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G01B7/345
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B7/00
Measuring arrangements characterised by the use of electric or magnetic means
Current Industry
G01B7/345
for measuring evenness
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Patents Grants
last 30 patents
Information
Patent Grant
Hand tool edge tester
Patent number
11,474,014
Issue date
Oct 18, 2022
Razor Edge Systems, Inc.
Mary T. Graves
G01 - MEASURING TESTING
Information
Patent Grant
3D floating support system and related geometry-detecting machine o...
Patent number
11,002,532
Issue date
May 11, 2021
RDE COMPANY S.R.L.
Gabriele Bomba
G01 - MEASURING TESTING
Information
Patent Grant
3D floating support system and related geometry-detecting machine o...
Patent number
10,890,440
Issue date
Jan 12, 2021
RDE COMPANY S.R.L.
Gabriele Bomba
G01 - MEASURING TESTING
Information
Patent Grant
Roughness measurement sensor, an apparatus with a roughness measure...
Patent number
10,539,407
Issue date
Jan 21, 2020
Klingelnberg AG
Georg Mies
G01 - MEASURING TESTING
Information
Patent Grant
Shape-detecting machine for slender articles
Patent number
10,514,252
Issue date
Dec 24, 2019
RDE COMPANY S.R.L.
Gabriele Bomba
G01 - MEASURING TESTING
Information
Patent Grant
Verifying end effector flatness using electrical continuity
Patent number
10,190,865
Issue date
Jan 29, 2019
Lam Research Corporation
Silvia Rocio Aguilar Amaya
G01 - MEASURING TESTING
Information
Patent Grant
Fiber waviness detection method and apparatus for conductive compos...
Patent number
10,132,778
Issue date
Nov 20, 2018
IHI Corporation
Akinori Tsuda
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Tool for detecting verticality between axle hole and milling plane
Patent number
9,228,818
Issue date
Jan 5, 2016
ZHEJIANG LINIX MOTOR CO., LTD.
Xin Wang
G01 - MEASURING TESTING
Information
Patent Grant
Control device for a parallel slider device, control method and mea...
Patent number
8,819,952
Issue date
Sep 2, 2014
Kuroda Precision Industries Ltd.
Kaoru Naoi
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method and system for measuring film stress in a wafer film
Patent number
8,004,303
Issue date
Aug 23, 2011
National Semiconductor Corporation
Peter J. Hopper
G01 - MEASURING TESTING
Information
Patent Grant
Pin height adjustment in bed of nails shape measurement
Patent number
7,509,218
Issue date
Mar 24, 2009
Corning Incorporated
Steven F Hoysan
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for planeness testing
Patent number
7,443,157
Issue date
Oct 28, 2008
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.
Bing-Jun Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Graphical rolled steel sheet flatness display and method of using same
Patent number
7,225,652
Issue date
Jun 5, 2007
ISG Technologies, Inc.
Thomas J. Russo
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Graphical rolled steel sheet flatness display and method of using same
Patent number
6,948,347
Issue date
Sep 27, 2005
ISG Technologies Inc.
Thomas J. Russo
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Technique for measuring small distances between, and for measuring...
Patent number
6,742,380
Issue date
Jun 1, 2004
Seagate Technology LLC
Matthew M. Johnston
G01 - MEASURING TESTING
Information
Patent Grant
Process for detecting flatness defects
Patent number
6,722,194
Issue date
Apr 20, 2004
Vai Clecim le Polyedre
Thierry Malard
G01 - MEASURING TESTING
Information
Patent Grant
Glide head with outer active rail
Patent number
6,666,076
Issue date
Dec 23, 2003
Seagate Technology LLC
Zuxuan Lin
G11 - INFORMATION STORAGE
Information
Patent Grant
Strip flatness measuring device
Patent number
6,658,947
Issue date
Dec 9, 2003
T. Sendzimir, Inc.
Michael G. Sendzimir
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Flatness measuring roller
Patent number
6,606,919
Issue date
Aug 19, 2003
Vai Clecim
Remi Perenon
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Advanced glidehead sensor for small slider
Patent number
6,557,399
Issue date
May 6, 2003
Seagate Technology, LLC
Chiao-Ping Ku
G11 - INFORMATION STORAGE
Information
Patent Grant
Method of and apparatus for contactless planarity measurements on f...
Patent number
6,448,764
Issue date
Sep 10, 2002
BWG Bergwerk-Und Walzwerk-Maschinenbau GmbH
Rolf Noe
G01 - MEASURING TESTING
Information
Patent Grant
Measuring roller for determining flatness deviations
Patent number
6,354,013
Issue date
Mar 12, 2002
BFIVDEh-Institut fur angewandte Forschung GmbH
Gert Mucke
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Grant
Advanced glidehead sensor for small slider
Patent number
6,314,799
Issue date
Nov 13, 2001
Seagate Technology, LLC
Chiao-Ping Ku
G11 - INFORMATION STORAGE
Information
Patent Grant
Measurement of surface wear
Patent number
6,301,950
Issue date
Oct 16, 2001
Federal-Mogul Friction Products Limited
Ronald I Cotterill
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Surface flatness measuring apparatus
Patent number
6,275,032
Issue date
Aug 14, 2001
System Seiko Co., Ltd.
