for displaying measured electric variables in digital form

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CPC
G01R13/02

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

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G01R13/02for displaying measured electric variables in digital form

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Noise reduction of oscilloscope waveforms
- Patent number 12,188,963
- Issue date Jan 7, 2025
- Keysight Technologies, Inc.
- David L. Gines
- G01 - MEASURING TESTING
Information Patent Grant
Spur detection in a sampled waveform in a mixed analog/digital syst...
- Patent number 12,188,964
- Issue date Jan 7, 2025
- International Business Machines Corporation
- Timothy Lindquist
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Systems and methods for condition monitoring
- Patent number 12,140,508
- Issue date Nov 12, 2024
- Green Running Limited
- Raza Rizvi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement device and measurement method with advanced trigger
- Patent number 12,135,339
- Issue date Nov 5, 2024
- Rohde & Schwarz GmbH & Co.
- Armin Horn
- G01 - MEASURING TESTING
Information Patent Grant
Cyclic loop image representation for waveform data
- Patent number 12,092,692
- Issue date Sep 17, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Battery charger with battery state detection
- Patent number 12,087,920
- Issue date Sep 10, 2024
- Schumacher Electric Corporation
- Patrick J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Swept parameter oscilloscope
- Patent number 12,085,590
- Issue date Sep 10, 2024
- Tektronix, Inc.
- John J. Pickerd
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, computer-readable medium, and inf...
- Patent number 12,066,463
- Issue date Aug 20, 2024
- Ricoh Company, Ltd.
- Miyako Asai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Oscilloscope and signal analysis method
- Patent number 12,055,564
- Issue date Aug 6, 2024
- Rohde & Schwarz GmbH & Co. KG
- Manuel Stein
- G01 - MEASURING TESTING
Information Patent Grant
Noise reduction of oscilloscope waveforms
- Patent number 12,025,638
- Issue date Jul 2, 2024
- Keysight Technologies, Inc.
- David L. Gines
- G01 - MEASURING TESTING
Information Patent Grant
Pattern acquisitions in equivalent time sampling systems
- Patent number 12,019,098
- Issue date Jun 25, 2024
- Tektronix, Inc.
- Noah Brummer
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Digital oscilloscope having fractional calculus operation and displ...
- Patent number 11,994,536
- Issue date May 28, 2024
- University of Electronic Science and Technology of China
- Bo Xu
- G01 - MEASURING TESTING
Information Patent Grant
5-PS-resolution waveform-capture-device on a field-programmable gat...
- Patent number 11,994,571
- Issue date May 28, 2024
- OHIO STATE INNOVATION FOUNDATION
- Noeloikeau Charlot
- G01 - MEASURING TESTING
Information Patent Grant
Clock anomaly detection
- Patent number 11,962,306
- Issue date Apr 16, 2024
- NVIDIA Corporation
- Kedar Rajpathak
- G01 - MEASURING TESTING
Information Patent Grant
Tool for electronics testing and diagnostics
- Patent number 11,953,524
- Issue date Apr 9, 2024
- Gentiam LLC
- Omar Laldin
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device and method
- Patent number 11,946,951
- Issue date Apr 2, 2024
- Rohde & Schwarz GmbH & Co. KG
- Philip Diegmann
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing device as well as method of applying a zone trigger
- Patent number 11,933,819
- Issue date Mar 19, 2024
- Rohde & Schwarz GmbH & Co. KG
- Markus Breunig
- G01 - MEASURING TESTING
Information Patent Grant
Multiple analog-to-digital converter system to provide simultaneous...
- Patent number 11,936,397
- Issue date Mar 19, 2024
- Tektronix, Inc.
- Alexander Krauska
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for decoding oscilloscope signal and oscilloscope
- Patent number 11,928,068
- Issue date Mar 12, 2024
- AUTEL INTELLIGENT TECHNOLOGY CORP., LTD.
