for laser desorption

Industry

CPC
H01J49/0418

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/0418for laser desorption

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of sample preparation for Maldi and automated system therefor
- Patent number 12,181,392
- Issue date Dec 31, 2024
- Becton, Dickinson and Company
- Timothy Wiles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus
- Patent number 12,183,564
- Issue date Dec 31, 2024
- Kratos Analytical Limited
- Andrew Bowdler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information management device for mass spectrometer
- Patent number 12,176,197
- Issue date Dec 24, 2024
- Shimadzu Corporation
- Shinichi Iwamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laterally-extended trapped ion mobility spectrometer
- Patent number 12,163,919
- Issue date Dec 10, 2024
- Melvin Andrew Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Articles and methods involving detection of binding
- Patent number 12,135,330
- Issue date Nov 5, 2024
- CHARLES RIVER LABORATORIES INTERNATIONAL, INC.
- Michael D. Scholle
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Grant
Silicon nanowire chip and silicon nanowire chip-based mass spectrum...
- Patent number 12,094,702
- Issue date Sep 17, 2024
- Hangzhou Well-Healthcare Technologies Co., LTD
- Jianmin Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, adapter, ionization method and mass spectrometry me...
- Patent number 12,080,536
- Issue date Sep 3, 2024
- Hamamatsu Photonics K.K.
- Akira Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods of rapid and autonomous detection of aerosol pa...
- Patent number 12,074,018
- Issue date Aug 27, 2024
- Zeteo Tech, Inc.
- Wayne A. Bryden
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for measuring organic matter in blood by using LDI-MS, and d...
- Patent number 12,033,841
- Issue date Jul 9, 2024
- Korea Research Institute of Standards and Science
- Tae Geol Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method to conduct correlated chemical mapping
- Patent number 11,990,325
- Issue date May 21, 2024
- DH Technologies Development Pte. Ltd.
- Thomas R. Covey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 11,967,496
- Issue date Apr 23, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-assisted laser desorption/ionization method, mass spectrome...
- Patent number 11,961,728
- Issue date Apr 16, 2024
- Hamamatsu Photonics K.K.
- Yasuhide Naito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Agnostic compound elution determination
- Patent number 11,953,478
- Issue date Apr 9, 2024
- DH Technologies Development Pte. Ltd.
- Nic G. Bloomfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support
- Patent number 11,947,260
- Issue date Apr 2, 2024
- Hamamatsu Photonics K.K.
- Akira Tashiro
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Sample support, sample ionization method, and mass spectrometry method
- Patent number 11,935,733
- Issue date Mar 19, 2024
- Hamamatsu Photonics K.K.
- Miu Takimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, method for producing sample support, ionization met...
- Patent number 11,929,245
- Issue date Mar 12, 2024
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drive device driving a movable portion in a vacuum chamber
- Patent number 11,915,865
- Issue date Feb 27, 2024
- Shimadzu Corporation
- Masaji Furuta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capture probe
- Patent number 11,892,383
- Issue date Feb 6, 2024
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-intrusive laser-based technique for monitor and control of prot...
- Patent number 11,887,830
- Issue date Jan 30, 2024
- University of Wyoming
- Erica Belmont
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Humidity stabilization during the preparation of biological samples...
- Patent number 11,781,952
- Issue date Oct 10, 2023
- Martin Schürenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of sample preparation for maldi and automated system therefor
- Patent number 11,774,332
- Issue date Oct 3, 2023
- Becton Dickinson and Company
- Timothy Wiles
- G01 - MEASURING TESTING
Information Patent Grant
Laser desorption, ablation, and ionization system for mass spectrom...
- Patent number 11,769,656
- Issue date Sep 26, 2023
- Exum Instruments
- Jeffrey Williams
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
General-purpose nanochip for mass spectrum analysis, preparation me...
- Patent number 11,764,047
- Issue date Sep 19, 2023
- Hangzhou Well-Healthcare Technologies Co., LTD
- Jianmin Wu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Humidification of laser ablated sample for analysis
- Patent number 11,756,777
- Issue date Sep 12, 2023
- Elemental Scientific Inc.
- Michael P. Field
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Separation of liquid in droplets and sedimented material enclosed t...
- Patent number 11,749,514
- Issue date Sep 5, 2023
- Martin Schürenberg
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Variable beam size via homogenizer movement
- Patent number 11,747,586
- Issue date Sep 5, 2023
- ELEMENTAL SCIENTIFIC LASERS, LLC
- Jay N. Wilkins
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polymeric materials for MALDI imaging and method of using the polym...
- Patent number 11,749,513
- Issue date Sep 5, 2023
- King Abdullah University of Science and Technology
- Dominik Ludewig Michels
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support
- Patent number 11,735,406
- Issue date Aug 22, 2023
- Hamamatsu Photonics K.K.
- Masahiro Kotani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support, sample ionization method, and mass spectrometry method
- Patent number 11,694,883
- Issue date Jul 4, 2023
- Hamamatsu Photonics K.K.
- Miu Takimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample support body
