for controlling eveness

Industry

CPC
G01B5/285

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B5/00Measuring arrangements characterised by the use of mechanical means

Current Industry

G01B5/285for controlling eveness

Industries

Patents Grantslast 30 patents

Information Patent Grant
Skate blade flatness gage
- Patent number 12,135,210
- Issue date Nov 5, 2024
- Michael William Hauer
- G01 - MEASURING TESTING
Information Patent Grant
Continuous high resolution surface profiling apparatus and method
- Patent number RE49844
- Issue date Feb 20, 2024
- Paul Toom
Information Patent Grant
Measuring device for measuring uneveness of a surface of an item
- Patent number 11,835,336
- Issue date Dec 5, 2023
- LM Wind Power A/S
- Casper Kildegaard
- G01 - MEASURING TESTING
Information Patent Grant
Grading tools
- Patent number 11,656,069
- Issue date May 23, 2023
- Massimo Conte
- G01 - MEASURING TESTING
Information Patent Grant
Grading tools
- Patent number 11,619,479
- Issue date Apr 4, 2023
- Massimo Conte
- G01 - MEASURING TESTING
Information Patent Grant
Large-size synthetic quartz glass substrate, evaluation method, and...
- Patent number 11,591,260
- Issue date Feb 28, 2023
- Shin-Etsu Chemical Co., Ltd.
- Yoko Ishitsuka
- B24 - GRINDING POLISHING
Information Patent Grant
Inclinometer-based surface profilometry
- Patent number 11,326,879
- Issue date May 10, 2022
- Appareo Systems, LLC
- Marshall T. Bremer
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Grant
Method for measuring the flatness of a metal product and associated...
- Patent number 11,235,365
- Issue date Feb 1, 2022
- CLECIM S.A.S.
- Bastien Bouby
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Jig for inspecting display module
- Patent number 10,989,938
- Issue date Apr 27, 2021
- BOE Technology Group Co., Ltd.
- Faxin Qu
- G01 - MEASURING TESTING
Information Patent Grant
System for shape error in-situ measurement of large-scale torus
- Patent number 10,976,146
- Issue date Apr 13, 2021
- Dalian University of Technology
- Qingchao Sun
- G01 - MEASURING TESTING
Information Patent Grant
Large-size synthetic quartz glass substrate, evaluation method, and...
- Patent number 10,865,139
- Issue date Dec 15, 2020
- Shin-Etsu Chemical Co., Ltd.
- Yoko Ishitsuka
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Cylindrical target production method and cylindrical target
- Patent number 10,670,384
- Issue date Jun 2, 2020
- Sumitomo Chemical Company, Limited
- Mizuki Shiraishi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Indium phosphide substrate, method of inspecting indium phosphide s...
- Patent number 10,663,277
- Issue date May 26, 2020
- Sumitomo Electric Industries, Ltd.
- Shinya Fujiwara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wheel flange planeness detection device
- Patent number 10,571,240
- Issue date Feb 25, 2020
- CITIC Dicastal CO., LTD.
- Huiying Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for verifying perpendicularity of concrete tes...
- Patent number 10,551,161
- Issue date Feb 4, 2020
- Deslauriers, Inc.
- Gary Workman
- G01 - MEASURING TESTING
Information Patent Grant
Flatness detector
- Patent number 10,508,893
- Issue date Dec 17, 2019
- Fu Tai Hua Industry (Shenzhen) Co., Ltd.
- Li-Chin Lu
- G01 - MEASURING TESTING
Information Patent Grant
Indium phosphide substrate, method of inspecting indium phosphide s...
- Patent number 10,473,445
- Issue date Nov 12, 2019
- Sumitomo Electric Industries, Ltd.
- Shinya Fujiwara
- B24 - GRINDING POLISHING
Information Patent Grant
Indium phosphide substrate, method of inspecting indium phosphide s...
- Patent number 10,436,566
- Issue date Oct 8, 2019
- Sumitomo Electric Industries, Ltd.
- Shinya Fujiwara
- G01 - MEASURING TESTING
Information Patent Grant
Flange checking apparatus for performing on-site flange run-out checks
- Patent number 10,254,098
- Issue date Apr 9, 2019
- Matthew Narayane
- G01 - MEASURING TESTING
Information Patent Grant
Test indicator
- Patent number 9,933,277
- Issue date Apr 3, 2018
- Mitutoyo Corporation