- Liangliang Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic trigger type identification method, device, and oscilloscope
- Patent number 11,906,551
- Issue date Feb 20, 2024
- RIGOL TECHNOLOGIES (BEIJING), INC.
- Shichang Suo
- G01 - MEASURING TESTING
Information Patent Grant
Voltage monitoring circuit for interface
- Patent number 11,899,061
- Issue date Feb 13, 2024
- Apple Inc.
- Fabien S. Faure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Signal analyzer
- Patent number 11,885,832
- Issue date Jan 30, 2024
- Rohde & Schwarz GmbH & Co. KG
- Thomas Guenther
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement apparatus and method for controlling a measurement appa...
- Patent number 11,879,914
- Issue date Jan 23, 2024
- Rohde & Schwarz GmbH & Co. KG
- Wolfgang Herbordt
- G01 - MEASURING TESTING
Information Patent Grant
Capacitance measurement without disconnecting from high power circuit
- Patent number 11,881,381
- Issue date Jan 23, 2024
- Lam Research Corporation
- Sunil Kapoor
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Digital oscilloscope and oscillogram generation system
- Patent number 11,874,302
- Issue date Jan 16, 2024
- BOE Technology Group Co., Ltd.
- Congrui Wu
- G01 - MEASURING TESTING
Information Patent Grant
Multiprobe measurement device and method
- Patent number 11,867,724
- Issue date Jan 9, 2024
- Gerd Bresser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement instrument
- Patent number 11,867,725
- Issue date Jan 9, 2024
- Rohde & Schwarz GmbH & Co. KG
- Bernhard Sterzbach
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact voltage sensing method and apparatus
- Patent number 11,860,195
- Issue date Jan 2, 2024
- Interbay Assets, LLC
- Michael C. Lorek
- G01 - MEASURING TESTING
Information Patent Grant
On-chip oscilloscope
- Patent number 11,835,551
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chung-Peng Hsieh
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing error in time domain waveform of a s...
- Patent number 11,821,920
- Issue date Nov 21, 2023
- Keysight Technologies, Inc.
- Marlin E. Viss
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PLATFORM TO STREAM, VIEW, ANALYZE AND COLLABORATE ON TEST AND MEASU...
- Publication number 20250020694
- Publication date Jan 16, 2025
- Tektronix, Inc.
- Thomas Buida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ANALYZING A DEMODULATED MEASUREMENT SIGNAL, COMPUTER-REA...
- Publication number 20250004050
- Publication date Jan 2, 2025
- ROHDE &SCHWARZ GMBH & CO. KG
- PB BALASUBRAMANIUM
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION
- Publication number 20250004014
- Publication date Jan 2, 2025
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
INSTRUMENT AND MEASUREMENT TRANSLATOR USING MACHINE LEARNING
- Publication number 20250004015
- Publication date Jan 2, 2025
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Application
Battery Charger with Battery State Detection
- Publication number 20240421366
- Publication date Dec 19, 2024
- Schumacher Electric Corporation
- Patrick J. Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE...
- Publication number 20240393369
- Publication date Nov 28, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURATION METHOD OF CONFIGURING A MEASUREMENT INSTRUMENT
- Publication number 20240385213
- Publication date Nov 21, 2024
- ROHDE &SCHWARZ GMBH & CO. KG
- Julius SEEGER
- G01 - MEASURING TESTING
Information Patent Application
ISOLATED TEST AND MEASUREMENT PROBE
- Publication number 20240369665
- Publication date Nov 7, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END
- Publication number 20240353447
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT RESULT DISPLAY METHOD
- Publication number 20240353448
- Publication date Oct 24, 2024
- Hioki E. E. Corporation
- Naoya KITAMURA
- G01 - MEASURING TESTING
Information Patent Application
INTERLEAVED DIGITAL TRIGGER CORRECTION
- Publication number 20240353449