- Patent number 11,656,198
- Issue date May 23, 2023
- Hamamatsu Photonics K.K.
- Takayuki Ohmura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL
- Publication number 20240355610
- Publication date Oct 24, 2024
- Bruker Daltonics GmbH & Co. KG
- Sebastian BÖHM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Capture Probe
- Publication number 20240344938
- Publication date Oct 17, 2024
- UT-Battelle, LLC
- Vilmos KERTESZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR TIMED INTRODUCTION OF SAMPLE INTO A MASS SPEC...
- Publication number 20240312774
- Publication date Sep 19, 2024
- DH Technologies Development Pte. Ltd.
- Peter Kovarik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Remote Chamber And Dart-MS System Using Same
- Publication number 20240304432
- Publication date Sep 12, 2024
- LG CHEM, LTD.
- Hyun Sik You
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DESORBING AND IONIZING OF SAMPLE MATERIAL
- Publication number 20240177986
- Publication date May 30, 2024
- Bruker Daltonics GmbH & Co. KG
- Marcel NIEHAUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYSIS PLATE FOR A MASS SPECTROMETRY ANALYSIS AND ASSOCIATED METH...
- Publication number 20240118287
- Publication date Apr 11, 2024
- BIOMERIEUX
- Jean-Philippe CHARRIER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF SAMPLE PREPARATION FOR MALDI AND AUTOMATED SYSTEM THEREFOR
- Publication number 20240085285
- Publication date Mar 14, 2024
- Becton, Dickinson and Company
- Timothy Wiles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT BODY, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230420237
- Publication date Dec 28, 2023
- Hamamatsu Photonics K.K.
- Masahiro KOTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT
- Publication number 20230253196
- Publication date Aug 10, 2023
- Hamamatsu Photonics K.K.
- Akira TASHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...
- Publication number 20230245876
- Publication date Aug 3, 2023
- Zeteo Tech, Inc.
- Wayne A. BRYDEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING ANALYTES
- Publication number 20230221282
- Publication date Jul 13, 2023
- MONASH UNIVERSITY
- Rajpreet Singh MINHAS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Increased Throughput
- Publication number 20230207299
- Publication date Jun 29, 2023
- DH Technologies Development Pte. Ltd.
- Thomas R Covey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROME...
- Publication number 20230207296
- Publication date Jun 29, 2023
- HAMAMATSU PHOTONICS K. K.
- Yasuhide NAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR DESORPTION SCANNING OF ANALYTE MATERIAL ON A SAMPLE SUPPORT
- Publication number 20230145540
- Publication date May 11, 2023
- Bruker Daltonics GmbH & Co. KG
- Andreas HAASE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LASER DESORPTION/IONIZATION MASS SPECTROMETER AND LASER POWER ADJUS...
- Publication number 20230132727
- Publication date May 4, 2023
- SHIMADZU CORPORATION
- Akihito KORENAGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCREENING WITH MASS SPECTROMETRY FOR MYCOBACTERIA PRIOR TO CARDIOTH...
- Publication number 20230135821
- Publication date May 4, 2023
- Imperial College Innovations Limited
- Gerald Larrouy-Maumus
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN CARRIER AND METHOD FOR MANUFACTURING SPECIMEN CARRIER
- Publication number 20230095349
- Publication date Mar 30, 2023
- Hamamatsu Photonics K.K.
- Akira TASHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HUMIDITY STABILIZATION DURING THE PREPARATION OF BIOLOGICAL SAMPLES...
- Publication number 20230089846
- Publication date Mar 23, 2023
- Bruker Daltonics GmbH & Co. KG
- Martin SCHÜRENBERG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...
- Publication number 20230039261
- Publication date Feb 9, 2023
- Zeteo Tech, Inc.
- WAYNE A. BRYDEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CAPTURE PROBE
- Publication number 20230040409
- Publication date Feb 9, 2023
- UT-Battelle, LLC
- Vilmos Kertesz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING UNIT, MASS SPECTROMETER, AND MASS SPECTROMETRY METHOD
- Publication number 20230042588
- Publication date Feb 9, 2023
- Hamamatsu Photonics K.K.
- Yasuhide NAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20230025534
- Publication date Jan 26, 2023
- HAMAMATSU PHOTONICS K. K.
- Miu TAKIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF SAMPLE PREPARATION FOR MALDI AND AUTOMATED SYSTEM THEREFOR
- Publication number 20220364965
- Publication date Nov 17, 2022
- Becton, Dickinson and Company
- Timothy Wiles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SILICON NANOWIRE CHIP AND SILICON NANOWIRE CHIP-BASED MASS SPECTRUM...
- Publication number 20220359180
- Publication date Nov 10, 2022
- Hangzhou Well-Healthcare Technologies Co., LTD
- Jianmin WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO-VOLUME CRYOABLATION CELL APPARATUS AND ABLATION METHOD THEREOF...
- Publication number 20220310377
- Publication date Sep 29, 2022
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Liangliang HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER
- Publication number 20220299473
- Publication date Sep 22, 2022
- Bruker Scientific LLC
- Melvin Andrew PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT BODY
- Publication number 20220260528
- Publication date Aug 18, 2022
- HAMAMATSU PHOTONICS K. K.
- Takayuki OHMURA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD
- Publication number 20220238317
- Publication date Jul 28, 2022
- HAMAMATSU PHOTONICS K. K.
- Miu TAKIMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE SUPPORT, ADAPTER, IONIZATION METHOD AND MASS SPECTROMETRY ME...
- Publication number 20220223396
- Publication date Jul 14, 2022
- Hamamatsu Photonics K.K.
- Akira TASHIRO
- H01 - BASIC ELECTRIC ELEMENTS

