for detection of specific nanostructure sample or nanostructure-related property

Industry

CPC
Y10S977/852

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

Current Industry

Y10S977/852for detection of specific nanostructure sample or nanostructure-related property

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for single-molecule detection using nanopores
- Patent number 11,624,727
- Issue date Apr 11, 2023
- The Trustees of Columbia University In the City of New York
- Jacob Rosenstein
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for characterizing carbon nanotubes by using scanning electr...
- Patent number 10,020,191
- Issue date Jul 10, 2018
- Tsinghua University
- Dong-Qi Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Systems and methods for single-molecule detection using nanopores
- Patent number 9,217,727
- Issue date Dec 22, 2015
- The Trustees of Columbia University In the City of New York
- Jacob Rosenstein
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method for molecular separation, purification, and se...
- Patent number 8,968,545
- Issue date Mar 3, 2015
- Lux Bio Group, Inc.
- Gordon Holt
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Hybrid contact mode scanning cantilever system
- Patent number 8,156,568
- Issue date Apr 10, 2012
- Picocal, Inc.
- Angelo Gaitas
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 8,102,174
- Issue date Jan 24, 2012
- Infineon Technologies North America Corp.
- Daniel Christopher Worledge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 8,027,185
- Issue date Sep 27, 2011
- International Business Machines Corporation
- Daniel Christopher Worledge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 8,004,278
- Issue date Aug 23, 2011
- International Business Machines Corporation
- Daniel Christopher Worledge
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe in pulsed-force mode, digital and in real time
- Patent number 7,877,816
- Issue date Jan 25, 2011
- Witec Wissenschaftliche Instrumente und Technologie GmbH
- Peter Spizig
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods for verifying fluid movement
- Patent number 7,795,037
- Issue date Sep 14, 2010
- Novartis Vaccines and Diagnostics, Inc.
- Willy Lagwinski
- G01 - MEASURING TESTING
Information Patent Grant
Wafer for electrically characterizing tunnel junction film stacks w...
- Patent number 7,622,735
- Issue date Nov 24, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning method
- Patent number 7,456,400
- Issue date Nov 25, 2008
- Seiko Instruments Inc.
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe characterization of surfaces
- Patent number 7,420,106
- Issue date Sep 2, 2008
- The University of Utah Research Foundation
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Grant
Methods for verifying fluid movement
- Patent number 7,384,795
- Issue date Jun 10, 2008
- Novartis Vaccines and Diagnostics, Inc.
- Willy Lagwinski
- G01 - MEASURING TESTING
Information Patent Grant
In situ scanning tunneling microscope tip treatment device for spin...
- Patent number 7,361,893
- Issue date Apr 22, 2008
- UT-Battelle, LLC
- An-Ping Li
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and specimen observation method and semic...
- Patent number 7,323,684
- Issue date Jan 29, 2008
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning in scanning probe microscopy and...
- Patent number 7,178,387
- Issue date Feb 20, 2007
- General Nanotechnology L.L.C.
- Victor B. Kley
- G01 - MEASURING TESTING
Information Patent Grant
Topography and recognition imaging atomic force microscope and meth...
- Patent number 7,152,462
- Issue date Dec 26, 2006
- Agilent Technologies, Inc.
- Peter Hinterdorfer
- G01 - MEASURING TESTING
Information Patent Grant
Dual stage instrument for scanning a specimen
- Patent number 7,100,430
- Issue date Sep 5, 2006
- KLA-Tencor Corporation
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Grant
Sensing mode atomic force microscope
- Patent number 7,095,020
- Issue date Aug 22, 2006
- Brookhaven Science Associates
- Paul V. C. Hough
- G01 - MEASURING TESTING
Information Patent Grant
Spatially resolved electromagnetic property measurement
- Patent number 7,078,896
- Issue date Jul 18, 2006
- The Trustees of the University of Pennsylvania
- Dawn A. Bonnell
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 7,066,015
- Issue date Jun 27, 2006
- SII NanoTechnology Inc.
- Akihiko Honma
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and specimen observation method
- Patent number 7,067,806
- Issue date Jun 27, 2006
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy, method of measuring surface configuration...
- Patent number 6,989,535
- Issue date Jan 24, 2006
- Hitachi, Ltd.
- Hiroshi Tani
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and method for picking and placing of nanoscale objects uti...
- Patent number 6,987,277
- Issue date Jan 17, 2006
- Zyvex Corporation
- Christof Baur
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic force microscopy measurements of contact resistance and curr...
- Patent number 6,981,407
- Issue date Jan 3, 2006
- Fidelica Microsystems, Inc.
- Shiva Prakash
- G01 - MEASURING TESTING
Information Patent Grant
Scanning tip orientation adjustment method for atomic force microscopy
- Patent number 6,978,654
- Issue date Dec 27, 2005
- Infineon Technologies AG
- David James Shuman
- G01 - MEASURING TESTING
Information Patent Grant
Topography and recognition imaging atomic force microscope and meth...
- Patent number 6,952,952
- Issue date Oct 11, 2005
- Molecular Imaging Corporation
- Peter Hinterdorfer
- G01 - MEASURING TESTING
Information Patent Grant
Techniques for electrically characterizing tunnel junction film sta...
- Patent number 6,927,569
- Issue date Aug 9, 2005
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscopy measurements of contact resistance and curr...
- Patent number 6,912,894
- Issue date Jul 5, 2005
- Fidelica Microsystems, Inc.