- Publication date Oct 24, 2024
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Application
EYE MARGIN TEST METHOD AND ELECTRONIC APPARATUS PERFORMING TEST OPE...
- Publication number 20240310414
- Publication date Sep 19, 2024
- Samsung Electronics Co., Ltd.
- Woongki MIN
- G01 - MEASURING TESTING
Information Patent Application
Electrical Testing Device with Probe Having Portions with Different...
- Publication number 20240288471
- Publication date Aug 29, 2024
- Snap-on Incorporated
- Nicholas A. Gabbey
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT THAT USES MEASUREMENT PRECONDITIONS...
- Publication number 20240288474
- Publication date Aug 29, 2024
- Tektronix, Inc.
- David C. Vollum
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION
- Publication number 20240255572
- Publication date Aug 1, 2024
- Tektronix, Inc.
- Muhammad Saad Chughtai
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSTIC INSTRUMENT
- Publication number 20240255546
- Publication date Aug 1, 2024
- Snap-on Incorporated
- Joshua C. Covington
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL SIGNAL SAMPLING DEVICE
- Publication number 20240230719
- Publication date Jul 11, 2024
- RIGOL TECHNOLOGIES CO., LTD.
- Hui SHI
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE ANALOG-TO-DIGITAL CONVERTER SYSTEM TO PROVIDE SIMULTANEOUS...
- Publication number 20240223200
- Publication date Jul 4, 2024
- Tektronix, Inc.
- Alexander Krauska
- G01 - MEASURING TESTING
Information Patent Application
TOOL FOR ELECTRONICS TESTING AND DIAGNOSTICS
- Publication number 20240210445
- Publication date Jun 27, 2024
- Gentiam LLC
- Omar Laldin
- G01 - MEASURING TESTING
Information Patent Application
REAL-EQUIVALENT-TIME OSCILLOSCOPE
- Publication number 20240151753
- Publication date May 9, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL SIGNAL SAMPLING DEVICE
- Publication number 20240133922
- Publication date Apr 25, 2024
- RIGOL TECHNOLOGIES CO., LTD.
- Hui SHI
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE INSTRUMENT NOISE REMOVAL
- Publication number 20240125837
- Publication date Apr 18, 2024
- Tektronix, Inc.
- Kan Tan
- G01 - MEASURING TESTING
Information Patent Application
METHOD, SIGNAL PROCESSING DEVICE, AND MEASUREMENT APPLICATION DEVICE
- Publication number 20240103056
- Publication date Mar 28, 2024
- Rohde& Schwarz GmbH & Co. KG
- Mahmud NASEEF
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION DEVICE, POSTPROCESSING DEVICE, METHOD AND N...
- Publication number 20240103043
- Publication date Mar 28, 2024
- Rohde& Schwarz GmbH & Co. KG
- Volker OHLEN
- G01 - MEASURING TESTING
Information Patent Application
CAPACITANCE MEASUREMENT WITHOUT DISCONNECTING FROM HIGH POWER CIRCUIT
- Publication number 20240096598
- Publication date Mar 21, 2024
- LAM RESEARCH CORPORATION
- Sunil Kapoor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT APPLICATION DEVICE, MEASUREMENT APPLICATION SETUP AND M...
- Publication number 20240094272
- Publication date Mar 21, 2024
- Rohde& Schwarz GmbH & Co. KG
- Tobias FASTNER
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPLICATION SETUP AND METHOD
- Publication number 20240085461
- Publication date Mar 14, 2024
- Rohde& Schwarz GmbH & Co. KG
- Bendix KOOPMANN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR CONTINUOUS RECORDING AND CONTROLLABLE PLAYBACK OF INPUT...
- Publication number 20240080251
- Publication date Mar 7, 2024
- Tektronix, Inc.
- Shane L. Arnold
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DE-SKEW METHOD FOR DYNAMIC TESTING USING TRANSFER FUNCTION OF CURRE...
- Publication number 20240069070
- Publication date Feb 29, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Takamasa Arai
- G01 - MEASURING TESTING
Information Patent Application
Measurement Of A Sequence Of Recurring Electronic Signals
- Publication number 20240044943
- Publication date Feb 8, 2024
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Falk Eilenberger
- G01 - MEASURING TESTING