Tetsuya Iwata
G11 - INFORMATION STORAGE
Information
Patent Grant
Sensor for measuring degree of flatness
Patent number
6,255,664
Issue date
Jul 3, 2001
Super Silicon Crystal Research Institute Corp.
Shinji Okawa
G01 - MEASURING TESTING
Information
Patent Grant
Waviness measurement
Patent number
6,250,142
Issue date
Jun 26, 2001
SKF Nova AB
Bo Göransson
G01 - MEASURING TESTING
Information
Patent Grant
Method of processing a substrate including measuring for planarity...
Patent number
6,111,419
Issue date
Aug 29, 2000
Motorola Inc.
Douglas D. Lefever
G01 - MEASURING TESTING
Information
Patent Grant
Flattening process for epitaxial semiconductor wafers
Patent number
6,030,887
Issue date
Feb 29, 2000
MEMC Electronic Materials, Inc.
Ankur H. Desai
C30 - CRYSTAL GROWTH
Information
Patent Grant
Method of and apparatus for measuring flatness of semiconductor waf...
Patent number
6,002,262
Issue date
Dec 14, 1999
Komatsu Electronic Metals Co., Ltd.
Junichiro Higashi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
IMPROVED CONTACTLESS DETECTION OF VIBRATIONS IN METAL BELTS
Publication number
20240384977
Publication date
Nov 21, 2024
PRIMETALS TECHNOLOGIES GERMANY GMBH
Mark DOLBY
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Application
3D FLOATING SUPPORT SYSTEM AND RELATED GEOMETRY-DETECTING MACHINE O...
Publication number
20200116476
Publication date
Apr 16, 2020
RDE COMPANY S.R.L.
Gabriele BOMBA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SHAPE ERROR IN-SITU MEASUREMENT OF TORUSES
Publication number
20190178642
Publication date
Jun 13, 2019
DALIAN UNIVERSITY OF TECHNOLOGY
Qingchao SUN
G01 - MEASURING TESTING
Information
Patent Application
SHAPE-DETECTING MACHINE FOR SLENDER ARTICLES
Publication number
20190120615
Publication date
Apr 25, 2019
RDE COMPANY S.R.L.
Gabriele BOMBA
G01 - MEASURING TESTING
Information
Patent Application
VERIFYING END EFFECTOR FLATNESS USING ELECTRICAL CONTINUITY
Publication number
20170211922
Publication date
Jul 27, 2017
LAM RESEARCH CORPORATION
Silvia Rocio Aguilar Amaya
G01 - MEASURING TESTING
Information
Patent Application
COMPUTER PRODUCT, UNEVENNESS ANALYSIS METHOD, AND UNEVENNESS ANALYZER
Publication number
20160244066
Publication date
Aug 25, 2016
Fujitsu Limited
Hiroyuki TANI
B60 - VEHICLES IN GENERAL
Information
Patent Application
Tool for Detecting Verticality between Axle Hole and Milling Plane
Publication number
20130318806
Publication date
Dec 5, 2013
ZHEJIANG LINIX MOTOR CO., LTD.
Xin Wang
G01 - MEASURING TESTING
Information
Patent Application
Control Device for a Parallel Slider Device, Control Method Therefo...
Publication number
20130008042
Publication date
Jan 10, 2013
KURODA PRECISION INDUSTRIES LTD.
Kaoru Naoi
G01 - MEASURING TESTING
Information
Patent Application
Method and system for measuring film stress in a wafer film
Publication number
20100141292
Publication date
Jun 10, 2010
National Semiconductor
Peter J. Hopper
G01 - MEASURING TESTING
Information
Patent Application
Pin height adjustment in bed of nails shape measurement
Publication number
20080120044
Publication date
May 22, 2008
CORNING INCORPORATED, a New York corporation
Steven F. Hoysan
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR PLANENESS TESTING
Publication number
20080041142
Publication date
Feb 21, 2008
HON HAI Precision Industry CO., LTD.
BING-JUN ZHANG
G01 - MEASURING TESTING
Information
Patent Application
Graphical rolled steel sheet flatness display and method of using same
Publication number
20060016518
Publication date
Jan 26, 2006
ISG TECHNOLOGIES INC.
Thomas J. Russo
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Application
Graphical rolled steel sheet flatness display and method of using same
Publication number
20040144145
Publication date
Jul 29, 2004
Bethlehem Steel Corporation
Thomas J. Russo
B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information
Patent Application
Process for detecting flatness defects
Publication number
20020178840
Publication date
Dec 5, 2002
Thierry Malard
G01 - MEASURING TESTING
Information
Patent Application
Flatness measuring roller
Publication number
20020092365
Publication date
Jul 18, 2002
Remi Perenon
G01 - MEASURING TESTING
Information
Patent Application
Glide head with outer active rail
Publication number
20020069695
Publication date
Jun 13, 2002
Zuxuan Lin
G01 - MEASURING TESTING
Information
Patent Application
Technique for measuring small distances between and for measuring t...
Publication number
20020029609
Publication date
Mar 14, 2002
Matthew M. Johnston
G01 - MEASURING TESTING
Information
Patent Application
Method of and apparatus for contactless planarity measurements on f...
Publication number
20010007422
Publication date
Jul 12, 2001
BWG Bergwerk- und Walzwerk-Maschinenbau GmbH
Rolf Noe
G01 - MEASURING TESTING