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H03M1/1095

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HELECTRICITY H03Electronic circuits H03MCODING DECODING CODE CONVERSION IN GENERAL H03M1/00Analogue/digital conversion Digital/analogue conversion

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H03M1/1095for ac performance

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Baseline wander compensator and method
- Patent number 12,021,543
- Issue date Jun 25, 2024
- MACOM Technology Solutions Holdings, Inc.
- David Foley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of testing electronic circuits and corresponding circuit
- Patent number 11,762,019
- Issue date Sep 19, 2023
- STMicroelectronics S.r.l.
- David Vincenzoni
- G01 - MEASURING TESTING
Information Patent Grant
Phase frequency response measurement method
- Patent number 11,372,041
- Issue date Jun 28, 2022
- Guzik Technical Enterprises
- Valeriy Serebryanskiy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device which detects occurrence of an abnormality dur...
- Patent number 11,327,829
- Issue date May 10, 2022
- Kabushiki Kaisha Toshiba
- Shigeru Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Low noise and low distortion test method and system for analog-to-d...
- Patent number 10,892,768
- Issue date Jan 12, 2021
- Texas Instruments Incorporated
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Successive approximation type analog-to-digital (A/D) converter
- Patent number 10,090,851
- Issue date Oct 2, 2018
- Olympus Corporation
- Shuzo Hiraide
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for performing ADC phase-frequency response test
- Patent number 10,090,849
- Issue date Oct 2, 2018
- Chenguang Cai
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing differential analog-to-digital converter and sys...
- Patent number 9,438,262
- Issue date Sep 6, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Tao Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-chip analog-to-digital converter (ADC) linearity text for embedd...
- Patent number 9,240,798
- Issue date Jan 19, 2016
- Texas Instruments Incorporated
- Cormac Harrington
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and methodology for analog-to-digital converter linearity te...
- Patent number 9,184,759
- Issue date Nov 10, 2015
- Zhongjun Yu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for interference suppression of a sampling process and a dev...
- Patent number 9,106,245
- Issue date Aug 11, 2015
- Robert Bosch GmbH
- Thomas Wuchert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for digital-to-analog converter calibration
- Patent number 9,035,810
- Issue date May 19, 2015
- IQ-Analog Corporation
- Mikko Waltari
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Testing apparatus and method for testing analog-to-digital converter
- Patent number 8,648,740
- Issue date Feb 11, 2014
- Silicon Motion, Inc.
- Hung-Sheng Chang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Compensating for harmonic distortion in an instrument channel
- Patent number 8,400,338
- Issue date Mar 19, 2013
- Teradyne, Inc.
- David O'Brien
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for vector-based analog-to-digital converter se...
- Patent number 8,310,385
- Issue date Nov 13, 2012
- Qualcomm, Incorporated
- Sachin D Dasnurkar
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electrical circuit and method for testing electronic component
- Patent number 7,912,667
- Issue date Mar 22, 2011
- Infineon Technologies AG
- Claus Dworski
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus to test and compensate multi-channel digital-...
- Patent number 7,868,794
- Issue date Jan 11, 2011
- Texas Instruments Incorporated
- Ramyanshu Datta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converter with capacitor array
- Patent number 7,659,845
- Issue date Feb 9, 2010
- Infineon Technologies AG
- Manfred Bresch
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor integrated circuit capable of screening conforming di...
- Patent number 7,633,416
- Issue date Dec 15, 2009
- Kabushiki Kaisha Toshiba
- Koji Horisaki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device and method for testing of digital-to-analog converter
- Patent number 7,609,190
- Issue date Oct 27, 2009
- Advanced Micro Devices, Inc.
- Ravi Ramaswami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital PLL for a system-on-chip for digital control of electronic...
- Patent number 7,557,663
- Issue date Jul 7, 2009
- Systel Development & Industries Ltd.
- Daniel Rubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test apparatus and method for testing analog/digital converters
- Patent number 7,391,349
- Issue date Jun 24, 2008
- Infineon Technologies AG
- Claus Dworski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Built-in self-test apparatus and method for digital-to-analog conve...
- Patent number 7,355,537
- Issue date Apr 8, 2008
- Spirox Corporation
- Chun Wei Lin
- G01 - MEASURING TESTING
Information Patent Grant
High speed data converter testing devices, methods, & systems
- Patent number 7,250,882
- Issue date Jul 31, 2007
- Georgia Tech Research Corporation
- Shalabh Goyal
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System on chip for digital control of electronic power devices
- Patent number 7,242,335
- Issue date Jul 10, 2007
- Systel Development & Industries Ltd.
- Daniel Rubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scheme and method for testing Analog-to-Digital converters
- Patent number 7,154,422
- Issue date Dec 26, 2006
- National Cheng Kung University
- Yun-Che Wen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of and apparatus for characterizing an analog to digital con...
- Patent number 7,129,879
- Issue date Oct 31, 2006
- Analog Devices, Inc.
- Adam Glibbery
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low circuit overhead built in self test for oversampled ADC's
- Patent number 7,062,401
- Issue date Jun 13, 2006
- LSI Logic Corporation
- Donald McGrath