for laser desorption

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of sample preparation for Maldi and automated system therefor

Mass spectrometry apparatus

Information management device for mass spectrometer

Laterally-extended trapped ion mobility spectrometer

Articles and methods involving detection of binding

Silicon nanowire chip and silicon nanowire chip-based mass spectrum...

Sample support, adapter, ionization method and mass spectrometry me...

Systems and methods of rapid and autonomous detection of aerosol pa...

Method for measuring organic matter in blood by using LDI-MS, and d...

System and method to conduct correlated chemical mapping

High resolution imaging apparatus and method

Surface-assisted laser desorption/ionization method, mass spectrome...

Agnostic compound elution determination

Sample support

Sample support, sample ionization method, and mass spectrometry method

Sample support, method for producing sample support, ionization met...

Drive device driving a movable portion in a vacuum chamber

Capture probe

Non-intrusive laser-based technique for monitor and control of prot...

Humidity stabilization during the preparation of biological samples...

Method of sample preparation for maldi and automated system therefor

Laser desorption, ablation, and ionization system for mass spectrom...

General-purpose nanochip for mass spectrum analysis, preparation me...

Humidification of laser ablated sample for analysis

Separation of liquid in droplets and sedimented material enclosed t...

Variable beam size via homogenizer movement

Polymeric materials for MALDI imaging and method of using the polym...

Sample support

Sample support, sample ionization method, and mass spectrometry method

Sample support body

Patents Applicationslast 30 patents

HIGH RESOLUTION IMAGING APPARATUS AND METHOD

DEVICE AND METHOD FOR THE SPECTROMETRIC ANALYSIS OF SAMPLE MATERIAL

Capture Probe

METHOD AND SYSTEM FOR TIMED INTRODUCTION OF SAMPLE INTO A MASS SPEC...

Remote Chamber And Dart-MS System Using Same

METHOD FOR DESORBING AND IONIZING OF SAMPLE MATERIAL

ANALYSIS PLATE FOR A MASS SPECTROMETRY ANALYSIS AND ASSOCIATED METH...

METHOD OF SAMPLE PREPARATION FOR MALDI AND AUTOMATED SYSTEM THEREFOR

SAMPLE SUPPORT BODY, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT

SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...

METHOD FOR DETECTING ANALYTES

Method for Increased Throughput

SURFACE-ASSISTED LASER DESORPTION/IONIZATION METHOD, MASS SPECTROME...

DEVICE FOR DESORPTION SCANNING OF ANALYTE MATERIAL ON A SAMPLE SUPPORT

LASER DESORPTION/IONIZATION MASS SPECTROMETER AND LASER POWER ADJUS...

SCREENING WITH MASS SPECTROMETRY FOR MYCOBACTERIA PRIOR TO CARDIOTH...

SPECIMEN CARRIER AND METHOD FOR MANUFACTURING SPECIMEN CARRIER

HUMIDITY STABILIZATION DURING THE PREPARATION OF BIOLOGICAL SAMPLES...

SYSTEMS AND METHODS OF RAPID AND AUTONOMOUS DETECTION OF AEROSOL PA...

CAPTURE PROBE

IMAGING UNIT, MASS SPECTROMETER, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

METHOD OF SAMPLE PREPARATION FOR MALDI AND AUTOMATED SYSTEM THEREFOR

SILICON NANOWIRE CHIP AND SILICON NANOWIRE CHIP-BASED MASS SPECTRUM...

TWO-VOLUME CRYOABLATION CELL APPARATUS AND ABLATION METHOD THEREOF...

LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER

SAMPLE SUPPORT BODY

SAMPLE SUPPORT, SAMPLE IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

SAMPLE SUPPORT, ADAPTER, IONIZATION METHOD AND MASS SPECTROMETRY ME...