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G01R17/105
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R17/00
Measuring arrangements involving comparison with a reference value
Current Industry
G01R17/105
for measuring impedance or resistance
Industries
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Patents Grants
last 30 patents
Information
Patent Grant
Offset calibration and diagnostics for resistance-based bridge circ...
Patent number
11,906,610
Issue date
Feb 20, 2024
Honeywell International Inc.
Ian Bentley
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor testkey pattern and test method thereof
Patent number
11,721,599
Issue date
Aug 8, 2023
United Semiconductor (Xiamen) Co., Ltd.
Linshan Yuan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sensor and inspection device
Patent number
11,703,530
Issue date
Jul 18, 2023
Kabushiki Kaisha Toshiba
Akira Kikitsu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for estimation of sensor resistance
Patent number
11,644,493
Issue date
May 9, 2023
Cirrus Logic, Inc.
Saurabh Singh
G01 - MEASURING TESTING
Information
Patent Grant
Verification of correct operation of a physical parameter sensor
Patent number
11,630,015
Issue date
Apr 18, 2023
Rosemount Aerospace Inc.
Mark Buenz
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor array with different RA TMR film
Patent number
11,598,828
Issue date
Mar 7, 2023
Western Digital Technologies, Inc.
Yuankai Zheng
G01 - MEASURING TESTING
Information
Patent Grant
AC impedance measurement circuit with calibration function
Patent number
11,567,113
Issue date
Jan 31, 2023
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring device and method of monitoring an impedance of a protec...
Patent number
11,486,907
Issue date
Nov 1, 2022
TE Connectivity Germany GmbH
Stefan Kipp
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Magnetic sensor array with one TMR stack having two free layers
Patent number
11,415,645
Issue date
Aug 16, 2022
Western Digital Technologies, Inc.
Yuankai Zheng
G11 - INFORMATION STORAGE
Information
Patent Grant
AC impedance measurement circuit with calibration function
Patent number
11,280,818
Issue date
Mar 22, 2022
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining the resistance temperature characteristic of...
Patent number
11,262,393
Issue date
Mar 1, 2022
BorgWarner Ludwigsburg GmbH
Karsten Volland
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Bottom leads chemical mechanical planarization for TMR magnetic sen...
Patent number
11,201,280
Issue date
Dec 14, 2021
Western Digital Technologies, Inc.
Ronghui Zhou
G11 - INFORMATION STORAGE
Information
Patent Grant
Dual free layer TMR magnetic field sensor
Patent number
11,169,227
Issue date
Nov 9, 2021
Western Digital Technologies, Inc.
Chih-Ching Hu
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor with serial resistor for asymmetric sensing field r...
Patent number
11,169,228
Issue date
Nov 9, 2021
Western Digital Technologies, Inc.
Yung-Hung Wang
G11 - INFORMATION STORAGE
Information
Patent Grant
Half-bridge differential sensor
Patent number
11,085,953
Issue date
Aug 10, 2021
Melexis Technologies NV
Asparuh Ivanov Grigorov
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensing apparatus
Patent number
11,061,085
Issue date
Jul 13, 2021
iSentek Inc.
Fu-Te Yuan
G01 - MEASURING TESTING
Information
Patent Grant
Measuring bridge arrangement with improved error detection
Patent number
10,983,187
Issue date
Apr 20, 2021
Ypsomed AG
Michael Gentz
G01 - MEASURING TESTING
Information
Patent Grant
Electronic device, method for operating the same, and wireless cont...
Patent number
10,809,785
Issue date
Oct 20, 2020
TPK Glass Solutions (Xiamen) Inc.
Chao-Sung Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detecting device
Patent number
10,718,795
Issue date
Jul 21, 2020
FANUC CORPORATION
Shougo Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuit for biasing and readout of resistive sensor stru...
Patent number
10,698,009
Issue date
Jun 30, 2020
Melexis Technologies SA
Johan L. Raman
G01 - MEASURING TESTING
Information
Patent Grant
Resistance calibration
Patent number
10,663,995
Issue date
May 26, 2020
SOCIONEXT INC.