- Tatsushi Terauchi
- G01 - MEASURING TESTING
Information Patent Grant
Tilt angle adjuster for form measuring device
- Patent number 9,891,033
- Issue date Feb 13, 2018
- Mitutoyo Corporation
- Youhei Onodera
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring flatness of plate
- Patent number 9,739,590
- Issue date Aug 22, 2017
- Samsung Display Co., Ltd.
- Jeong Won Han
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring the faces of a crank bearing
- Patent number 9,683,914
- Issue date Jun 20, 2017
- JENOPTIK Industrial Metrology Germany GmbH
- Guido Dietz
- G01 - MEASURING TESTING
Information Patent Grant
Continuous high resolution surface profiling apparatus and method
- Patent number 9,404,738
- Issue date Aug 2, 2016
- Paul Toom
- G01 - MEASURING TESTING
Information Patent Grant
Flatness inspection spider
- Patent number 9,329,018
- Issue date May 3, 2016
- MERIDIAN EQUIPMENT, INC.
- Jeffery A. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Tool for detecting verticality between axle hole and milling plane
- Patent number 9,228,818
- Issue date Jan 5, 2016
- ZHEJIANG LINIX MOTOR CO., LTD.
- Xin Wang
- G01 - MEASURING TESTING
Information Patent Grant
Straightness measuring instrument
- Patent number 9,228,820
- Issue date Jan 5, 2016
- Chin-Chang Huang
- G01 - MEASURING TESTING
Information Patent Grant
Flatness measuring apparatus
- Patent number 9,074,867
- Issue date Jul 7, 2015
- Shenzhen Futaihong Precision Industry Co., Ltd.
- Jin-Shan Cui
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring form attributes, position attribute...
- Patent number 8,964,023
- Issue date Feb 24, 2015
- JENOPTIK Industrial Metrology Germany GmbH
- Ernst Neumann
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring and/or testing waviness of a planar textile
- Patent number 8,573,035
- Issue date Nov 5, 2013
- Airbus Operations GmbH
- Julian Kuntz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM AND CHECKING METHOD
- Publication number 20240019238
- Publication date Jan 18, 2024
- SINTOKOGIO, LTD.
- Yoshikane TANAAMI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR MEASURING UNEVENESS OF A SURFACE OF AN ITEM
- Publication number 20220404132
- Publication date Dec 22, 2022
- LM WIND POWER A/S
- Casper KILDEGAARD
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING THE CONFIGURATION OF ELONGATED E...
- Publication number 20220214153
- Publication date Jul 7, 2022
- SCHNELL S.P.A.
- Simone RUPOLI
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
METHODS AND APPARATUS FOR ESTIMATING MATERIAL SHEET SHAPE
- Publication number 20220163309
- Publication date May 26, 2022
- Corning Incorporated
- John Steele Abbott
- G01 - MEASURING TESTING
Information Patent Application
GRADING TOOLS
- Publication number 20220128344
- Publication date Apr 28, 2022
- Massimo CONTE
- G01 - MEASURING TESTING
Information Patent Application
LARGE-SIZE SYNTHETIC QUARTZ GLASS SUBSTRATE, EVALUATION METHOD, AND...
- Publication number 20200346974
- Publication date Nov 5, 2020
- Shin-Etsu Chemical Co., Ltd.
- Yoko ISHITSUKA
- G01 - MEASURING TESTING
Information Patent Application
Skate Blade Flatness Gage
- Publication number 20200309499
- Publication date Oct 1, 2020
- Michael William Hauer
- G01 - MEASURING TESTING
Information Patent Application
INCLINOMETER-BASED SURFACE PROFILOMETRY
- Publication number 20200309521
- Publication date Oct 1, 2020
- Appareo Systems, LLC
- Marshall T. Bremer
- G01 - MEASURING TESTING
Information Patent Application
INDIUM PHOSPHIDE SUBSTRATE, METHOD OF INSPECTING INDIUM PHOSPHIDE S...
- Publication number 20200041247
- Publication date Feb 6, 2020
- Sumitomo Electric Industries, Ltd.
- Shinya FUJIWARA
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD FOR SHAPE ERROR IN-SITU MEASUREMENT OF TORUSES
- Publication number 20190178642
- Publication date Jun 13, 2019
- DALIAN UNIVERSITY OF TECHNOLOGY
- Qingchao SUN
- G01 - MEASURING TESTING
Information Patent Application
WHEEL FLANGE PLANENESS DETECTION DEVICE
- Publication number 20190025039
- Publication date Jan 24, 2019
