for gaseous samples

Industry

CPC
H01J49/0422

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/0422for gaseous samples

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Tissue analysis by mass spectrometry or ion mobility spectrometry
- Patent number 12,315,714
- Issue date May 27, 2025
- Micromass UK Limited
- Steven Derek Pringle
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Analytical system and method including switching between liquid chr...
- Patent number 12,306,147
- Issue date May 20, 2025
- Roche Diagnostics Operations, Inc.
- Stefan Quint
- G01 - MEASURING TESTING
Information Patent Grant
Vapor sample collection apparatus and method for vapor sample colle...
- Patent number 12,290,109
- Issue date May 6, 2025
- The Green Labs Group, Inc.
- Aric Jennings
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Direct reduction shaft furnace with probe for measuring interior ga...
- Patent number 12,241,684
- Issue date Mar 4, 2025
- Arcelormittal
- Mahdi Farahani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test device and test method for isotope measurement of noble gases...
- Patent number 12,209,966
- Issue date Jan 28, 2025
- INSTITUTE OF GEOLOGY AND GEOPHYSICS, CHINESE ACADEMY OF SCIENCES
- Xuhang Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 12,198,918
- Issue date Jan 14, 2025
- YOUNG IN ACE Co., Ltd.
- Sung Won Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inert non-adsorbing crimpable capillaries and devices for adjusting...
- Patent number 12,159,778
- Issue date Dec 3, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Michael Krummen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Locating mining sites using an open mass spectrometer
- Patent number 12,100,580
- Issue date Sep 24, 2024
- LUNAR HELIUM-3 MINING, LLC
- Chris Salvino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer
- Patent number 12,087,565
- Issue date Sep 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Kouji Ishiguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analyzing apparatus and control method
- Patent number 12,078,611
- Issue date Sep 3, 2024
- Atonarp Inc.
- Naoki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IRMS sample introduction system and method
- Patent number 12,080,537
- Issue date Sep 3, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of rapid and autonomous detection of aerosol pa...
- Patent number 12,074,018
- Issue date Aug 27, 2024
- Zeteo Tech, Inc.
- Wayne A. Bryden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for analyzing biological samples
- Patent number 12,061,136
- Issue date Aug 13, 2024
- Olfactomics Oy
- Antti Roine
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for generating interference spectra for low detec...
- Patent number 12,053,755
- Issue date Aug 6, 2024
- MLS ACQ, Inc
- Martin L. Spartz
- G01 - MEASURING TESTING
Information Patent Grant
Automated system for online detection of organic molecular impuriti...
- Patent number 12,055,530
- Issue date Aug 6, 2024
- Elemental Scientific, Inc.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for ICPMS instrument stability control with strong acid resi...
- Patent number 12,040,172
- Issue date Jul 16, 2024
- Elemental Scientific, Inc.
- Kevin Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring concentration of fluorine gas in halogen fluor...
- Patent number 11,984,308
- Issue date May 14, 2024
- Resonac Corporation
- Atsushi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility analyser
- Patent number 11,977,051
- Issue date May 7, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transfer line, GCMS arrangement and mounting assembly
- Patent number 11,959,896
- Issue date Apr 16, 2024
- Micromass UK Limited
- Carl Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and method for analysing a gas by mass spectrometry
- Patent number 11,791,147
- Issue date Oct 17, 2023
- LEYBOLD GMBH
- Anthony Hin Yiu Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometric analysis of microbes
- Patent number 11,764,048
- Issue date Sep 19, 2023
- Micromass UK Limited
- Zoltan Takats
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method of evaluating analysis device, method of calibrating analysi...
- Patent number 11,754,526
- Issue date Sep 12, 2023
- Shimadzu Corporation
- Yukihiko Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion analyzer
- Patent number 11,735,408
- Issue date Aug 22, 2023
- Shimadzu Corporation
- Hidenori Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Unbiased ion identification by multiple ions
- Patent number 11,710,625
- Issue date Jul 25, 2023
- KARSA OY
- Aleksei Shcherbinin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cell population analysis
- Patent number 11,710,627
- Issue date Jul 25, 2023
- Micromass UK Limited
- Emrys Jones
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus and method for analyzing evolved gas
- Patent number 11,646,188
- Issue date May 9, 2023
- Hitachi High-Tech Science Corporation
- Ryusuke Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for quantifying two or more analytes using mass...
- Patent number 11,637,005
- Issue date Apr 25, 2023
- PerkinElmer U.S. LLC
- Samad Bazargan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 11,621,154
- Issue date Apr 4, 2023
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for detecting analytes dissolved in liquids by pl...
- Patent number 11,600,479
- Issue date Mar 7, 2023
- Microsaic Systems PLC
- Steven Wright
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample introduction system for mass spectrometry
- Patent number 11,594,407
- Issue date Feb 28, 2023
- Gholamreza Javahery
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING THE FLOW OF AEROSOLS
