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for measuring contour or curvature along an axis
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G01B7/281
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B7/00
Measuring arrangements characterised by the use of electric or magnetic means
Current Industry
G01B7/281
for measuring contour or curvature along an axis
Industries
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Organizations
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Impact
Patents Grants
last 30 patents
Information
Patent Grant
Geometry sensor for inline inspection tool
Patent number
11,913,783
Issue date
Feb 27, 2024
Cypress In-Line Inspection, LLC
Blake Kay Burton
G01 - MEASURING TESTING
Information
Patent Grant
System, method and device for fluid conduit inspection
Patent number
11,773,716
Issue date
Oct 3, 2023
INGU Solutions Inc.
Zachary Shand
G01 - MEASURING TESTING
Information
Patent Grant
Mount assembly, a system and a method for collecting fluid conduit...
Patent number
11,767,944
Issue date
Sep 26, 2023
INGU Solutions Inc.
Anouk van Pol
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Sensor device for measuring the rotational position of an element
Patent number
11,441,885
Issue date
Sep 13, 2022
TE Connectivity Germany GmbH
Tom Ocket
G01 - MEASURING TESTING
Information
Patent Grant
Wire electrical discharge machine
Patent number
10,024,644
Issue date
Jul 17, 2018
FANUC CORPORATION
Hiroyuki Abe
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Three-dimensional edge profile determination
Patent number
9,417,047
Issue date
Aug 16, 2016
Toyota Motor Engineering & Manufacturing North America, Inc.
Kenneth T. Gowen
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device for measuring pipe size
Patent number
9,273,945
Issue date
Mar 1, 2016
Liqui-Force Sewer Services Inc.
Jeff Lewis
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring and aligning a rotary cylindrical apparatus
Patent number
9,234,737
Issue date
Jan 12, 2016
Andritz Oy
Teemu Hakkinen
G01 - MEASURING TESTING
Information
Patent Grant
Non-differential elastomer curvature sensor
Patent number
9,228,822
Issue date
Jan 5, 2016
President and Fellows of Harvard College
Carmel Majidi
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring and correcting a parallelism error in a nuclea...
Patent number
8,885,789
Issue date
Nov 11, 2014
Areva NC
Daniel Lavios
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Apparatus, system, and method for automated item tracking
Patent number
8,860,572
Issue date
Oct 14, 2014
Element ID, Inc.
John E. Romaine
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, system, and method for automated item tracking
Patent number
8,581,722
Issue date
Nov 12, 2013
Element ID, Inc.
John E. Romaine
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for ascertaining the deformation of a fuel assemb...
Patent number
8,453,514
Issue date
Jun 4, 2013
Areva GmbH
Wolfgang Hummel
G01 - MEASURING TESTING
Information
Patent Grant
Method of measuring a length of sections of extrados or intrados cu...
Patent number
8,279,454
Issue date
Oct 2, 2012
CML International S.p.A.
Alessandro Caporusso
G01 - MEASURING TESTING
Information
Patent Grant
Method for evaluating semiconductor wafer, apparatus for evaluating...
Patent number
7,810,383
Issue date
Oct 12, 2010
Shin-Etsu Handotai Co., Ltd.
Keiichi Okabe
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Apparatus for inspecting deformation of pipes
Patent number
7,159,477
Issue date
Jan 9, 2007
Borealis Technology Oy
Emil Edwin
G01 - MEASURING TESTING
Information
Patent Grant
Riser and tubular inspection systems
Patent number
6,931,748
Issue date
Aug 23, 2005
Varco I/P, Inc.
Clive Chemo Lam
G01 - MEASURING TESTING
Information
Patent Grant
System and method for monitoring defects in structures
Patent number
6,922,641
Issue date
Jul 26, 2005
General Electric Company
Thomas Batzinger
G01 - MEASURING TESTING
Information
Patent Grant
System for collecting data used by surface profiling scheme
Patent number
6,912,478
Issue date
Jun 28, 2005
Allen Face and Company, LC
S. Allen Face, III
G01 - MEASURING TESTING
Information
Patent Grant
High speed linear displacement measurement
Patent number
6,862,814
Issue date
Mar 8, 2005
The Boeing Company
Stephen J. Bennison
G01 - MEASURING TESTING
Information
Patent Grant
Determining a surface profile of an object
Patent number
6,734,670
Issue date
May 11, 2004
Shell Oil Company
Paulus Carolus Nicolaas Crouzen
G01 - MEASURING TESTING
Information
Patent Grant
Rotating probe for inspecting tubes having an eccentric housing for...
Patent number
5,453,688
Issue date
Sep 26, 1995
Atomic Energy of Canada Limited
Valentino S. Cecco
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for deflection measurements using eddy current...
Patent number
5,214,379
Issue date
May 25, 1993
The United States of America as represented by the administrator of the Natio...
Engmin J. Chern
G01 - MEASURING TESTING
Information
Patent Grant
Method of and apparatus for detecting cross sectional area variatio...
Patent number
5,036,277
Issue date
Jul 30, 1991
Crucible Societe Anonyme
Nicolaas T. van der Walt
G01 - MEASURING TESTING
Information
Patent Grant
Calibration of eddy current profilometry
Patent number
4,942,545
Issue date
Jul 17, 1990
Combustion Engineering, Inc.
Mark A. Sapia
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting cross sectional area variations...
Patent number
4,929,897
Issue date
May 29, 1990
Crucible Societe Anonyme
Nicholaas T. Van Der Walt
G01 - MEASURING TESTING
Information
Patent Grant
Tube curvature measuring probe and method
Patent number
4,910,877
Issue date
Mar 27, 1990
The United States of America as represented by the United States Department o...
George J. Sokol
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for inspecting the profile of the inner wall o...
