for inserting reference markers

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G01R13/0245

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R13/00Arrangements for displaying electric variables or waveforms

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G01R13/0245for inserting reference markers

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Patents Grantslast 30 patents

Information Patent Grant
Digital oscilloscope and oscillogram generation system
- Patent number 11,874,302
- Issue date Jan 16, 2024
- BOE Technology Group Co., Ltd.
- Congrui Wu
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for generating a trigger signal for a...
- Patent number 11,422,160
- Issue date Aug 23, 2022
- Rohde & Schwarz GmbH & Co. KG
- Wolfgang Herbordt
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating an oscilloscope as well as oscilloscope
- Patent number 11,415,602
- Issue date Aug 16, 2022
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Phase identification display method
- Patent number 10,976,349
- Issue date Apr 13, 2021
- Gregory Hubert Piesinger
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Measurement apparatus and method for analyzing a waveform of a signal
- Patent number 10,852,323
- Issue date Dec 1, 2020
- Rohde & Schwarz GmbH & Co. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for analyzing a measured signal as well as measurement unit
- Patent number 10,802,050
- Issue date Oct 13, 2020
- Rohde & Schwarz GmbH & Co. KG
- Sven Barthel
- G01 - MEASURING TESTING
Information Patent Grant
Method and a measuring device for investigating signal parameters
- Patent number 10,670,631
- Issue date Jun 2, 2020
- Rohde & Schwarz GmbH & Co. KG
- Luke Cirillo
- G01 - MEASURING TESTING
Information Patent Grant
Waveform display device
- Patent number 10,663,489
- Issue date May 26, 2020
- Yokogawa Electric Corporation
- Takeshi Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring system as well as method for analyzing an analog signal
- Patent number 10,620,264
- Issue date Apr 14, 2020
- Rohde & Schwarz GmbH & Co. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Grant
Trigger on final occurrence
- Patent number 10,365,300
- Issue date Jul 30, 2019
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Slide closure multi tester
- Patent number 10,228,393
- Issue date Mar 12, 2019
- Kane USA, Inc.
- Sean Patrick Tierney
- G01 - MEASURING TESTING
Information Patent Grant
Internal chirp generator with time aligned acquisition in a mixed-d...
- Patent number 9,869,699
- Issue date Jan 16, 2018
- Tektronix, Inc.
- Donald J. Dalebroux
- G01 - MEASURING TESTING
Information Patent Grant
Waveform processing assistance method and system
- Patent number 9,797,929
- Issue date Oct 24, 2017
- Shimadzu Corporation
- Daisuke Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Logical triggering in the frequency domain
- Patent number 9,784,776
- Issue date Oct 10, 2017
- Tektronix, Inc.
- John A. Dement
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for selecting waveforms on electronic test equipment
- Patent number 9,727,228
- Issue date Aug 8, 2017
- Keysight Technologies, Inc.
- Douglas James Beck
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring device and method for marking common timing points
- Patent number 9,317,946
- Issue date Apr 19, 2016
- Rohde & Schwarz GmbH & Co. KG
- Florian Lang
- G01 - MEASURING TESTING
Information Patent Grant
Waveform observing apparatus and waveform observing system
- Patent number 8,854,398
- Issue date Oct 7, 2014
- Keyence Corporation
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Grant
Waveform observing apparatus and waveform observing system
- Patent number 8,537,178
- Issue date Sep 17, 2013
- Keyence Corporation
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 8,487,935
- Issue date Jul 16, 2013
- Anritsu Corporation
- Kazunori Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Mark extension for analysis of long record length data
- Patent number 8,223,151
- Issue date Jul 17, 2012
- Tektronix, Inc.
- Keith D. Rule
- G01 - MEASURING TESTING
Information Patent Grant
Envelope generation algorithm
- Patent number 8,214,163
- Issue date Jul 3, 2012
- LeCroy Corporation
- Michael G Hertz
- G01 - MEASURING TESTING
Information Patent Grant
Methods, systems, and apparatus for multi-domain markers
- Patent number 8,184,121
- Issue date May 22, 2012
- Tektronix, Inc.
- Kathryn A. Engholm
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous physical and protocol layer analysis
- Patent number 7,965,764
- Issue date Jun 21, 2011
- LeCroy Corporation
- Roland Gamper
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Simultaneous physical and protocol layer analysis
- Patent number 7,756,199
- Issue date Jul 13, 2010
- LeCroy Corporation
- Roland Gamper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Simultaneous physical and protocol layer analysis
- Patent number 7,403,560
- Issue date Jul 22, 2008
- LeCroy Corporation
- Roland Gamper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for visually time-correlating waveform measure...
- Patent number 6,917,889
- Issue date Jul 12, 2005
- Tektronix, Inc.
- Benjamin A. Ward
- G01 - MEASURING TESTING
Information Patent Grant
Method of waveform time stamping for minimizing digitization artifa...
- Patent number 6,571,186
- Issue date May 27, 2003
- Textronix, Inc.
- Benjamin A. Ward
- G01 - MEASURING TESTING
Information Patent Grant
Method of time stamping a waveform edge of an input signal
- Patent number 6,549,859
- Issue date Apr 15, 2003
- Tektronix Inc.
- Benjamin A. Ward
- G01 - MEASURING TESTING
Information Patent Grant
System and method for annotating a graphical user interface display...
- Patent number 6,262,728
- Issue date Jul 17, 2001
- Agilent Technologies, Inc.
- Jay A. Alexander
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for varying the incremental movement of a mark...
- Patent number 6,025,833
- Issue date Feb 15, 2000
- Hewlett-Packard Company