- Publication number 20250183024
- Publication date Jun 5, 2025
- University of Hawaii
- Tyler R. RAY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESIDUAL GAS ANALYSER, PROJECTION EXPOSURE APPARATUS COMPRISING A R...
- Publication number 20250174452
- Publication date May 29, 2025
- Carl Zeiss SMT GMBH
- Achim SCHOELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESIDUAL GAS ANALYSER, PROJECTION EXPOSURE APPARATUS COMPRISING A R...
- Publication number 20250166983
- Publication date May 22, 2025
- Carl Zeiss SMT GMBH
- Achim SCHOELL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER ION SOURCE
- Publication number 20250140544
- Publication date May 1, 2025
- IONOSCOPE LIMITED LIABILITY COMPANY
- Sergey Stanislavovich POTESHIN
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETRY METHOD AND SYSTEM
- Publication number 20250137994
- Publication date May 1, 2025
- UNIVERSITATS-KINDERSPITAL BEIDER BASEL
- Pablo MARTINEZ-LOZANO SINUES
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIRECT REDUCTION SHAFT FURNACE WITH PROBE FOR MEASURING INTERIOR GA...
- Publication number 20250102227
- Publication date Mar 27, 2025
- ARCELORMITTAL
- Mahdi FARAHANI
- C21 - METALLURGY OF IRON
Information Patent Application
SYSTEMS AND METHODS FOR A VENTLESS GAS CHROMATOGRAPHY MASS SPECTROM...
- Publication number 20250093309
- Publication date Mar 20, 2025
- Agilent Technologies, Inc.
- Derek WOLFE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE INLET APPARATUS FOR ISOTOPE RATIO SPECTROMETRY
- Publication number 20250095978
- Publication date Mar 20, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Jens Radke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR TRANSMITTING GASEOUS IONIC SAMPLE MATERIAL...
- Publication number 20250079144
- Publication date Mar 6, 2025
- Bruker Daltonics GmbH & Co. KG
- Benjamin BIRNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS ANALYZING APPARATUS AND CONTROL METHOD
- Publication number 20250020613
- Publication date Jan 16, 2025
- ATONARP INC.
- Naoki TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...
- Publication number 20240426796
- Publication date Dec 26, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR GENERATING INTERFERENCE SPECTRA FOR LOW DETEC...
- Publication number 20240359153
- Publication date Oct 31, 2024
- MLS ACQ, Inc. D/B/A Max Analytical Technologies
- Martin L. Spartz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20240363324
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Clinical Methods and Pharmaceutical Compositions Employing AMPA Rec...
- Publication number 20240355686
- Publication date Oct 24, 2024
- Daniel Pierce RADIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer and Mass Spectrometry Method
- Publication number 20240347328
- Publication date Oct 17, 2024
- Shimadzu Corporation
- Kazutaka MITSUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATED SYSTEMS AND METHODS FOR SEPARATING COMPOUNDS
- Publication number 20240282564
- Publication date Aug 22, 2024
- DH Technologies Development Pte. Ltd.
- Leigh BEDFORD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20240274427
- Publication date Aug 15, 2024
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS SAMPLING APPARATUS FOR A PHYSICAL VAPOR TRANSPORT SYSTEM
- Publication number 20240266160
- Publication date Aug 8, 2024
- CVD Equipment Corporation
- Maxim S. Shatalov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLOW RECIRCULATION FOR MOBILITY SEPARATION IMPROVEMENT
- Publication number 20240255466
- Publication date Aug 1, 2024
- Thermo Finnigan LLC
- Mikhail V. UGAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MOBILITY ANALYSER
- Publication number 20240248064
- Publication date Jul 25, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND TECHNIQUES FOR IN-SOURCE ION SEPARATION
- Publication number 20240222105
- Publication date Jul 4, 2024
- Thermo Finnigan LLC
- Mikhail V. UGAROV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SYSTEM TO GENERATE A HIGH YIELD OF NEGATIVE IONS FOR ICP-MS
- Publication number 20240203722
- Publication date Jun 20, 2024
- Gholamreza JAVAHERY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYDROGEN FLUORIDE DETECTION USING MASS SPECTROMETRY
- Publication number 20240194468
- Publication date Jun 13, 2024
- Syft Technologies Ltd
- Caleb Allpress
- G01 - MEASURING TESTING
Information Patent Application
HIGH PRESSURE ION OPTICAL DEVICES
- Publication number 20240186132
- Publication date Jun 6, 2024
- Philip MARRIOTT
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE-STABILIZED DUAL INLET GAS MASS SPECTROMETRY
- Publication number 20240186131
- Publication date Jun 6, 2024
- The Regents of the University of California
- Benjamin Birner
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME
- Publication number 20240177983
- Publication date May 30, 2024
- HITACHI HIGH-TECH COORPORATION
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...
- Publication number 20240128071
- Publication date Apr 18, 2024
- Micromass UK Limited
- Zoltán TAKÁTS
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
GAS ANALYZING APPARATUS AND CONTROL METHOD
- Publication number 20240068989
- Publication date Feb 29, 2024
- ATONARP INC.
- Naoki TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INERT NON-ADSORBING CRIMPABLE CAPILLARIES AND DEVICES FOR ADJUSTING...
- Publication number 20240021424
- Publication date Jan 18, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Michael KRUMMEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD
- Publication number 20240014022
- Publication date Jan 11, 2024
- ISOTOPX LTD
- Damian Paul TOOTELL
- H01 - BASIC ELECTRIC ELEMENTS

