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G01N2021/95661

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/95661for leads

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Patents Grantslast 30 patents

Information Patent Grant
Electronic component evaluation method, electronic component evalua...
- Patent number 11,723,183
- Issue date Aug 8, 2023
- SUMIDA CORPORATION
- Junji Morita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and method for defect analysis of wire connections
- Patent number 10,186,025
- Issue date Jan 22, 2019
- WITRINS S.R.O
- Roman Franz Wieser
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing printed circuit board and method of inspect...
- Patent number 10,067,073
- Issue date Sep 4, 2018
- Nitto Denko Corporation
- Yoshihiro Toyoda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Image processing device, method for controlling same, program, and...
- Patent number 9,752,994
- Issue date Sep 5, 2017
- Omron Corporation
- Takeshi Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Substrate detection device and method
- Patent number 9,689,807
- Issue date Jun 27, 2017
- BOE Technology Group Co., Ltd.
- Chao Ye
- G01 - MEASURING TESTING
Information Patent Grant
Recognition apparatus, recognition method, mounting apparatus, and...
- Patent number 9,319,593
- Issue date Apr 19, 2016
- Samsung Electronics Co., Ltd.
- Ueyama Shinji
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspecting potentially interfering features in a machine vision system
- Patent number 8,269,830
- Issue date Sep 18, 2012
- Mitutoyo Corporation
- Mark Lawrence Delaney
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method
- Patent number 8,260,030
- Issue date Sep 4, 2012
- Koh Young Technology Inc.
- Hee-Tae Kim
- G01 - MEASURING TESTING
Information Patent Grant
Image capturing for pattern recognition of electronic devices
- Patent number 7,876,950
- Issue date Jan 25, 2011
- ASM Assembly Automation LTD
- Wei Yu
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for inspecting centerplane connectors
- Patent number 7,742,071
- Issue date Jun 22, 2010
- Oracle America, Inc.
- John F. Kennedy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing ball array devices using an inspection appa...
- Patent number 7,653,237
- Issue date Jan 26, 2010
- Scanner Technologies Corporation
- Elwin M. Beaty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image pick-up inspection equipment and method
- Patent number 7,627,241
- Issue date Dec 1, 2009
- Renesas Technology Corp.
- Takanori Okita
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing ball array devices using an inspection appa...
- Patent number 7,570,798
- Issue date Aug 4, 2009
- Elwin M. Beaty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring confidence of ball grid array model in surface...
- Patent number 7,158,663
- Issue date Jan 2, 2007
- Siemens Corporate Research, Inc.
- Tong Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for backlighting and imaging multiple views of...
- Patent number 7,154,596
- Issue date Dec 26, 2006
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Grant
Co-planarity examination method and optical module for electronic c...
- Patent number 7,012,682
- Issue date Mar 14, 2006
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and method for electrode plate-connected struc...
- Patent number 6,925,201
- Issue date Aug 2, 2005
- Matsushita Electric Industrial Co., Ltd.
- Toshiaki Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Co-planarity and top-down examination method and optical module for...
- Patent number 6,813,016
- Issue date Nov 2, 2004
- PPT Vision, Inc.
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for providing illumination in machine vision sy...
- Patent number 6,624,597
- Issue date Sep 23, 2003
- Color Kinetics, Inc.
- Kevin J. Dowling
- G01 - MEASURING TESTING
Information Patent Grant
Optical system
- Patent number 6,552,783
- Issue date Apr 22, 2003
- Teradyne, Inc.
- Peter E. Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
3-D lead inspection
- Patent number 6,532,063
- Issue date Mar 11, 2003
- Semiconductor Technologies & Instruments
- Seow Hoon Tan
- G01 - MEASURING TESTING
Information Patent Grant
3D profile analysis for surface contour inspection
- Patent number 6,366,689
- Issue date Apr 2, 2002
- ASTI, Inc.
- Sreenivas Rao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for measuring object features with coordinated tw...
- Patent number 6,291,816
- Issue date Sep 18, 2001
- Robotic Vision Systems, Inc.
- Kuo-Ching Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting solder portions
- Patent number 5,598,345
- Issue date Jan 28, 1997
- Matsushita Electric Industrial Co., Ltd.
- Nobufumi Tokura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring bend amount of IC leads
- Patent number 5,412,477
- Issue date May 2, 1995
- NEC Corporation
- Tomoyuki Kida
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining solder quality
- Patent number 5,157,463
- Issue date Oct 20, 1992
- Texas Instruments Incorporated
- Mark D. Brown
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of specular, three-dimensional...
- Patent number 5,058,178
- Issue date Oct 15, 1991
- AT&T Bell Laboratories
- Rajarshi Ray
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Coplanarity inspection machine
- Patent number 5,045,710
- Issue date Sep 3, 1991
- American Tech Manufacturing Corp.
- Frank V. Linker
- G01 - MEASURING TESTING
Information Patent Grant
Coplanarity inspection machine
- Patent number 4,996,439
- Issue date Feb 26, 1991
- American Tech Manufacturing, Corp.
- Frank V. Linker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE PROCESSING DEVICE, METHOD FOR CONTROLLING SAME, PROGRAM, AND...
- Publication number 20140372075
- Publication date Dec 18, 2014
- Takeshi KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
RECOGNITION APPARATUS, RECOGNITION METHOD, MOUNTING APPARATUS, AND...
- Publication number 20140160272
- Publication date Jun 12, 2014
- Samsung Electronics Co., Ltd.
- Ueyama SHINJI
- G01 - MEASURING TESTING
Information Patent Application
PART INSPECTION SYSTEM
- Publication number 20130120557
- Publication date May 16, 2013
- MICROSCAN SYSTEMS, INC.
- Steven J. King
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND THREE-DIMENSIONAL...
- Publication number 20120218562
- Publication date Aug 30, 2012
- Omron Corporation
- Hirotaka OGINO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD
- Publication number 20100246931
- Publication date Sep 30, 2010
- KOH YOUNG TECHNOLOGY INC.
- Hee-Tae KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICALLY MONITORING AN ALOX FABRICATION PROCESS
- Publication number 20100078329
- Publication date Apr 1, 2010
- Uri Mirsky
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Micro-surface inspection tool
- Publication number 20080141795
- Publication date Jun 19, 2008
- Daniel F. Gagnon
- G01 - MEASURING TESTING
Information Patent Application
Image capturing for pattern recognition of electronic devices
- Publication number 20080056560
- Publication date Mar 6, 2008
- Wei Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Perspective switching optical device for 3D semiconductor inspection
- Publication number 20080013158
- Publication date Jan 17, 2008
- Mark Richard Shires
- G01 - MEASURING TESTING
Information Patent Application
Method of Manufacturing Ball Array Devices Using an Inspection Appa...
- Publication number 20070183646
- Publication date Aug 9, 2007
- Elwin M. Beaty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of Manufacturing Ball Array Devices Using an Inspection Appa...
- Publication number 20070183645
- Publication date Aug 9, 2007
- Elwin M. Beaty
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image pick-up inspection equipment and method
- Publication number 20060170911
- Publication date Aug 3, 2006
- Renesas Technology Corp.
- Takanori Okita
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for backlighting and imaging multiple views of...
- Publication number 20060152741
- Publication date Jul 13, 2006
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Application
Co-planarity examination method and optical module for electronic c...
- Publication number 20040227959
- Publication date Nov 18, 2004
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring confidence of ball grid array model in surface...
- Publication number 20040213451
- Publication date Oct 28, 2004
- Tong Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and apparatus for inspecting centerplane connectors
- Publication number 20040148128
- Publication date Jul 29, 2004
- Sun Microsystems, Inc.
- John F. Kennedy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting a bump electrode
- Publication number 20040109602
- Publication date Jun 10, 2004
- Yusuke Konno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Co-planarity and top-down examination method and optical module for...
- Publication number 20030174318
- Publication date Sep 18, 2003
- Bradley L. Quist
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for providing illumination in machine vision sy...
- Publication number 20020101200
- Publication date Aug 1, 2002
- Kevin J. Dowling
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and method for electrode plate-connected struc...
- Publication number 20020076094
- Publication date Jun 20, 2002
- Toshiaki Nakanishi
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electronic component evaluation method, electronic component evalua...