Patent number
4,876,506
Issue date
Oct 24, 1989
Westinghouse Electric Corp.
Stephen D. Brown
G01 - MEASURING TESTING
Information
Patent Grant
A surveying and mapping apparatus for indicating the level differen...
Patent number
4,858,329
Issue date
Aug 22, 1989
Technion Research & Development Foundation Ltd.
Gedalyahu Manor
G01 - MEASURING TESTING
Information
Patent Grant
Rotating head profilometer probe
Patent number
4,851,773
Issue date
Jul 25, 1989
Samuel Rothstein
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CURVE INDUCTIVE SENSOR
Publication number
20250012555
Publication date
Jan 9, 2025
Magnisity Ltd.
Ron BARAK
G01 - MEASURING TESTING
Information
Patent Application
Curved Surface Measurement Device and Method for Preparation Thereof
Publication number
20240053133
Publication date
Feb 15, 2024
National Yang Ming Chiao Tung University
Kuei Ann WEN
G08 - SIGNALLING
Information
Patent Application
METHOD AND DEVICE FOR DETERMINING CENTERS OF A HOLLOW SHAFT ROTATAB...
Publication number
20230152079
Publication date
May 18, 2023
NILES-SIMMONS INDUSTRIEANLAGEN GMBH
Reinhard ROBOTTA
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, METHOD AND DEVICE FOR FLUID CONDUIT INSPECTION
Publication number
20210238991
Publication date
Aug 5, 2021
INGU Solutions Inc.
Zachary Shand
E21 - EARTH DRILLING MINING
Information
Patent Application
Sensor Device For Measuring The Rotational Position Of An Element
Publication number
20210080243
Publication date
Mar 18, 2021
TE Connectivity Belgium BVBA
Tom Ocket
G01 - MEASURING TESTING
Information
Patent Application
MOUNT ASSEMBLY, A SYSTEM AND A METHOD FOR COLLECTING FLUID CONDUIT...
Publication number
20190368665
Publication date
Dec 5, 2019
INGU Solutions Inc.
Anouk van Pol
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Application
DOWNHOLE MAPPING SYSTEM
Publication number
20140336937
Publication date
Nov 13, 2014
Jørgen Hallundbæk
G01 - MEASURING TESTING
Information
Patent Application
Apparatus, System, and Method for Automated Item Tracking
Publication number
20140084054
Publication date
Mar 27, 2014
Element ID, Inc.
John E. Romaine
G01 - MEASURING TESTING
Information
Patent Application
NON-DIFFERENTIAL ELASTOMER CURVATURE SENSOR
Publication number
20130312541
Publication date
Nov 28, 2013
President and Fellows of Harvard College
Carmel Majidi
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION DEVICE FOR MEASURING PIPE SIZE
Publication number
20120300224
Publication date
Nov 29, 2012
LIQUI-FORCE SEWER SERVICES, INC.
Jeff Lewis
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MEASURING AND ALIGNING A ROTARY CYLINDRICAL APPARATUS
Publication number
20120290258
Publication date
Nov 15, 2012
ANDRITZ OY
Teemu Hakkinen
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR ASCERTAINING THE DEFORMATION OF A FUEL ASSEMB...
Publication number
20120222489
Publication date
Sep 6, 2012
AREVA NP GMBH
WOLFGANG HUMMEL
G01 - MEASURING TESTING
Information
Patent Application
Apparatus, System, and Method for Automated Item Tracking
Publication number
20110234398
Publication date
Sep 29, 2011
ELEMENT ID, INC.
John E. Romaine
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE FOR MEASURING AND CORRECTING A PARALLELISM ERROR IN A NUCLEA...
Publication number
20110164717
Publication date
Jul 7, 2011
AREVA NC
Daniel Lavios
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Application
PIPELINE MONITORING APPARATUS AND METHOD
Publication number
20110095752
Publication date
Apr 28, 2011
Gordon Campbell Short
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MEASURING A LENGTH OF SECTIONS OF EXTRADOS OR INTRADOS CU...
Publication number
20110032542
Publication date
Feb 10, 2011
CML INTERNATIONAL S.P.A.
Alessandro CAPORUSSO
G01 - MEASURING TESTING
Information
Patent Application
SURFACE PROFILE MEASURING INSTRUMENT
Publication number
20080208524
Publication date
Aug 28, 2008
ELCOMETER INSTRUMENTS LIMITED
Ian Carrington Sellars
G01 - MEASURING TESTING
Information
Patent Application
Method for Evaluating Semiconductor Wafer, Apparatus for Evaluating...
Publication number
20080166823
Publication date
Jul 10, 2008
Keiichi Okabe
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for inspecting deformation of pipes
Publication number
20050120812
Publication date
Jun 9, 2005
Emil Edwin
G01 - MEASURING TESTING
Information
Patent Application
System and method for monitoring defects in structures
Publication number
20050075800
Publication date
Apr 7, 2005
Thomas Batzinger
G01 - MEASURING TESTING
Information
Patent Application
High speed linear displacement measurement
Publication number
20040117999
Publication date
Jun 24, 2004
Stephen J. Bennison
G01 - MEASURING TESTING
Information
Patent Application
Riser and tubular inspection systems
Publication number
20040016139
Publication date
Jan 29, 2004
Clive Chemo Lam
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for measuring shape of pipeline and method therefor
Publication number
20030233894
Publication date
Dec 25, 2003
JFE Engineering Corporation
Kouichi Tezuka
E21 - EARTH DRILLING MINING
Information
Patent Application
Determining a surface profile of an object
Publication number
20030169035
Publication date
Sep 11, 2003
Paulus Carolus Nicolaas Crouzen
G01 - MEASURING TESTING