Hassan Shafeeu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Wheatstone bridge sensing system with multiple current sources
Patent number
10,416,697
Issue date
Sep 17, 2019
Semiconductor Components Industries, LLC
Jacques Jean Bertin
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for calculating offset of wheatstone bridge ty...
Patent number
10,310,050
Issue date
Jun 4, 2019
Korea Electronics Technology Institute
Won Ki Park
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for ascertaining an inner resistance of a supply...
Patent number
10,286,868
Issue date
May 14, 2019
Robert Bosch GmbH
Carsten List
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Programmable self-adjusting resistance source
Patent number
10,191,084
Issue date
Jan 29, 2019
IET Labs, Inc.
Benjamin Salim Sheena
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Circuit including a switched capacitor bridge and method
Patent number
10,177,781
Issue date
Jan 8, 2019
Silicon Laboratories Inc.
Louis Nervegna
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Methods and systems for accuracy improvement in current comparators
Patent number
10,151,777
Issue date
Dec 11, 2018
GUIDELINE INSTRUMENTS LIMITED
Mark Evans
G01 - MEASURING TESTING
Information
Patent Grant
Multisensory detector
Patent number
10,126,333
Issue date
Nov 13, 2018
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Guillaume Jourdan
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods that allow for simultaneous sensor and signal c...
Patent number
9,927,318
Issue date
Mar 27, 2018
Honeywell International Inc
Vishal Malhan
G01 - MEASURING TESTING
Information
Patent Grant
Measurement circuit
Patent number
9,910,073
Issue date
Mar 6, 2018
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Loic Joet
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
CIRCUIT BOARD AND MONITORING METHOD THEREFOR
Publication number
20240310431
Publication date
Sep 19, 2024
Wiwynn Corporation
Gong-Bo SONG
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Sensor Readout System and Sensor Readout Method
Publication number
20240192028
Publication date
Jun 13, 2024
Stichting IMEC Nederland
Roland Van Wegberg
G01 - MEASURING TESTING
Information
Patent Application
OFFSET CALIBRATION AND DIAGNOSTICS FOR RESISTANCE-BASED BRIDGE CIRC...
Publication number
20220291322
Publication date
Sep 15, 2022
Honeywell International Inc.
Ian Bentley
G01 - MEASURING TESTING
Information
Patent Application
BRIDGE SENSOR DC ERROR CANCELLATION SCHEME
Publication number
20220149856
Publication date
May 12, 2022
Microsoft Technology Licensing, LLC
Chang Joon PARK
G01 - MEASURING TESTING
Information
Patent Application
AC Impedance Measurement Circuit with Calibration Function
Publication number
20220074980
Publication date
Mar 10, 2022
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Application
AC Impedance Measurement Circuit with Calibration Function
Publication number
20210382100
Publication date
Dec 9, 2021
Hycon Technology Corporation
Po-Yin Chao
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Sensor Array with Different RA TMR Film
Publication number
20210063507
Publication date
Mar 4, 2021
Western Digital Technologies, Inc.
Yuankai ZHENG
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Sensor with Serial Resistor for Asymmetric Sensing Field R...
Publication number
20210063509
Publication date
Mar 4, 2021
Western Digital Technologies, Inc.
Yung-Hung WANG
G01 - MEASURING TESTING
Information
Patent Application
Dual Free Layer TMR Magnetic Field Sensor
Publication number
20210063508
Publication date
Mar 4, 2021
Western Digital Technologies, Inc.
Chih-Ching HU
G01 - MEASURING TESTING
Information
Patent Application
Magnetic Sensor Array With One TMR Stack Having Two Free Layers
Publication number
20210055361
Publication date
Feb 25, 2021
Western Digital Technologies, Inc.
Yuankai ZHENG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Bottom Leads Chemical Mechanical Planarization for TMR Magnetic Sen...
Publication number
20210057638
Publication date
Feb 25, 2021
Western Digital Technologies, Inc.
Ronghui ZHOU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC FIELD SENSING APPARATUS
Publication number
20200300937
Publication date
Sep 24, 2020
Isentek Inc.
