for dc performance

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CPC
H03M1/109

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HELECTRICITY H03Electronic circuits H03MCODING DECODING CODE CONVERSION IN GENERAL H03M1/00Analogue/digital conversion Digital/analogue conversion

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H03M1/109for dc performance

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Baseline wander compensator and method
- Patent number 12,021,543
- Issue date Jun 25, 2024
- MACOM Technology Solutions Holdings, Inc.
- David Foley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of testing electronic circuits and corresponding circuit
- Patent number 11,762,019
- Issue date Sep 19, 2023
- STMicroelectronics S.r.l.
- David Vincenzoni
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic circuits and corresponding circuit
- Patent number 11,500,021
- Issue date Nov 15, 2022
- STMicroelectronics S.r.l.
- David Vincenzoni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems with ADC circuitry and associated methods
- Patent number 11,489,537
- Issue date Nov 1, 2022
- Semiconductor Components Industries, LLC
- Bharat Balar
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Phase frequency response measurement method
- Patent number 11,372,041
- Issue date Jun 28, 2022
- Guzik Technical Enterprises
- Valeriy Serebryanskiy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device which detects occurrence of an abnormality dur...
- Patent number 11,327,829
- Issue date May 10, 2022
- Kabushiki Kaisha Toshiba
- Shigeru Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Switching circuit for checking an analog input circuit of an A/D co...
- Patent number 10,998,913
- Issue date May 4, 2021
- WAGO Verwaltungsgesellschaft mbH
- Alexander Buelow
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low noise and low distortion test method and system for analog-to-d...
- Patent number 10,892,768
- Issue date Jan 12, 2021
- Texas Instruments Incorporated
- Rahul Vijay Kulkarni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
ADC self-test using time base and current source
- Patent number 10,637,494
- Issue date Apr 28, 2020
- Microchip Technology Incorporated
- James E. Bartling
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Apparatus and method for the characterization of analog-to-digital...
- Patent number RE47805
- Issue date Jan 7, 2020
- Infineon Technologies AG
- Heinz Mattes
Information Patent Grant
Pattern based estimation of errors in ADC
- Patent number 10,320,405
- Issue date Jun 11, 2019
- Texas Instruments Incorporated
- Srinivas Kumar Reddy Naru
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit for measuring flicker noise and method of using the same
- Patent number 10,295,583
- Issue date May 21, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chao Chieh Li
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit including calibration for offset voltage compensation
- Patent number 10,122,372
- Issue date Nov 6, 2018
- Keysight Technologies, Inc.
- Daniel James Huber
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Successive approximation type analog-to-digital (A/D) converter
- Patent number 10,090,851
- Issue date Oct 2, 2018
- Olympus Corporation
- Shuzo Hiraide
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for performing ADC phase-frequency response test
- Patent number 10,090,849
- Issue date Oct 2, 2018
- Chenguang Cai
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test for ADC
- Patent number 10,079,610
- Issue date Sep 18, 2018
- Infineon Technologies AG
- Peter Bogner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for identifying a failure in an analog to digit...
- Patent number 9,935,646
- Issue date Apr 3, 2018
- Schweitzer Engineering Laboratories, Inc.
- Travis C. Mallett
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and circuit for testing successive approximation ADC
- Patent number 9,800,255
- Issue date Oct 24, 2017
- Realtek Semiconductor Corporation
- Shih-Hsiung Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital converting device and method of operating analog-...
- Patent number 9,692,437
- Issue date Jun 27, 2017
- Electronics and Telecommunications Research Institute
- Young-deuk Jeon
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for measuring the DC-transfer characteristic of a...
- Patent number 9,584,146
- Issue date Feb 28, 2017
- Mediatek Inc.
- Frank Op 't Eynde
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog-to-digital conversion circuit
- Patent number 9,496,885
- Issue date Nov 15, 2016
- Socionext, Inc.
- Takeshi Takayama
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for testing differential analog-to-digital converter and sys...
- Patent number 9,438,262
- Issue date Sep 6, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Tao Chen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 9,258,006
- Issue date Feb 9, 2016
- Renesas Electronics Corporation
- Takashi Oshima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On-chip analog-to-digital converter (ADC) linearity text for embedd...
- Patent number 9,240,798
- Issue date Jan 19, 2016
- Texas Instruments Incorporated
- Cormac Harrington
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and methodology for analog-to-digital converter linearity te...
- Patent number 9,184,759
- Issue date Nov 10, 2015
- Zhongjun Yu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for estimation of offset and gain errors in a t...
- Patent number 9,154,147
- Issue date Oct 6, 2015
- Integrated Device Technology Inc.
- Arnaud Biallais
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device
- Patent number 9,124,288
- Issue date Sep 1, 2015
- Renesas Electronics Corporation
- Takahiro Umezaki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
ADC testing
- Patent number 9,106,247
- Issue date Aug 11, 2015
- Ateeda Ltd.
- David Hamilton
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for interference suppression of a sampling process and a dev...
- Patent number 9,106,245
- Issue date Aug 11, 2015
- Robert Bosch GmbH
- Thomas Wuchert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 9,100,034
- Issue date Aug 4, 2015
- Renesas Electronics Corporation
- Takashi Oshima