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System on chip for digital control of electronic power devices
- Patent number 6,946,984
- Issue date Sep 20, 2005
- Systel Development & Industries Ltd.
- Daniel Rubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analog to digital converter with encoder circuit and testing method...
- Patent number 6,703,951
- Issue date Mar 9, 2004
- Fujitsu Limited
- Sanroku Tsukamoto
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
BASELINE WANDER COMPENSATOR AND METHOD
- Publication number 20230403023
- Publication date Dec 14, 2023
- MACOM Technology Solution Holdings, Inc.
- David Foley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PHASE FREQUENCY RESPONSE MEASUREMENT METHOD
- Publication number 20220170979
- Publication date Jun 2, 2022
- Guzik Technical Enterprises
- Valeriy Serebryanskiy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SUCCESSIVE APPROXIMATION TYPE ANALOG-TO-DIGITAL (A/D) CONVERTER
- Publication number 20180083646
- Publication date Mar 22, 2018
- OLYMPUS CORPORATION
- Shuzo Hiraide
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT FOR MEASURING FLICKER NOISE AND METHOD OF USING THE SAME
- Publication number 20160305999
- Publication date Oct 20, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chao Chieh LI
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEXT FOR EMBEDD...
- Publication number 20150249458
- Publication date Sep 3, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Cormac HARRINGTON
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR INTERFERENCE SUPPRESSION OF A SAMPLING PROCESS AND A DEV...
- Publication number 20150116139
- Publication date Apr 30, 2015
- ROBERT BOSCH GmbH
- Thomas Wuchert
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING APPARATUS AND METHOD FOR TESTING ANALOG-TO-DIGITAL CONVERTER
- Publication number 20130154861
- Publication date Jun 20, 2013
- SILICON MOTION, INC.
- Hung-Sheng CHANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
COMPENSATING FOR HARMONIC DISTORTION IN AN INSTRUMENT CHANNEL
- Publication number 20110227767
- Publication date Sep 22, 2011
- David O'Brien
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND METHODS FOR VECTOR-BASED ANALOG-TO-DIGITAL CONVERTER SE...
- Publication number 20100289679
- Publication date Nov 18, 2010
- QUALCOMM Incorporated
- Sachin D Dasnurkar
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS AND APPARATUS TO TEST AND COMPENSATE MULTI-CHANNEL DIGITAL-...
- Publication number 20100164762
- Publication date Jul 1, 2010
- Ramyanshu Datta
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG-TO-DIGITAL CONVERTER WITH CAPACITOR ARRAY
- Publication number 20090319211
- Publication date Dec 24, 2009
- INFINEON TECHNOLOGIES AG
- MANFRED BRESCH
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM ON CHIP FOR DIGITAL CONTROL OF ELECTRONIC POWER DEVICES
- Publication number 20090299500
- Publication date Dec 3, 2009
- SYSTEL DEVELOPMENT & INDUSTRIES LTD.
- Daniel Rubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR TESTING OF DIGITAL-TO-ANALOG CONVERTER
- Publication number 20090261999
- Publication date Oct 22, 2009
- Advanced Micro Devices, Inc.
- Ravi Ramaswami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT CAPABLE OF SCREENING CONFORMING DI...
- Publication number 20080238741
- Publication date Oct 2, 2008
- Koji Horisaki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System On Chip For Digital Control Of Electronic Power Devices
- Publication number 20070291890
- Publication date Dec 20, 2007
- SYSTEL DEVELOPMENT & INDUSTRIES LTD.
- Daniel Rubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test Apparatus And Method For Testing Analog/Digital Converters
- Publication number 20070216555
- Publication date Sep 20, 2007
- Claus Dworski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Electrical circuit and method for testing electronic component
- Publication number 20070063723
- Publication date Mar 22, 2007
- Claus Dworski
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
High speed data converter testing devices, methods, & systems
- Publication number 20060290548
- Publication date Dec 28, 2006
- Georgia Tech Research Corporation
- Shalabh Goyal
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Scheme and method for testing analog-to digital converters
- Publication number 20060001560
- Publication date Jan 5, 2006
- Yun-Che Wen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System on chip for digital control of electronic power devices
- Publication number 20050140532
- Publication date Jun 30, 2005
- SYSTEL DEVELOPMENT & INDUSTRIES Ltd.
- Daniel Rubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for measuring data converter
- Publication number 20050068210
- Publication date Mar 31, 2005
- Chun Wei Lin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Built-in self-test apparatus and method for digital-to-analog conve...
- Publication number 20050035750
- Publication date Feb 17, 2005
- Chun Wei Lin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System on chip for digital control of electronic power devices
- Publication number 20030197632
- Publication date Oct 23, 2003
- SYSTEL DEVELOPMENT & INDUSTRIES Ltd.
- Daniel Rubin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING METHOD AND APPARATUS OF GLITCH NOISE AND STORAGE MEDIUM
- Publication number 20030002573
- Publication date Jan 2, 2003
- KAZUYA TAKAHASHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Analog to digital converter with encoder circuit and testing method...
- Publication number 20020044077
- Publication date Apr 18, 2002
- FUJITSU LIMITED
- Sanroku Tsukamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Evaluation system for analog-digital or digital-analog converter
- Publication number 20020005794
- Publication date Jan 17, 2002
- Takahiro Yamaguchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Analog to digital converter with encoder circuit and testing method...
- Publication number 20010043150
- Publication date Nov 22, 2001
- FUJITSU LIMITED
- Sanroku Tsukamoto
- H03 - BASIC ELECTRONIC CIRCUITRY