- Shiva Prakash
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR SINGLE-MOLECULE DETECTION USING NANOPORES
- Publication number 20140048416
- Publication date Feb 20, 2014
- Jacob Rosenstein
- B82 - NANO-TECHNOLOGY
Information Patent Application
APPARATUS AND METHOD FOR MOLECULAR SEPARATION, PURIFICATION, AND SE...
- Publication number 20130256137
- Publication date Oct 3, 2013
- LUX BIO GROUP, INC.
- Gordon HOLT
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEMS AND METHODS FOR SINGLE-MOLECULE DETECTION USING NANOPORES
- Publication number 20130180867
- Publication date Jul 18, 2013
- THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK
- Jacob Rosenstein
- B82 - NANO-TECHNOLOGY
Information Patent Application
Techniques for Electrically Characterizing Tunnel Junction Film Sta...
- Publication number 20100023287
- Publication date Jan 28, 2010
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Electrically Characterizing Tunnel Junction Film Sta...
- Publication number 20090309587
- Publication date Dec 17, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Techniques for Electrically Characterizing Tunnel Junction Film Sta...
- Publication number 20090267597
- Publication date Oct 29, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
WAFER FOR ELECTRICALLY CHARACTERIZING TUNNEL JUNCTION FILM STACKS W...
- Publication number 20090261820
- Publication date Oct 22, 2009
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Hybrid Contact Mode Scanning Cantilever System
- Publication number 20080266575
- Publication date Oct 30, 2008
- Angelo Gaitas
- G01 - MEASURING TESTING
Information Patent Application
Methods for Verifying Fluid Movement
- Publication number 20080248587
- Publication date Oct 9, 2008
- Willy Lagwinski
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe in pulsed-force mode, digital and in real time
- Publication number 20070114406
- Publication date May 24, 2007
- Witec Wissenschaftliche Instrumente und Technologie GmbH
- Peter Spizig
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe characterization of surfaces
- Publication number 20060225164
- Publication date Oct 5, 2006
- The University of Utah
- Clayton C. Williams
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and specimen observation method and semic...
- Publication number 20060219900
- Publication date Oct 5, 2006
- Hitachi, Ltd
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and scanning method
- Publication number 20060113472
- Publication date Jun 1, 2006
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Topography and recognition imaging atomic force microscope and meth...
- Publication number 20060016251
- Publication date Jan 26, 2006
- Peter Hinterdorfer
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20050217354
- Publication date Oct 6, 2005
- Akihiko Honma
- G01 - MEASURING TESTING
Information Patent Application
Spatially resolved electromagnetic property measurement
- Publication number 20050174130
- Publication date Aug 11, 2005
- Trustees of the University of Pennsylvania
- Dawn A. Bonnell
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and specimen observation method and semic...
- Publication number 20050151077
- Publication date Jul 14, 2005
- Hitachi, Ltd
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
System and method for picking and placing of nanoscale objects util...
- Publication number 20050077468
- Publication date Apr 14, 2005
- Zyvex Corporation
- Christof Baur
- B82 - NANO-TECHNOLOGY
Information Patent Application
Sensing mode atomic force microscope
- Publication number 20050029450
- Publication date Feb 10, 2005
- Paul V.C. Hough
- G01 - MEASURING TESTING
Information Patent Application
Dual stage instrument for scanning a specimen
- Publication number 20050005688
- Publication date Jan 13, 2005
- Amin Samsavar
- G01 - MEASURING TESTING
Information Patent Application
Scanning tip orientation adjustment method for atomic force microscopy
- Publication number 20050000275
- Publication date Jan 6, 2005
- David James Shuman
- G01 - MEASURING TESTING
Information Patent Application
SCANNING TIP ORIENTATION ADJUSTMENT METHOD FOR ATOMIC FORCE MICROSCOPY
- Publication number 20040200261
- Publication date Oct 14, 2004
- David James Shuman
- G01 - MEASURING TESTING
Information Patent Application
Methods for verifying fluid movement
- Publication number 20040197929
- Publication date Oct 7, 2004
- Chiron Corporation
- Willy Lagwinski
- G01 - MEASURING TESTING
Information Patent Application
Topography and recognition imaging atomic force microscope and meth...
- Publication number 20040129064
- Publication date Jul 8, 2004
- Peter Hinterdorfer
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and specimen observation method and semic...
- Publication number 20040089059
- Publication date May 13, 2004
- Hitachi, Ltd
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Atomic force microscopy measurements of contact resistance and curr...
- Publication number 20040069052
- Publication date Apr 15, 2004
- Shiva Prakash
- G01 - MEASURING TESTING
Information Patent Application
Techniques for electrically characterizing tunnel junction film sta...
- Publication number 20040051522
- Publication date Mar 18, 2004
- International Business Machines Corporation
- Daniel Christopher Worledge
- G01 - MEASURING TESTING
Information Patent Application
Atomic force microscopy measurements of contact resistance and curr...
- Publication number 20040020284
- Publication date Feb 5, 2004
- Shiva Prakash
- G01 - MEASURING TESTING
Information Patent Application
Atomic force microscopy measurements of contact resistance and curr...
- Publication number 20040016291
- Publication date Jan 29, 2004
- Shiva Prakash
- G01 - MEASURING TESTING
Information Patent Application
Atomic force microscopy measurements of contact resistance and curr...
- Publication number 20040016285
- Publication date Jan 29, 2004
- Shiva Prakash
- G01 - MEASURING TESTING

