for error compensation

Industry

CPC
G01Q30/06

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

Current Industry

G01Q30/06for error compensation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Detection of probabilistic process windows
- Patent number 12,142,454
- Issue date Nov 12, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,996,265
- Issue date May 28, 2024
- Fractilla, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for detecting mechanical and magnetic features with nanoscal...
- Patent number 11,835,547
- Issue date Dec 5, 2023
- Yi-Chun Chen
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AFM imaging with metrology-preserving real time denoising
- Patent number 11,796,565
- Issue date Oct 24, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of imaging a surface using a scanning probe microscope
- Patent number 11,733,265
- Issue date Aug 22, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Grant
AFM imaging with creep correction
- Patent number 11,714,104
- Issue date Aug 1, 2023
- Bruker Nano, Inc.
- Jason Osborne
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 11,670,480
- Issue date Jun 6, 2023
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
AFM imaging with real time drift correction
- Patent number 11,604,210
- Issue date Mar 14, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for predicting stochastic-aware process window an...
- Patent number 11,521,825
- Issue date Dec 6, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for low-noise edge detection and its use for proc...
- Patent number 11,508,546
- Issue date Nov 22, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern height information correction system and pattern height inf...
- Patent number 11,448,663
- Issue date Sep 20, 2022
- HITACHI HIGH-TECH CORPORATION
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and analysis method
- Patent number 11,415,596
- Issue date Aug 16, 2022
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,380,516
- Issue date Jul 5, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,361,937
- Issue date Jun 14, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measuremen...
- Patent number 11,355,306
- Issue date Jun 7, 2022
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for autonomous scanning probe microscopy with in-...
- Patent number 11,320,455
- Issue date May 3, 2022
- The Governors of the University of Alberta
- Mohammad Rashidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface sensitive atomic force microscope based infrared spectroscopy
- Patent number 11,226,285
- Issue date Jan 18, 2022
- Bruker Nano, Inc.
- Kevin Kjoller
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing polymer membrane
- Patent number 11,145,049
- Issue date Oct 12, 2021
- LG Chem, Ltd.
- Hyung Ju Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 11,004,654
- Issue date May 11, 2021
- Fractilia, LLC
- Chris Mack
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,955,436
- Issue date Mar 23, 2021
- Shimadzu Corporation
- Masahiro Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Low drift system for a metrology instrument
- Patent number 10,900,997
- Issue date Jan 26, 2021
- Bruker Nano, Inc.
- Andrew Neushul
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,712,363
- Issue date Jul 14, 2020
- Hitachi High-Tech Science Corporation
- Masayuki Iwasa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope
- Patent number 10,697,997
- Issue date Jun 30, 2020
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Sample for measuring particles, method for measuring particles and...
- Patent number 10,697,767
- Issue date Jun 30, 2020
- Hitachi High-Technologies Corporation
- Tomihiro Hashizume
- G01 - MEASURING TESTING
Information Patent Grant
Method for error correction in scanning probe microscopy
- Patent number 10,670,625
- Issue date Jun 2, 2020
- University of Florida Research Foundation, Incorporated
- Xiaoguang Zhang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 10,665,417
- Issue date May 26, 2020
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 10,665,418
- Issue date May 26, 2020
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Scanning probe microscope and surface image correction method
- Patent number 10,564,183
- Issue date Feb 18, 2020
- Shimadzu Corporation
- Masato Hirade
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generating and analyzing roughness measurements
- Patent number 10,522,322
- Issue date Dec 31, 2019
- Fractilia, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, systems and computer program products configured to adjust...
- Patent number 10,224,178
- Issue date Mar 5, 2019
- Samsung Electronics Co., Ltd.
- Yongseok Jung
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20240312757
- Publication date Sep 19, 2024
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITIONING SYSTEM AND METHOD
- Publication number 20240295583
- Publication date Sep 5, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
Method of Dispositioning and Control of a Semiconductor Manufacturi...
- Publication number 20240258066
- Publication date Aug 1, 2024
- FRACTILIA, LLC
- Chris Mack
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...
- Publication number 20240241151
- Publication date Jul 18, 2024
- Nearfield Instruments B.V.
- Hamed SADEGHIAN MARNANI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...
- Publication number 20240210442
- Publication date Jun 27, 2024
- Nearfield Instruments B.V.
- Taras PISKUNOV
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20230326711
- Publication date Oct 12, 2023
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING MECHANICAL AND MAGNETIC FEATURES WITH NANOSCAL...
- Publication number 20230168275
- Publication date Jun 1, 2023
- National Cheng Kung University
- Yi-Chun Chen
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING AND/OR PREDICTING UNBIASED PARAME...
- Publication number 20230134093
- Publication date May 4, 2023
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE
- Publication number 20230030991
- Publication date Feb 2, 2023
- INFINITESIMA LIMITED
- Andrew Humphris
- G01 - MEASURING TESTING
Information Patent Application
AFM Imaging with Real Time Drift Correction
- Publication number 20230009857
- Publication date Jan 12, 2023
- Bruker Nano, Inc.
- Vladimir Fonoberov
- B82 - NANO-TECHNOLOGY
Information Patent Application
AFM Imaging with Metrology-Preserving Real Time Denoising
- Publication number 20220326277
- Publication date Oct 13, 2022
- Bruker Nano, Inc.
- Vladimir Fonoberov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-...
- Publication number 20220155339
- Publication date May 19, 2022
- Quantum Silicon Inc.
- Mohammad Rashidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION OF PROBABILISTIC PROCESS WINDOWS
- Publication number 20220068594
- Publication date Mar 3, 2022
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-...
- Publication number 20210373045
- Publication date Dec 2, 2021
- Quantum Silicon Inc.
- Mohammad Rashidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20210327675
- Publication date Oct 21, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PREDICTING STOCHASTIC-AWARE PROCESS WINDOW AN...
- Publication number 20210225609
- Publication date Jul 22, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR LOW-NOISE EDGE DETECTION AND ITS USE FOR PROC...
- Publication number 20210202204
- Publication date Jul 1, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20210142977
- Publication date May 13, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20210082658
- Publication date Mar 18, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...
- Publication number 20210066027
- Publication date Mar 4, 2021
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND ANALYSIS METHOD
- Publication number 20210055326
- Publication date Feb 25, 2021
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
ACTIVE NOISE ISOLATION FOR TUNNELING APPLICATIONS (ANITA)
- Publication number 20210025919
- Publication date Jan 28, 2021
- The Penn State Research Foundation
- Eric Hudson
- G01 - MEASURING TESTING
Information Patent Application
Method for Analyzing Polymer Membrane
- Publication number 20200402224
- Publication date Dec 24, 2020
- LG CHEM, LTD.
- Hyung Ju Ryu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS
- Publication number 20200211813
- Publication date Jul 2, 2020
- FRACTILIA, LLC
- Chris MACK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Low Drift System for a Metrology Instrument
- Publication number 20200166540
- Publication date May 28, 2020
- Bruker Nano, Inc.
- Andrew Neushul
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20200003800
- Publication date Jan 2, 2020
- Shimadzu Corporation
- Masahiro OHTA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ERROR CORRECTION IN SCANNING PROBE MICROSCOPY
- Publication number 20190369138
- Publication date Dec 5, 2019
- UNIVERSITY OF FLORIDA RESEARCH FOUNDATION INC.
- Xiaoguang ZHANG
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190293680
- Publication date Sep 26, 2019
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SURFACE IMAGE CORRECTION METHOD
- Publication number 20190277882
- Publication date Sep 12, 2019
- Shimadzu Corporation
- Masato HIRADE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20190234992
- Publication date Aug 1, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masayuki IWASA
- G01 - MEASURING TESTING

