kawata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for dynamic cellular probing and diagnostics u...
- Patent number 8,149,416
- Issue date Apr 3, 2012
- Arryx, Inc.
- Osman Akcakir
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface plasmon assisted microscope
- Patent number 7,956,989
- Issue date Jun 7, 2011
- University of North Texas Health Science Center at Fort Worth
- Zygmunt Gryczynski
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Single analyte molecule detection by fibre fluorescence probe
- Patent number 7,657,133
- Issue date Feb 2, 2010
- University of Basel
- Bert Hecht
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for detecting deformability of cells using spa...
- Patent number 7,460,240
- Issue date Dec 2, 2008
- Arryx, Inc.
- Osman Akcakir
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for scanning apertureless fluorescence mircroscope
- Patent number 7,247,842
- Issue date Jul 24, 2007
- California Institute of Technology
- Stephen R. Quake
- G01 - MEASURING TESTING
Information Patent Grant
Near-field intra-cellular apertureless microscope
- Patent number 7,116,475
- Issue date Oct 3, 2006
- Nanopoint, Inc.
- Daniel G. O'Connell
- G01 - MEASURING TESTING
Information Patent Grant
Conductive transparent probe and probe control apparatus
- Patent number 7,075,071
- Issue date Jul 11, 2006
- Nippon Telegraph and Telephone Corporation
- Toru Murashita
- G01 - MEASURING TESTING
Information Patent Grant
Conductive transparent probe and probe control apparatus
- Patent number 7,041,974
- Issue date May 9, 2006
- Nippon Telegraph and Telephone Corporation
- Toru Murashita
- G01 - MEASURING TESTING
Information Patent Grant
Conductive transparent probe and probe control apparatus
- Patent number 7,038,202
- Issue date May 2, 2006
- Nippon Telegraph and Telephone Corporation
- Toru Murashita
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for scanning apertureless fluorescence microscope
- Patent number 6,953,927
- Issue date Oct 11, 2005
- California Institute of Technology
- Stephen R. Quake
- G01 - MEASURING TESTING
Information Patent Grant
Conductive transparent probe and probe control apparatus
- Patent number 6,953,930
- Issue date Oct 11, 2005
- Nippon Telegraph and Telephone Corporation
- Toru Murashita
- G01 - MEASURING TESTING
Information Patent Grant
Optical microscopy and its use in the study of cells
- Patent number 6,929,934
- Issue date Aug 16, 2005
- Imperial College Innovations, Ltd.
- Yuri Evgenievich Korchev
- G01 - MEASURING TESTING
Information Patent Grant
Scanning device, especially for detecting fluorescent light
- Patent number 6,809,324
- Issue date Oct 26, 2004
- Carl Zeiss Jena GmbH
- Stefan Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Scanning near field optical microscope
- Patent number 5,894,122
- Issue date Apr 13, 1999
- Seiko Instruments Inc.
- Eisuke Tomita
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method device and system for optical near-field scanning microscopy...
- Patent number 5,838,000
- Issue date Nov 17, 1998
- Huels Aktiengesellschaft
- Michael Mertesdorf
- B82 - NANO-TECHNOLOGY
Information Patent Grant
High resolution observation apparatus with photon scanning microscope
- Patent number 5,304,795
- Issue date Apr 19, 1994
- Seiko Instruments Inc.
- Masamichi Fujihira
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Near-field scanning optical microscope using a fluorescent probe
- Patent number 5,105,305
- Issue date Apr 14, 1992
- AT&T Bell Laboratories
- Robert E. Betzig
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MICROSCOPY IMAGING
- Publication number 20240385212
- Publication date Nov 21, 2024
- Alentic Microscience Inc.
- Alan Marc Fine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING
- Publication number 20230228682
- Publication date Jul 20, 2023
- Alentic Microscience Inc.
- Alan Marc Fine
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM-DOT-BASED MEASURING SYSTEM AND METHOD
- Publication number 20210382086
- Publication date Dec 9, 2021
- SHANGHAI UNIVERSITY
- Na CHEN
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPY IMAGING
- Publication number 20210116475
- Publication date Apr 22, 2021
- Alentic Microscience Inc.
- Alan Marc Fine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICROSCOPY IMAGING
- Publication number 20200256889
- Publication date Aug 13, 2020
- Alentic Microscience Inc.
- Alan Marc Fine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS, APPARATUSES, AND METHODS FOR OPTICAL FOCUSING IN SCATTERIN...
- Publication number 20190219527
- Publication date Jul 18, 2019
- DONGGYU KIM
- G01 - MEASURING TESTING