- Christopher P Duff
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAVEFORM DISPLAY DEVICE
- Publication number 20230324877
- Publication date Oct 12, 2023
- FANUC CORPORATION
- Junichi TEZUKA
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL OSCILLOSOPE AND OSCILLOGRAM GENERATION SYSTEM
- Publication number 20220308089
- Publication date Sep 29, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Congrui WU
- G01 - MEASURING TESTING
Information Patent Application
PEAK SELECTION ASSISTANCE FOR RF SPECTRUM ANALYSIS
- Publication number 20220244293
- Publication date Aug 4, 2022
- EXFO INC.
- Dominic LAPIERRE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING A MEASUREMENT DEVICE
- Publication number 20210109130
- Publication date Apr 15, 2021
- Rohde& Schwarz GmbH & Co. KG
- Sven Barthel
- G01 - MEASURING TESTING
Information Patent Application
Phase Identification Display Method
- Publication number 20210096159
- Publication date Apr 1, 2021
- Gregory Hubert Piesinger
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND METHOD FOR ANALYZING A WAVEFORM OF A SIGNAL
- Publication number 20200209281
- Publication date Jul 2, 2020
- Rohde& Schwarz GmbH & Co. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR GENERATING A TRIGGER SIGNAL FOR A...
- Publication number 20200200801
- Publication date Jun 25, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Wolfgang Herbordt
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OPERATING AN OSCILLOSCOPE AS WELL AS OSCILLOSCOPE
- Publication number 20200174041
- Publication date Jun 4, 2020
- ROHDE & SCHWARZ GMBH & CO. KG
- Andrew Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING SYSTEM AS WELL AS METHOD FOR ANALYZING AN ANALOG SIGNAL
- Publication number 20180335474
- Publication date Nov 22, 2018
- ROHDE & SCHWARZ GMBH & CO. KG
- Markus Freidhof
- G01 - MEASURING TESTING
Information Patent Application
SLIDE CLOSURE MULTI TESTER
- Publication number 20180038893
- Publication date Feb 8, 2018
- Universal Enterprises, Inc.
- Sean Patrick Tierney
- G01 - MEASURING TESTING
Information Patent Application
TRIGGER ON FINAL OCCURRENCE
- Publication number 20170227581
- Publication date Aug 10, 2017
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
INTERNAL CHIRP GENERATOR WITH TIME ALIGNED ACQUISITION IN A MIXED-D...
- Publication number 20160103154
- Publication date Apr 14, 2016
- Tektronix, Inc.
- Donald J. Dalebroux
- G01 - MEASURING TESTING
Information Patent Application
DETECTION METHOD OF ALGORITHM IN INTEGRATED CIRCUIT
- Publication number 20150260768
- Publication date Sep 17, 2015
- KABUSHIKI KAISHA TOSHIBA
- Keishi SAKANUSHI
- G01 - MEASURING TESTING
Information Patent Application
Method for Selecting Waveforms on Electronic Test Equipment
- Publication number 20140240240
- Publication date Aug 28, 2014
- AGILENT TECHNOLOGIES, INC.
- Douglas James Beck
- G01 - MEASURING TESTING
Information Patent Application
INTERNAL CHIRP GENERATOR WITH TIME ALIGNED ACQUISITION IN A MIXED-D...
- Publication number 20140111184
- Publication date Apr 24, 2014
- Tektronix, Inc.
- Donald J. Dalebroux
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE AND METHOD FOR MARKING COMMON TIMING POINTS
- Publication number 20140071136
- Publication date Mar 13, 2014
- ROHDE & SCHWARZ GMBH & CO. KG
- Florian LANG
- G01 - MEASURING TESTING
Information Patent Application
LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN
- Publication number 20140012526
- Publication date Jan 9, 2014
- Tektronix, Inc.
- John A. Dement
- G01 - MEASURING TESTING
Information Patent Application
Waveform Observing Apparatus and Waveform Observing System
- Publication number 20130328816
- Publication date Dec 12, 2013
- KEYENCE CORPORATION
- Naoki Goto
- G01 - MEASURING TESTING
Information Patent Application
LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN
- Publication number 20110274150
- Publication date Nov 10, 2011
- Tektronix, Inc.
- JOHN A. DEMENT
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASURING APPARATUS AND MEASURING METHOD
- Publication number 20100245389
- Publication date Sep 30, 2010
- Kazunori Aoki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS
- Publication number 20100141657
- Publication date Jun 10, 2010
- Roland Gamper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Waveform Observing Apparatus and Waveform Observing System
- Publication number 20100026713
- Publication date Feb 4, 2010
- KEYENCE CORPORATION
- Naoki Goto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MARK EXTENSION FOR ANALYSIS OF LONG RECORD LENGTH DATA
- Publication number 20090192740
- Publication date Jul 30, 2009
- Tektronix, Inc.
- Keith D. RULE
- G01 - MEASURING TESTING
Information Patent Application
Methods, Systems, and Apparatus For Multi-Domain Markers
- Publication number 20080259082
- Publication date Oct 23, 2008
- Tektronix, Inc.
- Kathryn A. Engholm
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS
- Publication number 20080255784
- Publication date Oct 16, 2008
- Roland Gamper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Envelope generation algorithm
- Publication number 20070219734
- Publication date Sep 20, 2007
- LeCroy Corporation
- Michael G. Hertz
- G01 - MEASURING TESTING
Information Patent Application
Simultaneous physical and protocol layer analysis
- Publication number 20050175079
- Publication date Aug 11, 2005
- Roland Gamper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for displaying markers and rendered waveforms
- Publication number 20040017384
- Publication date Jan 29, 2004
- Stanley E. Jaffe
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Markers positioned in the trace of a logic analyzer snap to locatio...
- Publication number 20040017399
- Publication date Jan 29, 2004
- Douglas James Beck
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for visually time-correlating waveform measure...
- Publication number 20030163266
- Publication date Aug 28, 2003
- Benjamin A. Ward
- G01 - MEASURING TESTING