- CITIC Dicastal CO.,L TD
- Huiying LIU
- G01 - MEASURING TESTING
Information Patent Application
LARGE-SIZE SYNTHETIC QUARTZ GLASS SUBSTRATE, EVALUATION METHOD, AND...
- Publication number 20180319705
- Publication date Nov 8, 2018
- Shin-Etsu Chemical Co., Ltd.
- Yoko ISHITSUKA
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
METHOD FOR MEASURING THE FLATNESS OF A METAL PRODUCT AND ASSOCIATED...
- Publication number 20180318895
- Publication date Nov 8, 2018
- Primetals Technologies France SAS
- Bastien BOUBY
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
METHOD AND APPARATUS FOR VERIFYING PERPENDICULARITY OF CONCRETE TES...
- Publication number 20180292195
- Publication date Oct 11, 2018
- Deslauriers, Inc.
- Gary Workman
- G01 - MEASURING TESTING
Information Patent Application
TILT ANGLE ADJUSTER FOR FORM MEASURING DEVICE
- Publication number 20160290778
- Publication date Oct 6, 2016
- MITUTOYO CORPORATION
- Youhei ONODERA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR MEASURING FLATNESS OF PLATE
- Publication number 20160290777
- Publication date Oct 6, 2016
- SAMSUNG DISPLAY CO., LTD.
- Jeong Won Han
- G01 - MEASURING TESTING
Information Patent Application
SHAPE SENSOR DEVICES, SHAPE ERROR DETECTION SYSTEMS, AND RELATED SH...
- Publication number 20150233694
- Publication date Aug 20, 2015
- Guil Bergman
- G01 - MEASURING TESTING
Information Patent Application
STRAIGHTNESS MEASURING INSTRUMENT
- Publication number 20150226536
- Publication date Aug 13, 2015
- Chin-Chang HUANG
- G01 - MEASURING TESTING
Information Patent Application
REUSABLE SHIM SHELL MECHANICAL EDGE SETTING SYSTEM AND METHOD FOR S...
- Publication number 20150027082
- Publication date Jan 29, 2015
- New Standards Manufacturing Co.
- James P. Hoffman
- E04 - BUILDING
Information Patent Application
Tape Measure with Measurement Indicia Dial
- Publication number 20140352164
- Publication date Dec 4, 2014
- Scott Goldstein
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS HIGH RESOLUTION SURFACE PROFILING APPARATUS AND METHOD
- Publication number 20140324383
- Publication date Oct 30, 2014
- Paul Toom
- G01 - MEASURING TESTING
Information Patent Application
FLATNESS MEASURING APPARATUS
- Publication number 20140182153
- Publication date Jul 3, 2014
- FIH (HONG KONG) LIMITED
- JIN-SHAN CUI
- G01 - MEASURING TESTING
Information Patent Application
Tool for Detecting Verticality between Axle Hole and Milling Plane
- Publication number 20130318806
- Publication date Dec 5, 2013
- ZHEJIANG LINIX MOTOR CO., LTD.
- Xin Wang
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Measuring Form Attributes, Position Attribute...
- Publication number 20130300861
- Publication date Nov 14, 2013
- JENOPTIK Industrial Metrology Germany GmbH
- Ernst NEUMANN
- G01 - MEASURING TESTING
Information Patent Application
CURVATURE EXAMINING JIG
- Publication number 20120096727
- Publication date Apr 26, 2012
- ASKEY COMPUTER CORP.
- JIA-CHUN ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING AND/OR TESTING WAVINESS OF A PLANAR TEXTILE
- Publication number 20110247410
- Publication date Oct 13, 2011
- SQI Diagnostics Systems Inc.
- Julian Kuntz
- G01 - MEASURING TESTING
Information Patent Application
STRAIGHTNESS MEASURING METHOD AND STRAIGHTNESS MEASURING APPARATUS
- Publication number 20100106455
- Publication date Apr 29, 2010
- Sumitomo Heavy Industries, Ltd.
- Yoshihisa KIYOTA
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT SHAPE SENSOR AND DEVICE
- Publication number 20090113993
- Publication date May 7, 2009
- MACHINE CONCEPTS, INC.
- John Elting
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
MICROMETER-BASED MEASURING SYSTEM AND METHOD OF USING SAME
- Publication number 20080155846
- Publication date Jul 3, 2008
- SHENZHEN FUTAIHONG PRECISION INDUSTRY CO., LTD.
- LEI LI
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Measuring Waviness of Sheet Materials
- Publication number 20080155850
- Publication date Jul 3, 2008
- Sonoco Development, Inc.
- Edgar Robert Campbell
- G01 - MEASURING TESTING