Information Patent Application
LASER SCANNING OBSERVATION DEVICE AND LASER SCANNING METHOD
- Publication number 20160299170
- Publication date Oct 13, 2016
- SONY CORPORATION
- Terumasa Ito
- G02 - OPTICS
Information Patent Application
MICROSCOPY IMAGING
- Publication number 20160041200
- Publication date Feb 11, 2016
- Alentic Microsciemce Inc.
- Alan Marc Fine
- G02 - OPTICS
Information Patent Application
Microscopy imaging
- Publication number 20110249109
- Publication date Oct 13, 2011
- Alan Marc Fine
- G02 - OPTICS
Information Patent Application
Optical Microscope
- Publication number 20110079712
- Publication date Apr 7, 2011
- National University Corporation Shiozouka Universi ty
- Yoshimasa Kawata
- G02 - OPTICS
Information Patent Application
DEVICE AND METHOD FOR THE EVANESCENT ILLUMINATION OF A SAMPLE
- Publication number 20110062348
- Publication date Mar 17, 2011
- CARL ZEISS MICROIMAGING GMBH
- Manfred Matthae
- G02 - OPTICS
Information Patent Application
Substance-Information Acquisition Method Using Evanescent Light Bea...
- Publication number 20100203504
- Publication date Aug 12, 2010
- Yoichi Katsumoto
- G01 - MEASURING TESTING
Information Patent Application
PROBES FOR SCANNING PROBE MICROSCOPY
- Publication number 20100032719
- Publication date Feb 11, 2010
- Seunghun HONG
- G01 - MEASURING TESTING
Information Patent Application
Method for Detecting Nanoparticles and the Use Thereof
- Publication number 20090239251
- Publication date Sep 24, 2009
- Centre National de la Recherche Scientifique(CNRS)
- Emmanuel Fort
- G02 - OPTICS
Information Patent Application
Apparatus and method for dynamic cellular probing and diagnostics u...
- Publication number 20090128825
- Publication date May 21, 2009
- Arryx, Inc.
- Osman Akcakir
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER FOR NEAR FIELD OPTICAL MICROSCOPES, PLASMON ENHANCED FLU...
- Publication number 20090101815
- Publication date Apr 23, 2009
- FUJIFILM CORPORATION
- Hisashi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PLASMON ASSISTED MICROSCOPE
- Publication number 20080231834
- Publication date Sep 25, 2008
- University of North Texas Health Science Center at Fort Worth
- Zygmunt Gryczynski
- G02 - OPTICS
Information Patent Application
Single Analyte Molecule Detection by Fibre Fluorescemce Probe
- Publication number 20080089635
- Publication date Apr 17, 2008
- University of Basel
- Bert Hecht
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SCANNING APERTURELESS FLUORESCENCE MICROSCOPE
- Publication number 20070152144
- Publication date Jul 5, 2007
- California Institute of Technology
- Stephen R. Quake
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for detecting deformability of cells using spa...
- Publication number 20070086919
- Publication date Apr 19, 2007
- Arryx, Inc.
- Osman Akcakir
- G01 - MEASURING TESTING
Information Patent Application
Near-field intra-cellular apertureless microscope
- Publication number 20060119934
- Publication date Jun 8, 2006
- Daniel G. O'Connell
- G01 - MEASURING TESTING
Information Patent Application
Conductive transparent probe and probe control apparatus
- Publication number 20050247875
- Publication date Nov 10, 2005
- Nippon Telegraph and Telephone Corporation
- Toru Murashita
- G01 - MEASURING TESTING
Information Patent Application
Conductive transparent probe and probe control apparatus
- Publication number 20050242282
- Publication date Nov 3, 2005
- Nippon Telegraph and Telephone Corporation
- Toru Murashita
- G01 - MEASURING TESTING
Information Patent Application
Conductive transparent probe and probe control apparatus
- Publication number 20050103994
- Publication date May 19, 2005
- Nippon Telegraph and Telephone Corporation
- Toru Murashita
- G01 - MEASURING TESTING
Information Patent Application
Method and system for scanning apertureless fluorescence microscope
- Publication number 20040089816
- Publication date May 13, 2004
- California Institute of Technology
- Stephen R. Quake
- G02 - OPTICS
Information Patent Application
Parallel analysis of molecular interactions
- Publication number 20030186311
- Publication date Oct 2, 2003
- BioForce Nanosciences, Inc.
- Eric Henderson
- G01 - MEASURING TESTING
Information Patent Application
Optical fiber probe and scanning probe microscope provided with the...
- Publication number 20030085351
- Publication date May 8, 2003
- Ken Nakajima
- G01 - MEASURING TESTING
Information Patent Application
Conductive transparent probe and probe control apparatus
- Publication number 20030037605
- Publication date Feb 27, 2003
- Nippon Telegraph and Telephone Corporation
- Toru Murashita
- B82 - NANO-TECHNOLOGY