for detection of specific nanostructure sample or nanostructure-related property

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for single-molecule detection using nanopores

Method for characterizing carbon nanotubes by using scanning electr...

Systems and methods for single-molecule detection using nanopores

Apparatus and method for molecular separation, purification, and se...

Hybrid contact mode scanning cantilever system

Techniques for electrically characterizing tunnel junction film sta...

Techniques for electrically characterizing tunnel junction film sta...

Techniques for electrically characterizing tunnel junction film sta...

Scanning probe in pulsed-force mode, digital and in real time

Methods for verifying fluid movement

Wafer for electrically characterizing tunnel junction film stacks w...

Scanning probe microscope and scanning method

Scanning probe characterization of surfaces

Methods for verifying fluid movement

In situ scanning tunneling microscope tip treatment device for spin...

Scanning probe microscope and specimen observation method and semic...

Method and apparatus for scanning in scanning probe microscopy and...

Topography and recognition imaging atomic force microscope and meth...

Dual stage instrument for scanning a specimen

Sensing mode atomic force microscope

Spatially resolved electromagnetic property measurement

Scanning probe microscope

Scanning probe microscope and specimen observation method

Atomic force microscopy, method of measuring surface configuration...

Systems and method for picking and placing of nanoscale objects uti...

Atomic force microscopy measurements of contact resistance and curr...

Scanning tip orientation adjustment method for atomic force microscopy

Topography and recognition imaging atomic force microscope and meth...

Techniques for electrically characterizing tunnel junction film sta...

Atomic force microscopy measurements of contact resistance and curr...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR SINGLE-MOLECULE DETECTION USING NANOPORES

APPARATUS AND METHOD FOR MOLECULAR SEPARATION, PURIFICATION, AND SE...

SYSTEMS AND METHODS FOR SINGLE-MOLECULE DETECTION USING NANOPORES

Techniques for Electrically Characterizing Tunnel Junction Film Sta...

Techniques for Electrically Characterizing Tunnel Junction Film Sta...

Techniques for Electrically Characterizing Tunnel Junction Film Sta...

WAFER FOR ELECTRICALLY CHARACTERIZING TUNNEL JUNCTION FILM STACKS W...

Hybrid Contact Mode Scanning Cantilever System

Methods for Verifying Fluid Movement

Scanning probe in pulsed-force mode, digital and in real time

Scanning probe characterization of surfaces

Scanning probe microscope and specimen observation method and semic...

Scanning probe microscope and scanning method

Topography and recognition imaging atomic force microscope and meth...

Scanning probe microscope

Spatially resolved electromagnetic property measurement

Scanning probe microscope and specimen observation method and semic...

System and method for picking and placing of nanoscale objects util...

Sensing mode atomic force microscope

Dual stage instrument for scanning a specimen

Scanning tip orientation adjustment method for atomic force microscopy

SCANNING TIP ORIENTATION ADJUSTMENT METHOD FOR ATOMIC FORCE MICROSCOPY

Methods for verifying fluid movement

Topography and recognition imaging atomic force microscope and meth...

Scanning probe microscope and specimen observation method and semic...

Atomic force microscopy measurements of contact resistance and curr...

Techniques for electrically characterizing tunnel junction film sta...

Atomic force microscopy measurements of contact resistance and curr...

Atomic force microscopy measurements of contact resistance and curr...

Atomic force microscopy measurements of contact resistance and curr...