Inspection system and method for defect analysis of wire connections

Method of manufacturing printed circuit board and method of inspect...

Image processing device, method for controlling same, program, and...

Substrate detection device and method

Recognition apparatus, recognition method, mounting apparatus, and...

Inspecting potentially interfering features in a machine vision system

Inspection method

Image capturing for pattern recognition of electronic devices

Methods and apparatus for inspecting centerplane connectors

Method of manufacturing ball array devices using an inspection appa...

Image pick-up inspection equipment and method

Method of manufacturing ball array devices using an inspection appa...

Method for measuring confidence of ball grid array model in surface...

Method and apparatus for backlighting and imaging multiple views of...

Co-planarity examination method and optical module for electronic c...

Inspection apparatus and method for electrode plate-connected struc...

Co-planarity and top-down examination method and optical module for...

Systems and methods for providing illumination in machine vision sy...

Optical system

3-D lead inspection

3D profile analysis for surface contour inspection

System and method for measuring object features with coordinated tw...

Method and apparatus for inspecting solder portions

Apparatus for measuring bend amount of IC leads

Method for determining solder quality

Method and apparatus for inspection of specular, three-dimensional...

Coplanarity inspection machine

Coplanarity inspection machine

Patents Applicationslast 30 patents

IMAGE PROCESSING DEVICE, METHOD FOR CONTROLLING SAME, PROGRAM, AND...

RECOGNITION APPARATUS, RECOGNITION METHOD, MOUNTING APPARATUS, AND...

PART INSPECTION SYSTEM

THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND THREE-DIMENSIONAL...

INSPECTION METHOD

OPTICALLY MONITORING AN ALOX FABRICATION PROCESS

Micro-surface inspection tool

Image capturing for pattern recognition of electronic devices

Perspective switching optical device for 3D semiconductor inspection

Method of Manufacturing Ball Array Devices Using an Inspection Appa...

Method of Manufacturing Ball Array Devices Using an Inspection Appa...

Image pick-up inspection equipment and method

Method and apparatus for backlighting and imaging multiple views of...

Co-planarity examination method and optical module for electronic c...

Method for measuring confidence of ball grid array model in surface...

Methods and apparatus for inspecting centerplane connectors

Method and apparatus for inspecting a bump electrode

Co-planarity and top-down examination method and optical module for...

Systems and methods for providing illumination in machine vision sy...

Inspection apparatus and method for electrode plate-connected struc...