for error compensation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Detection of probabilistic process windows

System and method for generating and analyzing roughness measuremen...

Method for detecting mechanical and magnetic features with nanoscal...

AFM imaging with metrology-preserving real time denoising

Method of imaging a surface using a scanning probe microscope

AFM imaging with creep correction

System and method for generating and analyzing roughness measurements

AFM imaging with real time drift correction

System and method for predicting stochastic-aware process window an...

System and method for low-noise edge detection and its use for proc...

Pattern height information correction system and pattern height inf...

Scanning probe microscope and analysis method

System and method for generating and analyzing roughness measuremen...

System and method for generating and analyzing roughness measuremen...

System and method for generating and analyzing roughness measuremen...

System and method for autonomous scanning probe microscopy with in-...

Surface sensitive atomic force microscope based infrared spectroscopy

Method for analyzing polymer membrane

System and method for generating and analyzing roughness measurements

Scanning probe microscope

Low drift system for a metrology instrument

Scanning probe microscope

Scanning probe microscope

Sample for measuring particles, method for measuring particles and...

Method for error correction in scanning probe microscopy

System and method for generating and analyzing roughness measurements

System and method for generating and analyzing roughness measurements

Scanning probe microscope and surface image correction method

System and method for generating and analyzing roughness measurements

Methods, systems and computer program products configured to adjust...

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

POSITIONING SYSTEM AND METHOD

Method of Dispositioning and Control of a Semiconductor Manufacturi...

SYSTEM FOR PERFORMING ATOMIC FORCE MICROSCOPY, INCLUDING A GRID PLA...

METHOD OF CALIBRATING IN A SCANNING PROBE MICROSCOPY SYSTEM AN OPTI...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

METHOD FOR DETECTING MECHANICAL AND MAGNETIC FEATURES WITH NANOSCAL...

SYSTEM AND METHOD FOR DETERMINING AND/OR PREDICTING UNBIASED PARAME...

METHOD OF IMAGING A SURFACE USING A SCANNING PROBE MICROSCOPE

AFM Imaging with Real Time Drift Correction

AFM Imaging with Metrology-Preserving Real Time Denoising

SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-...

DETECTION OF PROBABILISTIC PROCESS WINDOWS

SYSTEM AND METHOD FOR AUTONOMOUS SCANNING PROBE MICROSCOPY WITH IN-...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

SYSTEM AND METHOD FOR PREDICTING STOCHASTIC-AWARE PROCESS WINDOW AN...

SYSTEM AND METHOD FOR LOW-NOISE EDGE DETECTION AND ITS USE FOR PROC...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMEN...

SCANNING PROBE MICROSCOPE AND ANALYSIS METHOD

ACTIVE NOISE ISOLATION FOR TUNNELING APPLICATIONS (ANITA)

Method for Analyzing Polymer Membrane

SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS

Low Drift System for a Metrology Instrument

SCANNING PROBE MICROSCOPE

METHOD FOR ERROR CORRECTION IN SCANNING PROBE MICROSCOPY

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE AND SURFACE IMAGE CORRECTION METHOD

SCANNING PROBE MICROSCOPE