for ac performance

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Baseline wander compensator and method

Method of testing electronic circuits and corresponding circuit

Phase frequency response measurement method

Semiconductor device which detects occurrence of an abnormality dur...

Low noise and low distortion test method and system for analog-to-d...

Successive approximation type analog-to-digital (A/D) converter

Method for performing ADC phase-frequency response test

Method for testing differential analog-to-digital converter and sys...

On-chip analog-to-digital converter (ADC) linearity text for embedd...

System and methodology for analog-to-digital converter linearity te...

Method for interference suppression of a sampling process and a dev...

System and method for digital-to-analog converter calibration

Testing apparatus and method for testing analog-to-digital converter

Compensating for harmonic distortion in an instrument channel

Systems and methods for vector-based analog-to-digital converter se...

Electrical circuit and method for testing electronic component

Methods and apparatus to test and compensate multi-channel digital-...

Analog-to-digital converter with capacitor array

Semiconductor integrated circuit capable of screening conforming di...

Device and method for testing of digital-to-analog converter

Digital PLL for a system-on-chip for digital control of electronic...

Test apparatus and method for testing analog/digital converters

Built-in self-test apparatus and method for digital-to-analog conve...

High speed data converter testing devices, methods, & systems

System on chip for digital control of electronic power devices

Scheme and method for testing Analog-to-Digital converters

Method of and apparatus for characterizing an analog to digital con...

Low circuit overhead built in self test for oversampled ADC's

System on chip for digital control of electronic power devices

Analog to digital converter with encoder circuit and testing method...

Patents Applicationslast 30 patents

BASELINE WANDER COMPENSATOR AND METHOD

PHASE FREQUENCY RESPONSE MEASUREMENT METHOD

SUCCESSIVE APPROXIMATION TYPE ANALOG-TO-DIGITAL (A/D) CONVERTER

CIRCUIT FOR MEASURING FLICKER NOISE AND METHOD OF USING THE SAME

ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEXT FOR EMBEDD...

METHOD FOR INTERFERENCE SUPPRESSION OF A SAMPLING PROCESS AND A DEV...

TESTING APPARATUS AND METHOD FOR TESTING ANALOG-TO-DIGITAL CONVERTER

COMPENSATING FOR HARMONIC DISTORTION IN AN INSTRUMENT CHANNEL

SYSTEMS AND METHODS FOR VECTOR-BASED ANALOG-TO-DIGITAL CONVERTER SE...

METHODS AND APPARATUS TO TEST AND COMPENSATE MULTI-CHANNEL DIGITAL-...

ANALOG-TO-DIGITAL CONVERTER WITH CAPACITOR ARRAY

SYSTEM ON CHIP FOR DIGITAL CONTROL OF ELECTRONIC POWER DEVICES

DEVICE AND METHOD FOR TESTING OF DIGITAL-TO-ANALOG CONVERTER

SEMICONDUCTOR INTEGRATED CIRCUIT CAPABLE OF SCREENING CONFORMING DI...

System On Chip For Digital Control Of Electronic Power Devices

Test Apparatus And Method For Testing Analog/Digital Converters

Electrical circuit and method for testing electronic component

High speed data converter testing devices, methods, & systems

Scheme and method for testing analog-to digital converters

System on chip for digital control of electronic power devices

Apparatus and method for measuring data converter

Built-in self-test apparatus and method for digital-to-analog conve...

System on chip for digital control of electronic power devices

TESTING METHOD AND APPARATUS OF GLITCH NOISE AND STORAGE MEDIUM

Analog to digital converter with encoder circuit and testing method...

Evaluation system for analog-digital or digital-analog converter

Analog to digital converter with encoder circuit and testing method...