for inserting reference markers

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Digital oscilloscope and oscillogram generation system

Measurement system and method for generating a trigger signal for a...

Method for operating an oscilloscope as well as oscilloscope

Phase identification display method

Measurement apparatus and method for analyzing a waveform of a signal

Method for analyzing a measured signal as well as measurement unit

Method and a measuring device for investigating signal parameters

Waveform display device

Measuring system as well as method for analyzing an analog signal

Trigger on final occurrence

Slide closure multi tester

Internal chirp generator with time aligned acquisition in a mixed-d...

Waveform processing assistance method and system

Logical triggering in the frequency domain

Method for selecting waveforms on electronic test equipment

Measuring device and method for marking common timing points

Waveform observing apparatus and waveform observing system

Waveform observing apparatus and waveform observing system

Measuring apparatus and measuring method

Mark extension for analysis of long record length data

Envelope generation algorithm

Methods, systems, and apparatus for multi-domain markers

Simultaneous physical and protocol layer analysis

Simultaneous physical and protocol layer analysis

Simultaneous physical and protocol layer analysis

Method and apparatus for visually time-correlating waveform measure...

Method of waveform time stamping for minimizing digitization artifa...

Method of time stamping a waveform edge of an input signal

System and method for annotating a graphical user interface display...

Method and apparatus for varying the incremental movement of a mark...

Patents Applicationslast 30 patents

WAVEFORM DISPLAY DEVICE

DIGITAL OSCILLOSOPE AND OSCILLOGRAM GENERATION SYSTEM

PEAK SELECTION ASSISTANCE FOR RF SPECTRUM ANALYSIS

METHOD AND APPARATUS FOR CONTROLLING A MEASUREMENT DEVICE

Phase Identification Display Method

MEASUREMENT APPARATUS AND METHOD FOR ANALYZING A WAVEFORM OF A SIGNAL

MEASUREMENT SYSTEM AND METHOD FOR GENERATING A TRIGGER SIGNAL FOR A...

METHOD FOR OPERATING AN OSCILLOSCOPE AS WELL AS OSCILLOSCOPE

MEASURING SYSTEM AS WELL AS METHOD FOR ANALYZING AN ANALOG SIGNAL

SLIDE CLOSURE MULTI TESTER

TRIGGER ON FINAL OCCURRENCE

INTERNAL CHIRP GENERATOR WITH TIME ALIGNED ACQUISITION IN A MIXED-D...

DETECTION METHOD OF ALGORITHM IN INTEGRATED CIRCUIT

Method for Selecting Waveforms on Electronic Test Equipment

INTERNAL CHIRP GENERATOR WITH TIME ALIGNED ACQUISITION IN A MIXED-D...

MEASURING DEVICE AND METHOD FOR MARKING COMMON TIMING POINTS

LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN

Waveform Observing Apparatus and Waveform Observing System

LOGICAL TRIGGERING IN THE FREQUENCY DOMAIN

MEASURING APPARATUS AND MEASURING METHOD

SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS

Waveform Observing Apparatus and Waveform Observing System

MARK EXTENSION FOR ANALYSIS OF LONG RECORD LENGTH DATA

Methods, Systems, and Apparatus For Multi-Domain Markers

SIMULTANEOUS PHYSICAL AND PROTOCOL LAYER ANALYSIS

Envelope generation algorithm

Simultaneous physical and protocol layer analysis

Method for displaying markers and rendered waveforms

Markers positioned in the trace of a logic analyzer snap to locatio...

Method and apparatus for visually time-correlating waveform measure...