for controlling eveness

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Skate blade flatness gage

Continuous high resolution surface profiling apparatus and method

Measuring device for measuring uneveness of a surface of an item

Grading tools

Grading tools

Large-size synthetic quartz glass substrate, evaluation method, and...

Inclinometer-based surface profilometry

Method for measuring the flatness of a metal product and associated...

Jig for inspecting display module

System for shape error in-situ measurement of large-scale torus

Large-size synthetic quartz glass substrate, evaluation method, and...

Cylindrical target production method and cylindrical target

Indium phosphide substrate, method of inspecting indium phosphide s...

Wheel flange planeness detection device

Method and apparatus for verifying perpendicularity of concrete tes...

Flatness detector

Indium phosphide substrate, method of inspecting indium phosphide s...

Indium phosphide substrate, method of inspecting indium phosphide s...

Flange checking apparatus for performing on-site flange run-out checks

Test indicator

Tilt angle adjuster for form measuring device

Device for measuring flatness of plate

Device for measuring the faces of a crank bearing

Continuous high resolution surface profiling apparatus and method

Flatness inspection spider

Tool for detecting verticality between axle hole and milling plane

Straightness measuring instrument

Flatness measuring apparatus

Device and method for measuring form attributes, position attribute...

Method for measuring and/or testing waviness of a planar textile

Patents Applicationslast 30 patents

MEASUREMENT SYSTEM AND CHECKING METHOD

MEASURING DEVICE FOR MEASURING UNEVENESS OF A SURFACE OF AN ITEM

METHOD AND APPARATUS FOR DETECTING THE CONFIGURATION OF ELONGATED E...

METHODS AND APPARATUS FOR ESTIMATING MATERIAL SHEET SHAPE

GRADING TOOLS

LARGE-SIZE SYNTHETIC QUARTZ GLASS SUBSTRATE, EVALUATION METHOD, AND...

Skate Blade Flatness Gage

INCLINOMETER-BASED SURFACE PROFILOMETRY

INDIUM PHOSPHIDE SUBSTRATE, METHOD OF INSPECTING INDIUM PHOSPHIDE S...

METHOD FOR SHAPE ERROR IN-SITU MEASUREMENT OF TORUSES

WHEEL FLANGE PLANENESS DETECTION DEVICE

LARGE-SIZE SYNTHETIC QUARTZ GLASS SUBSTRATE, EVALUATION METHOD, AND...

METHOD FOR MEASURING THE FLATNESS OF A METAL PRODUCT AND ASSOCIATED...

METHOD AND APPARATUS FOR VERIFYING PERPENDICULARITY OF CONCRETE TES...

TILT ANGLE ADJUSTER FOR FORM MEASURING DEVICE

DEVICE FOR MEASURING FLATNESS OF PLATE

SHAPE SENSOR DEVICES, SHAPE ERROR DETECTION SYSTEMS, AND RELATED SH...

STRAIGHTNESS MEASURING INSTRUMENT

REUSABLE SHIM SHELL MECHANICAL EDGE SETTING SYSTEM AND METHOD FOR S...

Tape Measure with Measurement Indicia Dial

CONTINUOUS HIGH RESOLUTION SURFACE PROFILING APPARATUS AND METHOD

FLATNESS MEASURING APPARATUS

Tool for Detecting Verticality between Axle Hole and Milling Plane

Device and Method for Measuring Form Attributes, Position Attribute...

CURVATURE EXAMINING JIG

METHOD FOR MEASURING AND/OR TESTING WAVINESS OF A PLANAR TEXTILE

STRAIGHTNESS MEASURING METHOD AND STRAIGHTNESS MEASURING APPARATUS

NON-CONTACT SHAPE SENSOR AND DEVICE

MICROMETER-BASED MEASURING SYSTEM AND METHOD OF USING SAME

Apparatus and Method for Measuring Waviness of Sheet Materials