for gaseous samples

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Tissue analysis by mass spectrometry or ion mobility spectrometry

Analytical system and method including switching between liquid chr...

Vapor sample collection apparatus and method for vapor sample colle...

Direct reduction shaft furnace with probe for measuring interior ga...

Test device and test method for isotope measurement of noble gases...

Mass spectrometer

Inert non-adsorbing crimpable capillaries and devices for adjusting...

Locating mining sites using an open mass spectrometer

Mass spectrometer

Gas analyzing apparatus and control method

IRMS sample introduction system and method

Systems and methods of rapid and autonomous detection of aerosol pa...

Method and apparatus for analyzing biological samples

Method and system for generating interference spectra for low detec...

Automated system for online detection of organic molecular impuriti...

Method for ICPMS instrument stability control with strong acid resi...

Method for measuring concentration of fluorine gas in halogen fluor...

Ion mobility analyser

Transfer line, GCMS arrangement and mounting assembly

Mass spectrometer and method for analysing a gas by mass spectrometry

Spectrometric analysis of microbes

Method of evaluating analysis device, method of calibrating analysi...

Ion analyzer

Unbiased ion identification by multiple ions

Cell population analysis

Apparatus and method for analyzing evolved gas

Methods and systems for quantifying two or more analytes using mass...

Bench-top time of flight mass spectrometer

System and method for detecting analytes dissolved in liquids by pl...

Sample introduction system for mass spectrometry

Patents Applicationslast 30 patents

SYSTEM AND METHOD FOR CONTROLLING THE FLOW OF AEROSOLS

RESIDUAL GAS ANALYSER, PROJECTION EXPOSURE APPARATUS COMPRISING A R...

RESIDUAL GAS ANALYSER, PROJECTION EXPOSURE APPARATUS COMPRISING A R...

MASS SPECTROMETER ION SOURCE

MASS SPECTROMETRY METHOD AND SYSTEM

DIRECT REDUCTION SHAFT FURNACE WITH PROBE FOR MEASURING INTERIOR GA...

SYSTEMS AND METHODS FOR A VENTLESS GAS CHROMATOGRAPHY MASS SPECTROM...

MULTIPLE INLET APPARATUS FOR ISOTOPE RATIO SPECTROMETRY

APPARATUS AND METHOD FOR TRANSMITTING GASEOUS IONIC SAMPLE MATERIAL...

GAS ANALYZING APPARATUS AND CONTROL METHOD

AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...

METHOD AND SYSTEM FOR GENERATING INTERFERENCE SPECTRA FOR LOW DETEC...

MASS SPECTROMETER

Clinical Methods and Pharmaceutical Compositions Employing AMPA Rec...

Mass Spectrometer and Mass Spectrometry Method

AUTOMATED SYSTEMS AND METHODS FOR SEPARATING COMPOUNDS

MASS SPECTROMETER

GAS SAMPLING APPARATUS FOR A PHYSICAL VAPOR TRANSPORT SYSTEM

FLOW RECIRCULATION FOR MOBILITY SEPARATION IMPROVEMENT

ION MOBILITY ANALYSER

SYSTEMS AND TECHNIQUES FOR IN-SOURCE ION SEPARATION

A SYSTEM TO GENERATE A HIGH YIELD OF NEGATIVE IONS FOR ICP-MS

HYDROGEN FLUORIDE DETECTION USING MASS SPECTROMETRY

HIGH PRESSURE ION OPTICAL DEVICES

PRESSURE-STABILIZED DUAL INLET GAS MASS SPECTROMETRY

MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME

INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...

GAS ANALYZING APPARATUS AND CONTROL METHOD

INERT NON-ADSORBING CRIMPABLE CAPILLARIES AND DEVICES FOR ADJUSTING...

APPARATUS AND METHOD