Fluorescence

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Quantum-dot-based measuring system and method

Microscopy imaging

Microscopy imaging

Systems, apparatuses, and methods for optical focusing in scatterin...

Microscopy imaging

Systems and methods for non-destructive surface chemical analysis o...

Active probe for near field optical microscopy comprising hyperpola...

Device and method for the evanescent illumination of a sample

Optical microscope

Apparatus and method for dynamic cellular probing and diagnostics u...

Surface plasmon assisted microscope

Single analyte molecule detection by fibre fluorescence probe

Apparatus and method for detecting deformability of cells using spa...

Method and system for scanning apertureless fluorescence mircroscope

Near-field intra-cellular apertureless microscope

Conductive transparent probe and probe control apparatus

Conductive transparent probe and probe control apparatus

Conductive transparent probe and probe control apparatus

Method and system for scanning apertureless fluorescence microscope

Conductive transparent probe and probe control apparatus

Optical microscopy and its use in the study of cells

Scanning device, especially for detecting fluorescent light

Scanning near field optical microscope

Method device and system for optical near-field scanning microscopy...

High resolution observation apparatus with photon scanning microscope

Near-field scanning optical microscope using a fluorescent probe

Patents Applicationslast 30 patents

MICROSCOPY IMAGING

MICROSCOPY IMAGING

QUANTUM-DOT-BASED MEASURING SYSTEM AND METHOD

MICROSCOPY IMAGING

MICROSCOPY IMAGING

SYSTEMS, APPARATUSES, AND METHODS FOR OPTICAL FOCUSING IN SCATTERIN...

LASER SCANNING OBSERVATION DEVICE AND LASER SCANNING METHOD

MICROSCOPY IMAGING

Microscopy imaging

Optical Microscope

DEVICE AND METHOD FOR THE EVANESCENT ILLUMINATION OF A SAMPLE

Substance-Information Acquisition Method Using Evanescent Light Bea...

PROBES FOR SCANNING PROBE MICROSCOPY

Method for Detecting Nanoparticles and the Use Thereof

Apparatus and method for dynamic cellular probing and diagnostics u...

CANTILEVER FOR NEAR FIELD OPTICAL MICROSCOPES, PLASMON ENHANCED FLU...

SURFACE PLASMON ASSISTED MICROSCOPE

Single Analyte Molecule Detection by Fibre Fluorescemce Probe

METHOD AND SYSTEM FOR SCANNING APERTURELESS FLUORESCENCE MICROSCOPE

Apparatus and method for detecting deformability of cells using spa...

Near-field intra-cellular apertureless microscope

Conductive transparent probe and probe control apparatus

Conductive transparent probe and probe control apparatus

Conductive transparent probe and probe control apparatus

Method and system for scanning apertureless fluorescence microscope

Parallel analysis of molecular interactions

Optical fiber probe and scanning probe microscope provided with the...

Conductive transparent probe and probe control apparatus