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
TESTING ADCs
- Publication number 20240187014
- Publication date Jun 6, 2024
- NORDIC SEMICONDUCTOR ASA
- Henrik FON
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
BASELINE WANDER COMPENSATOR AND METHOD
- Publication number 20230403023
- Publication date Dec 14, 2023
- MACOM Technology Solution Holdings, Inc.
- David Foley
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD OF TESTING ELECTRONIC CIRCUITS AND CORRESPONDING CIRCUIT
- Publication number 20230031516
- Publication date Feb 2, 2023
- STMicroelectronics S.r.l
- David Vincenzoni
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PHASE FREQUENCY RESPONSE MEASUREMENT METHOD
- Publication number 20220170979
- Publication date Jun 2, 2022
- Guzik Technical Enterprises
- Valeriy Serebryanskiy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SWITCHING CIRCUIT FOR CHECKING AN ANALOG INPUT CIRCUIT OF AN A/D CO...
- Publication number 20200228130
- Publication date Jul 16, 2020
- WAGO Verwaltungsgesellschaft mit beschränkter Haftung
- Alexander BUELOW
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PATTERN BASED ESTIMATION OF ERRORS IN ADC
- Publication number 20180191362
- Publication date Jul 5, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Srinivas Kumar Reddy Naru
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SUCCESSIVE APPROXIMATION TYPE ANALOG-TO-DIGITAL (A/D) CONVERTER
- Publication number 20180083646
- Publication date Mar 22, 2018
- OLYMPUS CORPORATION
- Shuzo Hiraide
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR IDENTIFYING A FAILURE IN AN ANALOG TO DIGIT...
- Publication number 20170019120
- Publication date Jan 19, 2017
- Schweitzer Engineering Laboratories, Inc.
- Travis C. Mallett
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT FOR MEASURING FLICKER NOISE AND METHOD OF USING THE SAME
- Publication number 20160305999
- Publication date Oct 20, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chao Chieh LI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150326238
- Publication date Nov 12, 2015
- RENESAS ELECTRONICS CORPORATION
- Takahiro UMEZAKI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEXT FOR EMBEDD...
- Publication number 20150249458
- Publication date Sep 3, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Cormac HARRINGTON
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150188557
- Publication date Jul 2, 2015
- RENESAS ELECTRONICS CORPORATION
- Takahiro UMEZAKI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR INTERFERENCE SUPPRESSION OF A SAMPLING PROCESS AND A DEV...
- Publication number 20150116139
- Publication date Apr 30, 2015
- ROBERT BOSCH GmbH
- Thomas Wuchert
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
APPARATUS AND METHOD FOR THE CHARACTERIZATION OF ANALOG-TO-DIGITAL...
- Publication number 20140333464
- Publication date Nov 13, 2014
- INFINEON TECHNOLOGIES AG
- Heinz MATTES
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEMORYLESS SLIDING WINDOW HISTOGRAM BASED BIST
- Publication number 20140333460
- Publication date Nov 13, 2014
- STMicroelectronics International N.V
- Ravindranath Ramalingaiah Munnan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND METHODS FOR ESTIMATION OF OFFSET AND GAIN ERRORS IN A T...
- Publication number 20140266823
- Publication date Sep 18, 2014
- Arnaud Biallais
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20140253352
- Publication date Sep 11, 2014
- RENESAS ELECTRONICS CORPORATION
- Takashi OSHIMA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ADC TESTING
- Publication number 20140203954
- Publication date Jul 24, 2014
- Ateeda LTD
- David Hamilton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS, SYSTEMS AND METHODS FOR FOR DIGITAL TESTING OF ADC/DAC C...
- Publication number 20140191890
- Publication date Jul 10, 2014
- Stephen J. Spinks
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CONVERSION CIRCUIT AND CHIP
- Publication number 20140143624
- Publication date May 22, 2014
- Huawei Technologies Co., Ltd
- Peter Kaiping DENG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR VERIFYING DIGITAL TO ANALOG CONVERTER DESIGN
- Publication number 20140115549
- Publication date Apr 24, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Cheng Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TESTING OF DIGITAL TO ANALOG CONVERTERS IN SERIAL INTERFACES
- Publication number 20140049415
- Publication date Feb 20, 2014
- International Business Machines Corporation
- Steven J. Baumgartner
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System and Method for Detection of ADC Errors
- Publication number 20130249721
- Publication date Sep 26, 2013
- TYCO HEALTHCARE GROUP LP
- Robert B. Smith
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND APPARATUS FOR SELF-TEST OF SUCCESSIVE APPROXIMATION REGI...
- Publication number 20130249723
- Publication date Sep 26, 2013
- Sanjoy K. Dey
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TESTING APPARATUS AND METHOD FOR TESTING ANALOG-TO-DIGITAL CONVERTER
- Publication number 20130154861
- Publication date Jun 20, 2013
- SILICON MOTION, INC.
- Hung-Sheng CHANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR SELF-TEST OF SUCCESSIVE APPROXIMATION REGI...
- Publication number 20120256774
- Publication date Oct 11, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Sanjoy K. Dey
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST APPARATUS AND TEST METHOD FOR A/D CONVERTER
- Publication number 20120229314
- Publication date Sep 13, 2012
- Advantest Corporation
- Koji Asami
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CAPACITIVE INPUT TEST METHOD
- Publication number 20120098557
- Publication date Apr 26, 2012
- Zentrum Mikroelektronik Dresden AG
- Mathias Krauss
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR SELF-TESTING A DIGITAL-TO-ANALOG CONVERTER...
- Publication number 20120098687
- Publication date Apr 26, 2012
- MOTOROLA, INC.
- JEFFREY B. WILHITE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD OF TESTING DIGITAL-TO-ANALOG AND ANALOG-TO-DIGITAL CONVERTERS
- Publication number 20120075130
- Publication date Mar 29, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Jun ZHANG
- H03 - BASIC ELECTRONIC CIRCUITRY