for displaying measured electric variables in digital form

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Noise reduction of oscilloscope waveforms

Spur detection in a sampled waveform in a mixed analog/digital syst...

Systems and methods for condition monitoring

Measurement device and measurement method with advanced trigger

Cyclic loop image representation for waveform data

Battery charger with battery state detection

Swept parameter oscilloscope

Information processing apparatus, computer-readable medium, and inf...

Oscilloscope and signal analysis method

Noise reduction of oscilloscope waveforms

Pattern acquisitions in equivalent time sampling systems

Digital oscilloscope having fractional calculus operation and displ...

5-PS-resolution waveform-capture-device on a field-programmable gat...

Clock anomaly detection

Tool for electronics testing and diagnostics

Measurement device and method

Signal processing device as well as method of applying a zone trigger

Multiple analog-to-digital converter system to provide simultaneous...

Method and apparatus for decoding oscilloscope signal and oscilloscope

Automatic trigger type identification method, device, and oscilloscope

Voltage monitoring circuit for interface

Signal analyzer

Measurement apparatus and method for controlling a measurement appa...

Capacitance measurement without disconnecting from high power circuit

Digital oscilloscope and oscillogram generation system

Multiprobe measurement device and method

Measurement instrument

Non-contact voltage sensing method and apparatus

On-chip oscilloscope

System and method for reducing error in time domain waveform of a s...

Patents Applicationslast 30 patents

PLATFORM TO STREAM, VIEW, ANALYZE AND COLLABORATE ON TEST AND MEASU...

METHOD FOR ANALYZING A DEMODULATED MEASUREMENT SIGNAL, COMPUTER-REA...

MULTIPLE PULSE EXTRACTION FOR TRANSMITTER CALIBRATION

INSTRUMENT AND MEASUREMENT TRANSLATOR USING MACHINE LEARNING

Battery Charger with Battery State Detection

REAL-EQUIVALENT-TIME OSCILLOSCOPE CLOCK DATA RECOVERY WITH SOFTWARE...

CONFIGURATION METHOD OF CONFIGURING A MEASUREMENT INSTRUMENT

ISOLATED TEST AND MEASUREMENT PROBE

TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END

MEASUREMENT APPARATUS AND MEASUREMENT RESULT DISPLAY METHOD

INTERLEAVED DIGITAL TRIGGER CORRECTION

EYE MARGIN TEST METHOD AND ELECTRONIC APPARATUS PERFORMING TEST OPE...

Electrical Testing Device with Probe Having Portions with Different...

TEST AND MEASUREMENT INSTRUMENT THAT USES MEASUREMENT PRECONDITIONS...

TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION

DIAGNOSTIC INSTRUMENT

ELECTRICAL SIGNAL SAMPLING DEVICE

MULTIPLE ANALOG-TO-DIGITAL CONVERTER SYSTEM TO PROVIDE SIMULTANEOUS...

TOOL FOR ELECTRONICS TESTING AND DIAGNOSTICS

REAL-EQUIVALENT-TIME OSCILLOSCOPE

ELECTRICAL SIGNAL SAMPLING DEVICE

ADAPTIVE INSTRUMENT NOISE REMOVAL

METHOD, SIGNAL PROCESSING DEVICE, AND MEASUREMENT APPLICATION DEVICE

MEASUREMENT APPLICATION DEVICE, POSTPROCESSING DEVICE, METHOD AND N...

CAPACITANCE MEASUREMENT WITHOUT DISCONNECTING FROM HIGH POWER CIRCUIT

MEASUREMENT APPLICATION DEVICE, MEASUREMENT APPLICATION SETUP AND M...

MEASUREMENT APPLICATION SETUP AND METHOD

SYSTEM FOR CONTINUOUS RECORDING AND CONTROLLABLE PLAYBACK OF INPUT...

DE-SKEW METHOD FOR DYNAMIC TESTING USING TRANSFER FUNCTION OF CURRE...

Measurement Of A Sequence Of Recurring Electronic Signals