Fu-Te Yuan
G01 - MEASURING TESTING
Information
Patent Application
HALF-BRIDGE DIFFERENTIAL SENSOR
Publication number
20200018781
Publication date
Jan 16, 2020
MELEXIS TECHNOLOGIES NV
Asparuh Ivanov GRIGOROV
G01 - MEASURING TESTING
Information
Patent Application
Pressure Sensing Apparatus and Control Method Thereof
Publication number
20190383685
Publication date
Dec 19, 2019
Tyco Electronics AMP Korea Co., Ltd.
Young-Deok Kim
G01 - MEASURING TESTING
Information
Patent Application
Monitoring Device and Method of Monitoring an Impedance of a Protec...
Publication number
20190212370
Publication date
Jul 11, 2019
TE Connectivity Germany GmbH
Stefan Kipp
B60 - VEHICLES IN GENERAL
Information
Patent Application
DETECTING DEVICE
Publication number
20190064226
Publication date
Feb 28, 2019
FANUC CORPORATION
Yuuki FUKUMOTO
G05 - CONTROLLING REGULATING
Information
Patent Application
DETECTING DEVICE
Publication number
20190064227
Publication date
Feb 28, 2019
FANUC CORPORATION
Shougo TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR CALCULATING OFFSET OF WHEATSTONE BRIDGE TY...
Publication number
20180180700
Publication date
Jun 28, 2018
Korea Electronics Technology Institute
Won Ki PARK
G01 - MEASURING TESTING
Information
Patent Application
MEASURING BRIDGE ARRANGEMENT WITH IMPROVED ERROR DETECTION
Publication number
20170350955
Publication date
Dec 7, 2017
TecPharma Licensing AG
Michael Gentz
G01 - MEASURING TESTING
Information
Patent Application
METHODS AND SYSTEMS FOR ACCURACY IMPROVEMENT IN CURRENT COMPARATORS
Publication number
20170184637
Publication date
Jun 29, 2017
Guildline Instruments Limited
Mark EVANS
G01 - MEASURING TESTING
Information
Patent Application
MULTICOMPONENT MAGNETIC FIELD SENSOR
Publication number
20160169985
Publication date
Jun 16, 2016
SENSITEC GMBH
Sebastian WEBER
G01 - MEASURING TESTING
Information
Patent Application
SINGLE-CHIP BRIDGE-TYPE MAGNETIC FIELD SENSOR
Publication number
20160109535
Publication date
Apr 21, 2016
MULTIDIMENSION TECHNOLOGY CO., LTD.
James Geza Deak
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS THAT ALLOW FOR SIMULTANEOUS SENSOR AND SIGNAL C...
Publication number
20150331016
Publication date
Nov 19, 2015
Honeywell International Inc.
Vishal Malhan
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT CIRCUIT
Publication number
20150293155
Publication date
Oct 15, 2015
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Loic JOET
G01 - MEASURING TESTING
Information
Patent Application
MULTISENSORY DETECTOR
Publication number
20150177281
Publication date
Jun 25, 2015
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENE. ALT.
Guillaume JOURDAN
G01 - MEASURING TESTING
Information
Patent Application
Capacitance to Digital Converter and Method
Publication number
20140375374
Publication date
Dec 25, 2014
Silicon Laboratories Inc.
Louis Nervegna
G01 - MEASURING TESTING
Information
Patent Application
Circuit Including a Switched Capacitor Bridge and Method
Publication number
20140375135
Publication date
Dec 25, 2014
Louis Nervegna
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING THE RESISTANCE OF A RESISTIVE STRUC...
Publication number
20140191768
Publication date
Jul 10, 2014
Linear Technology Corporation
Bernhard Helmut ENGL
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL/ BIOLOGICAL SENSORS EMPLOYING FUNCTIONALIZED NANOSWITCH ARRAY
Publication number
20130249574
Publication date
Sep 26, 2013
Battelle Memorian Institute
Larry J. House
G01 - MEASURING TESTING
Information
Patent Application
Static/dynamic Resistance Measuring Apparatus and Method
Publication number
20120105083
Publication date
May 3, 2012
Ningbo University
Jiankang Chen
G01 - MEASURING TESTING