for dc performance

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Baseline wander compensator and method

Method of testing electronic circuits and corresponding circuit

Method of testing electronic circuits and corresponding circuit

Systems with ADC circuitry and associated methods

Phase frequency response measurement method

Semiconductor device which detects occurrence of an abnormality dur...

Switching circuit for checking an analog input circuit of an A/D co...

Low noise and low distortion test method and system for analog-to-d...

ADC self-test using time base and current source

Apparatus and method for the characterization of analog-to-digital...

Pattern based estimation of errors in ADC

Circuit for measuring flicker noise and method of using the same

Circuit including calibration for offset voltage compensation

Successive approximation type analog-to-digital (A/D) converter

Method for performing ADC phase-frequency response test

Built-in self-test for ADC

Systems and methods for identifying a failure in an analog to digit...

Method and circuit for testing successive approximation ADC

Analog-to-digital converting device and method of operating analog-...

System and method for measuring the DC-transfer characteristic of a...

Analog-to-digital conversion circuit

Method for testing differential analog-to-digital converter and sys...

Semiconductor integrated circuit device

On-chip analog-to-digital converter (ADC) linearity text for embedd...

System and methodology for analog-to-digital converter linearity te...

Systems and methods for estimation of offset and gain errors in a t...

Semiconductor device

ADC testing

Method for interference suppression of a sampling process and a dev...

Semiconductor integrated circuit device

Patents Applicationslast 30 patents

TESTING ADCs

BASELINE WANDER COMPENSATOR AND METHOD

METHOD OF TESTING ELECTRONIC CIRCUITS AND CORRESPONDING CIRCUIT

PHASE FREQUENCY RESPONSE MEASUREMENT METHOD

SWITCHING CIRCUIT FOR CHECKING AN ANALOG INPUT CIRCUIT OF AN A/D CO...

PATTERN BASED ESTIMATION OF ERRORS IN ADC

SUCCESSIVE APPROXIMATION TYPE ANALOG-TO-DIGITAL (A/D) CONVERTER

SYSTEMS AND METHODS FOR IDENTIFYING A FAILURE IN AN ANALOG TO DIGIT...

CIRCUIT FOR MEASURING FLICKER NOISE AND METHOD OF USING THE SAME

SEMICONDUCTOR DEVICE

ON-CHIP ANALOG-TO-DIGITAL CONVERTER (ADC) LINEARITY TEXT FOR EMBEDD...

SEMICONDUCTOR DEVICE

METHOD FOR INTERFERENCE SUPPRESSION OF A SAMPLING PROCESS AND A DEV...

APPARATUS AND METHOD FOR THE CHARACTERIZATION OF ANALOG-TO-DIGITAL...

MEMORYLESS SLIDING WINDOW HISTOGRAM BASED BIST

SYSTEMS AND METHODS FOR ESTIMATION OF OFFSET AND GAIN ERRORS IN A T...

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

ADC TESTING

APPARATUS, SYSTEMS AND METHODS FOR FOR DIGITAL TESTING OF ADC/DAC C...

CONVERSION CIRCUIT AND CHIP

METHOD FOR VERIFYING DIGITAL TO ANALOG CONVERTER DESIGN

TESTING OF DIGITAL TO ANALOG CONVERTERS IN SERIAL INTERFACES

System and Method for Detection of ADC Errors

METHOD AND APPARATUS FOR SELF-TEST OF SUCCESSIVE APPROXIMATION REGI...

TESTING APPARATUS AND METHOD FOR TESTING ANALOG-TO-DIGITAL CONVERTER

METHOD AND APPARATUS FOR SELF-TEST OF SUCCESSIVE APPROXIMATION REGI...

TEST APPARATUS AND TEST METHOD FOR A/D CONVERTER

CAPACITIVE INPUT TEST METHOD

METHOD AND APPARATUS FOR SELF-TESTING A DIGITAL-TO-ANALOG CONVERTER...

METHOD OF TESTING DIGITAL-TO-ANALOG AND ANALOG-TO-DIGITAL CONVERTERS